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ORCIDDFT 2006: Arlington, Virginia, USA
- 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. IEEE Computer Society 2006, ISBN 0-7695-2706-X
Invited Talk
- David F. Heidel:
Single-Event-Upset Trends in Advanced CMOS Technologies. DFT 2006
Adaptive Design and Gate Level Redundancy
- Ramyanshu Datta, Jacob A. Abraham, Abdulkadir Utku Diril, Abhijit Chatterjee, Kevin J. Nowka:
Adaptive Design for Performance-Optimized Robustness. 3-11 - Tian Xia, Stephen Wyatt, Rupert Ho:
Employing On-Chip Jitter Test Circuit for Phase Locked Loop Self-Calibration. 12-19 - Kristian Granhaug, Snorre Aunet:
Improving Yield and Defect Tolerance in Multifunction Subthreshold CMOS Gates. 20-28 - Valeriu Beiu
, Walid Ibrahim, Y. A. Alkhawwar, Mawahib H. Sulieman:
Gate Failures Effectively Shape Multiplexing. 29-40
Delay Test
- Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz:
Test Generation for Open Defects in CMOS Circuits. 41-49 - Kyriakos Christou, Maria K. Michael, Spyros Tragoudas:
Implicit Critical PDF Test Generation with Maximal Test Efficiency. 50-58 - Hangkyu Lee, Suriyaprakash Natarajan, Srinivas Patil, Irith Pomeranz:
Selecting High-Quality Delay Tests for Manufacturing Test and Debug. 59-70
Emerging Technologies
- Xiaojun Ma, Jing Huang, Cecilia Metra, Fabrizio Lombardi:
Testing Reversible 1D Arrays for Molecular QCA. 71-79 - Minsu Choi, Myungsu Choi, Zachary D. Patitz, Nohpill Park:
Efficient and Robust Delay-Insensitive QCA (Quantum-Dot Cellular Automata) Design. 80-88 - Byunghyun Jang, Yong-Bin Kim, Fabrizio Lombardi:
Error Tolerance of DNA Self-Assembly by Monomer Concentration Control. 89-97 - Yadunandana Yellambalase, Minsu Choi, Yong-Bin Kim:
Inherited Redundancy and Configurability Utilization for Repairing Nanowire Crossbars with Clustered Defects. 98-106 - Reza M. Rad, Mohammad Tehranipoor:
A Reconfiguration-based Defect Tolerance Method for Nanoscale Devices. 107-118
Test Compression
- Sverre Wichlund, Frank Berntsen, Einar J. Aas:
Reducing ATE Bandwidth and memory requirements: A diagnosis friendly scan test response compactor. 119-127 - Hamidreza Hashempour, Fabrizio Lombardi:
A Novel Methodology for Functional Test Data Compression. 128-135 - Gang Zeng, Youhua Shi, Toshinori Takabatake, Masao Yanagisawa, Hideo Ito:
Low-Cost IP Core Test Using Multiple-Mode Loading Scan Chain and Scan Chain Clusters. 136-144 - Geewhun Seok, Il-soo Lee, Tony Ambler, Baxter F. Womack:
An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint. 145-156
Invited Talk
- Krishnendu Chakrabarty:
Reconfiguration-Based Defect Tolerance for Microfluidic Biochips. DFT 2006
Defect Tolerance and Error Correction
- Vijay K. Jain, Glenn H. Chapman:
Defect Tolerant and Energy Economized DSP Plane of a 3-D Heterogeneous SoC. 157-165 - Akhil Garg, Prashant Dubey:
Fuse Area Reduction based on Quantitative Yield Analysis and Effective Chip Cost. 166-174 - Hiroyuki Ohde, Haruhiko Kaneko, Eiji Fujiwara:
Low-Density Triple-Erasure Correcting Codes for Dependable Distributed Storage Systems. 175-183 - Rui Gong, Wei Chen, Fang Liu, Kui Dai, Zhiying Wang:
Modified Triple Modular Redundancy Structure based on Asynchronous Circuit Technique. 184-196
BIST and Pseudo-Functional Test
- Yuejian Wu, André Ivanov:
Low Power SoC Memory BIST. 197-205 - Avijit Dutta, Nur A. Touba:
Synthesis of Efficient Linear Test Pattern Generators. 206-214 - Abhijit Jas, Yi-Shing Chang, Sreejit Chakravarty:
An Approach to Minimizing Functional Constraints. 215-226
Reliability Evaluation and Analysis
- Salvatore Pontarelli, Marco Ottavi, Vamsi Vankamamidi, Adelio Salsano, Fabrizio Lombardi:
Reliability Evaluation of Repairable/Reconfigurable FPGAs. 227-235 - Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone:
Reliability Analysis of Self-Repairable MEMS Accelerometer. 236-244 - Sanghoan Chang, Gwan Choi:
Timing Failure Analysis of Commercial CPUs Under Operating Stress. 245-253 - André V. Fidalgo, Gustavo R. Alves, José M. Ferreira:
Real Time Fault Injection Using Enhanced OCD -- A Performance Analysis. 254-264
Approaches for Soft Errors
- Maurizio Rebaudengo, Luca Sterpone, Massimo Violante, Cristiana Bolchini, Antonio Miele, Donatella Sciuto:
Combined software and hardware techniques for the design of reliable IP processors. 265-273 - Ilia Polian, Bernd Becker, Masato Nakasato, Satoshi Ohtake, Hideo Fujiwara:
Low-Cost Hardening of Image Processing Applications Against Soft Errors. 274-279 - Carlos Arthur Lang Lisbôa, Luigi Carro, Matteo Sonza Reorda, Massimo Violante:
Online hardening of programs against SEUs and SETs. 280-290
Interactive Papers
- Chuen-Song Chen, Jien-Chung Lo, Tian Xia:
Equivalent IDDQ Tests for Systems with Regulated Power Supply. 291-299 - Ondrej Novák, Zdenek Plíva, Jiri Jenícek, Zbynek Mader, Michal Jarkovský:
Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead. 300-308 - Lei Fang, Michael S. Hsiao:
Bilateral Testing of Nano-scale Fault-tolerant Circuits. 309-317 - Sandeep Dechu, Manoj Kumar Goparaju, Spyros Tragoudas:
A Metric of Tolerance for the Manufacturing Defects of Threshold Logic Gates. 318-326 - Yoichi Sasaki, Kazuteru Namba, Hideo Ito:
Soft Error Masking Circuit and Latch Using Schmitt Trigger Circuit. 327-335 - Ajoy Kumar Palit, Kishore K. Duganapalli, Walter Anheier:
Influence of Resistive Bridging Fault on Crosstalk Coupling Effects in On-Chip Aggressor-Victim Interconnects. 336-344 - Álisson Michels, Lorenzo Petroli, Carlos Arthur Lang Lisbôa, Fernanda Gusmão de Lima Kastensmidt, Luigi Carro:
SET Fault Tolerant Combinational Circuits Based on Majority Logic. 345-352 - Yusuke Fukushima, Masaru Fukushi, Susumu Horiguchi:
An Improved Reconfiguration Method for Degradable Processor Arrays Using Genetic Algorithm. 353-361 - Yu-Jen Huang, Da-Ming Chang, Jin-Fu Li:
A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy. 362-370 - Marco Ottavi, Salvatore Pontarelli, A. Leandri, Adelio Salsano:
Design and Evaluation of a Hardware on-line Program-Flow Checker for Embedded Microcontrollers. 371-379 - Christian El Salloum, Andreas Steininger, Peter Tummeltshammer, Werner Harter:
Recovery Mechanisms for Dual Core Architectures. 380-388 - Yasser Sedaghat, Seyed Ghassem Miremadi, Mahdi Fazeli:
A Software-Based Error Detection Technique Using Encoded Signatures. 389-400
Diagnosis
- Hiroshi Takahashi, Shuhei Kadoyama, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato:
Effective Post-BIST Fault Diagnosis for Multiple Faults. 401-109 - Yukiya Miura, Jiro Kato:
Fault Diagnosis of Analog Circuits Based on Adaptive Test and Output Characteristics. 410-418 - Irith Pomeranz, Sudhakar M. Reddy:
Scan-Based Delay Fault Tests for Diagnosis of Transition Faults. 419-427 - Ying-Yen Chen, Jing-Jia Liou:
Enhancing Diagnosis Resolution For Delay Faults By Path Extension Method. 428-438
Defect and Fault Tolerance in Sensors and NOCs
- Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapman, Israel Koren, Zahava Koren:
On-Line Mapping of In-Field Defects in Image Sensor Arrays. 439-447 - Michelle L. La Haye, Cory Jung, David Chen, Glenn H. Chapman, Jozsef Dudas:
Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies. 448-456 - Cristian Grecu, André Ivanov, Res Saleh, Partha Pratim Pande:
NoC Interconnect Yield Improvement Using Crosspoint Redundancy. 457-465 - Partha Pratim Pande, Amlan Ganguly, Brett Feero, Benjamin Belzer, Cristian Grecu:
Design of Low power & Reliable Networks on Chip through joint crosstalk avoidance and forward error correction coding. 466-476
Test Techniques
- Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinger, Bashir M. Al-Hashimi:
Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving. 477-485 - Fengming Zhang, Warren Necoechea, Peter Reiter, Yong-Bin Kim, Fabrizio Lombardi:
Load Board Designs Using Compound Dot Technique and Phase Detector for Hierarchical ATE Calibrations. 486-494 - Xiaojun Ma, Fabrizio Lombardi:
Multi-Site and Multi-Probe Substrate Testing on an ATE. 495-506
Processor Checking and Jitter
- Federico Rota, Shantanu Dutt, Sahithi Krishna:
Off-Chip Control Flow Checking of On-Chip Processor-Cache Instruction Stream. 507-515 - Joonhyuk Yoo, Manoj Franklin:
The Filter Checker: An Active Verification Management Approach. 516-524 - Nandakumar P. Venugopal, Nihal Shastry, Shambhu J. Upadhyaya:
Effect of Process Variation on the Performance of Phase Frequency Detector. 525-534 - Di Mu, Tian Xia, Hao Zheng:
Data Dependent Jitter Characterization Based on Fourier Analysis. 534-544
Fault Tolerance Designs
- Lushan Liu, Ramalingam Sridhar, Shambhu J. Upadhyaya:
A 3-port Register File Design for Improved Fault Tolerance on Resistive Defects in Core-Cells. 545-553 - Tadayoshi Horita, Takurou Murata, Itsuo Takanami:
A Multiple-Weight-and-Neuron-Fault Tolerant Digital Multilayer Neural Network. 554-562 - Markus Ferringer, Gottfried Fuchs, Andreas Steininger, Gerald Kempf:
VLSI Implementation of a Fault-Tolerant Distributed Clock Generation. 563-571 - Mehran Mozaffari Kermani, Arash Reyhani-Masoleh:
Parity-Based Fault Detection Architecture of S-box for Advanced Encryption Standard. 572-580
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