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ORCIDBibTeX records: R. D. (Shawn) Blanton
@article{DBLP:journals/corr/abs-2402-19376,
author = {Harideep Nair and
Prabhu Vellaisamy and
Tsung{-}Han Lin and
Perry H. Wang and
Ronald Shawn Blanton and
John Paul Shen},
title = {OzMAC: An Energy-Efficient Sparsity-Exploiting Multiply-Accumulate-Unit
Design for {DL} Inference},
journal = {CoRR},
volume = {abs/2402.19376},
year = {2024},
url = {https://doi.org/10.48550/arXiv.2402.19376},
doi = {10.48550/ARXIV.2402.19376},
eprinttype = {arXiv},
eprint = {2402.19376},
timestamp = {Tue, 26 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/corr/abs-2402-19376.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/FangHLDB23,
author = {Chenlei Fang and
Qicheng Huang and
Zeye Liu and
Ruizhou Ding and
Ronald D. Blanton},
title = {Efficient Test Chip Design via Smart Computation},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {28},
number = {2},
pages = {22:1--22:31},
year = {2023},
url = {https://doi.org/10.1145/3558393},
doi = {10.1145/3558393},
timestamp = {Wed, 17 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/todaes/FangHLDB23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/LiWMB23,
author = {Wei Li and
Fangzhou Wang and
Jos{\'{e}} M. F. Moura and
R. D. (Shawn) Blanton},
title = {Global Floorplanning via Semidefinite Programming},
booktitle = {60th {ACM/IEEE} Design Automation Conference, {DAC} 2023, San Francisco,
CA, USA, July 9-13, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DAC56929.2023.10247967},
doi = {10.1109/DAC56929.2023.10247967},
timestamp = {Sun, 24 Sep 2023 13:31:06 +0200},
biburl = {https://dblp.org/rec/conf/dac/LiWMB23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isvlsi/VellaisamyNFTCLLWBS23,
author = {Prabhu Vellaisamy and
Harideep Nair and
Joseph Finn and
Manav Trivedi and
Albert Chen and
Anna Li and
Tsung{-}Han Lin and
Perry H. Wang and
Ronald Shawn Blanton and
John Paul Shen},
title = {tubGEMM: Energy-Efficient and Sparsity-Effective Temporal-Unary-Binary
Based Matrix Multiply Unit},
booktitle = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2023, Foz
do Iguacu, Brazil, June 20-23, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ISVLSI59464.2023.10238524},
doi = {10.1109/ISVLSI59464.2023.10238524},
timestamp = {Wed, 13 Sep 2023 08:43:37 +0200},
biburl = {https://dblp.org/rec/conf/isvlsi/VellaisamyNFTCLLWBS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mlcad/LiPMB23,
author = {Wei Li and
Ruben Purdy and
Jos{\'{e}} M. F. Moura and
R. D. Shawn Blanton},
title = {Characterize the ability of GNNs in attacking logic locking},
booktitle = {5th {ACM/IEEE} Workshop on Machine Learning for CAD, {MLCAD} 2023,
Snowbird, UT, USA, September 10-13, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/MLCAD58807.2023.10299817},
doi = {10.1109/MLCAD58807.2023.10299817},
timestamp = {Wed, 15 Nov 2023 09:43:46 +0100},
biburl = {https://dblp.org/rec/conf/mlcad/LiPMB23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/host/PurdyDB22,
author = {Ruben Purdy and
Danielle Duvalsaint and
R. D. Shawn Blanton},
title = {Secuirty Metrics for Logic Circuits},
booktitle = {{IEEE} International Symposium on Hardware Oriented Security and Trust,
{HOST} 2022, McLean, VA, USA, June 27-30, 2022},
pages = {53--56},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/HOST54066.2022.9840239},
doi = {10.1109/HOST54066.2022.9840239},
timestamp = {Mon, 15 Aug 2022 15:04:52 +0200},
biburl = {https://dblp.org/rec/conf/host/PurdyDB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/PurdyB22,
author = {Ruben Purdy and
R. D. Shawn Blanton},
title = {Large-Scale Logic-Locking Attacks via Simulation},
booktitle = {23rd International Symposium on Quality Electronic Design, {ISQED}
2022, Santa Clara, CA, USA, April 6-7, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ISQED54688.2022.9806265},
doi = {10.1109/ISQED54688.2022.9806265},
timestamp = {Mon, 04 Jul 2022 17:06:19 +0200},
biburl = {https://dblp.org/rec/conf/isqed/PurdyB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiNDMB22,
author = {Wei Li and
Chris Nigh and
Danielle Duvalsaint and
Subhasish Mitra and
Ronald D. Blanton},
title = {{PEPR:} Pseudo-Exhaustive Physically-Aware Region Testing},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {314--323},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00083},
doi = {10.1109/ITC50671.2022.00083},
timestamp = {Thu, 05 Jan 2023 13:13:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiNDMB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/PagliariniSMBPM21,
author = {Samuel Pagliarini and
Joseph Sweeney and
Ken Mai and
R. D. Shawn Blanton and
Larry T. Pileggi and
Subhasish Mitra},
title = {Split-Chip Design to Prevent {IP} Reverse Engineering},
journal = {{IEEE} Des. Test},
volume = {38},
number = {4},
pages = {109--118},
year = {2021},
url = {https://doi.org/10.1109/MDAT.2020.3033255},
doi = {10.1109/MDAT.2020.3033255},
timestamp = {Thu, 16 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/PagliariniSMBPM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DuvalsaintB21,
author = {Danielle Duvalsaint and
R. D. Shawn Blanton},
title = {Characterizing Corruptibility of Logic Locks using {ATPG}},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {213--222},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00030},
doi = {10.1109/ITC50571.2021.00030},
timestamp = {Mon, 29 Nov 2021 13:19:22 +0100},
biburl = {https://dblp.org/rec/conf/itc/DuvalsaintB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NighBB21,
author = {Chris Nigh and
Gaurav Bhargava and
Ronald D. Blanton},
title = {{AAA:} Automated, On-ATE {AI} Debug of Scan Chain Failures},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {314--318},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00044},
doi = {10.1109/ITC50571.2021.00044},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NighBB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/FangHB21,
author = {Chenlei Fang and
Qicheng Huang and
R. D. Shawn Blanton},
title = {Memory-Efficient Adaptive Test Pattern Reordering for Accurate Diagnosis},
booktitle = {39th {IEEE} {VLSI} Test Symposium, {VTS} 2021, San Diego, CA, USA,
April 25-28, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/VTS50974.2021.9441003},
doi = {10.1109/VTS50974.2021.9441003},
timestamp = {Wed, 09 Jun 2021 08:59:55 +0200},
biburl = {https://dblp.org/rec/conf/vts/FangHB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jossw/SweeneyPBP20,
author = {Joseph Sweeney and
Ruben Purdy and
Ronald D. Blanton and
Lawrence T. Pileggi},
title = {CircuitGraph: {A} Python package for Boolean circuits},
journal = {J. Open Source Softw.},
volume = {5},
number = {55},
pages = {2646},
year = {2020},
url = {https://doi.org/10.21105/joss.02646},
doi = {10.21105/JOSS.02646},
timestamp = {Tue, 16 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jossw/SweeneyPBP20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tii/NguyenLBL20,
author = {Cuong Manh Nguyen and
Xin Li and
Ronald DeShawn Blanton and
Xiang Li},
title = {Partial Bayesian Co-training for Virtual Metrology},
journal = {{IEEE} Trans. Ind. Informatics},
volume = {16},
number = {5},
pages = {2937--2945},
year = {2020},
url = {https://doi.org/10.1109/TII.2019.2903718},
doi = {10.1109/TII.2019.2903718},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tii/NguyenLBL20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/HuangFMB20,
author = {Qicheng Huang and
Chenlei Fang and
Soumya Mittal and
R. D. (Shawn) Blanton},
title = {Towards Smarter Diagnosis: {A} Learning-based Diagnostic Outcome Previewer},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {25},
number = {5},
pages = {43:1--43:20},
year = {2020},
url = {https://doi.org/10.1145/3398267},
doi = {10.1145/3398267},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/todaes/HuangFMB20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ChenZMBMS20,
author = {Jianqi Chen and
Monir Zaman and
Yiorgos Makris and
R. D. Shawn Blanton and
Subhasish Mitra and
Benjamin Carri{\'{o}}n Sch{\"{a}}fer},
title = {{DECOY:} DEflection-Driven HLS-Based Computation Partitioning for
Obfuscating Intellectual PropertY},
booktitle = {57th {ACM/IEEE} Design Automation Conference, {DAC} 2020, San Francisco,
CA, USA, July 20-24, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/DAC18072.2020.9218519},
doi = {10.1109/DAC18072.2020.9218519},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dac/ChenZMBMS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/etfa/NguyenLBL20,
author = {Cuong Nguyen and
Xin Li and
R. D. Shawn Blanton and
Xiang Li},
title = {Efficient Classification via Partial Co-Training for Virtual Metrology},
booktitle = {25th {IEEE} International Conference on Emerging Technologies and
Factory Automation, {ETFA} 2020, Vienna, Austria, September 8-11,
2020},
pages = {753--760},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ETFA46521.2020.9212012},
doi = {10.1109/ETFA46521.2020.9212012},
timestamp = {Mon, 02 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/etfa/NguyenLBL20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/FarahmandiSBP20,
author = {Farimah Farahmandi and
Ozgur Sinanoglu and
Ronald D. Blanton and
Samuel Pagliarini},
title = {Design Obfuscation versus Test},
booktitle = {{IEEE} European Test Symposium, {ETS} 2020, Tallinn, Estonia, May
25-29, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ETS48528.2020.9131590},
doi = {10.1109/ETS48528.2020.9131590},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/FarahmandiSBP20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/0001B20,
author = {Zeye Liu and
R. D. Shawn Blanton},
title = {High Defect-Density Yield Learning using Three-Dimensional Logic Test
Chips},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325244},
doi = {10.1109/ITC44778.2020.9325244},
timestamp = {Mon, 25 Jan 2021 08:44:58 +0100},
biburl = {https://dblp.org/rec/conf/itc/0001B20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangFB20,
author = {Qicheng Huang and
Chenlei Fang and
R. D. Shawn Blanton},
title = {{LAIDAR:} Learning for Accuracy and Ideal Diagnostic Resolution},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325212},
doi = {10.1109/ITC44778.2020.9325212},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangFB20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangFB20a,
author = {Qicheng Huang and
Chenlei Fang and
R. D. Shawn Blanton},
title = {Knowledge Transfer for Diagnosis Outcome Preview with Limited Data},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--9},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325214},
doi = {10.1109/ITC44778.2020.9325214},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangFB20a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/FangHB20,
author = {Chenlei Fang and
Qicheng Huang and
R. D. Shawn Blanton},
title = {Adaptive Test Pattern Reordering for Diagnosis using k-Nearest Neighbors},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2020, Taipei,
Taiwan, September 23-25, 2020},
pages = {59--64},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC-Asia51099.2020.00022},
doi = {10.1109/ITC-ASIA51099.2020.00022},
timestamp = {Thu, 22 Oct 2020 12:38:36 +0200},
biburl = {https://dblp.org/rec/conf/itc-asia/FangHB20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/HuangFB20,
author = {Qicheng Huang and
Chenlei Fang and
R. D. Shawn Blanton},
title = {Diagnosis Outcome Prediction on Limited Data via Transferred Random
Forest},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2020, Taipei,
Taiwan, September 23-25, 2020},
pages = {65--70},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC-Asia51099.2020.00023},
doi = {10.1109/ITC-ASIA51099.2020.00023},
timestamp = {Thu, 22 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc-asia/HuangFB20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/JainGRADB20,
author = {Ayush Jain and
Ujjwal Guin and
M. Tanjidur Rahman and
Navid Asadizanjani and
Danielle Duvalsaint and
R. D. Shawn Blanton},
title = {Special Session: Novel Attacks on Logic-Locking},
booktitle = {38th {IEEE} {VLSI} Test Symposium, {VTS} 2020, San Diego, CA, USA,
April 5-8, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/VTS48691.2020.9107641},
doi = {10.1109/VTS48691.2020.9107641},
timestamp = {Mon, 15 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/JainGRADB20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MittalB20,
author = {Soumya Mittal and
R. D. Shawn Blanton},
title = {A Deterministic-Statistical Multiple-Defect Diagnosis Methodology},
booktitle = {38th {IEEE} {VLSI} Test Symposium, {VTS} 2020, San Diego, CA, USA,
April 5-8, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/VTS48691.2020.9107603},
doi = {10.1109/VTS48691.2020.9107603},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MittalB20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2006-06806,
author = {Benjamin Tan and
Ramesh Karri and
Nimisha Limaye and
Abhrajit Sengupta and
Ozgur Sinanoglu and
Md. Moshiur Rahman and
Swarup Bhunia and
Danielle Duvalsaint and
Ronald D. Blanton and
Amin Rezaei and
Yuanqi Shen and
Hai Zhou and
Leon Li and
Alex Orailoglu and
Zhaokun Han and
Austin Benedetti and
Luciano Brignone and
Muhammad Yasin and
Jeyavijayan Rajendran and
Michael Zuzak and
Ankur Srivastava and
Ujjwal Guin and
Chandan Karfa and
Kanad Basu and
Vivek V. Menon and
Matthew French and
Peilin Song and
Franco Stellari and
Gi{-}Joon Nam and
Peter Gadfort and
Alric Althoff and
Joseph Tostenrude and
Saverio Fazzari and
Eric Breckenfeld and
Kenneth Plaks},
title = {Benchmarking at the Frontier of Hardware Security: Lessons from Logic
Locking},
journal = {CoRR},
volume = {abs/2006.06806},
year = {2020},
url = {https://arxiv.org/abs/2006.06806},
eprinttype = {arXiv},
eprint = {2006.06806},
timestamp = {Wed, 06 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/corr/abs-2006-06806.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RenTBT19,
author = {Xuanle Ren and
Francisco Pimentel Torres and
Ronald D. Blanton and
V{\'{\i}}tor Grade Tavares},
title = {{IC} Protection Against JTAG-Based Attacks},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {38},
number = {1},
pages = {149--162},
year = {2019},
url = {https://doi.org/10.1109/TCAD.2018.2802866},
doi = {10.1109/TCAD.2018.2802866},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RenTBT19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/BecklerB19,
author = {Matthew Layne Beckler and
Ronald D. Blanton},
title = {On-Chip Diagnosis of Generalized Delay Failures Using Compact Fault
Dictionaries},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {38},
number = {2},
pages = {322--334},
year = {2019},
url = {https://doi.org/10.1109/TCAD.2018.2803621},
doi = {10.1109/TCAD.2018.2803621},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/BecklerB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/DingLCMB19,
author = {Ruizhou Ding and
Zeye Liu and
Ting{-}Wu Chin and
Diana Marculescu and
R. D. (Shawn) Blanton},
title = {FLightNNs: Lightweight Quantized Deep Neural Networks for Fast and
Accurate Inference},
booktitle = {Proceedings of the 56th Annual Design Automation Conference 2019,
{DAC} 2019, Las Vegas, NV, USA, June 02-06, 2019},
pages = {200},
publisher = {{ACM}},
year = {2019},
url = {https://doi.org/10.1145/3316781.3317828},
doi = {10.1145/3316781.3317828},
timestamp = {Sun, 08 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dac/DingLCMB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MittalB19,
author = {Soumya Mittal and
R. D. Shawn Blanton},
title = {LearnX: {A} Hybrid Deterministic-Statistical Defect Diagnosis Methodology},
booktitle = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
May 27-31, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ETS.2019.8791512},
doi = {10.1109/ETS.2019.8791512},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/MittalB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/HuangFLDB19,
author = {Qicheng Huang and
Chenlei Fang and
Zeye Liu and
Ruizhou Ding and
R. D. Shawn Blanton},
title = {{IPSA:} Integer Programming via Sparse Approximation for Efficient
Test-Chip Design},
booktitle = {37th {IEEE} International Conference on Computer Design, {ICCD} 2019,
Abu Dhabi, United Arab Emirates, November 17-20, 2019},
pages = {11--19},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ICCD46524.2019.00011},
doi = {10.1109/ICCD46524.2019.00011},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/HuangFLDB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DuvalsaintJNB19,
author = {Danielle Duvalsaint and
Xiaoxiao Jin and
Benjamin Niewenhuis and
R. D. (Shawn) Blanton},
title = {Characterization of Locked Combinational Circuits via {ATPG}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000130},
doi = {10.1109/ITC44170.2019.9000130},
timestamp = {Mon, 24 Feb 2020 17:28:46 +0100},
biburl = {https://dblp.org/rec/conf/itc/DuvalsaintJNB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuHFB19,
author = {Zeye Liu and
Qicheng Huang and
Chenlei Fang and
R. D. (Shawn) Blanton},
title = {Improving Test Chip Design Efficiency via Machine Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000131},
doi = {10.1109/ITC44170.2019.9000131},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuHFB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/DuvalsaintLRB19,
author = {Danielle Duvalsaint and
Zeye Liu and
Ananya Ravikumar and
Ronald D. Blanton},
title = {Characterization of Locked Sequential Circuits via {ATPG}},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2019, Tokyo,
Japan, September 3-5, 2019},
pages = {97--102},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC-Asia.2019.00030},
doi = {10.1109/ITC-ASIA.2019.00030},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/DuvalsaintLRB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/FangHMB19,
author = {Chenlei Fang and
Qicheng Huang and
Soumya Mittal and
R. D. Shawn Blanton},
title = {Diagnosis Outcome Preview through Learning},
booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
April 23-25, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/VTS.2019.8758642},
doi = {10.1109/VTS.2019.8758642},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/FangHMB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NiewenhuisRLB19,
author = {Ben Niewenhuis and
Balaji Ravikumar and
Zeye Liu and
R. D. Shawn Blanton},
title = {Path Delay Test of the Carnegie Mellon Logic Characterization Vehicle},
booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
April 23-25, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/VTS.2019.8758651},
doi = {10.1109/VTS.2019.8758651},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/NiewenhuisRLB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-1904-02835,
author = {Ruizhou Ding and
Zeye Liu and
Ting{-}Wu Chin and
Diana Marculescu and
Ronald D. Blanton},
title = {FLightNNs: Lightweight Quantized Deep Neural Networks for Fast and
Accurate Inference},
journal = {CoRR},
volume = {abs/1904.02835},
year = {2019},
url = {http://arxiv.org/abs/1904.02835},
eprinttype = {arXiv},
eprint = {1904.02835},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/corr/abs-1904-02835.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/XueLB18,
author = {Yang Xue and
Xin Li and
Ronald D. Blanton},
title = {Improving Diagnostic Resolution of Failing ICs Through Learning},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {37},
number = {6},
pages = {1288--1297},
year = {2018},
url = {https://doi.org/10.1109/TCAD.2016.2611499},
doi = {10.1109/TCAD.2016.2611499},
timestamp = {Thu, 18 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/XueLB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/trets/DingLBM18,
author = {Ruizhou Ding and
Zeye Liu and
R. D. (Shawn) Blanton and
Diana Marculescu},
title = {Lightening the Load with Highly Accurate Storage- and Energy-Efficient
LightNNs},
journal = {{ACM} Trans. Reconfigurable Technol. Syst.},
volume = {11},
number = {3},
pages = {17:1--17:24},
year = {2018},
url = {https://doi.org/10.1145/3270689},
doi = {10.1145/3270689},
timestamp = {Fri, 24 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/trets/DingLBM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/DingLBM18,
author = {Ruizhou Ding and
Zeye Liu and
R. D. (Shawn) Blanton and
Diana Marculescu},
editor = {Youngsoo Shin},
title = {Quantized deep neural networks for energy efficient hardware-based
inference},
booktitle = {23rd Asia and South Pacific Design Automation Conference, {ASP-DAC}
2018, Jeju, Korea (South), January 22-25, 2018},
pages = {1--8},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ASPDAC.2018.8297274},
doi = {10.1109/ASPDAC.2018.8297274},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/DingLBM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/bigdataconf/GoelLB18,
author = {Abhinav Goel and
Zeye Liu and
Ronald D. Blanton},
editor = {Naoki Abe and
Huan Liu and
Calton Pu and
Xiaohua Hu and
Nesreen K. Ahmed and
Mu Qiao and
Yang Song and
Donald Kossmann and
Bing Liu and
Kisung Lee and
Jiliang Tang and
Jingrui He and
Jeffrey S. Saltz},
title = {CompactNet: High Accuracy Deep Neural Network Optimized for On-Chip
Implementation},
booktitle = {{IEEE} International Conference on Big Data {(IEEE} BigData 2018),
Seattle, WA, USA, December 10-13, 2018},
pages = {4723--4729},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/BigData.2018.8622329},
doi = {10.1109/BIGDATA.2018.8622329},
timestamp = {Fri, 19 Nov 2021 16:08:20 +0100},
biburl = {https://dblp.org/rec/conf/bigdataconf/GoelLB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/RenBT18,
author = {Xuanle Ren and
R. D. (Shawn) Blanton and
V{\'{\i}}tor Grade Tavares},
title = {Detection of {IJTAG} attacks using LDPC-based feature reduction and
machine learning},
booktitle = {23rd {IEEE} European Test Symposium, {ETS} 2018, Bremen, Germany,
May 28 - June 1, 2018},
pages = {1--6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ETS.2018.8400684},
doi = {10.1109/ETS.2018.8400684},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/ets/RenBT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/LiuB18,
author = {Zeye Liu and
Ronald D. Blanton},
title = {Back-End Layout Reflection for Test Chip Design},
booktitle = {36th {IEEE} International Conference on Computer Design, {ICCD} 2018,
Orlando, FL, USA, October 7-10, 2018},
pages = {456--463},
publisher = {{IEEE} Computer Society},
year = {2018},
url = {https://doi.org/10.1109/ICCD.2018.00074},
doi = {10.1109/ICCD.2018.00074},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/LiuB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangFMB18,
author = {Qicheng Huang and
Chenlei Fang and
Soumya Mittal and
R. D. Shawn Blanton},
title = {Improving Diagnosis Efficiency via Machine Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624884},
doi = {10.1109/TEST.2018.8624884},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangFMB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MittalB18,
author = {Soumya Mittal and
R. D. (Shawn) Blanton},
title = {{NOIDA:} Noise-resistant Intra-cell Diagnosis},
booktitle = {36th {IEEE} {VLSI} Test Symposium, {VTS} 2018, San Francisco, CA,
USA, April 22-25, 2018},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2018},
url = {https://doi.org/10.1109/VTS.2018.8368664},
doi = {10.1109/VTS.2018.8368664},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MittalB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-1802-02178,
author = {Ruizhou Ding and
Zeye Liu and
Rongye Shi and
Diana Marculescu and
R. D. (Shawn) Blanton},
title = {LightNN: Filling the Gap between Conventional Deep Neural Networks
and Binarized Networks},
journal = {CoRR},
volume = {abs/1802.02178},
year = {2018},
url = {http://arxiv.org/abs/1802.02178},
eprinttype = {arXiv},
eprint = {1802.02178},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/corr/abs-1802-02178.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/BlantonWXNXL17,
author = {Ronald Shawn Blanton and
Fa Wang and
Cheng Xue and
Pranab K. Nag and
Yang Xue and
Xin Li},
title = {{DFM} Evaluation Using {IC} Diagnosis Data},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {36},
number = {3},
pages = {463--474},
year = {2017},
url = {https://doi.org/10.1109/TCAD.2016.2587283},
doi = {10.1109/TCAD.2016.2587283},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/BlantonWXNXL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MittalB17,
author = {Soumya Mittal and
R. D. (Shawn) Blanton},
title = {{PADLOC:} Physically-Aware Defect Localization and Characterization},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {212--218},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.48},
doi = {10.1109/ATS.2017.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MittalB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/etfa/NguyenLBL17,
author = {Cuong Nguyen and
Xin Li and
Ronald Shawn Blanton and
Xiang Li},
title = {Partial co-training for virtual metrology},
booktitle = {22nd {IEEE} International Conference on Emerging Technologies and
Factory Automation, {ETFA} 2017, Limassol, Cyprus, September 12-15,
2017},
pages = {1--8},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ETFA.2017.8247660},
doi = {10.1109/ETFA.2017.8247660},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/etfa/NguyenLBL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/NiewenhuisMB17,
author = {Ben Niewenhuis and
Soumya Mittal and
R. D. (Shawn) Blanton},
title = {Multiple-defect diagnosis for Logic Characterization Vehicles},
booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
May 22-26, 2017},
pages = {1--6},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ETS.2017.7968231},
doi = {10.1109/ETS.2017.7968231},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/NiewenhuisMB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/glvlsi/DingLSMB17,
author = {Ruizhou Ding and
Zeye Liu and
Rongye Shi and
Diana Marculescu and
R. D. (Shawn) Blanton},
editor = {Laleh Behjat and
Jie Han and
Miroslav N. Velev and
Deming Chen},
title = {LightNN: Filling the Gap between Conventional Deep Neural Networks
and Binarized Networks},
booktitle = {Proceedings of the on Great Lakes Symposium on {VLSI} 2017, Banff,
AB, Canada, May 10-12, 2017},
pages = {35--40},
publisher = {{ACM}},
year = {2017},
url = {https://doi.org/10.1145/3060403.3060465},
doi = {10.1145/3060403.3060465},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/glvlsi/DingLSMB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/glvlsi/LinBT17,
author = {Xiang Lin and
R. D. (Shawn) Blanton and
Donald E. Thomas},
editor = {Laleh Behjat and
Jie Han and
Miroslav N. Velev and
Deming Chen},
title = {Random Forest Architectures on {FPGA} for Multiple Applications},
booktitle = {Proceedings of the on Great Lakes Symposium on {VLSI} 2017, Banff,
AB, Canada, May 10-12, 2017},
pages = {415--418},
publisher = {{ACM}},
year = {2017},
url = {https://doi.org/10.1145/3060403.3060416},
doi = {10.1145/3060403.3060416},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/glvlsi/LinBT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BecklerB17,
author = {Matthew Beckler and
Ronald D. Blanton},
title = {Fault simulation acceleration for {TRAX} dictionary construction using
GPUs},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--9},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242078},
doi = {10.1109/TEST.2017.8242078},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/BecklerB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuFB17,
author = {Zeye Liu and
Phillip Fynan and
Ronald D. Blanton},
title = {Front-end layout reflection for test chip design},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242041},
doi = {10.1109/TEST.2017.8242041},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuFB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/BecklerB17,
author = {Matthew Beckler and
R. D. Shawn Blanton},
title = {GPU-accelerated fault dictionary generation for the {TRAX} fault model},
booktitle = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
September 13-15, 2017},
pages = {34--39},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ITC-ASIA.2017.8097107},
doi = {10.1109/ITC-ASIA.2017.8097107},
timestamp = {Mon, 09 Aug 2021 14:54:04 +0200},
biburl = {https://dblp.org/rec/conf/itc-asia/BecklerB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/XueB17,
author = {Cheng Xue and
R. D. (Shawn) Blanton},
title = {Test-set reordering for improving diagnosability},
booktitle = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
April 9-12, 2017},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/VTS.2017.7928926},
doi = {10.1109/VTS.2017.7928926},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/XueB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/BlantonY16,
author = {R. D. Shawn Blanton and
David Yeh},
title = {Test: Wisdom From the Giants, Visions for the Future - Part 2},
journal = {{IEEE} Des. Test},
volume = {33},
number = {1},
pages = {77--84},
year = {2016},
url = {https://doi.org/10.1109/MDAT.2015.2497602},
doi = {10.1109/MDAT.2015.2497602},
timestamp = {Mon, 02 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/BlantonY16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/WangB16,
author = {Hongfei Wang and
R. D. (Shawn) Blanton},
title = {Ensemble Reduction via Logic Minimization},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {21},
number = {4},
pages = {67:1--67:17},
year = {2016},
url = {https://doi.org/10.1145/2897515},
doi = {10.1145/2897515},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/todaes/WangB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/LiuNMB16,
author = {Zeye Liu and
Ben Niewenhuis and
Soumya Mittal and
R. D. (Shawn) Blanton},
editor = {Luca Fanucci and
J{\"{u}}rgen Teich},
title = {Achieving 100{\%} cell-aware coverage by design},
booktitle = {2016 Design, Automation {\&} Test in Europe Conference {\&}
Exhibition, {DATE} 2016, Dresden, Germany, March 14-18, 2016},
pages = {109--114},
publisher = {{IEEE}},
year = {2016},
url = {https://ieeexplore.ieee.org/document/7459289/},
timestamp = {Mon, 09 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/LiuNMB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isvlsi/RenBT16,
author = {Xuanle Ren and
Ronald D. Blanton and
V{\'{\i}}tor Grade Tavares},
title = {A Learning-Based Approach to Secure {JTAG} Against Unseen Scan-Based
Attacks},
booktitle = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2016, Pittsburgh,
PA, USA, July 11-13, 2016},
pages = {541--546},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ISVLSI.2016.107},
doi = {10.1109/ISVLSI.2016.107},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isvlsi/RenBT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FynanLNMSB16,
author = {Phillip Fynan and
Zeye Liu and
Benjamin Niewenhuis and
Soumya Mittal and
Marcin Strajwas and
R. D. (Shawn) Blanton},
title = {Logic characterization vehicle design reflection via layout rewiring},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805849},
doi = {10.1109/TEST.2016.7805849},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FynanLNMSB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LimX0BA16,
author = {Carlston Lim and
Yang Xue and
Xin Li and
Ronald D. Blanton and
M. Enamul Amyeen},
title = {Diagnostic resolution improvement through learning-guided physical
failure analysis},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805824},
doi = {10.1109/TEST.2016.7805824},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LimX0BA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MittalLNB16,
author = {Soumya Mittal and
Zeye Liu and
Ben Niewenhuis and
R. D. (Shawn) Blanton},
title = {Test chip design for optimal cell-aware diagnosability},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805850},
doi = {10.1109/TEST.2016.7805850},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MittalLNB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/TamB15,
author = {Wing Chiu Jason Tam and
Ronald Shawn Blanton},
title = {{LASIC:} Layout Analysis for Systematic IC-Defect Identification Using
Clustering},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {34},
number = {8},
pages = {1278--1290},
year = {2015},
url = {https://doi.org/10.1109/TCAD.2015.2406854},
doi = {10.1109/TCAD.2015.2406854},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/TamB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/RenTB15,
author = {Xuanle Ren and
V{\'{\i}}tor Grade Tavares and
R. D. (Shawn) Blanton},
editor = {Wolfgang Nebel and
David Atienza},
title = {Detection of illegitimate access to {JTAG} via statistical learning
in chip},
booktitle = {Proceedings of the 2015 Design, Automation {\&} Test in Europe
Conference {\&} Exhibition, {DATE} 2015, Grenoble, France, March
9-13, 2015},
pages = {109--114},
publisher = {{ACM}},
year = {2015},
url = {http://dl.acm.org/citation.cfm?id=2755777},
timestamp = {Mon, 09 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/RenTB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/BlantonLMMMPST15,
author = {Ronald D. Blanton and
Xin Li and
Ken Mai and
Diana Marculescu and
Radu Marculescu and
Jeyanandh Paramesh and
Jeff G. Schneider and
Donald E. Thomas},
editor = {Diana Marculescu and
Frank Liu},
title = {Statistical Learning in Chip {(SLIC)}},
booktitle = {Proceedings of the {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 2015, Austin, TX, USA, November 2-6, 2015},
pages = {664--669},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ICCAD.2015.7372633},
doi = {10.1109/ICCAD.2015.7372633},
timestamp = {Mon, 26 Jun 2023 16:43:56 +0200},
biburl = {https://dblp.org/rec/conf/iccad/BlantonLMMMPST15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/XueB15,
author = {Cheng Xue and
R. D. (Shawn) Blanton},
title = {A one-pass test-selection method for maximizing test coverage},
booktitle = {33rd {IEEE} International Conference on Computer Design, {ICCD} 2015,
New York City, NY, USA, October 18-21, 2015},
pages = {621--628},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ICCD.2015.7357173},
doi = {10.1109/ICCD.2015.7357173},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/XueB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BlantonNL15,
author = {R. D. (Shawn) Blanton and
Benjamin Niewenhuis and
Zeye (Dexter) Liu},
title = {Design reflection for optimal test-chip implementation},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342379},
doi = {10.1109/TEST.2015.7342379},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BlantonNL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BarraganLABSS15,
author = {Manuel J. Barrag{\'{a}}n and
Gildas L{\'{e}}ger and
Florence Aza{\"{\i}}s and
Ronald D. Blanton and
Adit D. Singh and
Stephen Sunter},
title = {Special session: Hot topics: Statistical test methods},
booktitle = {33rd {IEEE} {VLSI} Test Symposium, {VTS} 2015, Napa, CA, USA, April
27-29, 2015},
pages = {1--2},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/VTS.2015.7116265},
doi = {10.1109/VTS.2015.7116265},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/BarraganLABSS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NiewenhuisB15,
author = {Ben Niewenhuis and
Ronald D. Blanton},
title = {Efficient built-in self test of regular logic characterization vehicles},
booktitle = {33rd {IEEE} {VLSI} Test Symposium, {VTS} 2015, Napa, CA, USA, April
27-29, 2015},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/VTS.2015.7116303},
doi = {10.1109/VTS.2015.7116303},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/NiewenhuisB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RenMB15,
author = {Xuanle Ren and
Mitchell Martin and
Ronald D. Blanton},
title = {Improving accuracy of on-chip diagnosis via incremental learning},
booktitle = {33rd {IEEE} {VLSI} Test Symposium, {VTS} 2015, Napa, CA, USA, April
27-29, 2015},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/VTS.2015.7116280},
doi = {10.1109/VTS.2015.7116280},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RenMB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/TamB14,
author = {Wing Chiu Tam and
R. D. (Shawn) Blanton},
title = {Design-for-Manufacturability Assessment for Integrated Circuits Using
{RADAR}},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {33},
number = {10},
pages = {1559--1572},
year = {2014},
url = {https://doi.org/10.1109/TCAD.2014.2336216},
doi = {10.1109/TCAD.2014.2336216},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/TamB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/BiswasWB14,
author = {Sounil Biswas and
Hongfei Wang and
R. D. (Shawn) Blanton},
title = {Reducing test cost of integrated, heterogeneous systems using pass-fail
test data analysis},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {19},
number = {2},
pages = {20:1--20:23},
year = {2014},
url = {https://doi.org/10.1145/2566666},
doi = {10.1145/2566666},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/todaes/BiswasWB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XueB14,
author = {Cheng Xue and
R. D. (Shawn) Blanton},
title = {Predicting {IC} Defect Level Using Diagnosis},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {113--118},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.31},
doi = {10.1109/ATS.2014.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XueB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PorcheB14,
author = {John A. Porche and
R. D. (Shawn) Blanton},
title = {Physically-Aware Diagnostic Resolution},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {206--211},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.46},
doi = {10.1109/ATS.2014.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PorcheB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isicir/0001BGT14,
author = {Xin Li and
Ronald Shawn Blanton and
Pulkit Grover and
Donald E. Thomas},
title = {Ultra-low-power biomedical circuit design and optimization: Catching
the don't cares},
booktitle = {2014 International Symposium on Integrated Circuits (ISIC), Singapore,
December 10-12, 2014},
pages = {115--118},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ISICIR.2014.7029551},
doi = {10.1109/ISICIR.2014.7029551},
timestamp = {Wed, 16 Oct 2019 14:14:56 +0200},
biburl = {https://dblp.org/rec/conf/isicir/0001BGT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isicir/BlantonLMMMPST14,
author = {Ronald D. Blanton and
Xin Li and
Ken Mai and
Diana Marculescu and
Radu Marculescu and
Jeyanandh Paramesh and
Jeff G. Schneider and
Donald E. Thomas},
title = {{SLIC:} Statistical learning in chip},
booktitle = {2014 International Symposium on Integrated Circuits (ISIC), Singapore,
December 10-12, 2014},
pages = {119--123},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ISICIR.2014.7029574},
doi = {10.1109/ISICIR.2014.7029574},
timestamp = {Thu, 18 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isicir/BlantonLMMMPST14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BlantonNT14,
author = {Ronald D. Blanton and
Ben Niewenhuis and
Carl Taylor},
title = {Logic characterization vehicle design for maximal information extraction
for yield learning},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035345},
doi = {10.1109/TEST.2014.7035345},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BlantonNT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangLBSCB14,
author = {Shanghang Zhang and
Xin Li and
Ronald D. Blanton and
Jos{\'{e}} Machado da Silva and
John M. Carulli Jr. and
Kenneth M. Butler},
title = {Bayesian model fusion: Enabling test cost reduction of analog/RF circuits
via wafer-level spatial variation modeling},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035328},
doi = {10.1109/TEST.2014.7035328},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangLBSCB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/BlantonWXNXL13,
author = {Ronald D. Blanton and
Fa Wang and
Cheng Xue and
Pranab K. Nag and
Yang Xue and
Xin Li},
editor = {J{\"{o}}rg Henkel},
title = {{DREAMS:} {DFM} rule EvAluation using manufactured silicon},
booktitle = {The {IEEE/ACM} International Conference on Computer-Aided Design,
ICCAD'13, San Jose, CA, USA, November 18-21, 2013},
pages = {99--106},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/ICCAD.2013.6691104},
doi = {10.1109/ICCAD.2013.6691104},
timestamp = {Mon, 19 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iccad/BlantonWXNXL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NiewenhuisBBM13,
author = {Ben Niewenhuis and
Ronald D. Blanton and
Mudit Bhargava and
Ken Mai},
title = {{SCAN-PUF:} {A} low overhead Physically Unclonable Function from scan
chain power-up states},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651904},
doi = {10.1109/TEST.2013.6651904},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NiewenhuisBBM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XuePLB13,
author = {Yang Xue and
Osei Poku and
Xin Li and
Ronald D. Blanton},
title = {{PADRE:} Physically-Aware Diagnostic Resolution Enhancement},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651899},
doi = {10.1109/TEST.2013.6651899},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/XuePLB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DworakBFHKMPSX13,
author = {Jennifer Dworak and
Ronald Shawn Blanton and
Masahiro Fujita and
Kazumi Hatayama and
Naghmeh Karimi and
Michail Maniatakos and
Antonis M. Paschalis and
Adit D. Singh and
Tian Xia},
title = {Special session 4B: Elevator talks},
booktitle = {31st {IEEE} {VLSI} Test Symposium, {VTS} 2013, Berkeley, CA, USA,
April 29 - May 2, 2013},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/VTS.2013.6548899},
doi = {10.1109/VTS.2013.6548899},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DworakBFHKMPSX13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/BlantonTYNP12,
author = {R. D. (Shawn) Blanton and
Wing Chiu Tam and
Xiaochun Yu and
Jeffrey E. Nelson and
Osei Poku},
title = {Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations},
journal = {{IEEE} Des. Test Comput.},
volume = {29},
number = {1},
pages = {36--47},
year = {2012},
url = {https://doi.org/10.1109/MDT.2011.2178587},
doi = {10.1109/MDT.2011.2178587},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/BlantonTYNP12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/TamB12,
author = {Wing Chiu Tam and
Ronald D. Blanton},
title = {Physically-Aware Analysis of Systematic Defects in Integrated Circuits},
journal = {{IEEE} Des. Test Comput.},
volume = {29},
number = {5},
pages = {81--93},
year = {2012},
url = {https://doi.org/10.1109/MDT.2012.2211093},
doi = {10.1109/MDT.2012.2211093},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/TamB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/LinPBNLI12,
author = {Yen{-}Tzu Lin and
Osei Poku and
R. D. (Shawn) Blanton and
Phil Nigh and
Peter Lloyd and
Vikram Iyengar},
title = {Physically-Aware N-Detect Test},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {31},
number = {2},
pages = {308--321},
year = {2012},
url = {https://doi.org/10.1109/TCAD.2011.2168526},
doi = {10.1109/TCAD.2011.2168526},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/LinPBNLI12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/TamB12,
author = {Wing Chiu Tam and
R. D. (Shawn) Blanton},
title = {{SLIDER:} Simulation of Layout-Injected Defects for Electrical Responses},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {31},
number = {6},
pages = {918--929},
year = {2012},
url = {https://doi.org/10.1109/TCAD.2012.2184108},
doi = {10.1109/TCAD.2012.2184108},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/TamB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/YuB12,
author = {Xiaochun Yu and
R. D. (Shawn) Blanton},
title = {Diagnosis-Assisted Adaptive Test},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {31},
number = {9},
pages = {1405--1416},
year = {2012},
url = {https://doi.org/10.1109/TCAD.2012.2193580},
doi = {10.1109/TCAD.2012.2193580},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/YuB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/YuB12a,
author = {Xiaochun Yu and
Ronald D. Blanton},
title = {Improving Diagnosis Through Failing Behavior Identification},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {31},
number = {10},
pages = {1614--1625},
year = {2012},
url = {https://doi.org/10.1109/TCAD.2012.2196278},
doi = {10.1109/TCAD.2012.2196278},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/YuB12a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/WangPYLKB12,
author = {Hongfei Wang and
Osei Poku and
Xiaochun Yu and
Sizhe Liu and
Ibrahima Komara and
Ronald D. Blanton},
editor = {Patrick Groeneveld and
Donatella Sciuto and
Soha Hassoun},
title = {Test-data volume optimization for diagnosis},
booktitle = {The 49th Annual Design Automation Conference 2012, {DAC} '12, San
Francisco, CA, USA, June 3-7, 2012},
pages = {567--572},
publisher = {{ACM}},
year = {2012},
url = {https://doi.org/10.1145/2228360.2228462},
doi = {10.1145/2228360.2228462},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/WangPYLKB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BecklerB12,
author = {Matthew Beckler and
R. D. (Shawn) Blanton},
title = {On-chip diagnosis for early-life and wear-out failures},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401580},
doi = {10.1109/TEST.2012.6401580},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BecklerB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/BiswasB11,
author = {Sounil Biswas and
Ronald D. Blanton},
title = {Reducing Test Execution Cost of Integrated, Heterogeneous Systems
Using Continuous Test Data},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {30},
number = {1},
pages = {148--158},
year = {2011},
url = {https://doi.org/10.1109/TCAD.2010.2066630},
doi = {10.1109/TCAD.2010.2066630},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/BiswasB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/LinB11,
author = {Yen{-}Tzu Lin and
R. D. (Shawn) Blanton},
title = {{METER:} Measuring Test Effectiveness Regionally},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {30},
number = {7},
pages = {1058--1071},
year = {2011},
url = {https://doi.org/10.1109/TCAD.2011.2113670},
doi = {10.1109/TCAD.2011.2113670},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/LinB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ZhangLLARB11,
author = {Wangyang Zhang and
Xin Li and
Frank Liu and
Emrah Acar and
Rob A. Rutenbar and
Ronald D. Blanton},
title = {Virtual Probe: {A} Statistical Framework for Low-Cost Silicon Characterization
of Nanoscale Integrated Circuits},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {30},
number = {12},
pages = {1814--1827},
year = {2011},
url = {https://doi.org/10.1109/TCAD.2011.2164536},
doi = {10.1109/TCAD.2011.2164536},
timestamp = {Fri, 22 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/ZhangLLARB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/TamB11,
author = {Wing Chiu Tam and
R. D. (Shawn) Blanton},
editor = {Leon Stok and
Nikil D. Dutt and
Soha Hassoun},
title = {To {DFM} or not to DFM?},
booktitle = {Proceedings of the 48th Design Automation Conference, {DAC} 2011,
San Diego, California, USA, June 5-10, 2011},
pages = {65--70},
publisher = {{ACM}},
year = {2011},
url = {https://doi.org/10.1145/2024724.2024740},
doi = {10.1145/2024724.2024740},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/TamB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/YuB11,
author = {Xiaochun Yu and
R. D. (Shawn) Blanton},
editor = {Joel R. Phillips and
Alan J. Hu and
Helmut Graeb},
title = {Statistical defect-detection analysis of test sets using readily-available
tester data},
booktitle = {2011 {IEEE/ACM} International Conference on Computer-Aided Design,
{ICCAD} 2011, San Jose, California, USA, November 7-10, 2011},
pages = {768--773},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ICCAD.2011.6105416},
doi = {10.1109/ICCAD.2011.6105416},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/YuB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TamB11,
author = {Wing Chiu Tam and
R. D. (Shawn) Blanton},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Physically-aware analysis of systematic defects in integrated circuits},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139137},
doi = {10.1109/TEST.2011.6139137},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TamB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TamB11,
author = {Wing Chiu Tam and
Ronald D. Blanton},
title = {{SLIDER:} {A} fast and accurate defect simulation framework},
booktitle = {29th {IEEE} {VLSI} Test Symposium, {VTS} 2011, May 1-5, 2011, Dana
Point, California, {USA}},
pages = {172--177},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/VTS.2011.5783779},
doi = {10.1109/VTS.2011.5783779},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vts/TamB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2011,
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://ieeexplore.ieee.org/xpl/conhome/6132473/proceeding},
isbn = {978-1-4577-0153-5},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2011.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/pieee/RickettsBLBMF10,
author = {David S. Ricketts and
James A. Bain and
Yi Luo and
Ronald D. Blanton and
Kenneth Mai and
Gary K. Fedder},
title = {Enhancing {CMOS} Using Nanoelectronic Devices: {A} Perspective on
Hybrid Integrated Systems},
journal = {Proc. {IEEE}},
volume = {98},
number = {12},
pages = {2061--2075},
year = {2010},
url = {https://doi.org/10.1109/JPROC.2010.2064270},
doi = {10.1109/JPROC.2010.2064270},
timestamp = {Fri, 02 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/pieee/RickettsBLBMF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/YuB10,
author = {Xiaochun Yu and
Ronald D. Blanton},
title = {Diagnosis of Integrated Circuits With Multiple Defects of Arbitrary
Characteristics},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {29},
number = {6},
pages = {977--987},
year = {2010},
url = {https://doi.org/10.1109/TCAD.2010.2048352},
doi = {10.1109/TCAD.2010.2048352},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/YuB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NelsonTB10,
author = {Jeffrey E. Nelson and
Wing Chiu Tam and
Ronald D. Blanton},
editor = {Ron Press and
Erik H. Volkerink},
title = {Automatic classification of bridge defects},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {305--314},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699231},
doi = {10.1109/TEST.2010.5699231},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NelsonTB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TamPB10,
author = {Wing Chiu Tam and
Osei Poku and
Ronald D. Blanton},
editor = {Ron Press and
Erik H. Volkerink},
title = {Systematic defect identification through layout snippet clustering},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {378--387},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699239},
doi = {10.1109/TEST.2010.5699239},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TamPB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YuB10,
author = {Xiaochun Yu and
Ronald D. Blanton},
editor = {Ron Press and
Erik H. Volkerink},
title = {Estimating defect-type distributions through volume diagnosis and
defect behavior attribution},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {664--673},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699270},
doi = {10.1109/TEST.2010.5699270},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YuB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TamBM10,
author = {Wing Chiu Tam and
R. D. (Shawn) Blanton and
Wojciech Maly},
title = {Evaluating yield and testing impact of sub-wavelength lithography},
booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
Santa Cruz, California, {USA}},
pages = {200--205},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/VTS.2010.5469576},
doi = {10.1109/VTS.2010.5469576},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TamBM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/TamPB09,
author = {Wing Chiu Tam and
Osei Poku and
R. D. (Shawn) Blanton},
title = {Automated failure population creation for validating integrated circuit
diagnosis methods},
booktitle = {Proceedings of the 46th Design Automation Conference, {DAC} 2009,
San Francisco, CA, USA, July 26-31, 2009},
pages = {708--713},
publisher = {{ACM}},
year = {2009},
url = {https://doi.org/10.1145/1629911.1630096},
doi = {10.1145/1629911.1630096},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/TamPB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/LiRB09,
author = {Xin Li and
Rob A. Rutenbar and
R. D. (Shawn) Blanton},
editor = {Jaijeet S. Roychowdhury},
title = {Virtual probe: {A} statistically optimal framework for minimum-cost
silicon characterization of nanoscale integrated circuits},
booktitle = {2009 International Conference on Computer-Aided Design, {ICCAD} 2009,
San Jose, CA, USA, November 2-5, 2009},
pages = {433--440},
publisher = {{ACM}},
year = {2009},
url = {https://doi.org/10.1145/1687399.1687481},
doi = {10.1145/1687399.1687481},
timestamp = {Mon, 09 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iccad/LiRB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinB09,
author = {Yen{-}Tzu Lin and
Ronald D. Blanton},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Test effectiveness evaluation through analysis of readily-available
tester data},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355716},
doi = {10.1109/TEST.2009.5355716},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/YuLTPB09,
author = {Xiaochun Yu and
Yen{-}Tzu Lin and
Wing Chiu Tam and
Osei Poku and
Ronald D. Blanton},
title = {Controlling {DPPM} through Volume Diagnosis},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {134--139},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.49},
doi = {10.1109/VTS.2009.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/YuLTPB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LinEB09,
author = {Yen{-}Tzu Lin and
Chukwuemeka U. Ezekwe and
Ronald D. Blanton},
title = {Physically-Aware N-Detect Test Relaxation},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {197--202},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.47},
doi = {10.1109/VTS.2009.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LinEB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BiswasB09,
author = {Sounil Biswas and
Ronald D. Blanton},
title = {Maintaining Accuracy of Test Compaction through Adaptive Re-learning},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {257--263},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.59},
doi = {10.1109/VTS.2009.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BiswasB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/YuB08,
author = {Xiaochun Yu and
R. D. (Shawn) Blanton},
editor = {Limor Fix},
title = {Multiple defect diagnosis using no assumptions on failing pattern
characteristics},
booktitle = {Proceedings of the 45th Design Automation Conference, {DAC} 2008,
Anaheim, CA, USA, June 8-13, 2008},
pages = {361--366},
publisher = {{ACM}},
year = {2008},
url = {https://doi.org/10.1145/1391469.1391567},
doi = {10.1145/1391469.1391567},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/YuB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/TamPB08,
author = {Wing Chiu Tam and
Osei Poku and
R. D. (Shawn) Blanton},
editor = {Limor Fix},
title = {Precise failure localization using automated layout analysis of diagnosis
candidates},
booktitle = {Proceedings of the 45th Design Automation Conference, {DAC} 2008,
Anaheim, CA, USA, June 8-13, 2008},
pages = {367--372},
publisher = {{ACM}},
year = {2008},
url = {https://doi.org/10.1145/1391469.1391568},
doi = {10.1145/1391469.1391568},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/TamPB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/BrownTBP08,
author = {Jason G. Brown and
Brian Taylor and
Ronald D. Blanton and
Larry T. Pileggi},
editor = {Donatella Sciuto},
title = {Automated Testability Enhancements for Logic Brick Libraries},
booktitle = {Design, Automation and Test in Europe, {DATE} 2008, Munich, Germany,
March 10-14, 2008},
pages = {480--485},
publisher = {{ACM}},
year = {2008},
url = {https://doi.org/10.1109/DATE.2008.4484727},
doi = {10.1109/DATE.2008.4484727},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/BrownTBP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/LinPBB08,
author = {Yen{-}Tzu Lin and
Osei Poku and
Naresh K. Bhatti and
Ronald D. Blanton},
editor = {Donatella Sciuto},
title = {Physically-Aware N-Detect Test Pattern Selection},
booktitle = {Design, Automation and Test in Europe, {DATE} 2008, Munich, Germany,
March 10-14, 2008},
pages = {634--639},
publisher = {{ACM}},
year = {2008},
url = {https://doi.org/10.1109/DATE.2008.4484748},
doi = {10.1109/DATE.2008.4484748},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/LinPBB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/BrownB08,
author = {Jason G. Brown and
R. D. (Shawn) Blanton},
title = {Automated Standard Cell Library Analysis for Improved Defect Modeling},
booktitle = {9th International Symposium on Quality of Electronic Design {(ISQED}
2008), 17-19 March 2008, San Jose, CA, {USA}},
pages = {643--648},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ISQED.2008.4479813},
doi = {10.1109/ISQED.2008.4479813},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/BrownB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BiswasB08,
author = {Sounil Biswas and
Ronald D. Blanton},
editor = {Douglas Young and
Nur A. Touba},
title = {Improving the Accuracy of Test Compaction through Adaptive Test Update},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700706},
doi = {10.1109/TEST.2008.4700706},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BiswasB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinPBNLI08,
author = {Yen{-}Tzu Lin and
Osei Poku and
Ronald D. Blanton and
Phil Nigh and
Peter Lloyd and
Vikram Iyengar},
editor = {Douglas Young and
Nur A. Touba},
title = {Evaluating the Effectiveness of Physically-Aware N-Detect Test using
Real Silicon},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700606},
doi = {10.1109/TEST.2008.4700606},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinPBNLI08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YuB08,
author = {Xiaochun Yu and
Ronald D. Blanton},
editor = {Douglas Young and
Nur A. Touba},
title = {An Effective and Flexible Multiple Defect Diagnosis Methodology Using
Error Propagation Analysis},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700595},
doi = {10.1109/TEST.2008.4700595},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YuB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BiswasB08,
author = {Sounil Biswas and
R. D. (Shawn) Blanton},
title = {Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data},
booktitle = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
2008, San Diego, California, {USA}},
pages = {299--308},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/VTS.2008.35},
doi = {10.1109/VTS.2008.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BiswasB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BrownB07,
author = {Jason G. Brown and
R. D. (Shawn) Blanton},
title = {A Built-in Self-test and Diagnosis Strategy for Chemically Assembled
Electronic Nanotechnology},
journal = {J. Electron. Test.},
volume = {23},
number = {2-3},
pages = {131--144},
year = {2007},
url = {https://doi.org/10.1007/s10836-006-0552-x},
doi = {10.1007/S10836-006-0552-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BrownB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PokuB07,
author = {Osei Poku and
Ronald D. Blanton},
editor = {Jill Sibert and
Janusz Rajski},
title = {Delay defect diagnosis using segment network faults},
booktitle = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
California, USA, October 21-26, 2007},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/TEST.2007.4437602},
doi = {10.1109/TEST.2007.4437602},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PokuB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-0710-4719,
author = {Sounil Biswas and
Peng Li and
R. D. (Shawn) Blanton and
Larry T. Pileggi},
title = {Specification Test Compaction for Analog Circuits and {MEMS}},
journal = {CoRR},
volume = {abs/0710.4719},
year = {2007},
url = {http://arxiv.org/abs/0710.4719},
eprinttype = {arXiv},
eprint = {0710.4719},
timestamp = {Mon, 13 Aug 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/corr/abs-0710-4719.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/NelsonZBPBMBS06,
author = {Jeffrey E. Nelson and
Thomas Zanon and
Jason G. Brown and
Osei Poku and
R. D. (Shawn) Blanton and
Wojciech Maly and
Brady Benware and
Chris Schuermyer},
title = {Extracting Defect Density and Size Distributions from Product ICs},
journal = {{IEEE} Des. Test Comput.},
volume = {23},
number = {5},
pages = {390--400},
year = {2006},
url = {https://doi.org/10.1109/MDT.2006.117},
doi = {10.1109/MDT.2006.117},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/NelsonZBPBMBS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/BiswasB06,
author = {Sounil Biswas and
Ronald D. Blanton},
title = {Statistical Test Compaction Using Binary Decision Trees},
journal = {{IEEE} Des. Test Comput.},
volume = {23},
number = {6},
pages = {452--462},
year = {2006},
url = {https://doi.org/10.1109/MDT.2006.154},
doi = {10.1109/MDT.2006.154},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/BiswasB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/JiangB06,
author = {Tao Jiang and
R. D. (Shawn) Blanton},
title = {Inductive fault analysis of surface-micromachined {MEMS}},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {25},
number = {6},
pages = {1104--1116},
year = {2006},
url = {https://doi.org/10.1109/TCAD.2005.855926},
doi = {10.1109/TCAD.2005.855926},
timestamp = {Wed, 22 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/JiangB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/BlantonDD06,
author = {Ronald D. Blanton and
Kumar N. Dwarakanath and
Rao Desineni},
title = {Defect Modeling Using Fault Tuples},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {25},
number = {11},
pages = {2450--2464},
year = {2006},
url = {https://doi.org/10.1109/TCAD.2006.870836},
doi = {10.1109/TCAD.2006.870836},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/BlantonDD06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/NelsonBDB06,
author = {Jeffrey E. Nelson and
Jason G. Brown and
Rao Desineni and
R. D. (Shawn) Blanton},
editor = {Ellen Sentovich},
title = {Multiple-detect {ATPG} based on physical neighborhoods},
booktitle = {Proceedings of the 43rd Design Automation Conference, {DAC} 2006,
San Francisco, CA, USA, July 24-28, 2006},
pages = {1099--1102},
publisher = {{ACM}},
year = {2006},
url = {https://doi.org/10.1145/1146909.1147186},
doi = {10.1145/1146909.1147186},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/NelsonBDB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/NelsonZDBPMB06,
author = {Jeffrey E. Nelson and
Thomas Zanon and
Rao Desineni and
Jason G. Brown and
N. Patil and
Wojciech Maly and
R. D. (Shawn) Blanton},
editor = {Georges G. E. Gielen},
title = {Extraction of defect density and size distributions from wafer sort
test results},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2006, Munich, Germany, March 6-10, 2006},
pages = {913--918},
publisher = {European Design and Automation Association, Leuven, Belgium},
year = {2006},
url = {https://doi.org/10.1109/DATE.2006.243807},
doi = {10.1109/DATE.2006.243807},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/NelsonZDBPMB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BhattiB06,
author = {Naresh K. Bhatti and
Ronald D. Blanton},
editor = {Scott Davidson and
Anne Gattiker},
title = {Diagnostic Test Generation for Arbitrary Faults},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297647},
doi = {10.1109/TEST.2006.297647},
timestamp = {Tue, 12 Dec 2023 09:46:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/BhattiB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DesineniPB06,
author = {Rao Desineni and
Osei Poku and
Ronald D. Blanton},
editor = {Scott Davidson and
Anne Gattiker},
title = {A Logic Diagnosis Methodology for Improved Localization and Extraction
of Accurate Defect Behavior},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297627},
doi = {10.1109/TEST.2006.297627},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DesineniPB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BrownB06,
author = {Jason G. Brown and
R. D. (Shawn) Blanton},
title = {Exploiting Regularity for Inductive Fault Analysis},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {364--369},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.35},
doi = {10.1109/VTS.2006.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BrownB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/BiswasLBP05,
author = {Sounil Biswas and
Peng Li and
R. D. (Shawn) Blanton and
Larry T. Pileggi},
title = {Specification Test Compaction for Analog Circuits and {MEMS}},
booktitle = {2005 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2005), 7-11 March 2005, Munich, Germany},
pages = {164--169},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DATE.2005.277},
doi = {10.1109/DATE.2005.277},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/BiswasLBP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/BlantonM05,
author = {R. D. (Shawn) Blanton and
Subhasish Mitra},
title = {Testing Nanometer Digital Integration Circuits: Myths, Reality and
the Road Ahead},
booktitle = {18th International Conference on {VLSI} Design {(VLSI} Design 2005),
with the 4th International Conference on Embedded Systems Design,
3-7 January 2005, Kolkata, India},
pages = {8--9},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ICVD.2005.162},
doi = {10.1109/ICVD.2005.162},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/BlantonM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DesineniB05,
author = {Rao Desineni and
R. D. (Shawn) Blanton},
title = {Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {366--373},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.41},
doi = {10.1109/VTS.2005.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DesineniB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isvlsi/LiuDCB04,
author = {Chunsheng Liu and
Kumar N. Dwarakanath and
Krishnendu Chakrabarty and
Ronald D. Blanton},
title = {Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST},
booktitle = {2004 {IEEE} Computer Society Annual Symposium on {VLSI} {(ISVLSI}
2004), Emerging Trends in {VLSI} Systems Design, 19-20 February 2004,
Lafayette, LA, {USA}},
pages = {173--178},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ISVLSI.2004.1339526},
doi = {10.1109/ISVLSI.2004.1339526},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isvlsi/LiuDCB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BrownB04,
author = {Jason G. Brown and
R. D. (Shawn) Blanton},
title = {{CAEN-BIST:} Testing the NanoFabric},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {462--471},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386982},
doi = {10.1109/TEST.2004.1386982},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BrownB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VogelsZDBMBNFHGMRT04,
author = {Thomas J. Vogels and
Thomas Zanon and
Rao Desineni and
R. D. (Shawn) Blanton and
Wojciech Maly and
Jason G. Brown and
Jeffrey E. Nelson and
Y. Fei and
X. Huang and
Padmini Gopalakrishnan and
Mahim Mishra and
Vyacheslav Rovner and
S. Tiwary},
title = {Benchmarking Diagnosis Algorithms With a Diverse Set of {IC} Deformations},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {508--517},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386987},
doi = {10.1109/TEST.2004.1386987},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VogelsZDBMBNFHGMRT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DebB04,
author = {Nilmoni Deb and
R. D. (Shawn) Blanton},
title = {Multi-Modal Built-In Self-Test for Symmetric Microsystems},
booktitle = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
Napa Valley, CA, {USA}},
pages = {139--147},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/VTEST.2004.1299237},
doi = {10.1109/VTEST.2004.1299237},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DebB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BiswasDB04,
author = {Sounil Biswas and
Kumar N. Dwarakanath and
R. D. (Shawn) Blanton},
title = {Generalized Sensitization using Fault Tuples},
booktitle = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
Napa Valley, CA, {USA}},
pages = {297--303},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/VTEST.2004.1299256},
doi = {10.1109/VTEST.2004.1299256},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BiswasDB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/BlantonH03,
author = {Ronald D. Blanton and
John P. Hayes},
title = {On the properties of the input pattern fault model},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {8},
number = {1},
pages = {108--124},
year = {2003},
url = {https://doi.org/10.1145/606603.606609},
doi = {10.1145/606603.606609},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/todaes/BlantonH03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/KunduB03,
author = {Rahul Kundu and
R. D. (Shawn) Blanton},
title = {{ATPG} for Noise-Induced Switch Failures in Domino Logic},
booktitle = {2003 International Conference on Computer-Aided Design, {ICCAD} 2003,
San Jose, CA, USA, November 9-13, 2003},
pages = {765--769},
publisher = {{IEEE} Computer Society / {ACM}},
year = {2003},
url = {https://doi.ieeecomputersociety.org/10.1109/ICCAD.2003.1257895},
doi = {10.1109/ICCAD.2003.1257895},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/KunduB03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KunduB03,
author = {Rahul Kundu and
R. D. (Shawn) Blanton},
title = {Path Delay Test Generation for Domino Logic Circuits in the Presence
of Crosstalk},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {122--130},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/TEST.2003.1270832},
doi = {10.1109/TEST.2003.1270832},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KunduB03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VogelsMB03,
author = {Thomas J. Vogels and
Wojciech Maly and
R. D. (Shawn) Blanton},
title = {Progressive Bridge Identification},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {309--318},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/TEST.2003.1270853},
doi = {10.1109/TEST.2003.1270853},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VogelsMB03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MalyGZVBS03,
author = {Wojciech Maly and
Anne E. Gattiker and
Thomas Zanon and
Thomas J. Vogels and
R. D. (Shawn) Blanton and
Thomas M. Storey},
title = {Deformations of {IC} Structure in Test and Yield Learning},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {856--865},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/TEST.2003.1271071},
doi = {10.1109/TEST.2003.1271071},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MalyGZVBS03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BlantonDS03,
author = {R. D. (Shawn) Blanton and
Kumar N. Dwarakanath and
Anirudh B. Shah},
title = {Analyzing the Effectiveness of Multiple-Detect Test Sets},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {876--885},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/TEST.2003.1271073},
doi = {10.1109/TEST.2003.1271073},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BlantonDS03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/NagGWBM02,
author = {Pranab K. Nag and
Anne E. Gattiker and
Sichao Wei and
Ronald D. Blanton and
Wojciech Maly},
title = {Modeling the Economics of Testing: {A} {DFT} Perspective},
journal = {{IEEE} Des. Test Comput.},
volume = {19},
number = {1},
pages = {29--41},
year = {2002},
url = {https://doi.org/10.1109/54.980051},
doi = {10.1109/54.980051},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/NagGWBM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/HeraguSKB02,
author = {Keerthi Heragu and
Manish Sharma and
Rahul Kundu and
Ronald D. Blanton},
title = {Test vector generation for charge sharing failures in dynamic logic},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {21},
number = {12},
pages = {1502--1508},
year = {2002},
url = {https://doi.org/10.1109/TCAD.2002.804377},
doi = {10.1109/TCAD.2002.804377},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/HeraguSKB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/vlsi/ArunachalamBP02,
author = {Ravishankar Arunachalam and
Ronald DeShawn Blanton and
Lawrence T. Pileggi},
title = {Accurate Coupling-centric Timing Analysis Incorporating Temporal and
Functional Isolation},
journal = {{VLSI} Design},
volume = {15},
number = {3},
pages = {605--618},
year = {2002},
url = {https://doi.org/10.1080/1065514021000012228},
doi = {10.1080/1065514021000012228},
timestamp = {Mon, 08 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/vlsi/ArunachalamBP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BlantonCDDMV02,
author = {Ronald D. Blanton and
John T. Chen and
Rao Desineni and
Kumar N. Dwarakanath and
Wojciech Maly and
Thomas J. Vogels},
title = {Fault Tuples in Diagnosis of Deep-Submicron Circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {233--241},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041765},
doi = {10.1109/TEST.2002.1041765},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BlantonCDDMV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DebB02,
author = {Nilmoni Deb and
R. D. (Shawn) Blanton},
title = {Built-In Self Test of {CMOS-MEMS} Accelerometers},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {1075--1084},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041864},
doi = {10.1109/TEST.2002.1041864},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DebB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DwarakanatB02,
author = {Kumar N. Dwarakanath and
R. D. (Shawn) Blanton},
title = {Exploiting Dominance and Equivalence using Fault Tuples},
booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
pages = {269--274},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/VTS.2002.1011151},
doi = {10.1109/VTS.2002.1011151},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DwarakanatB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KunduB02,
author = {Rahul Kundu and
R. D. (Shawn) Blanton},
title = {Timed Test Generation Crosstalk Switch Failures in Domino {CMOS} Circuits},
booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
pages = {379--388},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/VTS.2002.1011168},
doi = {10.1109/VTS.2002.1011168},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KunduB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MirBBKK02,
author = {Salvador Mir and
H. Bederr and
R. D. (Shawn) Blanton and
Hans G. Kerkhoff and
H. J. Klim},
title = {SoCs with MEMS? Can We Include {MEMS} in the SoCs Design and Test
Flow?},
booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
pages = {449--450},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/VTS.2002.1011179},
doi = {10.1109/VTS.2002.1011179},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MirBBKK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ArunachalamBP01,
author = {Ravishankar Arunachalam and
Ronald D. Blanton and
Lawrence T. Pileggi},
title = {False Coupling Interactions in Static Timing Analysis},
booktitle = {Proceedings of the 38th Design Automation Conference, {DAC} 2001,
Las Vegas, NV, USA, June 18-22, 2001},
pages = {726--731},
publisher = {{ACM}},
year = {2001},
url = {https://doi.org/10.1145/378239.379055},
doi = {10.1145/378239.379055},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/ArunachalamBP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/hldvt/UtamaphethaiBS01,
author = {Noppanunt Utamaphethai and
Ronald D. Blanton and
John Paul Shen},
title = {Relating buffer-oriented microarchitecture validation to high-level
pipeline functionality},
booktitle = {Proceedings of the Sixth {IEEE} International High-Level Design Validation
and Test Workshop 2001, Monterey, California, USA, November 7-9, 2001},
pages = {3--8},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/HLDVT.2001.972799},
doi = {10.1109/HLDVT.2001.972799},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/hldvt/UtamaphethaiBS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/NicolaidisBABSL01,
author = {Michael Nicolaidis and
Slimane Boutobza and
Nadir Achouri and
R. D. Shawn Blanton and
Julie Segal and
David Y. Lepejian and
Ben Chu and
Tony Singh and
Harvey Berman},
title = {Designing and Implementing Efficient {BISR} Techniques for Embedded
RAMs},
booktitle = {2nd Latin American Test Workshop, {LATW} 2001, Cancun, Mexico, February
11-14, 2001},
pages = {248--252},
publisher = {{IEEE}},
year = {2001},
timestamp = {Tue, 05 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/NicolaidisBABSL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HeraguSKB01,
author = {Keerthi Heragu and
Manish Sharma and
Rahul Kundu and
R. D. (Shawn) Blanton},
title = {Testing of Dynamic Logic Circuits Based on Charge Sharing},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {396--403},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923468},
doi = {10.1109/VTS.2001.923468},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HeraguSKB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/UtamaphethaiBS00,
author = {Noppanunt Utamaphethai and
R. D. (Shawn) Blanton and
John Paul Shen},
title = {Effectiveness of Microarchitecture Test Program Generation},
journal = {{IEEE} Des. Test Comput.},
volume = {17},
number = {4},
pages = {38--49},
year = {2000},
url = {https://doi.org/10.1109/54.895005},
doi = {10.1109/54.895005},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/UtamaphethaiBS00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/UtamaphethaiBS00,
author = {Noppanunt Utamaphethai and
R. D. (Shawn) Blanton and
John Paul Shen},
title = {A Buffer-Oriented Methodology for Microarchitecture Validation},
journal = {J. Electron. Test.},
volume = {16},
number = {1-2},
pages = {49--65},
year = {2000},
url = {https://doi.org/10.1023/A:1008384521954},
doi = {10.1023/A:1008384521954},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/UtamaphethaiBS00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/BlantonH00,
author = {Ronald D. Blanton and
John P. Hayes},
title = {On the design of fast, easily testable ALU's},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {8},
number = {2},
pages = {220--223},
year = {2000},
url = {https://doi.org/10.1109/92.831442},
doi = {10.1109/92.831442},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/BlantonH00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/DwarakanathB00,
author = {Kumar N. Dwarakanath and
Ronald D. Blanton},
editor = {Giovanni De Micheli},
title = {Universal fault simulation using fault tuples},
booktitle = {Proceedings of the 37th Conference on Design Automation, Los Angeles,
CA, USA, June 5-9, 2000},
pages = {786--789},
publisher = {{ACM}},
year = {2000},
url = {https://doi.org/10.1145/337292.337779},
doi = {10.1145/337292.337779},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/DwarakanathB00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KunduB00,
author = {Rahul Kundu and
Ronald D. Blanton},
title = {Identification of crosstalk switch failures in domino {CMOS} circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {502--509},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894243},
doi = {10.1109/TEST.2000.894243},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KunduB00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DebB00,
author = {Nilmoni Deb and
Ronald D. Blanton},
title = {Analysis of failure sources in surface-micromachined {MEMS}},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {739--749},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894270},
doi = {10.1109/TEST.2000.894270},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DebB00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DesineniDB00,
author = {Rao Desineni and
Kumar N. Dwarakanath and
Ronald D. Blanton},
title = {Universal test generation using fault tuples},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {812--819},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894283},
doi = {10.1109/TEST.2000.894283},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DesineniDB00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/CourtoisB99,
author = {Bernard Courtois and
R. D. (Shawn) Blanton},
title = {Guest Editors' Introduction},
journal = {{IEEE} Des. Test Comput.},
volume = {16},
number = {4},
pages = {16--17},
year = {1999},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/CourtoisB99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MukherjeeFB99,
author = {Tamal Mukherjee and
Gary K. Fedder and
R. D. (Shawn) Blanton},
title = {Hierarchical Design and Test of Integrated Microsystems},
journal = {{IEEE} Des. Test Comput.},
volume = {16},
number = {4},
pages = {18--27},
year = {1999},
url = {https://doi.org/10.1109/54.808200},
doi = {10.1109/54.808200},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/MukherjeeFB99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/micro/BechemCUBBS99,
author = {Candice Bechem and
Jonathan Combs and
Noppanunt Utamaphethai and
Bryan Black and
R. D. (Shawn) Blanton and
John Paul Shen},
title = {An integrated functional performance simulator},
journal = {{IEEE} Micro},
volume = {19},
number = {3},
pages = {26--35},
year = {1999},
url = {https://doi.org/10.1109/40.768499},
doi = {10.1109/40.768499},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/micro/BechemCUBBS99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JiangB99,
author = {Tao Jiang and
Ronald D. Blanton},
title = {Particulate failures for surface-micromachined {MEMS}},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {329--337},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805647},
doi = {10.1109/TEST.1999.805647},
timestamp = {Wed, 22 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JiangB99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/Blanton99,
author = {R. D. (Shawn) Blanton},
title = {IDDQ-Testability of Tree Circuits},
booktitle = {12th International Conference on {VLSI} Design {(VLSI} Design 1999),
10-13 January 1999, Goa, India},
pages = {78--86},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/ICVD.1999.745128},
doi = {10.1109/ICVD.1999.745128},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/Blanton99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/UtamaphethaiBS99,
author = {Noppanunt Utamaphethai and
R. D. (Shawn) Blanton and
John Paul Shen},
title = {Superscalar Processor Validation at the Microarchitecture Level},
booktitle = {12th International Conference on {VLSI} Design {(VLSI} Design 1999),
10-13 January 1999, Goa, India},
pages = {300--305},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/ICVD.1999.745164},
doi = {10.1109/ICVD.1999.745164},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/UtamaphethaiBS99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/DoughertyB98,
author = {William E. Dougherty and
R. D. (Shawn) Blanton},
title = {Using regression analysis for GA-based {ATPG} parameter optimization},
booktitle = {International Conference on Computer Design: {VLSI} in Computers and
Processors, {ICCD} 1998, Proceedings, 5-7 October, 1998, Austin, TX,
{USA}},
pages = {516--521},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/ICCD.1998.727098},
doi = {10.1109/ICCD.1998.727098},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/DoughertyB98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KolpekwarBW98,
author = {Abhijeet Kolpekwar and
Ronald D. Blanton and
David Woodilla},
title = {Failure modes for stiction in surface-micromachined {MEMS}},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {551--556},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743198},
doi = {10.1109/TEST.1998.743198},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KolpekwarBW98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KolpekwarKB98,
author = {Abhijeet Kolpekwar and
Chris S. Kellen and
Ronald D. Blanton},
title = {{MEMS} fault model generation using {CARAMEL}},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {557--566},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743199},
doi = {10.1109/TEST.1998.743199},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KolpekwarKB98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KaramLBR98,
author = {Jean{-}Michel Karam and
Marcelo Lubaszewski and
R. D. Shawn Blanton and
Andrew Richardson},
title = {Testing {MEMS}},
booktitle = {16th {IEEE} {VLSI} Test Symposium {(VTS} '98), 28 April - 1 May 1998,
Princeton, NJ, {USA}},
pages = {320--321},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.1998.10009},
doi = {10.1109/VTS.1998.10009},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KaramLBR98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BlantonH97,
author = {R. D. (Shawn) Blanton and
John P. Hayes},
title = {Testability Properties of Divergent Trees},
journal = {J. Electron. Test.},
volume = {11},
number = {3},
pages = {197--209},
year = {1997},
url = {https://doi.org/10.1023/A:1008262321471},
doi = {10.1023/A:1008262321471},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BlantonH97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/BlantonH97,
author = {Ronald D. Blanton and
John P. Hayes},
title = {The input pattern fault model and its application},
booktitle = {European Design and Test Conference, ED{\&}TC '97, Paris, France,
17-20 March 1997},
pages = {628},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/EDTC.1997.582441},
doi = {10.1109/EDTC.1997.582441},
timestamp = {Fri, 20 May 2022 15:59:03 +0200},
biburl = {https://dblp.org/rec/conf/date/BlantonH97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/BlantonH97,
author = {Ronald D. Blanton and
John P. Hayes},
title = {Properties of the Input Pattern Fault Model},
booktitle = {Proceedings 1997 International Conference on Computer Design: {VLSI}
in Computers {\&} Processors, {ICCD} '97, Austin, Texas, USA,
October 12-15, 1997},
pages = {372--380},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ICCD.1997.628897},
doi = {10.1109/ICCD.1997.628897},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/BlantonH97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WeiNBGM97,
author = {Sichao Wei and
Pranab K. Nag and
Ronald D. Blanton and
Anne E. Gattiker and
Wojciech Maly},
title = {To {DFT} or Not to DFT?},
booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
DC, USA, November 3-5, 1997},
pages = {557--566},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/TEST.1997.639664},
doi = {10.1109/TEST.1997.639664},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WeiNBGM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KolpekwarB97,
author = {Abhijeet Kolpekwar and
Ronald D. Blanton},
title = {Development of a {MEMS} Testing Methodology},
booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
DC, USA, November 3-5, 1997},
pages = {923--931},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/TEST.1997.639707},
doi = {10.1109/TEST.1997.639707},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KolpekwarB97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/BlantonH96,
author = {Ronald D. Blanton and
John P. Hayes},
title = {Testability of Convergent Tree Circuits},
journal = {{IEEE} Trans. Computers},
volume = {45},
number = {8},
pages = {950--963},
year = {1996},
url = {https://doi.org/10.1109/12.536237},
doi = {10.1109/12.536237},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/BlantonH96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgrawalBD96,
author = {Vishwani D. Agrawal and
Ronald D. Blanton and
Maurizio Damiani},
title = {Synthesis of Self-Testing Finite State Machines from High-Level Specifications},
booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
Validity, Washington, DC, USA, October 20-25, 1996},
pages = {757--766},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/TEST.1996.557135},
doi = {10.1109/TEST.1996.557135},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AgrawalBD96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BlantonH96,
author = {R. D. (Shawn) Blanton and
John P. Hayes},
title = {Design of a fast, easily testable {ALU}},
booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
Princeton, NJ, {USA}},
pages = {9--16},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/VTEST.1996.510829},
doi = {10.1109/VTEST.1996.510829},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BlantonH96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@phdthesis{DBLP:phd/us/Blanton95,
author = {R. D. (Shawn) Blanton},
title = {Design and testing of regular circuits},
school = {University of Michigan, {USA}},
year = {1995},
url = {https://hdl.handle.net/2027.42/104432},
timestamp = {Fri, 22 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/phd/us/Blanton95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ftcs/BlantonH93,
author = {Ronald D. Blanton and
John P. Hayes},
title = {Efficient Testing of Tree Circuits},
booktitle = {Digest of Papers: FTCS-23, The Twenty-Third Annual International Symposium
on Fault-Tolerant Computing, Toulouse, France, June 22-24, 1993},
pages = {176--185},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/FTCS.1993.627321},
doi = {10.1109/FTCS.1993.627321},
timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
biburl = {https://dblp.org/rec/conf/ftcs/BlantonH93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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