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BibTeX records: Rao Desineni
@inproceedings{DBLP:conf/itc/PanDSCFBC16, author = {Yan Pan and Rao Desineni and Kannan Sekar and Atul Chittora and Sherwin Fernandes and Neerja Bawaskar and John M. Carulli}, title = {Pylon: Towards an integrated customizable volume diagnosis infrastructure}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--9}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805872}, doi = {10.1109/TEST.2016.7805872}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/itc/PanDSCFBC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/MalikHMDSE13, author = {Shobhit Malik and Thomas Herrmann and Sriram Madhavan and Rao Desineni and Chris Schuermyer and Geir Eide}, title = {Deriving Feature Fail Rate from Silicon Volume Diagnostics Data}, journal = {{IEEE} Des. Test}, volume = {30}, number = {4}, pages = {26--34}, year = {2013}, url = {https://doi.org/10.1109/MDAT.2013.2273791}, doi = {10.1109/MDAT.2013.2273791}, timestamp = {Fri, 13 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/dt/MalikHMDSE13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DesineniPKR10, author = {Rao Desineni and Leah Pastel and Maroun Kassab and Robert Redburn}, editor = {Ron Press and Erik H. Volkerink}, title = {Hard to find, easy to find systematics; just find them}, booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX, USA, November 2-4, 2010}, pages = {388--397}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/TEST.2010.5699240}, doi = {10.1109/TEST.2010.5699240}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DesineniPKR10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tcad/BlantonDD06, author = {Ronald D. Blanton and Kumar N. Dwarakanath and Rao Desineni}, title = {Defect Modeling Using Fault Tuples}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {25}, number = {11}, pages = {2450--2464}, year = {2006}, url = {https://doi.org/10.1109/TCAD.2006.870836}, doi = {10.1109/TCAD.2006.870836}, timestamp = {Thu, 24 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tcad/BlantonDD06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dac/NelsonBDB06, author = {Jeffrey E. Nelson and Jason G. Brown and Rao Desineni and R. D. (Shawn) Blanton}, editor = {Ellen Sentovich}, title = {Multiple-detect {ATPG} based on physical neighborhoods}, booktitle = {Proceedings of the 43rd Design Automation Conference, {DAC} 2006, San Francisco, CA, USA, July 24-28, 2006}, pages = {1099--1102}, publisher = {{ACM}}, year = {2006}, url = {https://doi.org/10.1145/1146909.1147186}, doi = {10.1145/1146909.1147186}, timestamp = {Tue, 06 Nov 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dac/NelsonBDB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/NelsonZDBPMB06, author = {Jeffrey E. Nelson and Thomas Zanon and Rao Desineni and Jason G. Brown and N. Patil and Wojciech Maly and R. D. (Shawn) Blanton}, editor = {Georges G. E. Gielen}, title = {Extraction of defect density and size distributions from wafer sort test results}, booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe, {DATE} 2006, Munich, Germany, March 6-10, 2006}, pages = {913--918}, publisher = {European Design and Automation Association, Leuven, Belgium}, year = {2006}, url = {https://doi.org/10.1109/DATE.2006.243807}, doi = {10.1109/DATE.2006.243807}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/date/NelsonZDBPMB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DesineniPB06, author = {Rao Desineni and Osei Poku and Ronald D. Blanton}, editor = {Scott Davidson and Anne Gattiker}, title = {A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior}, booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara, CA, USA, October 22-27, 2006}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://doi.org/10.1109/TEST.2006.297627}, doi = {10.1109/TEST.2006.297627}, timestamp = {Tue, 12 Dec 2023 09:46:27 +0100}, biburl = {https://dblp.org/rec/conf/itc/DesineniPB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/DesineniB05, author = {Rao Desineni and R. D. (Shawn) Blanton}, title = {Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction}, booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm Springs, CA, {USA}}, pages = {366--373}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/VTS.2005.41}, doi = {10.1109/VTS.2005.41}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/DesineniB05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/VogelsZDBMBNFHGMRT04, author = {Thomas J. Vogels and Thomas Zanon and Rao Desineni and R. D. (Shawn) Blanton and Wojciech Maly and Jason G. Brown and Jeffrey E. Nelson and Y. Fei and X. Huang and Padmini Gopalakrishnan and Mahim Mishra and Vyacheslav Rovner and S. Tiwary}, title = {Benchmarking Diagnosis Algorithms With a Diverse Set of {IC} Deformations}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {508--517}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386987}, doi = {10.1109/TEST.2004.1386987}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/VogelsZDBMBNFHGMRT04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BlantonCDDMV02, author = {Ronald D. Blanton and John T. Chen and Rao Desineni and Kumar N. Dwarakanath and Wojciech Maly and Thomas J. Vogels}, title = {Fault Tuples in Diagnosis of Deep-Submicron Circuits}, booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002}, pages = {233--241}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/TEST.2002.1041765}, doi = {10.1109/TEST.2002.1041765}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BlantonCDDMV02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DesineniDB00, author = {Rao Desineni and Kumar N. Dwarakanath and Ronald D. Blanton}, title = {Universal test generation using fault tuples}, booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City, NJ, USA, October 2000}, pages = {812--819}, publisher = {{IEEE} Computer Society}, year = {2000}, url = {https://doi.org/10.1109/TEST.2000.894283}, doi = {10.1109/TEST.2000.894283}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DesineniDB00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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