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BibTeX records: Dawit Belete
@inproceedings{DBLP:conf/itc/TendolkarBSPGKCBTTA06, author = {Nandu Tendolkar and Dawit Belete and Bill Schwarz and Bob Podnar and Akshay Gupta and Steve Karako and Wu{-}Tung Cheng and Alex Babin and Kun{-}Han Tsai and Nagesh Tamarapalli and Greg Aldrich}, editor = {Scott Davidson and Anne Gattiker}, title = {Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis}, booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara, CA, USA, October 22-27, 2006}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://doi.org/10.1109/TEST.2006.297623}, doi = {10.1109/TEST.2006.297623}, timestamp = {Tue, 12 Dec 2023 09:46:27 +0100}, biburl = {https://dblp.org/rec/conf/itc/TendolkarBSPGKCBTTA06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TendolkarBRRSM05, author = {Nandu Tendolkar and Dawit Belete and Ashutosh Razdan and Hereman Reyes and Bill Schwarz and Marie Sullivan}, title = {Test methodology for Freescale's high performance e600 core based on PowerPC{\textcopyright} instruction set architecture}, booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005, Austin, TX, USA, November 8-10, 2005}, pages = {9}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/TEST.2005.1583968}, doi = {10.1109/TEST.2005.1583968}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/TendolkarBRRSM05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/PyronBBGRY02, author = {Carol Pyron and Rekha Bangalore and Dawit Belete and Jason Goertz and Ashutosh Razdan and Denise Younger}, title = {Silicon Symptoms to Solutions: Applying Design for Debug Techniques}, booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002}, pages = {664--672}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/TEST.2002.1041818}, doi = {10.1109/TEST.2002.1041818}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/PyronBBGRY02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BeleteRSRHM02, author = {Dawit Belete and Ashutosh Razdan and William Schwarz and Rajesh Raina and Christopher Hawkins and Jeff Morehead}, title = {Use of {DFT} Techniques In Speed Grading a 1GHz+ Microprocessor}, booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002}, pages = {1111--1119}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/TEST.2002.1041868}, doi = {10.1109/TEST.2002.1041868}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BeleteRSRHM02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/RainaBBKMPR00, author = {Rajesh Raina and Robert Bailey and Dawit Belete and Vikram Khosa and Robert F. Molyneaux and Javier Prado and Ashutosh Razdan}, title = {{DFT} advances in Motorola's Next-Generation 74xx PowerPC\({}^{\mbox{TM}}\) microprocessor}, booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City, NJ, USA, October 2000}, pages = {131--140}, publisher = {{IEEE} Computer Society}, year = {2000}, url = {https://doi.org/10.1109/TEST.2000.894200}, doi = {10.1109/TEST.2000.894200}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/RainaBBKMPR00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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