BibTeX records: Rao Desineni

download as .bib file

@inproceedings{DBLP:conf/itc/PanDSCFBC16,
  author       = {Yan Pan and
                  Rao Desineni and
                  Kannan Sekar and
                  Atul Chittora and
                  Sherwin Fernandes and
                  Neerja Bawaskar and
                  John M. Carulli},
  title        = {Pylon: Towards an integrated customizable volume diagnosis infrastructure},
  booktitle    = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
                  TX, USA, November 15-17, 2016},
  pages        = {1--9},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/TEST.2016.7805872},
  doi          = {10.1109/TEST.2016.7805872},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/PanDSCFBC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MalikHMDSE13,
  author       = {Shobhit Malik and
                  Thomas Herrmann and
                  Sriram Madhavan and
                  Rao Desineni and
                  Chris Schuermyer and
                  Geir Eide},
  title        = {Deriving Feature Fail Rate from Silicon Volume Diagnostics Data},
  journal      = {{IEEE} Des. Test},
  volume       = {30},
  number       = {4},
  pages        = {26--34},
  year         = {2013},
  url          = {https://doi.org/10.1109/MDAT.2013.2273791},
  doi          = {10.1109/MDAT.2013.2273791},
  timestamp    = {Fri, 13 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/MalikHMDSE13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DesineniPKR10,
  author       = {Rao Desineni and
                  Leah Pastel and
                  Maroun Kassab and
                  Robert Redburn},
  editor       = {Ron Press and
                  Erik H. Volkerink},
  title        = {Hard to find, easy to find systematics; just find them},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
                  USA, November 2-4, 2010},
  pages        = {388--397},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/TEST.2010.5699240},
  doi          = {10.1109/TEST.2010.5699240},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DesineniPKR10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/BlantonDD06,
  author       = {Ronald D. Blanton and
                  Kumar N. Dwarakanath and
                  Rao Desineni},
  title        = {Defect Modeling Using Fault Tuples},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {25},
  number       = {11},
  pages        = {2450--2464},
  year         = {2006},
  url          = {https://doi.org/10.1109/TCAD.2006.870836},
  doi          = {10.1109/TCAD.2006.870836},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/BlantonDD06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/NelsonBDB06,
  author       = {Jeffrey E. Nelson and
                  Jason G. Brown and
                  Rao Desineni and
                  R. D. (Shawn) Blanton},
  editor       = {Ellen Sentovich},
  title        = {Multiple-detect {ATPG} based on physical neighborhoods},
  booktitle    = {Proceedings of the 43rd Design Automation Conference, {DAC} 2006,
                  San Francisco, CA, USA, July 24-28, 2006},
  pages        = {1099--1102},
  publisher    = {{ACM}},
  year         = {2006},
  url          = {https://doi.org/10.1145/1146909.1147186},
  doi          = {10.1145/1146909.1147186},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/NelsonBDB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/NelsonZDBPMB06,
  author       = {Jeffrey E. Nelson and
                  Thomas Zanon and
                  Rao Desineni and
                  Jason G. Brown and
                  N. Patil and
                  Wojciech Maly and
                  R. D. (Shawn) Blanton},
  editor       = {Georges G. E. Gielen},
  title        = {Extraction of defect density and size distributions from wafer sort
                  test results},
  booktitle    = {Proceedings of the Conference on Design, Automation and Test in Europe,
                  {DATE} 2006, Munich, Germany, March 6-10, 2006},
  pages        = {913--918},
  publisher    = {European Design and Automation Association, Leuven, Belgium},
  year         = {2006},
  url          = {https://doi.org/10.1109/DATE.2006.243807},
  doi          = {10.1109/DATE.2006.243807},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/NelsonZDBPMB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DesineniPB06,
  author       = {Rao Desineni and
                  Osei Poku and
                  Ronald D. Blanton},
  editor       = {Scott Davidson and
                  Anne Gattiker},
  title        = {A Logic Diagnosis Methodology for Improved Localization and Extraction
                  of Accurate Defect Behavior},
  booktitle    = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
                  CA, USA, October 22-27, 2006},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/TEST.2006.297627},
  doi          = {10.1109/TEST.2006.297627},
  timestamp    = {Tue, 12 Dec 2023 09:46:27 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DesineniPB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DesineniB05,
  author       = {Rao Desineni and
                  R. D. (Shawn) Blanton},
  title        = {Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction},
  booktitle    = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
                  Springs, CA, {USA}},
  pages        = {366--373},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/VTS.2005.41},
  doi          = {10.1109/VTS.2005.41},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/DesineniB05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VogelsZDBMBNFHGMRT04,
  author       = {Thomas J. Vogels and
                  Thomas Zanon and
                  Rao Desineni and
                  R. D. (Shawn) Blanton and
                  Wojciech Maly and
                  Jason G. Brown and
                  Jeffrey E. Nelson and
                  Y. Fei and
                  X. Huang and
                  Padmini Gopalakrishnan and
                  Mahim Mishra and
                  Vyacheslav Rovner and
                  S. Tiwary},
  title        = {Benchmarking Diagnosis Algorithms With a Diverse Set of {IC} Deformations},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {508--517},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1386987},
  doi          = {10.1109/TEST.2004.1386987},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/VogelsZDBMBNFHGMRT04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BlantonCDDMV02,
  author       = {Ronald D. Blanton and
                  John T. Chen and
                  Rao Desineni and
                  Kumar N. Dwarakanath and
                  Wojciech Maly and
                  Thomas J. Vogels},
  title        = {Fault Tuples in Diagnosis of Deep-Submicron Circuits},
  booktitle    = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
                  MD, USA, October 7-10, 2002},
  pages        = {233--241},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/TEST.2002.1041765},
  doi          = {10.1109/TEST.2002.1041765},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BlantonCDDMV02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DesineniDB00,
  author       = {Rao Desineni and
                  Kumar N. Dwarakanath and
                  Ronald D. Blanton},
  title        = {Universal test generation using fault tuples},
  booktitle    = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
                  NJ, USA, October 2000},
  pages        = {812--819},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/TEST.2000.894283},
  doi          = {10.1109/TEST.2000.894283},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DesineniDB00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics