BibTeX records: Xiaoxin Fan

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Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
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@article{DBLP:journals/tcad/ChaudhuriLFC22,
  author       = {Arjun Chaudhuri and
                  Chunsheng Liu and
                  Xiaoxin Fan and
                  Krishnendu Chakrabarty},
  title        = {C-Testing and Efficient Fault Localization for {AI} Accelerators},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {41},
  number       = {7},
  pages        = {2348--2361},
  year         = {2022},
  url          = {https://doi.org/10.1109/TCAD.2021.3107401},
  doi          = {10.1109/TCAD.2021.3107401},
  timestamp    = {Tue, 28 Jun 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/ChaudhuriLFC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/ChaudhuriLFC20,
  author       = {Arjun Chaudhuri and
                  Chunsheng Liu and
                  Xiaoxin Fan and
                  Krishnendu Chakrabarty},
  title        = {C-Testing of {AI} Accelerators \({}^{\mbox{*}}\)},
  booktitle    = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
                  23-26, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ATS49688.2020.9301581},
  doi          = {10.1109/ATS49688.2020.9301581},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/ChaudhuriLFC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/HuangFTSCBR13,
  author       = {Yu Huang and
                  Xiaoxin Fan and
                  Huaxing Tang and
                  Manish Sharma and
                  Wu{-}Tung Cheng and
                  Brady Benware and
                  Sudhakar M. Reddy},
  title        = {Distributed dynamic partitioning based diagnosis of scan chain},
  booktitle    = {31st {IEEE} {VLSI} Test Symposium, {VTS} 2013, Berkeley, CA, USA,
                  April 29 - May 2, 2013},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/VTS.2013.6548916},
  doi          = {10.1109/VTS.2013.6548916},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/HuangFTSCBR13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/FanSCR12,
  author       = {Xiaoxin Fan and
                  Manish Sharma and
                  Wu{-}Tung Cheng and
                  Sudhakar M. Reddy},
  title        = {Diagnosis of Cell Internal Defects with Multi-cycle Test Patterns},
  booktitle    = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
                  19-22, 2012},
  pages        = {7--12},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/ATS.2012.62},
  doi          = {10.1109/ATS.2012.62},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/FanSCR12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/FanTHCRB12,
  author       = {Xiaoxin Fan and
                  Huaxing Tang and
                  Yu Huang and
                  Wu{-}Tung Cheng and
                  Sudhakar M. Reddy and
                  Brady Benware},
  title        = {Improved volume diagnosis throughput using dynamic design partitioning},
  booktitle    = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
                  USA, November 5-8, 2012},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/TEST.2012.6401564},
  doi          = {10.1109/TEST.2012.6401564},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/FanTHCRB12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/FanTRCB11,
  author       = {Xiaoxin Fan and
                  Huaxing Tang and
                  Sudhakar M. Reddy and
                  Wu{-}Tung Cheng and
                  Brady Benware},
  title        = {On Using Design Partitioning to Reduce Diagnosis Memory Footprint},
  booktitle    = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
                  Delhi, India, November 20-23, 2011},
  pages        = {219--225},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/ATS.2011.45},
  doi          = {10.1109/ATS.2011.45},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/FanTRCB11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ddecs/FanRP11,
  author       = {Xiaoxin Fan and
                  Sudhakar M. Reddy and
                  Irith Pomeranz},
  editor       = {Rolf Kraemer and
                  Adam Pawlak and
                  Andreas Steininger and
                  Mario Sch{\"{o}}lzel and
                  Jaan Raik and
                  Heinrich Theodor Vierhaus},
  title        = {Max-Fill: {A} method to generate high quality delay tests},
  booktitle    = {14th {IEEE} International Symposium on Design and Diagnostics of Electronic
                  Circuits {\&} Systems, {DDECS} 2011, Cottbus, Germany, April 13-15,
                  2011},
  pages        = {375--380},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/DDECS.2011.5783114},
  doi          = {10.1109/DDECS.2011.5783114},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/FanRP11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dsn/FanRWKS11,
  author       = {Xiaoxin Fan and
                  Sudhakar M. Reddy and
                  Senling Wang and
                  Seiji Kajihara and
                  Yasuo Sato},
  title        = {Genetic algorithm based approach for segmented testing},
  booktitle    = {{IEEE/IFIP} International Conference on Dependable Systems and Networks
                  Workshops {(DSN-W} 2011), Hong Kong, China, June 27-30, 2011},
  pages        = {85--90},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/DSNW.2011.5958841},
  doi          = {10.1109/DSNW.2011.5958841},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dsn/FanRWKS11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aspdac/HuFFF08,
  author       = {Yu Hu and
                  Xiang Fu and
                  Xiaoxin Fan and
                  Hideo Fujiwara},
  editor       = {Chong{-}Min Kyung and
                  Kiyoung Choi and
                  Soonhoi Ha},
  title        = {Localized random access scan: Towards low area and routing overhead},
  booktitle    = {Proceedings of the 13th Asia South Pacific Design Automation Conference,
                  {ASP-DAC} 2008, Seoul, Korea, January 21-24, 2008},
  pages        = {565--570},
  publisher    = {{IEEE}},
  year         = {2008},
  url          = {https://doi.org/10.1109/ASPDAC.2008.4484016},
  doi          = {10.1109/ASPDAC.2008.4484016},
  timestamp    = {Wed, 10 May 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aspdac/HuFFF08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/FanHW07,
  author       = {Xiaoxin Fan and
                  Yu Hu and
                  Laung{-}Terng Wang},
  title        = {An On-Chip Test Clock Control Scheme for Multi-Clock At-Speed Testing},
  booktitle    = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
                  2007},
  pages        = {341--348},
  publisher    = {{IEEE}},
  year         = {2007},
  url          = {https://doi.org/10.1109/ATS.2007.61},
  doi          = {10.1109/ATS.2007.61},
  timestamp    = {Wed, 09 Nov 2022 21:30:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/FanHW07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/WangFFLWLLHL07,
  author       = {Da Wang and
                  Xiaoxin Fan and
                  Xiang Fu and
                  Hui Liu and
                  Ke Wen and
                  Rui Li and
                  Huawei Li and
                  Yu Hu and
                  Xiaowei Li},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {The design-for-testability features of a general purpose microprocessor},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437585},
  doi          = {10.1109/TEST.2007.4437585},
  timestamp    = {Thu, 11 May 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/WangFFLWLLHL07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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