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ORCID15th IOLTS 2009: Sesimbra-Lisbon, Portugal
- 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal. IEEE Computer Society 2009, ISBN 978-1-4244-4596-7
Aging Monitoring and Analysis
- Dominik Lorenz, Georg Georgakos, Ulf Schlichtmann
:
Aging analysis of circuit timing considering NBTI and HCI. 3-8 - Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira:
Built-in aging monitoring for safety-critical applications. 9-14 - C. Guardiani, A. Shibkov, Angelo Brambilla, Giancarlo Storti Gajani, Davide Appello, Fausto Piazza, Paolo Bernardi:
An I-IP based approach for the monitoring of NBTI effects in SoCs. 15-20 - Elie Maricau, Georges G. E. Gielen:
A methodology for measuring transistor ageing effects towards accurate reliability simulation. 21-26
Transient Faults Evaluation and Analysis
- Rodrigo Possamai Bastos, Yannick Monnet, Gilles Sicard, Fernanda Lima Kastensmidt, Marc Renaudin, Ricardo Reis:
Comparing transient-fault effects on synchronous and on asynchronous circuits. 29-34 - Carmela Noro Grando, Carlos Arthur Lang Lisbôa, Álvaro Freitas Moreira, Luigi Carro:
Invariant checkers: An efficient low cost technique for run-time transient errors detection. 35-40 - Paolo Maistri, Régis Leveugle:
Towards automated fault pruning with Petri Nets. 41-46
System-Level Reliability and Security
- Massimo Violante, M. L. Esposti:
A low-cost solution for developing reliable Linux-based space computers for on-board data handling. 49-54 - Eberhard Böhl, Paul Duplys:
Nonlinear compression functions using the MISR approach for security purposes in automotive applications. 55-60 - Caroline Concatto, Pedro Almeida, Fernanda Lima Kastensmidt, Érika F. Cota, Marcelo Lubaszewski, Marcos Hervé:
Improving yield of torus nocs through fault-diagnosis-and-repair of interconnect faults. 61-66
Microprocessors and Multiprocessors
- Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello:
Evaluating Alpha-induced soft errors in embedded microprocessors. 69-74 - Eleftherios Kolonis, Michael Nicolaidis, Dimitris Gizopoulos, Mihalis Psarakis, Jacques Henri Collet, Piotr Zajac:
Enhanced self-configurability and yield in multicore grids. 75-80 - Xavier Vera, Jaume Abella, Javier Carretero, Pedro Chaparro, Antonio González:
Online error detection and correction of erratic bits in register files. 81-86
Soft Errors and FPGAs
- Niccolò Battezzati, Filomena Decuzzi, Massimo Violante, Michel Briet:
Application-oriented SEU sensitiveness analysis of Atmel rad-hard FPGAs. 89-94 - Michelangelo Grosso, Matteo Sonza Reorda:
Exploiting embedded FPGA in on-line software-based test strategies for microprocessor cores. 95-100 - José Rodrigo Azambuja, Fernando Sousa, Lucas Rosa, Fernanda Lima Kastensmidt:
Evaluating large grain TMR and selective partial reconfiguration for soft error mitigation in SRAM-based FPGAs. 101-106
Memories SEU Tolerance and Characterization
- Antonin Bougerol, Florent Miller, Nadine Buard:
Novel DRAM mitigation technique. 109-113 - Yuriy Shiyanovskii, Francis G. Wolff, Christos A. Papachristou:
SRAM cell design using tri-state devices for SEU protection. 114-119 - Sebastià A. Bota, Gabriel Torrens, Bartomeu Alorda:
Critical charge characterization in 6-T SRAMs during read mode. 120-125
Panel: Realistic Low Power Design: Let Errors Occur and Correct them Later or Mitigate Errors via Design Guardbanding and Process Control?
- Abhijit Chatterjee, Jacob A. Abraham, Adit D. Singh, Elie Maricau, Rakesh Kumar, Christos A. Papachristou:
Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?. 129
Soft Errors Tolerance
- Costas Argyrides, Carlos Arthur Lang Lisbôa, Dhiraj K. Pradhan, Luigi Carro:
A fast error correction technique for matrix multiplication algorithms. 133-137 - Pedro Reviriego, Juan Antonio Maestro, Anne O'Donnell, Chris J. Bleakley:
Soft error detection and correction for FFT based convolution using different block lengths. 138-143 - Mario García-Valderas, Marta Portela-García, Celia López-Ongil, Luis Entrena:
In-depth analysis of digital circuits against soft errors for selective hardening. 144-149
Design for Reliability and Dependability Issues in Massively Parallel Processor Chips
- Xavier Vera:
DFx for massively multiprocessors. 153 - Vikas Chandra:
Designing dependable multicore system with unreliable components. 154 - Gilles Bizot, Nacer-Eddine Zergainoh, Michael Nicolaidis:
Variability and reliability-aware application tasks scheduling and power control (Voltage and Frequency Scaling) in the future nanoscale multiprocessors system on chip. 155
Coding Techniques
- Michael Richter, Michael Gössel:
Concurrent checking with split-parity codes. 159-163 - Zhen Wang, Mark G. Karpovsky, Berk Sunar:
Multilinear codes for robust error detection. 164-169 - Shih-Hsin Hu, Jacob A. Abraham:
Error detection in 2-D Discrete Wavelet lifting transforms. 170-175
High Altitude and Remote SEU Experiments
- Dan Alexandrescu, Anne-Lise Lhomme-Perrot, Erwin Schäfer, Cyrille Beltrando:
Highs and lows of radiation testing. 179 - Guillaume Hubert, Raoul Velazco, Paul Peronnard:
A generic platform for remote accelerated tests and high altitude SEU experiments on advanced ICs: Correlation with MUSCA SEP3 calculations. 180 - André V. Fidalgo, Gustavo R. Alves, Manuel C. Felgueiras, Manuel G. Gericota:
Using test infrastructures for (remote) online evaluation of the sensitivity to SEUs of FPGAs. 181
Posters
- Fabian Vargas, Claudia A. Rocha, Bernardo Pianta, Marta Portela-García, Celia López-Ongil, Mario García-Valderas, Luis Entrena:
Briefing power/reliability optimization in embedded software design. 185-186 - Paul Duplys, Eberhard Böhl:
Linear and nonlinear MISR operations for safety and security in automotive applications. 187-188 - Junfeng Fan, Miroslav Knezevic, Dusko Karaklajic, Roel Maes, Vladimir Rozic, Lejla Batina, Ingrid Verbauwhede:
FPGA-based testing strategy for cryptographic chips: A case study on Elliptic Curve Processor for RFID tags. 189-191 - Salvatore Pontarelli, Gian Carlo Cardarilli, Marco Re, Adelio Salsano:
Error detection in addition chain based ECC Point Multiplication. 192-194 - Jose Luis Garcia-Gervacio, Víctor H. Champac:
Detectability analysis of small delays due to resistive opens considering process variations. 195-197 - José F. da Rocha, Nuno Dias, Angelo Monteiro, Alexandre Neves, Gabriel Santos, Marcelino B. Santos, João Paulo Teixeira:
Controllability and observability in mixed signal cores. 198-200 - Abbas Ramazani, Mohsin Amin, Fabrice Monteiro, Camille Diou, Abbas Dandache:
A fault tolerant journalized stack processor architecture. 201-202 - Alejandro Jiménez-Horas, Enrique San Millán, Celia López-Ongil, Marta Portela-García, Mario García-Valderas, Luis Entrena:
Pseudo-random number generation applied to robust modern cryptography: A new technique for block ciphers. 203-205 - Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis:
An Input Vector Monitoring Concurrent BIST scheme exploiting . 206-207 - Pablo Maqueda, Josep Rius:
Analysis of the extra delay on interconnects caused by resistive opens and shorts. 208-209 - Hafizur Rahaman, Jimson Mathew, Abusaleh M. Jabir, Dhiraj K. Pradhan:
C-testable S-box implementation for secure advanced encryption standard. 210-211 - Ashkan Eghbal, Pooria M. Yaghini, Hossein Pedram, Hamid R. Zarandi:
Fault injection-based evaluation of a synchronous NoC router. 212-214
Fault-Tolerance Techniques
- Alireza Namazi, Yasser Sedaghat, Seyed Ghassem Miremadi, Alireza Ejlali:
A low-cost fault-tolerant technique for Carry Look-Ahead adder. 217-222 - Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies. 223-228 - Samary Baranov, Ilya Levin, Osnat Keren, Mark G. Karpovsky:
Designing fault tolerant FSM by nano-PLA. 229-234
Field Testing and Self-Adaptation
- Amit Dutta, Malav Shah, G. Swathi, Rubin A. Parekhji:
Design techniques and tradeoffs in implementing non-destructive field test using logic BIST self-test. 237-242 - Kenneth M. Zick, John P. Hayes:
On-line characterization and reconfiguration for single event upset variations. 243-248 - Jayaram Natarajan, Gokul Kumar, Shreyas Sen, Muhammad Mudassar Nisar, Deuk Lee, Abhijit Chatterjee:
Aggressively voltage overscaled adaptive RF systems using error control at the bit and symbol levels. 249-254
Encoders, Checkers and Fault Secureness
- Houssein Jaber, Fabrice Monteiro, Abbas Dandache:
An effective fast and small-area parallel-pipeline architecture for OTM-convolutional encoders. 257-261 - Steffen Zeidler, Marcus Ehrig, Milos Krstic, Michael Augustin, Christoph Wolf, Rolf Kraemer:
Ultra low cost asynchronous handshake checker. 262-268 - Marc Hunger, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, Bernd Becker:
ATPG-based grading of strong fault-secureness. 269-274
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