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BibTeX records: Ahmad Safari
@article{DBLP:journals/tbe/ChenJZMYQLSZSMZ19, author = {Ruimin Chen and Laiming Jiang and Tianfu Zhang and Takayuki Matsuok and Masato Yamazaki and Xuejun Qian and Gengxi Lu and Ahmad Safari and Jianguo Zhu and K. Kirk Shung and Teng Ma and Qifa Zhou}, title = {Eco-Friendly Highly Sensitive Transducers Based on a New {KNN-NTK-FM} Lead-Free Piezoelectric Ceramic for High-Frequency Biomedical Ultrasonic Imaging Applications}, journal = {{IEEE} Trans. Biomed. Eng.}, volume = {66}, number = {6}, pages = {1580--1587}, year = {2019}, url = {https://doi.org/10.1109/TBME.2018.2876063}, doi = {10.1109/TBME.2018.2876063}, timestamp = {Sat, 09 Apr 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tbe/ChenJZMYQLSZSMZ19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mva/FangJDS03, author = {Tong Fang and Mohsen A. Jafari and Stephen C. Danforth and Ahmad Safari}, title = {Signature analysis and defect detection in layered manufacturing of ceramic sensors and actuators}, journal = {Mach. Vis. Appl.}, volume = {15}, number = {2}, pages = {63--75}, year = {2003}, url = {https://doi.org/10.1007/s00138-002-0074-1}, doi = {10.1007/S00138-002-0074-1}, timestamp = {Wed, 17 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mva/FangJDS03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/smc/BakhadyrovJFSDL98, author = {Izzat Bakhadyrov and Mohsen A. Jafari and Tong Fang and Ahmad Safari and Stephen C. Danforth and Noshir A. Langrana}, title = {Defect detection in indirect layered manufacturing}, booktitle = {Proceedings of the {IEEE} International Conference on Systems, Man and Cybernetics, {SMC} 1998, Hyatt Regency La Jolla, San Diego, California, USA, October 11-14,1998}, pages = {4251--4256}, publisher = {{IEEE}}, year = {1998}, url = {https://doi.org/10.1109/ICSMC.1998.727513}, doi = {10.1109/ICSMC.1998.727513}, timestamp = {Wed, 16 Oct 2019 14:14:51 +0200}, biburl = {https://dblp.org/rec/conf/smc/BakhadyrovJFSDL98.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/smc/FangJBSDL98, author = {Tong Fang and Mohsen A. Jafari and Izzat Bakhadyrov and Ahmad Safari and Stephen C. Danforth and Noshir A. Langrana}, title = {Online defect detection in layered manufacturing using process signature}, booktitle = {Proceedings of the {IEEE} International Conference on Systems, Man and Cybernetics, {SMC} 1998, Hyatt Regency La Jolla, San Diego, California, USA, October 11-14,1998}, pages = {4373--4378}, publisher = {{IEEE}}, year = {1998}, url = {https://doi.org/10.1109/ICSMC.1998.727536}, doi = {10.1109/ICSMC.1998.727536}, timestamp = {Thu, 07 Jun 2018 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/smc/FangJBSDL98.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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