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ORCIDETS 2010: Prague, Czech Republic
- 15th European Test Symposium, ETS 2010, Prague, Czech Republic, May 24-28, 2010. IEEE Computer Society 2010, ISBN 978-1-4244-5833-2
Plenary Presentations
- Michael Campbell:
Plenary presentations: Keynote: The product complexity and test - How product complexity impacts test industry. 9 - Abhijit Chatterjee:
Invited talk: Self-aware wireless communication and signal processing systems: Real-time adaptation for error resilience, low power and performance. 10
Embedded Tutorials
- Peter C. Maxwell:
Adaptive test directions. 12-16 - Frank Poehl, Frank Demmerle, Juergen Alt, Hermann Obermeir:
Production test challenges for highly integrated mobile phone SOCs - A case study. 17-22
3D and Multi-Core Test
- Brandon Noia, Sandeep Kumar Goel, Krishnendu Chakrabarty
, Erik Jan Marinissen, Jouke Verbree:
Test-architecture optimization for TSV-based 3D stacked ICs. 24-29 - Chun-Chuan Chi, Cheng-Wen Wu, Jin-Fu Li:
A low-cost and scalable test architecture for multi-core chips. 30-35 - Jouke Verbree, Erik Jan Marinissen, Philippe Roussel, Dimitrios Velenis:
On the cost-effectiveness of matching repositories of pre-tested wafers for wafer-to-wafer 3D chip stacking. 36-41
RF-Test
- Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir:
On the use of standard digital ATE for the analysis of RF signals. 43-48 - Louay Abdallah, Haralampos-G. D. Stratigopoulos, Christophe Kelma, Salvador Mir:
Sensors for built-in alternate RF test. 49-54 - Manuel J. Barragan Asian, Rafaella Fiorelli, Diego Vázquez, Adoración Rueda, José Luis Huertas:
Low-cost signature test of RF blocks based on envelope response analysis. 55-60
Post-Silicon Debug and Diagnosis
- Ho Fai Ko, Nicola Nicolici:
Combining scan and trace buffers for enhancing real-time observability in post-silicon debugging. 62-67
Memory Test
- Elena I. Vatajelu, Georgios Panagopoulos, Kaushik Roy, Joan Figueras:
Parametric failure analysis of embedded SRAMs using fast & accurate dynamic analysis. 69-74 - Yu-Jen Huang, Che-Wei Chou, Jin-Fu Li:
A low-cost built-in self-test scheme for an array of memories. 75-80 - Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez:
A two-layer SPICE model of the ATMEL TSTACTM eFlash memory technology for defect injection and faulty behavior prediction. 81-86
Fault Detection, Tolerance and Identification
- Masoud Zamani, Mehdi Baradaran Tahoori:
A transient error tolerant self-timed asynchronous architecture. 88-93 - Navid Farazmand, Mehdi Baradaran Tahoori:
Multiple fault diagnosis in crossbar nano-architectures. 94-99
Delay Analysis
- Ke Peng, Yu Huang, Pinki Mallick, Wu-Tung Cheng, Mohammad Tehranipoor:
Full-circuit SPICE simulation based validation of dynamic delay estimation. 101-106 - Mitsumasa Noda, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen, Yukiya Miura:
On estimation of NBTI-Induced delay degradation. 107-111
Advanced Test Infrastructure
- Raghavendra Adiga, Gandhi Arpit, Virendra Singh, Kewal K. Saluja, Adit D. Singh:
Modified T-Flip-Flop based scan cell for RAS. 113-118 - Sachin Dileep Dasnurkar, Jacob A. Abraham:
Calibration-enabled scalable built-in current sensor compatible with very low cost ATE. 119-124
Resistive Bridges and Opens
- Jose Luis Garcia-Gervacio, Víctor H. Champac:
Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs. 126-131 - Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine:
Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes. 132-137
BIST
- S. Behdad Hosseini, Ali Shahabi, Hasan Sohofi, Zainalabedin Navabi:
A reconfigurable online BIST for combinational hardware using digital neural networks. 139-144 - Hyunjin Kim, Jaeyong Chung, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo:
A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control. 145-150 - Emil Gizdarski:
Constructing augmented time compactors. 151-156
Advanced ADC Testing
- Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff:
Predicting dynamic specifications of ADCs with a low-quality digital input signal. 158-163 - Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho:
Test of embedded analog circuits based on a built-in current sensor. 164-169 - Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner:
Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications. 170-174
Design Validation, Test and Debug of Complex Systems
- Daniel Tille, Stephan Eggersglüß, Rene Krenz-Baath, Jürgen Schlöffel, Rolf Drechsler:
Improving CNF representations in SAT-based ATPG for industrial circuits using BDDs. 176-181 - Erik Larsson, Bart Vermeulen, Kees Goossens:
A distributed architecture to check global properties for post-silicon debug. 182-187 - Paula Herber, Marcel Pockrandt, Sabine Glesner:
Automated conformance evaluation of SystemC designs using timed automata. 188-193
Innovative Techniques for Highly Reliable Microprocessor-Based Systems
- Michelangelo Grosso, Wilson J. Pérez H., Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda, Jaime Velasco-Medina:
A software-based self-test methodology for system peripherals. 195-200 - Stefano Di Carlo, Andrea Miele, Paolo Prinetto, Antonio Trapanese:
Microprocessor fault-tolerance via on-the-fly partial reconfiguration. 201-206 - Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang, Kun-Han Tsai, Ken Amstutz:
Scan based speed-path debug for a microprocessor. 207-212
Fault Tolerance and Online Testing
- Cristiana Bolchini, Antonio Miele, Chiara Sandionigi, Niccolò Battezzati, Luca Sterpone, Massimo Violante:
An integrated flow for the design of hardened circuits on SRAM-based FPGAs. 214-219
Fault Diagnosis
- Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Diagnosis of failing scan cells through orthogonal response compaction. 221-226 - Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda:
An adaptive tester architecture for volume diagnosis. 227-232 - Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of full open defects in interconnect lines with fan-out. 233-238
Posters
- Irith Pomeranz, Sudhakar M. Reddy:
Input test data volume reduction based on test vector chains. 240 - Peter Mrak, Anton Biasizzo, Franc Novak:
On measurement uncertainty of ADC nonlinearities in oscillation-based test. 241 - Johannes Loinig, Christian Steger, Reinhold Weiss, Ernst Haselsteiner:
Fast simulation based testing of anti-tearing mechanisms for small embedded systems. 242 - Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen:
New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism. 243 - S. Fransi, G. L. Farre, L. Garcia-Deiros, Salvador Manich:
Design and implementation of Automatic Test Equipment IP module. 244 - Nader Alawadhi, Ozgur Sinanoglu, Mohammed Al-Mulla:
Add-on blocks and algorithms for improving stimulus compression. 245 - Sezer Gören, H. Fatih Ugurdag, Okan Palaz:
Defect-aware nanocrossbar logic mapping using Bipartite Subgraph Isomorphism & canonization. 246 - Yuki Yoshikawa, Tomomi Nuwa, Hideyuki Ichihara, Tomoo Inoue:
Hybrid test application in hybrid delay scan design. 247 - Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu:
Reconfigurable Concurrent Error Detection adaptive to dynamicity of power constraints. 248 - Sobeeh Almukhaizim, Mohammad Gh. Mohammad, Mohammad Khajah:
Test power reduction in compression-based reconfigurable scan architectures. 249 - Shaji Krishnan, Hans G. Kerkhoff:
Multivariate model for test response analysis. 250 - Gaetan Canivet, P. Maistn, Régis Leveugle, Frédéric Valette, Jessy Clédière, Marc Renaudin:
Robustness evaluation and improvements under laser-based fault attacks of an AES crypto-processor implemented on a SRAM-based FPGA. 251 - Kaouthar Bousselam, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Evaluation of concurrent error detection techniques on the Advanced Encryption Standard. 252 - Claus Braun, Hans-Joachim Wunderlich:
Algorithm-based fault tolerance for many-core architectures. 253 - Yu Zhang, Vishwani D. Agrawal:
A diagnostic test generation system and a coverage metric. 254 - Lilia Zaourar, Jihane Alami Chentoufi, Yann Kieffer, Arnaud Wenzel, Frederic Grandvaux:
A shared BIST optimization methodology for memory test. 255 - Yang Jin, Hong Wang, Zhengliang Lv, Shiyuan Yang:
Pipelined parallel test structure for mixed-signal SoCs. 256 - Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine:
Setting test conditions for improving SRAM reliability. 257 - Vladimir Pasca, Lorena Anghel, Claudia Rusu, Mounir Benabdenbi:
Configurable fault-tolerant link for inter-die communication in 3D on-chip networks. 258 - Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara:
Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach. 259 - Michiko Inoue, Akira Taketani, Tomokazu Yoneda, Hiroshi Iwata, Hideo Fujiwara:
Test pattern selection to optimize delay test quality with a limited size of test set. 260 - Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski:
Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy. 261 - Masaki Hashizume, Kazuya Nakaminami, Hiroyuki Yotsuyanagi, Yukinori Nakajima, Kozo Kinoshita:
Current-based testable design of level shifters in liquid crystal display drivers. 262 - Z. Xu, Andrew Richardson, Lijie Li, Mark L. Begbie, D. Koltsov, C. H. Wang:
A multi-mode MEMS sensor design to support system test and health & usage monitoring applications. 263 - Samed Maltabas, Osman Kubilay Ekekon, Martin Margala:
A new built-in IDDQ testing method using programmable BICS. 264 - Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev:
Defect filter for alternate RF test. 265-270
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