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ORCID8th Asian Test Symposium 1999: Shanghai, China
- 8th Asian Test Symposium (ATS '99), 16-18 November 1999, Shanghai, China. IEEE Computer Society 1999, ISBN 0-7695-0315-2
ATPG Related Approaches I
- Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara:
A Method of Test Generation for Weakly Testable Data Paths Using Test Knowledge Extracted from RTL Description. 5-12 - Junichi Hirase, Shinichi Yoshimura, Tomohisa Sczaki:
Automatic Test Pattern Generation for Improving the Fault Coverage of Microprocessors. 13-19 - Seiji Kajihara, Atsushi Murakami, Tomohisa Kaneko:
On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits. 20-24 - Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada:
Identification of Feedback Bridging Faults with Oscillation. 25-
Delay Fault & Memory Test
- Ad J. van de Goor, J. E. Simonse:
Defining SRAM Resistive Defects and Their Simulation Stimuli. 33-40 - Irith Pomeranz, Sudhakar M. Reddy:
Vector-Based Functional Fault Models for Delay Faults. 41-46 - G. Sidiropoulos, Haridimos T. Vergos, Dimitris Nikolos:
Easily Path Delay Fault Testable Non-Restoring Cellular Array Dividers. 47-52 - Said Hamdioui, Ad J. van de Goor:
March Tests for Word-Oriented Two-Port Memories. 53-
ATPG Related Approaches II
- Shiyi Xu, Tukwasibwe Justaf Frank:
An Evaluation of Test Generation Algorithms for combinational Circuits. 63-69 - Zhide Zeng, Jihua Chen, Hefeng Cao:
Research and Implementation of a High Speed Test Generation for Ultra Large Scale Combinational Circuits. 70-74 - Irith Pomeranz, Sudhakar M. Reddy:
Pattern Sensitivity: A Property to Guide Test Generation for Combinational Circuits. 75-80 - Jing-Jou Tang:
An Accurate Logic Threshold Voltages Determination Model for CMOS Gates to Facilitate Test Generation and Fault Simulation. 81-
BIST Related Approaches
- Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch:
Circuit Partitioning for Low Power BIST Design with Minimized Peak Power Consumption. 89-94 - Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi:
A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD. 95-100 - Albrecht P. Stroele, Frank Mayer:
Test Scheduling with Loop Folding and Its Application to Test Configurations with Accumulators. 101-106 - C. P. Ravikumar, Ashutosh Verma, Gaurav Chandra:
A Polynomial-Time Algorithm for Power Constrained Testing of Core Based Systems. 107-112 - Serge N. Demidenko, Kenneth V. Lever:
Accelerating Test Data Processin. 113-
Test Generation, Diagnosis, & Verification
- Arabi Keshk, Kozo Kinoshita, Yukiya Miura:
Procedure to Overcome the Byzantine General's Problem for Bridging Faults in CMOS Circuits. 121-126 - Chanyutt Arjhan, Raghvendra G. Deshmukh:
A Novel Fault-Detection Technique for The Parallel Multipliers and Dividers. 127-132 - Zhide Zeng, Jihua Chen, Pengxia Liu:
A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits. 133-
IDDQ Test
- Yoshinobu Higami, Yuzo Takamatsu, Kewal K. Saluja, Kozo Kinoshita:
Fault Simulation Techniques to Reduce IDDQ Measurement Vectors for Sequential Circuits. 141-146 - Hideyuki Ichihara, Kozo Kinoshita, Seiji Kajihara:
On an Effective Selection of IDDQ Measurement Vectors for Sequential Circuits. 147-152 - Junichi Hirase, Naoki Shindou, Kouji Akahori:
Scan Chain Diagnosis Using IDDQ Current Measurement. 153-157 - Arabi Keshk, Kozo Kinoshita, Yukiya Miura:
IDDQ Current Dependency on Test Vectors and Bridging Resistance. 158-163 - Tsuyoshi Shinogi, Terumine Hayashi:
A Parallel Generation System of Compact IDDQ Test Sets for Large Combinational Circuits. 164-
Sequential Circuit Test
- Hsing-Chung Liang, Chung-Len Lee:
An Effective Methodology for Mixed Scan and Reset Design Based on Test Generation and Structure of Sequential Circuits. 173-178 - Li Shen:
Genetic Algorithm Based Test Generation for Sequential Circuits. 179-184 - M. H. Konijnenburg, Hans van der Linden, Ad J. van de Goor:
Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation. 185-191 - Toshinori Hosokawa, Toshihiro Hiraoka, Tomoo Inoue, Hideo Fujiwara:
Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential Circuits Using a Time Expansion Model. 192-
Fault-Tolerant & Diagnosis
- Yasuyuki Taniguchi, Naotake Kamiura, Yutaka Hata, Nobuyuki Matsui:
Activation Function Manipulation for Fault Tolerant Feedforward Neural Networks. 203-208 - Tao Zhang, Dongcheng Hu, Shiyuan Yang:
Fault-Tolerant Analysis of Feedback Neural Networks with Threshold Neurons. 209-213 - Jianhua Gao, Shihuang Shao:
Fault-Tolerant Strategies and Their Design Methods for Application Software. 214-217 - Chenglian Peng, Baifeng Wu, Xiaoguang Sun:
Test by Distributed Monitoring. 218-
Analog Circuits Test
- Abdelhakim Khouas, Mohamed Dessouky, Anne Derieux:
Optimized Statistical Analog Fault Simulation. 227-232 - Chauchin Su, Yue-Tsang Chen, Chung-Len Lee:
Analog Metrology and Stimulus Selection in a Noisy Environment. 233-238 - Sam D. Huynh, Jinyan Zhang, Seongwon Kim, Giri Devarayanadurg, Mani Soma:
Efficient Test Set Design for Analog and Mixed-Signal Circuits and Systems. 239-
Railway Signaling Software
- Fangmei Wu, Meng Li:
Railway Signaling Safety-critical Software Testing Based on Dynamic Decision Table. 247-250 - Zhongwei Xu, Fangmei Wu:
A Novel Testing Approach for Safety-Critical Software. 251-255 - Haiying Tu, Fangmei Wu:
How to Design an Environment Simulator for Safety Critical Software Testing. 256-
DFT
- Debesh Kumar Das, Satoshi Ohtake, Hideo Fujiwara:
New DFT Techniques of Non-Scan Sequential Circuits with Complete Fault Efficiency. 263-268 - Teruhiko Yamada, Toshinori Kotake, Hiroshi Takahashi, Koji Yamazaki:
Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset. 269-274 - Abhijit Jas, Kartik Mohanram, Nur A. Touba:
An Embedded Core DFT Scheme to Obtain Highly Compressed Test Sets. 275-
Software Test & Verification
- Youngchul Kim, C. Robert Carlson:
Scenario Based Integration Testing for Object-Oriented Software Development. 283-288 - Huaikou Miao, Xiaolei Gao, Ling Liu:
An Approach to Testing the Nonexistence of Initial State in Z Specifications. 289-294 - Ian Ho, Jin-Cherng Lin:
Generating Test Cases for Real-Time Software by Time Petri Nets Model. 295-300 - Shyue-Kung Lu, Tsung-Ying Lee, Cheng-Wen Wu:
Defect Level Prediction Using Multi-Model Fault Coverage. 301-
Scan & Boundary Scan
- Tomoya Takasaki, Hideo Fujiwara, Tomoo Inoue:
A High-Level Synthesis Approach to Partial Scan Design Based on Acyclic Structure. 309-314 - Tsung-Chu Huang, Kuen-Jong Lee:
An Input Control Technique for Power Reduction in Scan Circuits During Test Application. 315-320 - Xinghao Chen, Thomas J. Snethen, Joe Swenton, Ron Walther:
A Simplified Method for Testing the IBM Pipeline Partial-Scan Microprocessor. 321-326 - Zulan Huang, Yizheng Ye, Zhigang Mao:
A New Algorithm for Retiming-Based Partial Scan. 327-
Beam Testing in Japan
- Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka:
Intelligent EB Test System for Automatic VLSI Fault Tracing. 335-341 - Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida:
Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators. 341-346 - Reisuke Shimoda, Takaki Yoshida, Masafumi Watari, Yasuhiro Toyota, Kiyokazu Nishi, Akira Motohara:
Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging, and Measurement Condition Dependent Faults in Fully Scanned Sequential Circuits. 347-
FPGA Test
- Yinlei Yu, Jian Xu, Wei-Kang Huang, Fabrizio Lombardi:
Minimizing the Number of Programming Steps for Diagnosis of Interconnect Faults in FPGAs. 357-362 - Michel Renovell, Jean-Michel Portal, Joan Figueras, Yervant Zorian:
Minimizing the Number of Test Configurations for Different FPGA Families. 363-368 - Abderrahim Doumar, Hideo Ito:
Testing the Logic Cells and Interconnect Resources for FPGAs. 369-374 - Lan Zhao, D. M. H. Walker, Fabrizio Lombardi:
IDDQ Testing of Input/Output Resources of SRAM-Based FPGAs. 375-
Beam Testing in Japan
- Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone:
Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. 383-388 - Takahide Sakata, Hideyuki Takahashi, Tetsu Sekine, Toshiya Ogiwara:
Investigation of Ga Contamination Due to Analysis by Dual Beam FIB. 389-393 - Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone:
Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. 394-
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