IEEE Design & Test of Computers, Volume 12

Volume 12, Number 1, 1995

EIC Message

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  EIC Message. IEEE Des. Test Comput. 12(1): 2-4 (1995)

Management Perspectives in EDA

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  Ajit M. Prabhu:
  Managing your EDA investments. IEEE Des. Test Comput. 12(1): 5-7, 89-90 (1995)

Call for Articles

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  Call for Articles. IEEE Des. Test Comput. 12(1): 7- (1995)

News

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  News. IEEE Des. Test Comput. 12(1): 8-9 (1995)

Conference Reports

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  Conference Reports. IEEE Des. Test Comput. 12(1): 10-11, 83-84 (1995)

Panel Summaries

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  Vinod K. Agarwal:
  VTS 1994 Panel Report on BIST for Consumer Products. IEEE Des. Test Comput. 12(1): 12- (1995)

Features

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  Tam-Anh Chu, Rabindra K. Roy:
  Guest Editors' Introduction: More Practical Asynchronous Design. IEEE Des. Test Comput. 12(1): 13- (1995)
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  Victor Varshavsky, Vyacheslav Marakhovsky, Vadim V. Smolensky:
  Designing Self-Timed Devices Using the Finite Automaton Model. 14-23
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  Trevor Wing Sang Lee, Mark R. Greenstreet, Carl-Johan H. Seger:
  Automatic Verification of Asynchronous Circuits. 24-31
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  Call for Articles. IEEE Des. Test Comput. 12(1): 31- (1995)
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  Alexandre Yakovlev, Albert Koelmans, Luciano Lavagno:
  High-Level Modeling and Design of Asynchronous Interface Logic. 32-40

Special Features

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  Shoab Ahmed Khan, Vijay K. Madisetti:
  System Partitioning of MCMs for Low Power. 41-52
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  Daniel D. Gajski, Frank Vahid:
  Specification and Design of Embedded Hardware-Software Systems. 53-67
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  Yuejian Wu, André Ivanov:
  Reducing Hardware with Fuzzy Multiple Signature Analysis. 68-74
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  A D&T Roundtable: Test Benchmarking. IEEE Des. Test Comput. 12(1): 75-82 (1995)

Author Guidelines

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  Author Guidelines: IEEE Design & Test of Computers. IEEE Des. Test Comput. 12(1): 85-86 (1995)

New Products

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  New Products. IEEE Des. Test Comput. 12(1): 87-89 (1995)

DATC Newsletter

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  DATC Newsletter. IEEE Des. Test Comput. 12(1): 91-92 (1995)

TTTC Newsletter

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  Test Technology TC Newsletter. IEEE Des. Test Comput. 12(1): 93-95 (1995)

Volume 12, Number 2, 1995

Management Perspectives in EDA

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  Ajit M. Prabhu:
  Management Perspectives in EDA. IEEE Des. Test Comput. 12(2): 3-4 (1995)

Conference Reports

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  N. Ranganathan, Sharad C. Seth:
  Conference Reports. IEEE Des. Test Comput. 12(2): 5, 81 (1995)

Features

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  Ben Bennetts:
  Guest Editor's Introduction. IEEE Des. Test Comput. 12(2): 6-7 (1995)
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  Robert C. Aitken:
  An Overview of Test Synthesis Tools. 8-15
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  Henry Cox:
  Synthesizing Circuits with Implicit Testability Constraints. 16-23
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  Kwang-Ting (Tim) Cheng:
  Single-Clock Partial Scan. 24-31
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  Call For Articles. IEEE Des. Test Comput. 12(2): 31- (1995)
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  Thomas E. Marchok, Aiman H. El-Maleh, Janusz Rajski, Wojciech Maly:
  Testability Implications of Performance-Driven Logic Synthesis. 32-39

Special Features

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  Charles F. Hawkins, Jerry M. Soden:
  IDDQ Design and Test Advantages Propel Industry. IEEE Des. Test Comput. 12(2): 40-41 (1995)
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  Don Douglas Josephson, Mark Storey, Daniel D. Dixon:
  Microprocessor IDDQ Testing: A Case Study. 42-52
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  Mick Tegethoff, Kenneth P. Parker:
  IEEE Std 1149.1: Where Are We? Where From Here? 53-59
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  Robert A. Walker, Samit Chaudhuri:
  Introduction to the Scheduling Problem. 60-69
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  Mustapha Slamani, Bozena Kaminska:
  Multifrequency Analysis of Faults in Analog Circuits. 70-80

Panel Summaries

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  Luc J. M. Claesen:
  ED&TC 1995: Simulation versus formal verification. IEEE Des. Test Comput. 12(2): 82- (1995)

News

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  News. IEEE Des. Test Comput. 12(2): 83- (1995)

DATC Newsletter

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  Joe Damore:
  Design Automation Technical Committee Newsletter. IEEE Des. Test Comput. 12(2): 84- (1995)

TTTC Newsletter

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  Test Technology TC Newsletter. IEEE Des. Test Comput. 12(2): 85-87 (1995)

Volume 12, Number 3, 1995

Panel Summaries

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  R. I. Campbell:
  Panel Summaries. IEEE Des. Test Comput. 12(3): 4- (1995)

Management Perspectives in EDA

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  Ajit M. Prabhu:
  The EDA Business Model Dialogue Part 1. IEEE Des. Test Comput. 12(3): 6-7, 106-107 (1995)

News

• 
  News. IEEE Des. Test Comput. 12(3): 8- (1995)

New Products

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  New Products. IEEE Des. Test Comput. 12(3): 9, 104-105 (1995)

Conference Reports

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  Conference Reports. IEEE Des. Test Comput. 12(3): 10-11, 103 (1995)

Features

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  Teruhiko Yamada:
  Accelerating the Pace of R&D in Asia. IEEE Des. Test Comput. 12(3): 12-13 (1995)
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  Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen:
  Identifying Untestable Faults in Sequential Circuits. 14-23
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  Rubin A. Parekhji, G. Venkatesh, Sunil D. Sherlekar:
  Concurrent Error Detection Using Monitoring Machines. 24-32
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  Yoshiaki Kakuda, Hideki Yukitomo, Shinji Kusumoto, Tohru Kikuno:
  Localizing Multiple Faults in a Protocol Implementation. 34-42
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  Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu:
  Multiple Fault Diagnosis by Sensitizing Input Pairs. 44-52

Special Features

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  Keith Baker, Alan Hales:
  Plug-and-Play IDDQ Testing for Test Fixtures. 53-61
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  Kenneth M. Wallquist:
  Achieving IDDQ/ISSQ Production Testing with QuiC-Mon. 62-69
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  Nand Kumar, Srinivas Katkoori, Leo Rader, Ranga Vemuri:
  Profile-Driven Behavioral Synthesis for Low-Power VLSI Systems. 70-84
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  Paolo Camurati, Paolo Prinetto, Matteo Sonza Reorda, Stefano Barbagallo, Andrea Burri, Davide Medina:
  Industrial BIST of Embedded RAMs. 86-95
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  A D&T Roundtable: The Practical Application of Formal Verification. IEEE Des. Test Comput. 12(3): 96-102 (1995)

DATC Newsletter

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  Design Automation Technical Committee Newsletter. IEEE Des. Test Comput. 12(3): 108-109 (1995)

TTTC Newsletter

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  Test Technology TC Newsletter. IEEE Des. Test Comput. 12(3): 110-111 (1995)

Volume 12, Number 4, 1995

News

• 
  News. IEEE Des. Test Comput. 12(4): 2-3 (1995)

Management Perspectives in EDA

• 
  Ajit M. Prabhu:
  The EDA Business Model Dialogue Part 2. IEEE Des. Test Comput. 12(4): 4-5, 98-99 (1995)

Features

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  Frederick L. Kitson:
  Guest Editor's Introduction: Multimedia Drives Changes. IEEE Des. Test Comput. 12(4): 6-7 (1995)
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  Frederick L. Kitson, Vasudev Bhaskaran, Devendra Kalra:
  Transitioning Desktops to Set Tops. 8-17
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  Jihong Kim, Yongmin Kim:
  Simulating Multimedia Systems with MVPSIM. 18-27
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  Christian J. Van Den Branden Lambrecht, Vasudev Bhaskaran, Al Kovalick, Murat Kunt:
  Automatically Assessing MPEG Coding Fidelity. 28-33
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  David K. Fibush:
  Testing Multimedia Transmission Systems. 34-44

Special Features

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  Manoj Sachdev:
  Testing Defects in Scan Chains. 45-51
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  Jing-Yang Jou, Kwang-Ting (Tim) Cheng:
  Timing-Driven Partial Scan. 52-59
• 
  Eugeni Isern, Joan Figueras:
  IDDQ Test and Diagnosis of CMOS Circuits. 60-67
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  Randall Mcree:
  Testing and Diagnosing Managed Networks. 68-80
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  Bulent I. Dervisoglu:
  Special Report: Shared-I/O Scan Test. 81-83
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  A D&T Roundtable: Low-Power Design. IEEE Des. Test Comput. 12(4): 84-90 (1995)
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  IEEE Design & Test of Computers Annual Index, Volume 12. IEEE Des. Test Comput. 12(4): 91-94 (1995)

Conference Reports

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  Sreejit Chakravarty, Ramalingam Sridhar, Shambhu J. Upadhyaya, Yervant Zorian, Gil Philips, Bozena Kaminska, Bernard Courtois:
  Conference Reports. IEEE Des. Test Comput. 12(4): 95-97 (1995)

DATC Newsletter

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  Design Automation Technical Committee Newsletter. IEEE Des. Test Comput. 12(4): 100-101 (1995)

TTTC Newsletter

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  Test Technology TC Newsletter. IEEE Des. Test Comput. 12(4): 102-103 (1995)