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BibTeX records: Frédéric Bancel
@article{DBLP:journals/et/HelyBFR07, author = {David H{\'{e}}ly and Fr{\'{e}}d{\'{e}}ric Bancel and Marie{-}Lise Flottes and Bruno Rouzeyre}, title = {Securing Scan Control in Crypto Chips}, journal = {J. Electron. Test.}, volume = {23}, number = {5}, pages = {457--464}, year = {2007}, url = {https://doi.org/10.1007/s10836-007-5000-z}, doi = {10.1007/S10836-007-5000-Z}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/HelyBFR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/FauraxTFB07, author = {Olivier Faurax and Assia Tria and Laurent Freund and Fr{\'{e}}d{\'{e}}ric Bancel}, title = {Robustness of circuits under delay-induced faults : test of {AES} with the {PAFI} tool}, booktitle = {13th {IEEE} International On-Line Testing Symposium {(IOLTS} 2007), 8-11 July 2007, Heraklion, Crete, Greece}, pages = {185--186}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/IOLTS.2007.57}, doi = {10.1109/IOLTS.2007.57}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/FauraxTFB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/HelyBFR06, author = {David H{\'{e}}ly and Fr{\'{e}}d{\'{e}}ric Bancel and Marie{-}Lise Flottes and Bruno Rouzeyre}, editor = {Georges G. E. Gielen}, title = {A secure scan design methodology}, booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe, {DATE} 2006, Munich, Germany, March 6-10, 2006}, pages = {1177--1178}, publisher = {European Design and Automation Association, Leuven, Belgium}, year = {2006}, url = {https://doi.org/10.1109/DATE.2006.244019}, doi = {10.1109/DATE.2006.244019}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/date/HelyBFR06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/HelyBFR06, author = {David H{\'{e}}ly and Fr{\'{e}}d{\'{e}}ric Bancel and Marie{-}Lise Flottes and Bruno Rouzeyre}, title = {Secure Scan Techniques: {A} Comparison}, booktitle = {12th {IEEE} International On-Line Testing Symposium {(IOLTS} 2006), 10-12 July 2006, Como, Italy}, pages = {119--124}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://doi.org/10.1109/IOLTS.2006.55}, doi = {10.1109/IOLTS.2006.55}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/HelyBFR06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ipps/ValetteTSB06, author = {Nicolas Valette and Lionel Torres and Gilles Sassatelli and Fr{\'{e}}d{\'{e}}ric Bancel}, title = {Securing embedded programmable gate arrays in secure circuits}, booktitle = {20th International Parallel and Distributed Processing Symposium {(IPDPS} 2006), Proceedings, 25-29 April 2006, Rhodes Island, Greece}, publisher = {{IEEE}}, year = {2006}, url = {https://doi.org/10.1109/IPDPS.2006.1639483}, doi = {10.1109/IPDPS.2006.1639483}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ipps/ValetteTSB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/HelyBFR06, author = {David H{\'{e}}ly and Fr{\'{e}}d{\'{e}}ric Bancel and Marie{-}Lise Flottes and Bruno Rouzeyre}, title = {Scan Pattern Watermarking}, booktitle = {7th Latin American Test Workshop, {LATW} 2006, Buenos Aires, Argentina, March 26-29, 2006}, pages = {63--67}, publisher = {{IEEE}}, year = {2006}, timestamp = {Thu, 27 Jul 2023 13:45:38 +0200}, biburl = {https://dblp.org/rec/conf/latw/HelyBFR06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/HelyBFR05, author = {David H{\'{e}}ly and Fr{\'{e}}d{\'{e}}ric Bancel and Marie{-}Lise Flottes and Bruno Rouzeyre}, title = {Test control for secure scan designs}, booktitle = {10th European Test Symposium, {ETS} 2005, Tallinn, Estonia, May 22-25, 2005}, pages = {190--195}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/ETS.2005.36}, doi = {10.1109/ETS.2005.36}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ets/HelyBFR05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/recosoc/ValetteTBB05, author = {Nicolas Valette and Lionel Torres and Fr{\'{e}}d{\'{e}}ric Bancel and Nicolas B{\'{e}}rard}, editor = {Gilles Sassatelli and Manfred Glesner and Lionel Torres and Leandro Soares Indrusiak and Thomas Hollstein}, title = {Integration of Reconfigurable Logic on Secure Circuits}, booktitle = {Proceedings of the 1st International Workshop on Reconfigurable Communication-centric Systems-on-Chip, ReCoSoC 2005, Montpellier, France, June 2005}, pages = {163--168}, publisher = {Univ. Montpellier {II}}, year = {2005}, timestamp = {Mon, 13 Nov 2006 14:44:44 +0100}, biburl = {https://dblp.org/rec/conf/recosoc/ValetteTBB05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/HelyFBRBR04, author = {David H{\'{e}}ly and Marie{-}Lise Flottes and Fr{\'{e}}d{\'{e}}ric Bancel and Bruno Rouzeyre and Nicolas B{\'{e}}rard and Michel Renovell}, title = {Scan Design and Secure Chip}, booktitle = {10th {IEEE} International On-Line Testing Symposium {(IOLTS} 2004), 12-14 July 2004, Funchal, Madeira Island, Portugal}, pages = {219--226}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.ieeecomputersociety.org/10.1109/IOLTS.2004.40}, doi = {10.1109/IOLTS.2004.40}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/HelyFBRBR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BertrandBR93, author = {Yves Bertrand and Fr{\'{e}}d{\'{e}}ric Bancel and Michel Renovell}, title = {Multiconfiguration Technique to Reduce Test Duration for Sequential Circuits}, booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993}, pages = {989--997}, publisher = {{IEEE} Computer Society}, year = {1993}, url = {https://doi.org/10.1109/TEST.1993.470600}, doi = {10.1109/TEST.1993.470600}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BertrandBR93.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vlsid/BertrandBR93, author = {Yves Bertrand and Fr{\'{e}}d{\'{e}}ric Bancel and Michel Renovell}, title = {A {DFT} Technique to Improve {ATPG} Efficiency for Sequential Circuits}, booktitle = {Proceedings of the Sixth International Conference on {VLSI} Design, {VLSI} Design 1993, Bombay, India, January 3-6, 1993}, pages = {51--54}, publisher = {{IEEE} Computer Society}, year = {1993}, url = {https://doi.org/10.1109/ICVD.1993.669637}, doi = {10.1109/ICVD.1993.669637}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vlsid/BertrandBR93.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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