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ORCIDETS 2011: Trondheim, Norway
- 16th European Test Symposium, ETS 2011, Trondheim, Norway, May 23-27, 2011. IEEE Computer Society 2011, ISBN 978-0-7695-4433-5
ETS'10 Best Paper
- Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. 1-6
Power Switches
- S. Saqib Khursheed, Sheng Yang, Bashir M. Al-Hashimi, Xiaoyu Huang, David Flynn:
Improved DFT for Testing Power Switches. 7-12 - Zhaobo Zhang, Xrysovalantis Kavousianos, Yan Luo, Yiorgos Tsiatouhas, Krishnendu Chakrabarty
:
Signature Analysis for Testing, Diagnosis, and Repair of Multi-mode Power Switches. 13-18
Security
- Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Scan Attacks and Countermeasures in Presence of Scan Response Compactors. 19-24
Converter Testing
- Esa Korhonen, Juha Kostamovaara:
Memory Optimized Two-Stimuli INL Test Method for DAC-ADC Pairs. 25-32 - Sehun Kook, Aritra Banerjee, Abhijit Chatterjee:
Signature Testing and Diagnosis of High Precision S? ADC Dynamic Specifications Using Model Parameter Estimation. 33-38
3D Technology
- Xuan-Lun Huang, Ping-Ying Kang, Jiun-Lang Huang, Yung-Fa Chou, Yung-Pin Lee, Ding-Ming Kwai:
A Pre- and Post-bond Self-Testing and Calibration Methodology for SAR ADC Array in 3-D CMOS Imager. 39-44 - Mottaqiallah Taouil, Said Hamdioui:
Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories. 45-50 - Chun-Chuan Chi, Erik Jan Marinissen, Sandeep Kumar Goel, Cheng-Wen Wu:
DfT Architecture for 3D-SICs with Multiple Towers. 51-56
Emerging Technologies
- Aritra Banerjee, Subho Chatterjee, Azad Naeemi, Abhijit Chatterjee:
Power Aware Post-manufacture Tuning of Analog Nanocircuits. 57-62 - Alexandru Paler, Armin Alaghi, Ilia Polian, John P. Hayes:
Tomographic Testing and Validation of Probabilistic Circuits. 63-68 - Masoud Zamani, Navid Farazmand, Mehdi Baradaran Tahoori:
Fault Masking and Diagnosis in Reversible Circuits. 69-74
Mixed-Signal and RF Test
- Afsaneh Nassery, Sule Ozev, Marian Verhelst, Mustapha Slamani:
Extraction of EVM from Transmitter System Parameters. 75-80 - Stephen K. Sunter, Aubin Roy:
A Mixed-Signal Test Bus and Analog BIST with 'Unlimited' Time and Voltage Resolution. 81-86
Dependability
- Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris:
AVF Analysis Acceleration via Hierarchical Fault Pruning. 87-92 - Hai Yu, Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh:
Efficient Fault Detection Architecture Design of Latch-Based Low Power DSP/MCU Processor. 93-98
Test Data Compression, Compaction, and Diagnosis
- Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
Reduced ATE Interface for High Test Data Compression. 99-104 - Ozgur Sinanoglu:
Toggle-Based Masking Scheme for Clustered Unknown Response Bits. 105-110 - Alejandro Cook, Melanie Elm, Hans-Joachim Wunderlich, Ulrich Abelein:
Structural In-Field Diagnosis for Random Logic Circuits. 111-116
Advances in Test
- Nicola Bombieri, Franco Fummi, Valerio Guarnieri:
Accelerating RTL Fault Simulation through RTL-to-TLM Abstraction. 117-122 - Anelise Kologeski, Caroline Concatto, Luigi Carro, Fernanda Lima Kastensmidt:
Improving Reliability in NoCs by Application-Specific Mapping Combined with Adaptive Fault-Tolerant Method in the Links. 123-128 - Alexander Finder, André Sülflow, Görschwin Fey:
Latency Analysis for Sequential Circuits. 129-134
Contactless and Memory Testing
- Mauro Scandiuzzo, Salvatore Cani, Luca Perugini, Simone Spolzino, Roberto Canegallo, Luca Perilli, Roberto Cardu, Eleonora Franchi, C. Gozzi, F. Maggioni:
Input/Output Pad for Direct Contact and Contactless Testing. 135-140
ATPG 1
- Stelios Neophytou, Kyriakos Christou, Maria K. Michael:
An Approach for Quantifying Path Correlation in Digital Circuits without any Path or Segment Enumeration. 141-146 - Jaan Raik, Anna Rannaste, Maksim Jenihhin, Taavi Viilukas, Raimund Ubar, Hideo Fujiwara:
Constraint-Based Hierarchical Untestability Identification for Synchronous Sequential Circuits. 147-152 - Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Ernesto Sánchez, Mauricio de Carvalho, Matteo Sonza Reorda:
A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing. 153-158
Analog Production Test
- Shaji Krishnan, Hans G. Kerkhoff:
A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. 159-164 - Ender Yilmaz, Sule Ozev:
Fast and Accurate DPPM Computation Using Model Based Filtering. 165-170
Post-silicon Debug
- Viacheslav Izosimov, Michele Lora, Graziano Pravadelli, Franco Fummi, Zebo Peng, Giuseppe Di Guglielmo, Masahiro Fujita:
Optimization of Assertion Placement in Time-Constrained Embedded Systems. 171-176
ATPG 2
- Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor:
Critical Fault-Based Pattern Generation for Screening SDDs. 177-182
Diagnosis
- Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich:
Structural Test for Graceful Degradation of NoC Switches. 183-188 - Irith Pomeranz:
On Transition Fault Diagnosis Using Multicycle At-Speed Broadside Tests. 189-194 - Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty:
Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer Theory for the Diagnosis of Board-Level Functional Failures. 195-200
Posters
- Harm C. M. Bossers, Johann L. Hurink, Gerard J. M. Smit:
Online Univariate Outlier Detection in Final Test: A Robust Rolling Horizon Approach. 201 - Massoud Mokhtarpour Ghahroodi, Mark Zwolinski, Rick Wong, Shi-Jie Wen:
Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS. 202 - Marie Engelene J. Obien, Satoshi Ohtake, Hideo Fujiwara:
F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG. 203 - Dongsoo Lee, Kaushik Roy:
Viterbi-Based Efficient Test Data Compression. 204 - Sandra Irobi, Zaid Al-Ars, Said Hamdioui:
Memory Test Optimization for Parasitic Bit Line Coupling in SRAMs. 205 - Ioannis Voyiatzis, Costas Efstathiou, Hera Antonopoulou:
A Novel SRAM-Cell Based Input Vector Monitoring Concurrent BIST Architecture. 206 - Uros Legat, Anton Biasizzo, Franc Novak:
FPGA Soft Error Recovery Mechanism with Small Hardware Overhead. 207 - Michael Nicolaidis, Vladimir Pasca, Lorena Anghel:
I-BIRAS: Interconnect Built-In Self-Repair and Adaptive Serialization in 3D Integrated Systems. 208 - Dhiego Silva, Kleber Stangherlin, Letícia Maria Veiras Bolzani, Fabian Vargas:
A Hardware-Based Approach for Fault Detection in RTOS-Based Embedded Systems. 209 - Min Li, Michael S. Hsiao:
High-Performance Diagnostic Fault Simulation on GPUs. 210 - Nuno Alves, Yiwen Shi, Nicholas Imbriglia, Jennifer Dworak, Kundan Nepal, R. Iris Bahar:
Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis. 211 - Jorge Luis Lagos-Benites, Michelangelo Grosso, Luca Sterpone, Matteo Sonza Reorda, G. Audisio, M. Pipponzi, Marco Sabatini:
A Low-Cost Emulation System for Fast Co-verification and Debug. 212 - Alessandro Cilardo, Carmelo Lofiego, Antonino Mazzeo, Nicola Mazzocca:
Revisiting Application-Dependent Test for FPGA Devices. 213 - Tomokazu Yoneda, Makoto Nakao, Michiko Inoue, Yasuo Sato, Hideo Fujiwara:
Temperature-Variation-Aware Test Pattern Optimization. 214 - Ramachandran Venkatasubramanian, Doohwang Chang, Sule Ozev:
Analysis and Mitigation of Electromigration in RF Circuits: An LNA Case Study. 215 - Yoshinobu Higami, Hiroshi Takahashi, Shin-ya Kobayashi, Kewal K. Saluja:
Enhancement of Clock Delay Faults Testing. 216 - Yukiya Miura:
Dual Edge Triggered Flip-Flops for Noise Aware Design. 217 - Feng Yuan, Xiao Liu, Qiang Xu:
On High-Quality Test Pattern Selection and Manipulation. 218
Embedded Tutorial
- Ilia Polian, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, Peter C. Maxwell:
Towards Variation-Aware Test Methods. 219-225
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