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ORCID9th DDECS 2006: Prague, Czech Republic
- Matteo Sonza Reorda, Ondrej Novák, Bernd Straube, Hana Kubátová, Zdenek Kotásek, Pavel Kubalík, Raimund Ubar, Jirí Bucek:
Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), Prague, Czech Republic, April 18-21, 2006. IEEE Computer Society 2006, ISBN 1-4244-0185-2
Invited Presentations
- Ketan Paranjape:
Multi-Site Collaboration in System on Chip Design and Validation: The Intel Experience. DDECS 2006: 1 - Jaume Segura:
CMOS Testing at the End of the Roadmap: Challenges and Opportunities. DDECS 2006: 2
Session I - Design Validation
- Pierre-André Mudry, Guillaume Zufferey, Gianluca Tempesti:
An Hybrid Genetic Algorithm for Constrained Hardware-Software Partitioning. 3-8 - Ralf Wimmer
, Marc Herbstritt, Bernd Becker:
Minimization of Large State Spaces using Symbolic Branching Bisimulation. 9-14 - Jochen Eisinger, Ilia Polian, Bernd Becker, Alexander Metzner, Stephan Thesing, Reinhard Wilhelm:
Automatic Identification of Timing Anomalies for Cycle-Accurate Worst-Case Execution Time Analysis. 15-20
Session II - Physical and IP Design
- Félix Tobajas, Roberto Esper-Chaín, Raúl Regidor, Octavio Santana, Roberto Sarmiento:
A Low Power 2.5 Gbps 1: 32 Deserializer in SiGe BiCMOS Technology. 21-26 - Kristian Granhaug, Snorre Aunet:
Six Subthreshold Full Adder Cells Characterized in 90 nm CMOS Technology. 27-32 - Abid Rashid, Frank H. P. Fitzek, Ole Olsen, Morten Gade, Yannick Le Moullec:
A Low Complexity, High Speed, Regular and Flexible Reed Solomon Decoder for Wireless Communication. 33-38 - András Timár, Ábel Vámos, György Bognár:
Comprehensive Design of a High Frequency PLL Synthesizer for ZigBee Application. 39-43
Session III - Innovative Design Techniques
- Alex Ngouanga, Gilles Sassatelli, Lionel Torres, André Borin Soares, Altamiro Amadeu Susin:
A Contextual Resources use: a Proof of Concept through the APACHES' Platform. 44-49 - Zoran Stamenkovic, C. Wolf, Günter Schoof, Jiri Gaisler:
LEON-2: General Purpose Processor for a Wireless Engine. 50-53 - Luca Sterpone, Massimo Violante:
ReCoM: A New Reconfigurable Compute Fabric Architecture for Computation-Intensive Applications. 54-58 - Ari Kulmala, Erno Salminen, Olli Lehtoranta, Timo D. Hämäläinen, Marko Hännikäinen:
Impact of Shared Instruction Memory on Performance of FPGA-based MP-SoC Video Encoder. 59-64 - Eero Aho, Jarno Vanne, Timo D. Hämäläinen:
Parallel Memory Architecture for Arbitrary Stride Accesses. 65-70
Poster Session I
- Grzegorz Pastuszak:
Architecture Design for the Context Formatter in the H.264/AVC Encoder. 71-72 - Lukas Ruckay:
Recognition of DRM Signal in Frequency Domain and Hardware Demands. 73-74 - V. V. Belkin, S. G. Sharshunov:
ISA Based Functional Test Generation with Application to Self-Test of RISC Processors. 75-76 - Youssef Serrestou, Vincent Beroulle, Chantal Robach:
How to Improve a Set of Design Validation Data by Using Mutation-based Test. 77-78 - Jiri Kadlec, Martin Danek:
Design and Verification Methodology for Reconfigurable Designs in Atmel FPSLIC. 79-80 - György Bognár, Gyula Horváth, Zoltán Szucs, Vladimír Székely:
Die Attach Quality Testing by Fully Contact-less Measurement Method. 81-82 - Tomás Martínek, Jan Korenek, Otto Fucík, Matej Lexa:
A Flexible Technique for the Automatic Design of Approximate String Matching Architectures. 83-84 - Lukás Sekanina, Lukás Starecek, Zdenek Kotásek:
Novel Logic Circuits Controlled by Vdd: Transistor-Level Simulations of Polymorphic Combinational Modules. 85-86 - Harri Lampinen, Pauli Perälä, Olli Vainio:
Design of a Scalable Asynchronous Dataflow Processor. 87-88 - Guoyan Zhang, Ronan Farrell:
Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits. 89-90
Student Session I
- Jaroslav Skarvada:
Test Scheduling for SoC under Power Constraints. 91-93 - Johannes Goplen Lomsdalen, Renè Jensen, Yngvar Berg:
Self-refreshing Multiple Valued Memory. 94-96 - Jirí Bucek, Róbert Lórencz:
Comparing Subtraction-Free and Traditional AMI. 97-99 - Pavel Kubalík, Radek Dobias, Hana Kubátová:
Dependability Computation for Fault Tolerant Reconfigurable Duplex System. 100-102
Session IV - Analog Design
- Shih-Chang Hsia, Wen-Ching Lee:
A New 6-bit Flash A/D Converter Using Novel Two-Step Structure. 103-107 - Ondrej Subrt, Pravoslav Martínek:
A Novel Design Evaluation Concept Applied to Switched-Current Algorithmic A/D Converters. 108-112 - Yves Joannon, Vincent Beroulle, Rami Khouri, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro:
Behavioral Modeling of WCDMA Transceiver with VHDL-AMS Language. 113-118
Session V - Analog and Mixed-Signal Test
- Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda:
A Sinewave Analyzer for Mixed-Signal BIST Applications in a 0.35µm Technology. 119-124 - Luz Balado, Emili Lupon, L. García, Rosa Rodríguez-Montañés, Joan Figueras:
Lissajous Based Mixed-Signal Testing for N-Observable Signals. 125-130 - Pavol Malosek, Viera Stopjaková:
PCA Data Preprocessing for Neural Network-based Detection of Parametric Defects in Analog IC. 131-135 - Stefan Vock, Ulrich Flogaus, Hans Martin von Staudt:
Productivity and Code Quality Improvement of Mixed-Signal Test Software by Applying Software Engineering Methods. 136-140
Poster Session II
- Régis Leveugle, V. Maingot:
On the Use of Information Redundancy When Designing Secure Chips. 141-142 - Reouven Elbaz, Lionel Torres, Gilles Sassatelli, Pierre Guillemin, Michel Bardouillet:
PE-ICE: Parallelized Encryption and Integrity Checking Engine. 143-144 - Martin Novotný, Jan Schmidt:
Normal Basis Multipliers of General Digit Width Applicable in Elliptic Curve Cryptography. 145-146 - Mohamed Abbas, Makoto Ikeda, Kunihiro Asada:
Statistical Model for Logic Errors in CMOS Digital Circuits for Reliability-Driven Design Flow. 147-148 - Aki Penttinen, Rafal P. Jastrzebski, Riku Pöllänen, Olli Pyrhönen:
Run-Time Debugging and Monitoring of FPGA Circuits Using Embedded Microprocessor. 149-150 - Geguang Pu, Jifeng He, Zongyan Qiu:
An Optimal Lower-Bound Algorithm for the High-Level Synthesis Scheduling Problem. 151-152 - Piotr Dziurzanski, Wlodzimierz Bielecki, Konrad Trifunovic, M. Kleszczonek:
A System for Transforming an ANSI C Code with OpenMP Directives into a SystemC Description. 153-154 - Eric Armengaud:
Low Level Bus Traffic Replay for the Test and Debugging of Time-Triggered Communication Systems. 155-156 - Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs. 157-158 - René Kothe, Christian Galke, Sabine Schultke, Henry Fröschke, Steffen Gaede, Heinrich Theodor Vierhaus:
Hardware/Software Based Hierarchical Self Test for SoCs. 159-160 - Josef Strnadel:
Power-Constrained, Sessionless SoC Test Scheduling Based on Exploration of I-Schedule State-Space. 161-162
Session VI - Timing Issues in Design and Test
- Xuan-Tu Tran, Vincent Beroulle, Jean Durupt, Chantal Robach, François Bertrand:
Design-for-Test of Asynchronous Networks-on-Chip. 163-167 - Cecilia Metra, Daniele Rossi, Martin Omaña, José Manuel Cazeaux, T. M. Mak:
Can Clock Faults be Detected Through Functional Test? 168-173 - André V. Fidalgo, Gustavo R. Alves, José M. Ferreira:
A Modified Debugging Infrastructure to Assist Real Time Fault Injection Campaigns. 174-179
Session VII - Fault Tolerance
- Andrzej Krasniewski:
Low-Cost Concurrent Error Detection for FSMs Implemented Using Embedded Memory Blocks of FPGAs. 180-185 - Heikki Kariniemi, Jari Nurmi:
Fault-Tolerant 2-D Mesh Network-on-Chip for Multi-Processor System-on-Chip. 186-191 - Pierre Vanhauwaert, Régis Leveugle, Philippe Roche:
A Flexible SoPC-based Fault Injection Environment. 192-197 - Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt:
Generation and Propagation of Single Event Transients in CMOS Circuits. 198-203 - Santosh Biswas, Siddhartha Mukhopadhyay, P. Patra, Dipankar Sarkar:
Concurrent Testing of Digital Circuits for Advanced Fault Models. 204-209 - René Kothe, Heinrich Theodor Vierhaus, Torsten Coym, Wolfgang Vermeiren, Bernd Straube:
Embedded Self Repair by Transistor and Gate Level Reconfiguration. 210-215
Poster Session III
- José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João Paulo Teixeira:
Probabilistic Testability Analysis and DFT Methods at RTL. 216-217 - Mario García-Valderas, Marta Portela-García, Celia López-Ongil, Luis Entrena-Arrontes:
An Extension of Transient Fault Emulation Techniques to Circuits with Embedded Memories. 218-219 - S. V. Yarmolik, Bartosz Sokol:
Optimal Memory Address Seeds for Pattern Sensitive Faults Detection. 220-221 - Jirí Jaros, Václav Dvorák:
Evolutionary Design of OAB and AAB Communication Schedules for Networking Systems on Chips. 222-223 - Milos Ohlídal, Josef Schwarz:
Collective Communication AAB for Regular and Irregular Topology Based on Prediction of Conflicts. 224-225 - Hsin-Chou Chi, Chia-Ming Wu, Sung-Tze Wu:
A Switch Supporting Circuit and Packet Switching for On-Chip Networks. 226-227 - Martin Simlastík, Peter Malík, Tomás Pikula, Marcel Baláz:
FPGA Implementation of a Fast MDCT Algorithm. 228-229 - Tomasz Garbolino, Michal Kopec, Krzysztof Gucwa, Andrzej Hlawiczka:
Detection, Localisation and Identification of Interconnection Faults Using MISR Compactor. 230-231 - Paolo Bernardi, Michelangelo Grosso:
Test Considerations about the Structured ASIC Paradigm. 232-233 - Marco Bucci, Raimondo Luzzi:
A Leakage-based Random Bit Generator with On-line Fault Detection. 234-235 - Vladislav Nagy, Viera Stopjaková:
New Current Monitor Using Auto Zero Voltage Comparator for IDD Testing of Mixed-signal Circuits. 236-237
Student Session II
- Zbysek Gajda:
A Core Generator for Multi-ALU Processors Utilized in Genetic Parallel Programming. 238-240 - Zbynek Mader, Michal Jarkovský:
SOC Diagnostic Design Using RESPIN Architecture. 241-243 - Younggap You, Yong-Dae Kim, Jong Hwa Choi:
Dynamic Decimal Adder Circuit Design by using the Carry Lookahead. 244-246 - Johannes Goplen Lomsdalen, Renè Jensen, Yngvar Berg:
Multiple Valued Counter. 247-249 - Martin Stáva, Ondrej Novák:
HW Implementation of the Backtrace Algorithm with Conflict-Driven Dynamic Reconfiguration. 250-252 - Gergely Perlaky, Gábor Mezösi, Imre Zolomy:
Sensor Powering with Integrated MOS Compatible Solar Cell Array. 253-255
Session VIII - Memory and Logic Test
- Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. 256-261 - Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
Minimal March-Based Fault Location Algorithm with Partial Diagnosis for all Static Faults in Random Access Memories. 262-267 - Petr Fiser, Hana Kubátová:
Multiple-Vector Column-Matching BIST Design Method. 268-273 - Leos Kafka, Ondrej Novák:
FPGA-based Fault Simulator. 274-278 - F. Guerreiro, Jorge Semião, A. Pierce, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage. 279-284 - Tomas Pecenka, Zdenek Kotásek, Lukás Sekanina:
FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Diagnostic Properties. 285-289
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