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ORCIDBibTeX records: Robert C. Aitken
@article{DBLP:journals/computer/DickAMSBLNLMSTVKMK23,
author = {Robert P. Dick and
Rob Aitken and
Jace Mogill and
John Paul Strachan and
Kirk Bresniker and
Wei Lu and
Yorie Nakahira and
Zhiyong Li and
Matthew J. Marinella and
William Severa and
A. Alec Talin and
Craig M. Vineyard and
Suhas Kumar and
Christian Mailhiot and
Lennie Klebanoff},
title = {Research Challenges for Energy-Efficient Computing in Automated Vehicles},
journal = {Computer},
volume = {56},
number = {3},
pages = {47--58},
year = {2023},
url = {https://doi.org/10.1109/MC.2022.3180987},
doi = {10.1109/MC.2022.3180987},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computer/DickAMSBLNLMSTVKMK23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurosys/LyuCAP022,
author = {Xiaosu Lyu and
Ludmila Cherkasova and
Robert C. Aitken and
Gabriel Parmer and
Timothy Wood},
editor = {Aaron Yi Ding and
Volker Hilt},
title = {Towards efficient processing of latency-sensitive serverless DAGs
at the edge},
booktitle = {EdgeSys@EuroSys 2022: Proceedings of the 5th International Workshop
on Edge Systems, Analytics and Networking, Rennes, France, April 5
- 8, 2022},
pages = {49--54},
publisher = {{ACM}},
year = {2022},
url = {https://doi.org/10.1145/3517206.3526274},
doi = {10.1145/3517206.3526274},
timestamp = {Wed, 30 Mar 2022 17:06:35 +0200},
biburl = {https://dblp.org/rec/conf/eurosys/LyuCAP022.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Aitken19,
author = {Robert C. Aitken},
title = {56th Design Automation Conference Report},
journal = {{IEEE} Des. Test},
volume = {36},
number = {6},
pages = {80--81},
year = {2019},
url = {https://doi.org/10.1109/MDAT.2019.2942327},
doi = {10.1109/MDAT.2019.2942327},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/Aitken19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tetc/AitkenM19,
author = {Rob Aitken and
Cecilia Metra},
title = {Special Section on Emerging Trends and Design Paradigms for Memory
Systems and Storage},
journal = {{IEEE} Trans. Emerg. Top. Comput.},
volume = {7},
number = {3},
pages = {433--434},
year = {2019},
url = {https://doi.org/10.1109/TETC.2019.2909487},
doi = {10.1109/TETC.2019.2909487},
timestamp = {Fri, 15 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tetc/AitkenM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iciot/AminCAK19,
author = {Poojitha Amin and
Ludmila Cherkasova and
Rob Aitken and
Vikas Kache},
editor = {Elisa Bertino and
Carl K. Chang and
Peter Chen and
Ernesto Damiani and
Michael Goul and
Katsunori Oyama},
title = {Automating Energy Demand Modeling and Forecasting Using Smart Meter
Data},
booktitle = {2019 {IEEE} International Congress on Internet of Things, {ICIOT}
2019, Milan, Italy, July 8-13, 2019},
pages = {133--137},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ICIOT.2019.00032},
doi = {10.1109/ICIOT.2019.00032},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/iciot/AminCAK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/im/AminCAK19,
author = {Poojitha Amin and
Ludmila Cherkasova and
Rob Aitken and
Vikas Kache},
editor = {Joe Betser and
Carol J. Fung and
Alex Clemm and
J{\'{e}}r{\^{o}}me Fran{\c{c}}ois and
Shingo Ata},
title = {Analysis and Demand Forecasting of Residential Energy Consumption
at Multiple Time Scales},
booktitle = {{IFIP/IEEE} International Symposium on Integrated Network Management,
{IM} 2019, Washington, DC, USA, April 09-11, 2019},
pages = {494--499},
publisher = {{IFIP}},
year = {2019},
url = {https://ieeexplore.ieee.org/document/8717811},
timestamp = {Tue, 10 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/im/AminCAK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/srds/GadepalliPCAP19,
author = {Phani Kishore Gadepalli and
Gregor Peach and
Ludmila Cherkasova and
Rob Aitken and
Gabriel Parmer},
title = {Challenges and Opportunities for Efficient Serverless Computing at
the Edge},
booktitle = {38th Symposium on Reliable Distributed Systems, {SRDS} 2019, Lyon,
France, October 1-4, 2019},
pages = {261--266},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/SRDS47363.2019.00036},
doi = {10.1109/SRDS47363.2019.00036},
timestamp = {Wed, 15 Apr 2020 15:03:23 +0200},
biburl = {https://dblp.org/rec/conf/srds/GadepalliPCAP19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MichaelDESHA17,
author = {Maria K. Michael and
Rolf Drechsler and
Stephan Eggersgl{\"{u}}{\ss} and
Haralampos{-}G. D. Stratigopoulos and
Sybille Hellebrand and
Rob Aitken},
title = {Foreword},
booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
May 22-26, 2017},
pages = {1--2},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ETS.2017.7968204},
doi = {10.1109/ETS.2017.7968204},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/ets/MichaelDESHA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi-dat/Aitken17,
author = {Rob Aitken},
title = {The road to a trillion: Making the IoT work},
booktitle = {2017 International Symposium on {VLSI} Design, Automation and Test,
{VLSI-DAT} 2017, Hsinchu, Taiwan, April 24-27, 2017},
pages = {1},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/VLSI-DAT.2017.7939706},
doi = {10.1109/VLSI-DAT.2017.7939706},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vlsi-dat/Aitken17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iet-cdt/AitkenCCDPSSY16,
author = {Robert C. Aitken and
Vikas Chandra and
Brian Cline and
Shidhartha Das and
David Pietromonaco and
Lucian Shifren and
Saurabh Sinha and
Greg Yeric},
title = {Predicting future complementary metal-oxide-semiconductor technology
- challenges and approaches},
journal = {{IET} Comput. Digit. Tech.},
volume = {10},
number = {6},
pages = {315--322},
year = {2016},
url = {https://doi.org/10.1049/iet-cdt.2015.0210},
doi = {10.1049/IET-CDT.2015.0210},
timestamp = {Wed, 27 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/iet-cdt/AitkenCCDPSSY16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/LaiCA16,
author = {Liangzhen Lai and
Vikas Chandra and
Rob Aitken},
editor = {Frank Liu},
title = {Resiliency in dynamically power managed designs},
booktitle = {Proceedings of the 35th International Conference on Computer-Aided
Design, {ICCAD} 2016, Austin, TX, USA, November 7-10, 2016},
pages = {69},
publisher = {{ACM}},
year = {2016},
url = {https://doi.org/10.1145/2966986.2980079},
doi = {10.1145/2966986.2980079},
timestamp = {Fri, 23 Jun 2023 22:29:48 +0200},
biburl = {https://dblp.org/rec/conf/iccad/LaiCA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/islped/Aitken16,
author = {Rob Aitken},
title = {Coordinating Communication, Technology and Design in the {IOT} Era},
booktitle = {Proceedings of the 2016 International Symposium on Low Power Electronics
and Design, {ISLPED} 2016, San Francisco Airport, CA, USA, August
08 - 10, 2016},
pages = {2},
publisher = {{ACM}},
year = {2016},
url = {https://doi.org/10.1145/2934583.2962725},
doi = {10.1145/2934583.2962725},
timestamp = {Tue, 06 Nov 2018 16:59:21 +0100},
biburl = {https://dblp.org/rec/conf/islped/Aitken16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsic/BhavnagarwalaIN16,
author = {Azeez Bhavnagarwala and
Imran Iqbal and
An Nguyen and
David Ondricek and
Vikas Chandra and
Robert C. Aitken},
title = {A 400mV active VMIN, 200mV retention VMIN, 2.8 GHz 64Kb {SRAM} with
a 0.09 um\({}^{\mbox{2}}\) 6T bitcell in a 16nm FinFET {CMOS} process},
booktitle = {2016 {IEEE} Symposium on {VLSI} Circuits, {VLSIC} 2016, Honolulu,
HI, USA, June 15-17, 2016},
pages = {1--2},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/VLSIC.2016.7573513},
doi = {10.1109/VLSIC.2016.7573513},
timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
biburl = {https://dblp.org/rec/conf/vlsic/BhavnagarwalaIN16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TahooriAVS16,
author = {Mehdi Baradaran Tahoori and
Rob Aitken and
Sriram R. Vangal and
Bal Sandhu},
title = {Test implications and challenges in near threshold computing special
session},
booktitle = {34th {IEEE} {VLSI} Test Symposium, {VTS} 2016, Las Vegas, NV, USA,
April 25-27, 2016},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/VTS.2016.7477295},
doi = {10.1109/VTS.2016.7477295},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TahooriAVS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/AitkenI15,
author = {Robert C. Aitken and
Tetsuya Iizuka},
title = {Session 12 - Tutorial - beyond {CMOS:} Large area electronics-concepts
and prospects},
booktitle = {2015 {IEEE} Custom Integrated Circuits Conference, {CICC} 2015, San
Jose, CA, USA, September 28-30, 2015},
pages = {1},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/CICC.2015.7338469},
doi = {10.1109/CICC.2015.7338469},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/cicc/AitkenI15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/SinhaSCCYACBRAM15,
author = {Saurabh Sinha and
Lucian Shifren and
Vikas Chandra and
Brian Cline and
Greg Yeric and
Robert C. Aitken and
Bingjie Cheng and
Andrew R. Brown and
Craig Riddet and
C. Alexandar and
Campbell Millar and
Asen Asenov},
title = {Circuit design perspectives for Ge FinFET at 10nm and beyond},
booktitle = {Sixteenth International Symposium on Quality Electronic Design, {ISQED}
2015, Santa Clara, CA, USA, March 2-4, 2015},
pages = {57--60},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ISQED.2015.7085398},
doi = {10.1109/ISQED.2015.7085398},
timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
biburl = {https://dblp.org/rec/conf/isqed/SinhaSCCYACBRAM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Aitken15,
author = {Rob Aitken},
title = {Panel: Is design-for-security the new DFT?},
booktitle = {33rd {IEEE} {VLSI} Test Symposium, {VTS} 2015, Napa, CA, USA, April
27-29, 2015},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/VTS.2015.7116299},
doi = {10.1109/VTS.2015.7116299},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Aitken15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AitkenCPT15,
author = {Rob Aitken and
Ethan H. Cannon and
Mondira Pant and
Mehdi Baradaran Tahoori},
title = {Resiliency challenges in sub-10nm technologies},
booktitle = {33rd {IEEE} {VLSI} Test Symposium, {VTS} 2015, Napa, CA, USA, April
27-29, 2015},
pages = {1--4},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/VTS.2015.7116281},
doi = {10.1109/VTS.2015.7116281},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AitkenCPT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LarssonEDAJL15,
author = {Erik Larsson and
Bill Eklow and
Scott Davidsson and
Rob Aitken and
Artur Jutman and
Christophe Lotz},
title = {No Fault Found: The root cause},
booktitle = {33rd {IEEE} {VLSI} Test Symposium, {VTS} 2015, Napa, CA, USA, April
27-29, 2015},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/VTS.2015.7116284},
doi = {10.1109/VTS.2015.7116284},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LarssonEDAJL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/esticas/LaiCAG14,
author = {Liangzhen Lai and
Vikas Chandra and
Robert C. Aitken and
Puneet Gupta},
title = {BTI-Gater: An Aging-Resilient Clock Gating Methodology},
journal = {{IEEE} J. Emerg. Sel. Topics Circuits Syst.},
volume = {4},
number = {2},
pages = {180--189},
year = {2014},
url = {https://doi.org/10.1109/JETCAS.2014.2315882},
doi = {10.1109/JETCAS.2014.2315882},
timestamp = {Thu, 28 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/esticas/LaiCAG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/ChoudhuryCAM14,
author = {Mihir R. Choudhury and
Vikas Chandra and
Robert C. Aitken and
Kartik Mohanram},
title = {Time-Borrowing Circuit Designs and Hardware Prototyping for Timing
Error Resilience},
journal = {{IEEE} Trans. Computers},
volume = {63},
number = {2},
pages = {497--509},
year = {2014},
url = {https://doi.org/10.1109/TC.2012.190},
doi = {10.1109/TC.2012.190},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/ChoudhuryCAM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/LaiCAG14,
author = {Liangzhen Lai and
Vikas Chandra and
Robert C. Aitken and
Puneet Gupta},
title = {SlackProbe: {A} Flexible and Efficient In Situ Timing Slack Monitoring
Methodology},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {33},
number = {8},
pages = {1168--1179},
year = {2014},
url = {https://doi.org/10.1109/TCAD.2014.2323195},
doi = {10.1109/TCAD.2014.2323195},
timestamp = {Thu, 28 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/LaiCAG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/Casale-RossiMADHHM14,
author = {Marco Casale{-}Rossi and
Giovanni De Micheli and
Rob Aitken and
Antun Domic and
Manfred Horstmann and
Robert Hum and
Philippe Magarshack},
editor = {Gerhard P. Fettweis and
Wolfgang Nebel},
title = {Panel: Emerging vs. established technologies, a two sphinxes' riddle
at the crossroads?},
booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
{DATE} 2014, Dresden, Germany, March 24-28, 2014},
pages = {1--4},
publisher = {European Design and Automation Association},
year = {2014},
url = {https://doi.org/10.7873/DATE.2014.016},
doi = {10.7873/DATE.2014.016},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/Casale-RossiMADHHM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/hotchips/ChandraA14,
author = {Vikas Chandra and
Rob Aitken},
title = {Mobile hardware security},
booktitle = {2014 {IEEE} Hot Chips 26 Symposium (HCS), Cupertino, CA, USA, August
10-12, 2014},
pages = {1--40},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/HOTCHIPS.2014.7478796},
doi = {10.1109/HOTCHIPS.2014.7478796},
timestamp = {Wed, 16 Oct 2019 14:14:56 +0200},
biburl = {https://dblp.org/rec/conf/hotchips/ChandraA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/AitkenPC14,
author = {Robert C. Aitken and
David Pietromonaco and
Brian Cline},
title = {{DFM} is dead - Long live {DFM}},
booktitle = {32nd {IEEE} International Conference on Computer Design, {ICCD} 2014,
Seoul, South Korea, October 19-22, 2014},
pages = {300--307},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ICCD.2014.6974697},
doi = {10.1109/ICCD.2014.6974697},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/AitkenPC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icicdt/BoleyCCA14,
author = {James Boley and
Benton H. Calhoun and
Vikas Chandra and
Robert C. Aitken},
title = {Modeling {SRAM} dynamic {VMIN}},
booktitle = {2014 {IEEE} International Conference on {IC} Design {\&} Technology,
{ICICDT} 2014, Austin, TX, USA, May 28-30, 2014},
pages = {1--4},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ICICDT.2014.6838609},
doi = {10.1109/ICICDT.2014.6838609},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/icicdt/BoleyCCA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/islped/BeshayCAC14,
author = {Peter Beshay and
Vikas Chandra and
Rob Aitken and
Benton H. Calhoun},
editor = {Yuan Xie and
Tanay Karnik and
Muhammad M. Khellah and
Renu Mehra},
title = {A digital dynamic write margin sensor for low power read/write operations
in 28nm {SRAM}},
booktitle = {International Symposium on Low Power Electronics and Design, ISLPED'14,
La Jolla, CA, {USA} - August 11 - 13, 2014},
pages = {307--310},
publisher = {{ACM}},
year = {2014},
url = {https://doi.org/10.1145/2627369.2627662},
doi = {10.1145/2627369.2627662},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/islped/BeshayCAC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ispd/AitkenYCSSIC14,
author = {Robert C. Aitken and
Greg Yeric and
Brian Cline and
Saurabh Sinha and
Lucian Shifren and
Imran Iqbal and
Vikas Chandra},
editor = {Cliff C. N. Sze and
Azadeh Davoodi},
title = {Physical design and FinFETs},
booktitle = {International Symposium on Physical Design, ISPD'14, Petaluma, CA,
USA, March 30 - April 02, 2014},
pages = {65--68},
publisher = {{ACM}},
year = {2014},
url = {https://doi.org/10.1145/2560519.2565871},
doi = {10.1145/2560519.2565871},
timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
biburl = {https://dblp.org/rec/conf/ispd/AitkenYCSSIC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/YericCSPCA13,
author = {Greg Yeric and
Brian Cline and
Saurabh Sinha and
David Pietromonaco and
Vikas Chandra and
Rob Aitken},
title = {The past present and future of design-technology co-optimization},
booktitle = {Proceedings of the {IEEE} 2013 Custom Integrated Circuits Conference,
{CICC} 2013, San Jose, CA, USA, September 22-25, 2013},
pages = {1--8},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/CICC.2013.6658476},
doi = {10.1109/CICC.2013.6658476},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/cicc/YericCSPCA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/LaiCAG13,
author = {Liangzhen Lai and
Vikas Chandra and
Robert C. Aitken and
Puneet Gupta},
editor = {Enrico Macii},
title = {SlackProbe: a low overhead in situ on-line timing slack monitoring
methodology},
booktitle = {Design, Automation and Test in Europe, {DATE} 13, Grenoble, France,
March 18-22, 2013},
pages = {282--287},
publisher = {{EDA} Consortium San Jose, CA, {USA} / {ACM} {DL}},
year = {2013},
url = {https://doi.org/10.7873/DATE.2013.070},
doi = {10.7873/DATE.2013.070},
timestamp = {Thu, 28 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/LaiCAG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/AitkenFKRR13,
author = {Robert C. Aitken and
G{\"{o}}rschwin Fey and
Zbigniew T. Kalbarczyk and
Frank Reichenbach and
Matteo Sonza Reorda},
editor = {Enrico Macii},
title = {Reliability analysis reloaded: how will we survive?},
booktitle = {Design, Automation and Test in Europe, {DATE} 13, Grenoble, France,
March 18-22, 2013},
pages = {358--367},
publisher = {{EDA} Consortium San Jose, CA, {USA} / {ACM} {DL}},
year = {2013},
url = {https://doi.org/10.7873/DATE.2013.084},
doi = {10.7873/DATE.2013.084},
timestamp = {Wed, 25 Sep 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/AitkenFKRR13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/BoleyCAC13,
author = {James Boley and
Vikas Chandra and
Robert C. Aitken and
Benton H. Calhoun},
editor = {Enrico Macii},
title = {Leveraging sensitivity analysis for fast, accurate estimation of {SRAM}
dynamic write V\({}_{\mbox{MIN}}\)},
booktitle = {Design, Automation and Test in Europe, {DATE} 13, Grenoble, France,
March 18-22, 2013},
pages = {1819--1824},
publisher = {{EDA} Consortium San Jose, CA, {USA} / {ACM} {DL}},
year = {2013},
url = {https://doi.org/10.7873/DATE.2013.364},
doi = {10.7873/DATE.2013.364},
timestamp = {Tue, 23 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/BoleyCAC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RobertsA13,
author = {Gordon W. Roberts and
Rob Aitken},
title = {Welcome message},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651865},
doi = {10.1109/TEST.2013.6651865},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RobertsA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/EvansNAAL13,
author = {Adrian Evans and
Michael Nicolaidis and
Rob Aitken and
Burcin Aktan and
Olivier Lauzeral},
title = {Hot topic session 4A: Reliability analysis of complex digital systems},
booktitle = {31st {IEEE} {VLSI} Test Symposium, {VTS} 2013, Berkeley, CA, USA,
April 29 - May 2, 2013},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/VTS.2013.6548898},
doi = {10.1109/VTS.2013.6548898},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/EvansNAAL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Aitken12,
author = {Rob Aitken},
title = {Yield Learning Perspectives},
journal = {{IEEE} Des. Test Comput.},
volume = {29},
number = {1},
pages = {59--62},
year = {2012},
url = {https://doi.org/10.1109/MDT.2011.2179350},
doi = {10.1109/MDT.2011.2179350},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/Aitken12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/HamdiouiA12,
author = {Said Hamdioui and
Rob Aitken},
title = {{VLSI} Test technology: Why is the field not sexy enough?},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233047},
doi = {10.1109/ETS.2012.6233047},
timestamp = {Tue, 28 Apr 2020 11:43:43 +0200},
biburl = {https://dblp.org/rec/conf/ets/HamdiouiA12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/islped/KimCABS12,
author = {Daeyeon Kim and
Vikas Chandra and
Robert C. Aitken and
David T. Blaauw and
Dennis Sylvester},
editor = {Naresh R. Shanbhag and
Massimo Poncino and
Pai H. Chou and
Ajith Amerasekera},
title = {An adaptive write word-line pulse width and voltage modulation architecture
for bit-interleaved 8T SRAMs},
booktitle = {International Symposium on Low Power Electronics and Design, ISLPED'12,
Redondo Beach, CA, {USA} - July 30 - August 01, 2012},
pages = {91--96},
publisher = {{ACM}},
year = {2012},
url = {https://doi.org/10.1145/2333660.2333684},
doi = {10.1145/2333660.2333684},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/islped/KimCABS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/islped/WagnerLABR12,
author = {Kenneth Wagner and
Martin St. Laurent and
Robert C. Aitken and
Hugh Barrass and
Randall Robinson},
editor = {Naresh R. Shanbhag and
Massimo Poncino and
Pai H. Chou and
Ajith Amerasekera},
title = {Panel: going green across communications and storage systems: control
of power in non-mobile devices},
booktitle = {International Symposium on Low Power Electronics and Design, ISLPED'12,
Redondo Beach, CA, {USA} - July 30 - August 01, 2012},
pages = {121--122},
publisher = {{ACM}},
year = {2012},
url = {https://doi.org/10.1145/2333660.2333691},
doi = {10.1145/2333660.2333691},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/islped/WagnerLABR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/ChandraA11,
author = {Vikas Chandra and
Robert C. Aitken},
title = {On the impact of gate oxide degradation on {SRAM} dynamic and static
write-ability},
booktitle = {Proceedings of the 16th Asia South Pacific Design Automation Conference,
{ASP-DAC} 2011, Yokohama, Japan, January 25-27, 2011},
pages = {707--712},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/ASPDAC.2011.5722278},
doi = {10.1109/ASPDAC.2011.5722278},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/aspdac/ChandraA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/NalamCAC11,
author = {Satyanand Nalam and
Vikas Chandra and
Robert C. Aitken and
Benton H. Calhoun},
title = {Dynamic write limited minimum operating voltage for nanoscale SRAMs},
booktitle = {Design, Automation and Test in Europe, {DATE} 2011, Grenoble, France,
March 14-18, 2011},
pages = {467--472},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/DATE.2011.5763081},
doi = {10.1109/DATE.2011.5763081},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/NalamCAC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/AitkenYF11,
author = {Rob Aitken and
Greg Yeric and
David Flynn},
title = {Correlating models and silicon for improved parametric yield},
booktitle = {Design, Automation and Test in Europe, {DATE} 2011, Grenoble, France,
March 14-18, 2011},
pages = {1159--1163},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/DATE.2011.5763194},
doi = {10.1109/DATE.2011.5763194},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/AitkenYF11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ChandraA11,
author = {Vikas Chandra and
Robert C. Aitken},
title = {Analytical model for {SRAM} dynamic write-ability degradation due
to gate oxide breakdown},
booktitle = {Design, Automation and Test in Europe, {DATE} 2011, Grenoble, France,
March 14-18, 2011},
pages = {1172--1175},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/DATE.2011.5763306},
doi = {10.1109/DATE.2011.5763306},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/ChandraA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/islped/KimCABS11,
author = {Daeyeon Kim and
Vikas Chandra and
Robert C. Aitken and
David T. Blaauw and
Dennis Sylvester},
editor = {Naehyuck Chang and
Hiroshi Nakamura and
Koji Inoue and
Kenichi Osada and
Massimo Poncino},
title = {Variation-aware static and dynamic writability analysis for voltage-scaled
bit-interleaved 8-T SRAMs},
booktitle = {Proceedings of the 2011 International Symposium on Low Power Electronics
and Design, 2011, Fukuoka, Japan, August 1-3, 2011},
pages = {145--150},
publisher = {{IEEE/ACM}},
year = {2011},
url = {http://portal.acm.org/citation.cfm?id=2016841\&\#38;CFID=34981777\&\#38;CFTOKEN=25607807},
timestamp = {Tue, 31 Jul 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/islped/KimCABS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@incollection{DBLP:books/sp/hubner2011/AitkenFG11,
author = {Rob Aitken and
Kriszti{\'{a}}n Flautner and
John Goodacre},
editor = {Michael H{\"{u}}bner and
J{\"{u}}rgen Becker},
title = {High-Performance Multiprocessor System on Chip: Trends in Chip Architecture
for the Mass Market},
booktitle = {Multiprocessor System-on-Chip - Hardware Design and Tool Integration},
pages = {223--239},
publisher = {Springer},
year = {2011},
url = {https://doi.org/10.1007/978-1-4419-6460-1\_10},
doi = {10.1007/978-1-4419-6460-1\_10},
timestamp = {Wed, 28 Apr 2021 16:06:52 +0200},
biburl = {https://dblp.org/rec/books/sp/hubner2011/AitkenFG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Aitken10,
author = {Rob Aitken},
title = {Time to retire our benchmarks},
journal = {{IEEE} Des. Test Comput.},
volume = {27},
number = {3},
pages = {88},
year = {2010},
url = {https://doi.org/10.1109/MDT.2010.73},
doi = {10.1109/MDT.2010.73},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/Aitken10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/GoodenoughA10,
author = {John Goodenough and
Rob Aitken},
editor = {Sachin S. Sapatnekar},
title = {Post-silicon is too late avoiding the {\textdollar}50 million paperweight
starts with validated designs},
booktitle = {Proceedings of the 47th Design Automation Conference, {DAC} 2010,
Anaheim, California, USA, July 13-18, 2010},
pages = {8--11},
publisher = {{ACM}},
year = {2010},
url = {https://doi.org/10.1145/1837274.1837279},
doi = {10.1145/1837274.1837279},
timestamp = {Wed, 09 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dac/GoodenoughA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/NSRKALPST10,
author = {Nagaraj Ns and
Juan C. Rey and
Jamil Kawa and
Robert C. Aitken and
Christian L{\"{u}}tkemeyer and
Vijay Pitchumani and
Andrzej J. Strojwas and
Steve Trimberger},
editor = {Sachin S. Sapatnekar},
title = {Who solves the variability problem?},
booktitle = {Proceedings of the 47th Design Automation Conference, {DAC} 2010,
Anaheim, California, USA, July 13-18, 2010},
pages = {218--219},
publisher = {{ACM}},
year = {2010},
url = {https://doi.org/10.1145/1837274.1837328},
doi = {10.1145/1837274.1837328},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/NSRKALPST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ChandraPA10,
author = {Vikas Chandra and
Cezary Pietrzyk and
Robert C. Aitken},
editor = {Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller and
Enrico Macii},
title = {On the efficacy of write-assist techniques in low voltage nanoscale
SRAMs},
booktitle = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany,
March 8-12, 2010},
pages = {345--350},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DATE.2010.5457179},
doi = {10.1109/DATE.2010.5457179},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/ChandraPA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ChoudhuryCMA10,
author = {Mihir R. Choudhury and
Vikas Chandra and
Kartik Mohanram and
Robert C. Aitken},
editor = {Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller and
Enrico Macii},
title = {Analytical model for TDDB-based performance degradation in combinational
logic},
booktitle = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany,
March 8-12, 2010},
pages = {423--428},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DATE.2010.5457168},
doi = {10.1109/DATE.2010.5457168},
timestamp = {Tue, 23 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/ChoudhuryCMA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/WieckowskiSBCIPA10,
author = {Michael Wieckowski and
Dennis Sylvester and
David T. Blaauw and
Vikas Chandra and
Sachin Idgunji and
Cezary Pietrzyk and
Robert C. Aitken},
editor = {Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller and
Enrico Macii},
title = {A black box method for stability analysis of arbitrary {SRAM} cell
structures},
booktitle = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany,
March 8-12, 2010},
pages = {795--800},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DATE.2010.5456943},
doi = {10.1109/DATE.2010.5456943},
timestamp = {Tue, 31 Jul 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/WieckowskiSBCIPA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ChoudhuryCMA10a,
author = {Mihir R. Choudhury and
Vikas Chandra and
Kartik Mohanram and
Robert C. Aitken},
editor = {Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller and
Enrico Macii},
title = {{TIMBER:} Time borrowing and error relaying for online timing error
resilience},
booktitle = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany,
March 8-12, 2010},
pages = {1554--1559},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DATE.2010.5457058},
doi = {10.1109/DATE.2010.5457058},
timestamp = {Tue, 23 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/ChoudhuryCMA10a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/NalamCPAC10,
author = {Satyanand Nalam and
Vikas Chandra and
Cezary Pietrzyk and
Robert C. Aitken and
Benton H. Calhoun},
title = {Asymmetric 6T {SRAM} with two-phase write and split bitline differential
sensing for low voltage operation},
booktitle = {11th International Symposium on Quality of Electronic Design {(ISQED}
2010), 22-24 March 2010, San Jose, CA, {USA}},
pages = {139--146},
publisher = {{IEEE}},
year = {2010},
url = {https://doi.org/10.1109/ISQED.2010.5450400},
doi = {10.1109/ISQED.2010.5450400},
timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
biburl = {https://dblp.org/rec/conf/isqed/NalamCPAC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KhursheedZAAK10,
author = {S. Saqib Khursheed and
Shida Zhong and
Robert C. Aitken and
Bashir M. Al{-}Hashimi and
Sandip Kundu},
editor = {Ron Press and
Erik H. Volkerink},
title = {Modeling the impact of process variation on resistive bridge defects},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {295--304},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699230},
doi = {10.1109/TEST.2010.5699230},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KhursheedZAAK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/DasBBFA09,
author = {Shidhartha Das and
David T. Blaauw and
David M. Bull and
Kriszti{\'{a}}n Flautner and
Rob Aitken},
title = {Addressing design margins through error-tolerant circuits},
booktitle = {Proceedings of the 46th Design Automation Conference, {DAC} 2009,
San Francisco, CA, USA, July 26-31, 2009},
pages = {11--12},
publisher = {{ACM}},
year = {2009},
url = {https://doi.org/10.1145/1629911.1629917},
doi = {10.1145/1629911.1629917},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/DasBBFA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ChandraA09,
author = {Vikas Chandra and
Robert C. Aitken},
editor = {Luca Benini and
Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller},
title = {Impact of voltage scaling on nanoscale {SRAM} reliability},
booktitle = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
April 20-24, 2009},
pages = {387--392},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/DATE.2009.5090694},
doi = {10.1109/DATE.2009.5090694},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/ChandraA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ispd/Aitken09,
author = {Robert C. Aitken},
editor = {Gi{-}Joon Nam and
Prashant Saxena},
title = {The challenges of correlating silicon and models in high variability
{CMOS} processes},
booktitle = {Proceedings of the 2009 International Symposium on Physical Design,
{ISPD} 2009, San Diego, California, USA, March 29 - April 1, 2009},
pages = {181--182},
publisher = {{ACM}},
year = {2009},
url = {https://doi.org/10.1145/1514932.1514972},
doi = {10.1145/1514932.1514972},
timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
biburl = {https://dblp.org/rec/conf/ispd/Aitken09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/Aitken09,
author = {Robert C. Aitken},
title = {{DFX} and Productivity},
booktitle = {{VLSI} Design 2009: Improving Productivity through Higher Abstraction,
The 22nd International Conference on {VLSI} Design, New Delhi, India,
5-9 January 2009},
pages = {8},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VLSI.Design.2009.105},
doi = {10.1109/VLSI.DESIGN.2009.105},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/Aitken09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/AitkenM08,
author = {Rob Aitken and
Erik Jan Marinissen},
title = {Guest Editors' Introduction: Addressing the Challenges of Debug and
Diagnosis},
journal = {{IEEE} Des. Test Comput.},
volume = {25},
number = {3},
pages = {206--207},
year = {2008},
url = {https://doi.org/10.1109/MDT.2008.67},
doi = {10.1109/MDT.2008.67},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/AitkenM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ReyNKKAHCS08,
author = {Juan C. Rey and
N. S. Nagaraj and
Andrew B. Kahng and
Fabian Klass and
Rob Aitken and
Cliff Hou and
Luigi Capodieci and
Vivek Singh},
editor = {Limor Fix},
title = {{DFM} in practice: hit or hype?},
booktitle = {Proceedings of the 45th Design Automation Conference, {DAC} 2008,
Anaheim, CA, USA, June 8-13, 2008},
pages = {898--899},
publisher = {{ACM}},
year = {2008},
url = {https://doi.org/10.1145/1391469.1391696},
doi = {10.1145/1391469.1391696},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/ReyNKKAHCS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/TurnoyWALWKH08,
author = {S. Turnoy and
Peter Wintermayr and
Robert C. Aitken and
Rudy Lauwereins and
J. Tracy Weed and
V. Kiefer and
J. Hartmann},
editor = {Donatella Sciuto},
title = {Panel Session - Caution Ahead: The Road to Design and Manufacturing
at 32 and 22 nm},
booktitle = {Design, Automation and Test in Europe, {DATE} 2008, Munich, Germany,
March 10-14, 2008},
pages = {510},
publisher = {{ACM}},
year = {2008},
url = {https://doi.org/10.1109/DATE.2008.4484732},
doi = {10.1109/DATE.2008.4484732},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/TurnoyWALWKH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChandraA08,
author = {Vikas Chandra and
Robert C. Aitken},
editor = {Cristiana Bolchini and
Yong{-}Bin Kim and
Dimitris Gizopoulos and
Mohammad Tehranipoor},
title = {Impact of Technology and Voltage Scaling on the Soft Error Susceptibility
in Nanoscale {CMOS}},
booktitle = {23rd {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2008), 1-3 October 2008, Boston, MA, {USA}},
pages = {114--122},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/DFT.2008.50},
doi = {10.1109/DFT.2008.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ChandraA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/AitkenBMR08,
author = {Rob Aitken and
Jerry Bautista and
Wojciech Maly and
Jan M. Rabaey},
editor = {Sani R. Nassif and
Jaijeet S. Roychowdhury},
title = {More Moore: foolish, feasible, or fundamentally different?},
booktitle = {2008 International Conference on Computer-Aided Design, {ICCAD} 2008,
San Jose, CA, USA, November 10-13, 2008},
pages = {9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ICCAD.2008.4681540},
doi = {10.1109/ICCAD.2008.4681540},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/AitkenBMR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/Aitken08,
author = {Rob Aitken},
title = {Special Session 4: Reliability and Circuit Simulation},
booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008),
7-9 July 2008, Rhodes, Greece},
pages = {195--196},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/IOLTS.2008.69},
doi = {10.1109/IOLTS.2008.69},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/Aitken08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@book{DBLP:books/daglib/0029055,
author = {Michael Keating and
David Flynn and
Robert C. Aitken and
Alan Gibbons and
Kaijian Shi},
title = {Low Power Methodology Manual - for System-on-Chip Design},
publisher = {Springer},
year = {2007},
url = {https://doi.org/10.1007/978-0-387-71819-4},
doi = {10.1007/978-0-387-71819-4},
isbn = {978-0-387-71818-7},
timestamp = {Tue, 16 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/books/daglib/0029055.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/GizopoulosAK07,
author = {Dimitris Gizopoulos and
Robert C. Aitken and
Sandip Kundu},
title = {Guest Editorial: Special Section on "Autonomous Silicon Validation
and Testing of Microprocessors and Microprocessor-Based Systems"},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {15},
number = {5},
pages = {493--494},
year = {2007},
url = {https://doi.org/10.1109/TVLSI.2007.896903},
doi = {10.1109/TVLSI.2007.896903},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/GizopoulosAK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/UzzamanMAAJGO07,
author = {Anis Uzzaman and
Fidel Muradali and
Takashi Aikyo and
Robert C. Aitken and
Tom Jackson and
Rajesh Galivanche and
Takeshi Onodera},
title = {Test Roles in Diagnosis and Silicon Debug},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {367},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.112},
doi = {10.1109/ATS.2007.112},
timestamp = {Wed, 09 Nov 2022 21:30:34 +0100},
biburl = {https://dblp.org/rec/conf/ats/UzzamanMAAJGO07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/Casale-RossiSADGMPS07,
author = {Marco Casale{-}Rossi and
Andrzej J. Strojwas and
Robert C. Aitken and
Antun Domic and
Carlo Guardiani and
Philippe Magarshack and
Douglas Pattullo and
Joseph Sawicki},
editor = {Rudy Lauwereins and
Jan Madsen},
title = {{DFM/DFY:} should you trust the surgeon or the family doctor?},
booktitle = {2007 Design, Automation and Test in Europe Conference and Exposition,
{DATE} 2007, Nice, France, April 16-20, 2007},
pages = {439--442},
publisher = {{EDA} Consortium, San Jose, CA, {USA}},
year = {2007},
url = {https://doi.org/10.1109/DATE.2007.364631},
doi = {10.1109/DATE.2007.364631},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/Casale-RossiSADGMPS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/AitkenI07,
author = {Robert C. Aitken and
Sachin Idgunji},
editor = {Rudy Lauwereins and
Jan Madsen},
title = {Worst-case design and margin for embedded {SRAM}},
booktitle = {2007 Design, Automation and Test in Europe Conference and Exposition,
{DATE} 2007, Nice, France, April 16-20, 2007},
pages = {1289--1294},
publisher = {{EDA} Consortium, San Jose, CA, {USA}},
year = {2007},
url = {https://dl.acm.org/citation.cfm?id=1266648},
timestamp = {Wed, 28 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/AitkenI07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/Aitken07,
author = {Robert C. Aitken},
title = {Defect or Variation? Characterizing Standard Cell Behavior at 90nm
and below},
booktitle = {8th International Symposium on Quality of Electronic Design {(ISQED}
2007), 26-28 March 2007, San Jose, CA, {USA}},
pages = {693--698},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/ISQED.2007.54},
doi = {10.1109/ISQED.2007.54},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/Aitken07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/MaciiPFADZ06,
author = {Enrico Macii and
Massoud Pedram and
Dirk Friebel and
Robert C. Aitken and
Antun Domic and
Roberto Zafalon},
editor = {Georges G. E. Gielen},
title = {Low-power design tools: are {EDA} vendors taking this matter seriously?},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2006, Munich, Germany, March 6-10, 2006},
pages = {1227},
publisher = {European Design and Automation Association, Leuven, Belgium},
year = {2006},
url = {https://doi.org/10.1109/DATE.2006.244075},
doi = {10.1109/DATE.2006.244075},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/MaciiPFADZ06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/Aitken06,
author = {Robert C. Aitken},
title = {Reliability Issues for Embedded {SRAM} at 90nm and Below},
booktitle = {12th {IEEE} International On-Line Testing Symposium {(IOLTS} 2006),
10-12 July 2006, Como, Italy},
pages = {75},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/IOLTS.2006.54},
doi = {10.1109/IOLTS.2006.54},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/Aitken06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/Aitken06,
author = {Robert C. Aitken},
title = {{DFM} Metrics for Standard Cells},
booktitle = {7th International Symposium on Quality of Electronic Design {(ISQED}
2006), 27-29 March 2006, San Jose, CA, {USA}},
pages = {491--496},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/ISQED.2006.50},
doi = {10.1109/ISQED.2006.50},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/Aitken06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aitken06,
author = {Robert C. Aitken},
editor = {Scott Davidson and
Anne Gattiker},
title = {The Design and Validation of {IP} for {DFM/DFY} Assurance},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297742},
doi = {10.1109/TEST.2006.297742},
timestamp = {Tue, 12 Dec 2023 09:46:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/Aitken06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Aitken05,
author = {Robert C. Aitken},
title = {{ITC} is Cool},
journal = {{IEEE} Des. Test Comput.},
volume = {22},
number = {6},
pages = {616},
year = {2005},
url = {https://doi.org/10.1109/MDT.2005.146},
doi = {10.1109/MDT.2005.146},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/Aitken05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/RobertsA05,
author = {Gordon W. Roberts and
Robert C. Aitken},
title = {Noise and reliability containment approaches},
booktitle = {Proceedings of the {IEEE} 2005 Custom Integrated Circuits Conference,
{CICC} 2005, DoubleTree Hotel, San Jose, California, USA, September
18-21, 2005},
pages = {20--21},
publisher = {{IEEE}},
year = {2005},
url = {https://doi.org/10.1109/CICC.2005.1568598},
doi = {10.1109/CICC.2005.1568598},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/cicc/RobertsA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/ZachariahA05,
author = {Mike Zachariah and
Robert C. Aitken},
title = {{ESD} implementation strategies},
booktitle = {Proceedings of the {IEEE} 2005 Custom Integrated Circuits Conference,
{CICC} 2005, DoubleTree Hotel, San Jose, California, USA, September
18-21, 2005},
pages = {474--475},
publisher = {{IEEE}},
year = {2005},
url = {https://doi.org/10.1109/CICC.2005.1568711},
doi = {10.1109/CICC.2005.1568711},
timestamp = {Wed, 17 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/cicc/ZachariahA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/AitkenH05,
author = {Robert C. Aitken and
Betina Hold},
title = {Modeling Soft-Error Susceptibility for {IP} Blocks},
booktitle = {11th {IEEE} International On-Line Testing Symposium {(IOLTS} 2005),
6-8 July 2005, Saint Raphael, France},
pages = {70--73},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/IOLTS.2005.44},
doi = {10.1109/IOLTS.2005.44},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/AitkenH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/AitkenEMKW04,
author = {Rob Aitken and
Stefan Eichenberger and
Gary Maier and
Sandip Kundu and
Hank Walker},
title = {{ITC} 2003 Roundtable: Design for Manufacturability},
journal = {{IEEE} Des. Test Comput.},
volume = {21},
number = {2},
pages = {144--156},
year = {2004},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/AitkenEMKW04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/StolicnyKPHA04,
author = {Carol Stolicny and
Tapio Koivukangas and
Rubin A. Parekhji and
Ian G. Harris and
Rob Aitken},
title = {{ITC} 2003 panels: Part 1},
journal = {{IEEE} Des. Test Comput.},
volume = {21},
number = {2},
pages = {160--163},
year = {2004},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/StolicnyKPHA04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Aitken04,
author = {Rob Aitken},
title = {Test at Gbps: Megaproblem or micromanagement?},
journal = {{IEEE} Des. Test Comput.},
volume = {21},
number = {4},
pages = {344},
year = {2004},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/Aitken04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/AitkenM04,
author = {Robert C. Aitken and
Fidel Muradali},
title = {From Working Design Flow to Working Chips: Dependencies and Impacts
of Methodology Decisions},
booktitle = {2004 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2004), 16-20 February 2004, Paris, France},
pages = {2},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/DATE.2004.1269149},
doi = {10.1109/DATE.2004.1269149},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/AitkenM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aitken04,
author = {Robert C. Aitken},
title = {A Modular Wrapper Enabling High Speed {BIST} and Repair for Small
Wide Memories},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {997--1005},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387365},
doi = {10.1109/TEST.2004.1387365},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Aitken04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mtdt/Aitken04,
author = {Robert C. Aitken},
title = {Redundancy {\&} It's Not Just for Defects Anymore},
booktitle = {12th {IEEE} International Workshop on Memory Technology, Design, and
Testing {(MTDT} 2004), 9-10 August 2004, San Jose, CA, {USA}},
pages = {117--120},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.ieeecomputersociety.org/10.1109/MTDT.2004.19},
doi = {10.1109/MTDT.2004.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/mtdt/Aitken04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/cm/GizopoulosA03,
author = {Dimitris Gizopoulos and
Robert C. Aitken},
title = {Guest editorial - testing and verification of communication system-on-chip
devices},
journal = {{IEEE} Commun. Mag.},
volume = {41},
number = {9},
pages = {72--73},
year = {2003},
url = {https://doi.org/10.1109/MCOM.2003.1232239},
doi = {10.1109/MCOM.2003.1232239},
timestamp = {Tue, 25 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/cm/GizopoulosA03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/AitkenR03,
author = {Robert C. Aitken and
Gordon W. Roberts},
title = {{ITC} 2003: Breaking Test Interface Bottlenecks},
journal = {{IEEE} Des. Test Comput.},
volume = {20},
number = {5},
pages = {54},
year = {2003},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/AitkenR03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/RobertsA03,
author = {Gordon W. Roberts and
Robert C. Aitken},
title = {{ITC} Highlights},
journal = {{IEEE} Des. Test Comput.},
volume = {20},
number = {5},
pages = {55--57},
year = {2003},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/RobertsA03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/AitkenDGB03,
author = {Rob Aitken and
Neeraj Dogra and
Dhrumil Gandhi and
Scott Becker},
title = {Redundancy, Repair, and Test Features of a 90nm Embedded {SRAM} Generator},
booktitle = {18th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2003), 3-5 November 2003, Boston, MA, USA,
Proceedings},
pages = {467--474},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/DFTVS.2003.1250145},
doi = {10.1109/DFTVS.2003.1250145},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/AitkenDGB03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aitken03,
author = {Robert C. Aitken},
title = {{DFM:} The Real 90nm Hurdle},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {1313},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.ieeecomputersociety.org/10.1109/ITC.2003.10013},
doi = {10.1109/ITC.2003.10013},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Aitken03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aitken03a,
author = {Robert C. Aitken},
title = {Silicon {IP} And Successful {DFM}},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {1314},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/TEST.2003.1271154},
doi = {10.1109/TEST.2003.1271154},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Aitken03a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mtdt/Aitken03,
author = {Robert C. Aitken},
title = {Applying Defect-Based Test to Embedded Memories in a {COT} Model},
booktitle = {11th {IEEE} International Workshop on Memory Technology, Design, and
Testing {(MTDT} 2003), 28-29 July 2003, San Jose, CA, {USA}},
pages = {72},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/MTDT.2003.1222364},
doi = {10.1109/MTDT.2003.1222364},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/mtdt/Aitken03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/AitkenW02,
author = {Robert C. Aitken and
Donald L. Wheater},
title = {Guest Editors' Introduction: Stressing the Fundamentals},
journal = {{IEEE} Des. Test Comput.},
volume = {19},
number = {5},
pages = {54--55},
year = {2002},
url = {https://doi.org/10.1109/MDT.2002.1033792},
doi = {10.1109/MDT.2002.1033792},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/AitkenW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/Aitken02,
author = {Robert C. Aitken},
title = {Test Generation and Fault Modeling for Stress Testing (invited)},
booktitle = {3rd International Symposium on Quality of Electronic Design, {ISQED}
2002, San Jose, CA, USA, March 18-21, 2002},
pages = {95--99},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/ISQED.2002.996704},
doi = {10.1109/ISQED.2002.996704},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/Aitken02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AitkenSDECM02,
author = {Robert C. Aitken and
Mustapha Slamani and
H. Ding and
William R. Eisenstadt and
Sanghoon Choi and
John McLaughlin},
title = {Wireless Test},
booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
pages = {173--174},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.2002.10011},
doi = {10.1109/VTS.2002.10011},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AitkenSDECM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SegalSAEGMSV02,
author = {Julie Segal and
Rene Segers and
Rob Aitken and
S. Eichenberge and
A. Gattike and
M. Millegen and
R. Seger and
S. Venkataraman},
title = {Test as a Key Enabler for Faster Yield Ramp-Up},
booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
pages = {177--180},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/VTS.2002.1011135},
doi = {10.1109/VTS.2002.1011135},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SegalSAEGMSV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellOADJQW00,
author = {Peter C. Maxwell and
Pete O'Neill and
Robert C. Aitken and
Ronald Dudley and
Neal Jaarsma and
Minh Quach and
Don Wiseman},
title = {Current ratios: a self-scaling technique for production {IDDQ} testing},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {1148--1156},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894324},
doi = {10.1109/TEST.2000.894324},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellOADJQW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computer/Aitken99,
author = {Robert C. Aitken},
title = {Nanometer Technology Effects on Fault Models for {IC} Testing},
journal = {Computer},
volume = {32},
number = {11},
pages = {46--51},
year = {1999},
url = {https://doi.org/10.1109/2.803640},
doi = {10.1109/2.803640},
timestamp = {Wed, 12 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computer/Aitken99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AitkenM99,
author = {Robert C. Aitken and
Fidel Muradali},
title = {Trends in {SLI} design and their effect on test},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {628--637},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805787},
doi = {10.1109/TEST.1999.805787},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AitkenM99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellOADJQW99,
author = {Peter C. Maxwell and
Pete O'Neill and
Robert C. Aitken and
Ronald Dudley and
Neal Jaarsma and
Minh Quach and
Don Wiseman},
title = {Current ratios: a self-scaling technique for production I{\_}DDQ testing},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {738--746},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805803},
doi = {10.1109/TEST.1999.805803},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellOADJQW99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aitken99,
author = {Robert C. Aitken},
title = {It Makes Sense to Combine {DFT} and {DFR/DFY}},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {1143},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805874},
doi = {10.1109/TEST.1999.805874},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Aitken99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Aitken99,
author = {Robert C. Aitken},
title = {Extending the Pseudo-Stuck-At Fault Model to Provide Complete {IDDQ}
Coverage},
booktitle = {17th {IEEE} {VLSI} Test Symposium {(VTS} '99), 25-30 April 1999, San
Diego, CA, {USA}},
pages = {128--134},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/VTEST.1999.766656},
doi = {10.1109/VTEST.1999.766656},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Aitken99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/AitkenCHSW98,
author = {Robert C. Aitken and
Jason Cong and
Randy Harr and
Kenneth L. Shepard and
Wayne H. Wolf},
editor = {Hiroto Yasuura},
title = {How will {CAD} handle billion-transistor systems? (panel)},
booktitle = {Proceedings of the 1998 {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 1998, San Jose, CA, USA, November 8-12, 1998},
pages = {5},
publisher = {{ACM} / {IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1145/288548.288552},
doi = {10.1145/288548.288552},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/AitkenCHSW98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aitken98,
author = {Robert C. Aitken},
title = {On-chip versus off-chip test: an artificial dichotomy},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {1146},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743346},
doi = {10.1109/TEST.1998.743346},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Aitken98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Aitken97,
author = {Robert C. Aitken},
title = {Modeling the Unmodelable: Algorithmic Fault Diagnosis},
journal = {{IEEE} Des. Test Comput.},
volume = {14},
number = {3},
pages = {98--103},
year = {1997},
url = {https://doi.org/10.1109/54.606006},
doi = {10.1109/54.606006},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/Aitken97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NighNBMAM97,
author = {Phil Nigh and
Wayne M. Needham and
Kenneth M. Butler and
Peter C. Maxwell and
Robert C. Aitken and
Wojciech Maly},
title = {So What Is an Optimal Test Mix? {A} Discussion of the {SEMATECH} Methods
Experiment},
booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
DC, USA, November 3-5, 1997},
pages = {1037--1038},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/TEST.1997.639727},
doi = {10.1109/TEST.1997.639727},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NighNBMAM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AgrawalABFKWZ97,
author = {Vishwani D. Agrawal and
Robert C. Aitken and
J. Braden and
Joan Figueras and
S. Kumar and
Hans{-}Joachim Wunderlich and
Yervant Zorian},
title = {Power Dissipation During Testing: Should We Worry About it?},
booktitle = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
Monterey, California, {USA}},
pages = {456--457},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.1997.10012},
doi = {10.1109/VTS.1997.10012},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AgrawalABFKWZ97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AitkenBGMN97,
author = {Phil Nigh and
Wayne M. Needham and
Kenneth M. Butler and
Peter C. Maxwell and
Robert C. Aitken},
title = {An experimental study comparing the relative effectiveness of functional,
scan, IDDq and delay-fault testing},
booktitle = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
Monterey, California, {USA}},
pages = {459},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/VTEST.1997.600334},
doi = {10.1109/VTEST.1997.600334},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AitkenBGMN97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Aitken96,
author = {Robert C. Aitken},
title = {When tools cry wolf: Testability pitfalls of synthesized designs},
journal = {{IEEE} Des. Test Comput.},
volume = {13},
number = {4},
pages = {96},
year = {1996},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.1996.10020},
doi = {10.1109/MDT.1996.10020},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/Aitken96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellAKB96,
author = {Peter C. Maxwell and
Robert C. Aitken and
Kathleen R. Kollitz and
Allen C. Brown},
title = {I\({}_{\mbox{DDQ}}\) and {AC} Scan: The War Against Unmodelled Defects},
booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
Validity, Washington, DC, USA, October 20-25, 1996},
pages = {250--258},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/TEST.1996.556969},
doi = {10.1109/TEST.1996.556969},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellAKB96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aitken96,
author = {Robert C. Aitken},
title = {Modelling the Unmodellable: Algorithmic Fault Diagnosis},
booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
Validity, Washington, DC, USA, October 20-25, 1996},
pages = {931},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/TEST.1996.557161},
doi = {10.1109/TEST.1996.557161},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Aitken96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AitkenHMNS96,
author = {Robert C. Aitken and
J. Hutcheson and
N. Murthy and
Phil Nigh and
Nicholas Sporck},
title = {Volume Manufacturing - ICs and Boards: {DFT} to the Rescue?},
booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
Princeton, NJ, {USA}},
pages = {212--213},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.1996.10003},
doi = {10.1109/VTS.1996.10003},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AitkenHMNS96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Aitken95,
author = {Robert C. Aitken},
title = {An Overview of Test Synthesis Tools},
journal = {{IEEE} Des. Test Comput.},
volume = {12},
number = {2},
pages = {8--15},
year = {1995},
url = {https://doi.org/10.1109/54.386000},
doi = {10.1109/54.386000},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/Aitken95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aitken95,
author = {Robert C. Aitken},
title = {Finding Defects with Fault Models},
booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down
the Cost of Test, Washington, DC, USA, October 21-25, 1995},
pages = {498--505},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/TEST.1995.529877},
doi = {10.1109/TEST.1995.529877},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Aitken95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellAH94,
author = {Peter C. Maxwell and
Robert C. Aitken and
Leendert M. Huisman},
title = {The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability},
booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
Next 25 Years, Washington, DC, USA, October 2-6, 1994},
pages = {739--746},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/TEST.1994.528020},
doi = {10.1109/TEST.1994.528020},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellAH94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MaxwellA93,
author = {Peter C. Maxwell and
Robert C. Aitken},
title = {Test Sets and Reject Rates: All Fault Coverages are Not Created Equal},
journal = {{IEEE} Des. Test Comput.},
volume = {10},
number = {1},
pages = {42--51},
year = {1993},
url = {https://doi.org/10.1109/54.199804},
doi = {10.1109/54.199804},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/MaxwellA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellA93,
author = {Peter C. Maxwell and
Robert C. Aitken},
title = {Biased Voting: {A} Method for Simulating {CMOS} Bridging Faults in
the Presence of Variable Gate Logic},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {63--72},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470717},
doi = {10.1109/TEST.1993.470717},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aitken93,
author = {Robert C. Aitken},
title = {{BP-1992} {A} Comparison of Defect Models for Fault Location with
I\({}_{\mbox{DDQ}}\) Measurements},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {1051--1060},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470593},
doi = {10.1109/TEST.1993.470593},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Aitken93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MaxwellA92,
author = {Peter C. Maxwell and
Robert C. Aitken},
title = {{IDDQ} testing as a component of a test suite: The need for several
fault coverage metrics},
journal = {J. Electron. Test.},
volume = {3},
number = {4},
pages = {305--316},
year = {1992},
url = {https://doi.org/10.1007/BF00135334},
doi = {10.1007/BF00135334},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MaxwellA92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Aitken92,
author = {Robert C. Aitken},
title = {Diagnosis of leakage faults with {IDDQ}},
journal = {J. Electron. Test.},
volume = {3},
number = {4},
pages = {367--375},
year = {1992},
url = {https://doi.org/10.1007/BF00135340},
doi = {10.1007/BF00135340},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Aitken92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/XavierAIA92,
author = {Dhiren Xavier and
Robert C. Aitken and
Andr{\'{e}} Ivanov and
Vinod K. Agarwal},
title = {Using an asymmetric error model to study aliasing in signature analysis
registers},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {11},
number = {1},
pages = {16--25},
year = {1992},
url = {https://doi.org/10.1109/43.108615},
doi = {10.1109/43.108615},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/XavierAIA92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellAJC92,
author = {Peter C. Maxwell and
Robert C. Aitken and
Vic Johansen and
Inshen Chiang},
title = {The Effectiveness of I\({}_{\mbox{DDQ}}\), Functional and Scan Tests:
How Many Fault Coverages Do We Need?},
booktitle = {Proceedings {IEEE} International Test Conference 1992, Discover the
New World of Test and Design, Baltimore, Maryland, USA, September
20-24, 1992},
pages = {168--177},
publisher = {{IEEE} Computer Society},
year = {1992},
url = {https://doi.org/10.1109/TEST.1992.527817},
doi = {10.1109/TEST.1992.527817},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellAJC92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aitken92,
author = {Robert C. Aitken},
title = {A Comparison of Defect Models for Fault Location with I\({}_{\mbox{DDQ}}\)
Measurements},
booktitle = {Proceedings {IEEE} International Test Conference 1992, Discover the
New World of Test and Design, Baltimore, Maryland, USA, September
20-24, 1992},
pages = {778--787},
publisher = {{IEEE} Computer Society},
year = {1992},
url = {https://doi.org/10.1109/TEST.1992.527900},
doi = {10.1109/TEST.1992.527900},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Aitken92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellAJC91,
author = {Peter C. Maxwell and
Robert C. Aitken and
Vic Johansen and
Inshen Chiang},
title = {The Effect of Different Test Sets on Quality Level Prediction: When
is 80{\%} better than 90{\%}?},
booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
pages = {358--364},
publisher = {{IEEE} Computer Society},
year = {1991},
url = {https://doi.org/10.1109/TEST.1991.519695},
doi = {10.1109/TEST.1991.519695},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/MaxwellAJC91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aitken91,
author = {Robert C. Aitken},
title = {Fault Location with Current Monitoring},
booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
pages = {623--632},
publisher = {{IEEE} Computer Society},
year = {1991},
url = {https://doi.org/10.1109/TEST.1991.519726},
doi = {10.1109/TEST.1991.519726},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Aitken91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/AitkenA89,
author = {Robert C. Aitken and
Vinod K. Agarwal},
title = {A diagnosis method using pseudo-random vectors without intermediate
signatures},
booktitle = {1989 {IEEE} International Conference on Computer-Aided Design, {ICCAD}
1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical
Papers},
pages = {574--577},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/ICCAD.1989.77016},
doi = {10.1109/ICCAD.1989.77016},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/AitkenA89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XavierAIA89,
author = {Dhiren Xavier and
Robert C. Aitken and
Andr{\'{e}} Ivanov and
Vinod K. Agarwal},
title = {: Experiments on Aliasing in Signature Analysis Registers},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {344--354},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82318},
doi = {10.1109/TEST.1989.82318},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/XavierAIA89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/AitkenA88,
author = {Robert C. Aitken and
Vinod K. Agarwal},
title = {Aliasing probability of non-exhaustive randomized syndrome tests},
booktitle = {1988 {IEEE} International Conference on Computer-Aided Design, {ICCAD}
1988, Santa Clara, CA, USA, November 7-10, 1988. Digest of Technical
Papers},
pages = {232--235},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/ICCAD.1988.122500},
doi = {10.1109/ICCAD.1988.122500},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/AitkenA88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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