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ORCID21st ISSRE 2010: San Jose, CA, USA
- IEEE 21st International Symposium on Software Reliability Engineering, ISSRE 2010, San Jose, CA, USA, 1-4 November 2010. IEEE Computer Society 2010, ISBN 978-0-7695-4255-3
Predicting Defects
- Boya Sun, Andy Podgurski, Soumya Ray
:
Improving the Precision of Dependence-Based Defect Mining by Supervised Learning of Rule and Violation Graphs. 1-10 - Kishor S. Trivedi, Dazhi Wang, D. Jason Hunt:
Computing the Number of Calls Dropped Due to Failures. 11-20 - Boya Sun, Gang Shu, Andy Podgurski, Shirong Li, Shijie Zhang, Jiong Yang:
Propagating Bug Fixes with Fast Subgraph Matching. 21-30
Reliability Modeling 1
- Hiroyuki Okamura, Yusuke Etani, Tadashi Dohi:
A Multi-factor Software Reliability Model Based on Logistic Regression. 31-40 - Peter T. Popov, Lorenzo Strigini:
Assessing Asymmetric Fault-Tolerant Software. 41-50 - Marc Forster, Daniel Schneider:
Flexible, Any-Time Fault Tree Analysis with Component Logic Models. 51-60
Empirical Studies 1
- Paulo C. Véras, Emília Villani, Ana Maria Ambrosio, Nuno Silva, Marco Vieira, Henrique Madeira:
Errors on Space Software Requirements: A Field Study and Application Scenarios. 61-70 - Domenico Cotroneo, Roberto Natella, Roberto Pietrantuono, Stefano Russo:
Software Aging Analysis of the Linux Operating System. 71-80 - Gursimran Singh Walia, Jeffrey C. Carver:
Evaluating the Use of Requirement Error Abstraction and Classification Method for Preventing Errors during Artifact Creation: A Feasibility Study. 81-90
Security 1
- Roger B. Dannenberg, Will Dormann, David Keaton, Robert C. Seacord, David Svoboda, Alex Volkovitsky, Timothy Wilson, Thomas Plum:
As-If Infinitely Ranged Integer Model. 91-100 - Prasanth Anbalagan, Mladen A. Vouk:
Towards a Bayesian Approach in Modeling the Disclosure of Unique Security Faults in Open Source Projects. 101-110 - Stephan Neuhaus, Thomas Zimmermann:
Security Trend Analysis with CVE Topic Models. 111-120
Testing 1
- Mike Papadakis, Nicos Malevris:
Automatic Mutation Test Case Generation via Dynamic Symbolic Execution. 121-130 - Florence Charreteur, Arnaud Gotlieb:
Constraint-Based Test Input Generation for Java Bytecode. 131-140 - Hadi Hemmati, Lionel C. Briand:
An Industrial Investigation of Similarity Measures for Model-Based Test Case Selection. 141-150
Validation 1
- Kang Gui, Suraj Kothari:
A 2-Phase Method for Validation of Matching Pair Property with Case Studies of Operating Systems. 151-160 - Sven Apel, Wolfgang Scholz, Christian Lengauer, Christian Kästner:
Detecting Dependences and Interactions in Feature-Oriented Design. 161-170 - Dominik Domis, Kai Höfig, Mario Trapp:
A Consistency Check Algorithm for Component-Based Refinements of Fault Trees. 171-180
Testing 2
- Sander van der Burg, Eelco Dolstra:
Automating System Tests Using Declarative Virtual Machines. 181-190 - Karthik Pattabiraman, Benjamin G. Zorn:
DoDOM: Leveraging DOM Invariants for Web 2.0 Application Robustness Testing. 191-200 - Haroon Malik, Bram Adams, Ahmed E. Hassan:
Pinpointing the Subsystems Responsible for the Performance Deviations in a Load Test. 201-210
Reliability Modeling 2
- Rivalino Matias, Kishor S. Trivedi, Paulo Romero Martins Maciel:
Using Accelerated Life Tests to Estimate Time to Software Aging Failure. 211-219 - Elisabeth A. Nguyen, Carlos F. Rexach, David P. Thorpe, Andrew E. Walther:
The Importance of Data Quality in Software Reliability Modeling. 220-228 - Indika Meedeniya, Lars Grunske:
An Efficient Method for Architecture-Based Reliability Evaluation for Evolving Systems with Changing Parameters. 229-238
Empirical Studies 2
- Sean Banerjee, Hema Srikanth, Bojan Cukic:
Log-Based Reliability Analysis of Software as a Service (SaaS). 239-248 - Amiya Kumar Maji, Kangli Hao, Salmin Sultana, Saurabh Bagchi:
Characterizing Failures in Mobile OSes: A Case Study with Android and Symbian. 249-258 - Arin Zahalka, Katerina Goseva-Popstojanova, Jeffrey Zemerick:
Empirical Evaluation of Factors Affecting Distinction between Failing and Passing Executions. 259-268
Practical Experience Reports
- Stefan Wagner, Bernhard Schätz, Stefan Puchner, Peter Kock:
A Case Study on Safety Cases in the Automotive Domain: Modules, Patterns, and Models. 269-278 - Heiko Koziolek, Bastian Schlich, Carlos G. Bilich:
A Large-Scale Industrial Case Study on Architecture-Based Software Reliability Analysis. 279-288 - Ivano Alessandro Elia, José Fonseca, Marco Vieira:
Comparing SQL Injection Detection Tools Using Attack Injection: An Experimental Study. 289-298 - José Fonseca, Marco Vieira, Henrique Madeira:
The Web Attacker Perspective - A Field Study. 299-308
Empirical Studies 3
- Nachiappan Nagappan, Andreas Zeller, Thomas Zimmermann, Kim Herzig, Brendan Murphy:
Change Bursts as Defect Predictors. 309-318 - Cristiano Bertolini, Alexandre Mota, Eduardo Aranha:
Calibrating Probabilistic GUI Testing Models Based on Experiments and Survival Analysis. 319-328 - Rachel Burrows, Fabiano Cutigi Ferrari, Otávio Augusto Lazzarini Lemos, Alessandro Garcia, François Taïani:
The Impact of Coupling on the Fault-Proneness of Aspect-Oriented Programs: An Empirical Study. 329-338
Security 2
- Vivek Iyer, Amit Kanitkar, Partha Dasgupta, Raghunathan Srinivasan:
Preventing Overflow Attacks by Memory Randomization. 339-347 - Hongyu Sun, Samik Basu, Vasant G. Honavar, Robyn R. Lutz:
Automata-Based Verification of Security Requirements of Composite Web Services. 348-357 - Hossain Shahriar, Mohammad Zulkernine:
Client-Side Detection of Cross-Site Request Forgery Attacks. 358-367
Testing 3
- Mark Grechanik, Christoph Csallner, Chen Fu, Qing Xie:
Is Data Privacy Always Good for Software Testing? 368-377 - Mohan Sridharan, Akbar Siami Namin:
Prioritizing Mutation Operators Based on Importance Sampling. 378-387 - May Khalil, Yvan Labiche:
On the Round Trip Path Testing Strategy. 388-397
Validation 2
- Zibin Zheng, Tom Chao Zhou, Michael R. Lyu, Irwin King:
FTCloud: A Component Ranking Framework for Fault-Tolerant Cloud Applications. 398-407 - Danhua Shao, Divya Gopinath, Sarfraz Khurshid, Dewayne E. Perry:
Optimizing Incremental Scope-Bounded Checking with Data-Flow Analysis. 408-417
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