BibTeX records: Keith Baker

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@article{DBLP:journals/jms/KimWAEB17,
  author       = {Peggy Y. Kim and
                  Jonathan P. Wanderer and
                  David Allbritton and
                  Matthias Eikermann and
                  Keith Baker},
  title        = {Anesthesia Residents Preferentially Request Operating Room Case Assignments
                  with Complex Cases},
  journal      = {J. Medical Syst.},
  volume       = {41},
  number       = {4},
  pages        = {64:1--64:11},
  year         = {2017},
  url          = {https://doi.org/10.1007/s10916-017-0718-3},
  doi          = {10.1007/S10916-017-0718-3},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/jms/KimWAEB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ijkl/LundqvistBW11,
  author       = {Karsten {\O}ster Lundqvist and
                  Keith Baker and
                  Shirley Williams},
  title        = {Ontology supported competency system},
  journal      = {Int. J. Knowl. Learn.},
  volume       = {7},
  number       = {3/4},
  pages        = {197--219},
  year         = {2011},
  url          = {https://doi.org/10.1504/IJKL.2011.044539},
  doi          = {10.1504/IJKL.2011.044539},
  timestamp    = {Fri, 03 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ijkl/LundqvistBW11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieeemm/Baker07,
  author       = {Keith Baker},
  title        = {Torque Kills! Future Control of the Ambient Electromagnetic Spectrum},
  journal      = {{IEEE} Multim.},
  volume       = {14},
  number       = {1},
  pages        = {4--8},
  year         = {2007},
  url          = {https://doi.org/10.1109/MMUL.2007.21},
  doi          = {10.1109/MMUL.2007.21},
  timestamp    = {Fri, 13 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ieeemm/Baker07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieeemm/Baker06,
  author       = {Keith Baker},
  title        = {Intrusive Interactivity Is Not an Ambient Experience},
  journal      = {{IEEE} Multim.},
  volume       = {13},
  number       = {2},
  pages        = {4--7},
  year         = {2006},
  url          = {https://doi.org/10.1109/MMUL.2006.33},
  doi          = {10.1109/MMUL.2006.33},
  timestamp    = {Fri, 13 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ieeemm/Baker06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/hpdc/FosterGG04,
  author       = {Ian T. Foster and
                  Jerry Gieraltowski and
                  Scott Gose and
                  Natalia Maltsev and
                  Edward N. May and
                  Alex Rodriguez and
                  Dinanath Sulakhe and
                  A. Vaniachine and
                  Jim Shank and
                  Saul Youssef and
                  David Adams and
                  Richard Baker and
                  Wensheng Deng and
                  Jason Smith and
                  Dantong Yu and
                  Iosif Legrand and
                  Suresh Singh and
                  Conrad Steenberg and
                  Yang Xia and
                  M. Anzar Afaq and
                  Eileen Berman and
                  James Annis and
                  L. A. T. Bauerdick and
                  Michael Ernst and
                  Ian Fisk and
                  Lisa Giacchetti and
                  Gregory E. Graham and
                  Anne Heavey and
                  Joseph Kaiser and
                  Nickolai Kuropatkin and
                  Ruth Pordes and
                  Vijay Sekhri and
                  John Weigand and
                  Yujun Wu and
                  Keith Baker and
                  Lawrence Sorrillo and
                  John Huth and
                  Matthew Allen and
                  Leigh Grundhoefer and
                  John Hicks and
                  Fred Luehring and
                  Steve Peck and
                  Robert Quick and
                  Stephen C. Simms and
                  George Fekete and
                  Jan vandenBerg and
                  Kihyeon Cho and
                  Kihwan Kwon and
                  Dongchul Son and
                  Hyoungwoo Park and
                  Shane Canon and
                  Keith R. Jackson and
                  David E. Konerding and
                  Jason Lee and
                  Doug Olson and
                  Iwona Sakrejda and
                  Brian Tierney and
                  Mark Green and
                  Russ Miller and
                  James Letts and
                  Terrence Martin and
                  David Bury and
                  Catalin Dumitrescu and
                  Daniel Engh and
                  Robert W. Gardner and
                  Marco Mambelli and
                  Yuri Smirnov and
                  Jens{-}S. V{\"{o}}ckler and
                  Michael Wilde and
                  Yong Zhao and
                  Xin Zhao and
                  Paul Avery and
                  Richard Cavanaugh and
                  Bockjoo Kim and
                  Craig Prescott and
                  Jorge Luis Rodriguez and
                  Andrew Zahn and
                  Shawn McKee and
                  Christopher T. Jordan and
                  James E. Prewett and
                  Timothy L. Thomas and
                  Horst Severini and
                  Ben Clifford and
                  Ewa Deelman and
                  Larry Flon and
                  Carl Kesselman and
                  Gaurang Mehta and
                  Nosa Olomu and
                  Karan Vahi and
                  Kaushik De and
                  Patrick McGuigan and
                  Mark Sosebee and
                  Dan Bradley and
                  Peter Couvares and
                  Alan DeSmet and
                  Carey Kireyev and
                  Erik Paulson and
                  Alain Roy and
                  Scott Koranda and
                  Brian Moe and
                  Bobby Brown and
                  Paul Sheldon},
  title        = {The Grid2003 Production Grid: Principles and Practice},
  booktitle    = {13th International Symposium on High-Performance Distributed Computing
                  {(HPDC-13} 2004), 4-6 June 2004, Honolulu, Hawaii, {USA}},
  pages        = {236--245},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.ieeecomputersociety.org/10.1109/HPDC.2004.36},
  doi          = {10.1109/HPDC.2004.36},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/hpdc/FosterGG04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MooreGBL00,
  author       = {Will R. Moore and
                  Guido Gronthoud and
                  Keith Baker and
                  Maurice Lousberg},
  title        = {Delay-fault testing and defects in deep sub-micron ICs-does critical
                  resistance really mean anything?},
  booktitle    = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
                  NJ, USA, October 2000},
  pages        = {95--104},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/TEST.2000.894196},
  doi          = {10.1109/TEST.2000.894196},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MooreGBL00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Baker99,
  author       = {Keith Baker},
  title        = {{SIA} Roadmaps: Sunset Boulevard for l{\_}DDQ},
  booktitle    = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
                  NJ, USA, 27-30 September 1999},
  pages        = {1121},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/TEST.1999.805854},
  doi          = {10.1109/TEST.1999.805854},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Baker99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Baker98,
  author       = {Keith Baker},
  title        = {Spice up your life: simulate mixed-signal ICs!},
  booktitle    = {Proceedings {IEEE} International Test Conference 1998, Washington,
                  DC, USA, October 18-22, 1998},
  pages        = {1131},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/TEST.1998.743321},
  doi          = {10.1109/TEST.1998.743321},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Baker98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/BakerB97,
  author       = {Keith Baker and
                  Jos van Beers},
  title        = {Shmoo Plotting: The Black Art of {IC} Testing},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {14},
  number       = {3},
  pages        = {90--97},
  year         = {1997},
  url          = {https://doi.org/10.1109/54.606005},
  doi          = {10.1109/54.606005},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/BakerB97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/Baker96,
  author       = {Keith Baker},
  title        = {{IDDQ:} you heard the hype, but what's really coming?},
  booktitle    = {1996 European Design and Test Conference, ED{\&}TC 1996, Paris,
                  France, March 11-14, 1996},
  pages        = {116--119},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/EDTC.1996.494135},
  doi          = {10.1109/EDTC.1996.494135},
  timestamp    = {Fri, 20 May 2022 15:52:30 +0200},
  biburl       = {https://dblp.org/rec/conf/date/Baker96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BakerB96,
  author       = {Keith Baker and
                  Jos van Beers},
  title        = {Shmoo Plots - the Black Art of {IC} Test},
  booktitle    = {Proceedings {IEEE} International Test Conference 1996, Test and Design
                  Validity, Washington, DC, USA, October 20-25, 1996},
  pages        = {932--933},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/TEST.1996.557162},
  doi          = {10.1109/TEST.1996.557162},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BakerB96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/BakerH95,
  author       = {Keith Baker and
                  Alan Hales},
  title        = {Plug-and-Play {IDDQ} Testing for Test Fixtures},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {12},
  number       = {3},
  pages        = {53--61},
  year         = {1995},
  url          = {https://doi.org/10.1109/MDT.1995.466379},
  doi          = {10.1109/MDT.1995.466379},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/BakerH95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Baker95,
  author       = {Keith Baker},
  title        = {Stuck-at Faults, PPMs Rejects or? What doe the {SIA} Roadmaps Say?},
  booktitle    = {Proceedings {IEEE} International Test Conference 1995, Driving Down
                  the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  pages        = {299},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/TEST.1995.529851},
  doi          = {10.1109/TEST.1995.529851},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Baker95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BakerWBV95,
  author       = {Keith Baker and
                  T. F. Waayers and
                  F. G. M. Bouwman and
                  M. J. W. Verstraelen},
  title        = {Plug {\&} Play I\({}_{\mbox{DDQ}}\) Monitoring with {QTAG}},
  booktitle    = {Proceedings {IEEE} International Test Conference 1995, Driving Down
                  the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  pages        = {739--749},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/TEST.1995.529905},
  doi          = {10.1109/TEST.1995.529905},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BakerWBV95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Baker94,
  author       = {Keith Baker},
  title        = {{QTAG:} {A} Standard for Test Fixture Based I\({}_{\mbox{DDQ}}\)/I\({}_{\mbox{SSQ}}\)
                  Monitors},
  booktitle    = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
                  Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  pages        = {194--202},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  url          = {https://doi.org/10.1109/TEST.1994.527950},
  doi          = {10.1109/TEST.1994.527950},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Baker94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BakerBRW94,
  author       = {Keith Baker and
                  A. H. Bratt and
                  Andrew Richardson and
                  A. Welbers},
  title        = {Development of a {CLASS} 1 {QTAG} Monitor},
  booktitle    = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
                  Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  pages        = {213--222},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  url          = {https://doi.org/10.1109/TEST.1994.527952},
  doi          = {10.1109/TEST.1994.527952},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BakerBRW94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HarveyRBB94,
  author       = {R. J. A. Harvey and
                  Andrew Mark David Richardson and
                  Eric Bruls and
                  Keith Baker},
  title        = {Analogue Fault Simulation Based on Layout-Dependent Fault Models},
  booktitle    = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
                  Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  pages        = {641--649},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  url          = {https://doi.org/10.1109/TEST.1994.528009},
  doi          = {10.1109/TEST.1994.528009},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HarveyRBB94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BouwmanZHBK94,
  author       = {Frank Bouwman and
                  Taco Zwemstra and
                  Sonny Hartanto and
                  Keith Baker and
                  Jan Koopmans},
  title        = {Application of Joint Time-Frequency Analysis in Mixed-Signal Testing},
  booktitle    = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
                  Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  pages        = {747--756},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  url          = {https://doi.org/10.1109/TEST.1994.528021},
  doi          = {10.1109/TEST.1994.528021},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BouwmanZHBK94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RosmalenBBJ93,
  author       = {M. M. A. van Rosmalen and
                  Keith Baker and
                  Eric Bruls and
                  Jochen A. G. Jess},
  title        = {Parameter Monitoring: Advantages and Pitfalls},
  booktitle    = {Proceedings {IEEE} International Test Conference 1993, Designing,
                  Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
                  17-21, 1993},
  pages        = {115--124},
  publisher    = {{IEEE} Computer Society},
  year         = {1993},
  url          = {https://doi.org/10.1109/TEST.1993.470711},
  doi          = {10.1109/TEST.1993.470711},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/RosmalenBBJ93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Baker92,
  author       = {Keith Baker},
  title        = {Time-to-Market: An Issue in Mixed-signal vs. Analogue},
  booktitle    = {Proceedings {IEEE} International Test Conference 1992, Discover the
                  New World of Test and Design, Baltimore, Maryland, USA, September
                  20-24, 1992},
  pages        = {254},
  publisher    = {{IEEE} Computer Society},
  year         = {1992},
  url          = {https://doi.org/10.1109/TEST.1992.527828},
  doi          = {10.1109/TEST.1992.527828},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Baker92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VerhelstMB92,
  author       = {Bas Verhelst and
                  Richard Morren and
                  Keith Baker},
  title        = {Using {EDIF} for Transfer of Test Data: Practical Experience},
  booktitle    = {Proceedings {IEEE} International Test Conference 1992, Discover the
                  New World of Test and Design, Baltimore, Maryland, USA, September
                  20-24, 1992},
  pages        = {459--465},
  publisher    = {{IEEE} Computer Society},
  year         = {1992},
  url          = {https://doi.org/10.1109/TEST.1992.527857},
  doi          = {10.1109/TEST.1992.527857},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/VerhelstMB92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MehtaniJMB92,
  author       = {R. Mehtani and
                  M. De Jonghe and
                  Richard Morren and
                  Keith Baker},
  title        = {Improving Total {IC} Design Quality Using Application Mode Testing},
  booktitle    = {Proceedings {IEEE} International Test Conference 1992, Discover the
                  New World of Test and Design, Baltimore, Maryland, USA, September
                  20-24, 1992},
  pages        = {866--872},
  publisher    = {{IEEE} Computer Society},
  year         = {1992},
  url          = {https://doi.org/10.1109/TEST.1992.527912},
  doi          = {10.1109/TEST.1992.527912},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MehtaniJMB92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ivc/CrennellB90,
  author       = {Kate Crennell and
                  Keith Baker},
  title        = {5th Alvey vision Conference},
  journal      = {Image Vis. Comput.},
  volume       = {8},
  number       = {1},
  pages        = {2--3},
  year         = {1990},
  url          = {https://doi.org/10.1016/0262-8856(90)90048-A},
  doi          = {10.1016/0262-8856(90)90048-A},
  timestamp    = {Thu, 20 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ivc/CrennellB90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BakerV90,
  author       = {Keith Baker and
                  Bas Verhelst},
  title        = {I\({}_{\mbox{DDQ}}\) testing because 'zero defects isn't enough':
                  a Philips perspective},
  booktitle    = {Proceedings {IEEE} International Test Conference 1990, Washington,
                  D.C., USA, September 10-14, 1990},
  pages        = {253--254},
  publisher    = {{IEEE} Computer Society},
  year         = {1990},
  url          = {https://doi.org/10.1109/TEST.1990.114025},
  doi          = {10.1109/TEST.1990.114025},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BakerV90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MehtaniBHHB90,
  author       = {R. Mehtani and
                  Keith Baker and
                  C. M. Huizer and
                  P. J. Hynes and
                  Jos van Beers},
  title        = {Macro-testability and the {VSP}},
  booktitle    = {Proceedings {IEEE} International Test Conference 1990, Washington,
                  D.C., USA, September 10-14, 1990},
  pages        = {739--748},
  publisher    = {{IEEE} Computer Society},
  year         = {1990},
  url          = {https://doi.org/10.1109/TEST.1990.114090},
  doi          = {10.1109/TEST.1990.114090},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MehtaniBHHB90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/JonesB87,
  author       = {N. A. Jones and
                  Keith Baker},
  title        = {Knowledge-based system tool for high-level {BIST} design},
  journal      = {Microprocess. Microsystems},
  volume       = {11},
  number       = {1},
  pages        = {35--40},
  year         = {1987},
  url          = {https://doi.org/10.1016/0141-9331(87)90327-9},
  doi          = {10.1016/0141-9331(87)90327-9},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mam/JonesB87.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/TanTBVP87,
  author       = {S. B. Tan and
                  K. Totton and
                  Keith Baker and
                  Prab Varma and
                  R. Porter},
  editor       = {A. O'Neill and
                  D. Thomas},
  title        = {A Fast Signature Simulation Tool for Built-In Self-Testing Circuits},
  booktitle    = {Proceedings of the 24th {ACM/IEEE} Design Automation Conference. Miami
                  Beach, FL, USA, June 28 - July 1, 1987},
  pages        = {17--25},
  publisher    = {{IEEE} Computer Society Press / {ACM}},
  year         = {1987},
  url          = {https://doi.org/10.1145/37888.37891},
  doi          = {10.1145/37888.37891},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/TanTBVP87.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JonesB86,
  author       = {N. A. Jones and
                  Keith Baker},
  title        = {An Intelligent Knowledge-Based System Tool for High-Level {BIST} Design},
  booktitle    = {Proceedings International Test Conference 1986, Washington, D.C.,
                  USA, September 1986},
  pages        = {743--749},
  publisher    = {{IEEE} Computer Society},
  year         = {1986},
  timestamp    = {Sun, 13 Sep 2015 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/JonesB86.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VarmaAB84,
  author       = {Prab Varma and
                  Anthony P. Ambler and
                  Keith Baker},
  title        = {An Analysis of the Economics of Self Test},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {20--30},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 13:40:15 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/VarmaAB84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/Baker80,
  author       = {Keith Baker},
  title        = {Specifying the system},
  journal      = {Microprocess. Microsystems},
  volume       = {4},
  number       = {7},
  pages        = {259--261},
  year         = {1980},
  url          = {https://doi.org/10.1016/0141-9331(80)90323-3},
  doi          = {10.1016/0141-9331(80)90323-3},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mam/Baker80.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/Baker79,
  author       = {Keith Baker},
  title        = {Microprocessor impact on commerce},
  journal      = {Microprocess. Microsystems},
  volume       = {3},
  number       = {2},
  pages        = {59--63},
  year         = {1979},
  url          = {https://doi.org/10.1016/0141-9331(79)90061-9},
  doi          = {10.1016/0141-9331(79)90061-9},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mam/Baker79.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/Baker79a,
  author       = {Keith Baker},
  title        = {Microprocessors and software design tools},
  journal      = {Microprocess. Microsystems},
  volume       = {3},
  number       = {2},
  pages        = {87--93},
  year         = {1979},
  url          = {https://doi.org/10.1016/0141-9331(79)90067-X},
  doi          = {10.1016/0141-9331(79)90067-X},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mam/Baker79a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/Baker77,
  author       = {Keith Baker},
  title        = {Improve complex software by using multiple microprocessors},
  journal      = {Microprocess.},
  volume       = {1},
  number       = {3},
  pages        = {165--168},
  year         = {1977},
  url          = {https://doi.org/10.1016/0308-5953(77)90118-0},
  doi          = {10.1016/0308-5953(77)90118-0},
  timestamp    = {Tue, 16 Aug 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mam/Baker77.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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