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ORCIDBibTeX records: Marcelino B. Santos
@inproceedings{DBLP:conf/biocas/RashidiRGASSSG23,
author = {Amin Rashidi and
Hassan Rivandi and
Milos Grubor and
Andr{\'{e}} Agostinho and
Valter S{\'{a}}dio and
Marcelino B. Santos and
Wouter A. Serdijn and
Vasiliki Giagka},
title = {Delta-Sigma Control Loop For Energy-Efficient Electrical Stimulation
with Arbitrary-Shape Stimuli},
booktitle = {{IEEE} Biomedical Circuits and Systems Conference, BioCAS 2023, Toronto,
ON, Canada, October 19-21, 2023},
pages = {1--5},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/BioCAS58349.2023.10388625},
doi = {10.1109/BIOCAS58349.2023.10388625},
timestamp = {Fri, 09 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/biocas/RashidiRGASSSG23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/smacd/SantosFSM23,
author = {Carlos Santos and
Jorge R. Fernandes and
Marcelino B. Santos and
Ricardo Martins},
title = {Paving the Way for the Electronic Design Automation of Power Management
Units},
booktitle = {19th International Conference on Synthesis, Modeling, Analysis and
Simulation Methods and Applications to Circuit Design, {SMACD} 2023,
Funchal, Portugal, July 3-5, 2023},
pages = {1--4},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/SMACD58065.2023.10192230},
doi = {10.1109/SMACD58065.2023.10192230},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/smacd/SantosFSM23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dcis/SantosFS22,
author = {Carlos Santos and
Jorge R. Fernandes and
Marcelino B. Santos},
title = {Load Optimized Gate Driving for Charge Pumps},
booktitle = {37th Conference on Design of Circuits and Integrated Systems, {DCIS}
2022, Pamplona, Spain, November 16-18, 2022},
pages = {1--5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/DCIS55711.2022.9970011},
doi = {10.1109/DCIS55711.2022.9970011},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dcis/SantosFS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/hci/SemiaoSS22,
author = {Jorge Semi{\~{a}}o and
Lu{\'{\i}}s Santos and
Marcelino B. Santos},
editor = {Margherita Antona and
Constantine Stephanidis},
title = {{DRAM} Performance Sensor},
booktitle = {Universal Access in Human-Computer Interaction. Novel Design Approaches
and Technologies - 16th International Conference, {UAHCI} 2022, Held
as Part of the 24th {HCI} International Conference, {HCII} 2022, Virtual
Event, June 26 - July 1, 2022, Proceedings, Part {I}},
series = {Lecture Notes in Computer Science},
volume = {13308},
pages = {510--521},
publisher = {Springer},
year = {2022},
url = {https://doi.org/10.1007/978-3-031-05028-2\_34},
doi = {10.1007/978-3-031-05028-2\_34},
timestamp = {Sun, 02 Oct 2022 16:02:13 +0200},
biburl = {https://dblp.org/rec/conf/hci/SemiaoSS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dcis/SemiaoSS21,
author = {Jorge Semi{\~{a}}o and
Lu{\'{\i}}s Santos and
Marcelino B. Santos},
title = {{SRAM} Performance Sensor},
booktitle = {{XXXVI} Conference on Design of Circuits and Integrated Systems, {DCIS}
2021, Vila do Conde, Portugal, November 24-26, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DCIS53048.2021.9666163},
doi = {10.1109/DCIS53048.2021.9666163},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dcis/SemiaoSS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@incollection{DBLP:books/sp/20/SemiaoSTT20,
author = {Jorge Semi{\~{a}}o and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {George Mastorakis and
Constandinos X. Mavromoustakis and
Jordi Mongay Batalla and
Evangelos Pallis},
title = {Internet of Things and Artificial Intelligence - {A} Wining Partnership?},
booktitle = {Convergence of Artificial Intelligence and the Internet of Things
- Technology, Communications and Computing},
pages = {369--390},
publisher = {Springer},
year = {2020},
url = {https://doi.org/10.1007/978-3-030-44907-0\_15},
doi = {10.1007/978-3-030-44907-0\_15},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/books/sp/20/SemiaoSTT20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dcis/LeitaoCS19,
author = {Jos{\'{e}} M. Leit{\~{a}}o and
Ricardo Chaves and
Marcelino B. Santos},
title = {Applying Model Checking in the Verification of a Clock Masking Unit},
booktitle = {{XXXIV} Conference on Design of Circuits and Integrated Systems, {DCIS}
2019, Bilbao, Spain, November 20-22, 2019},
pages = {1--5},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DCIS201949030.2019.8959910},
doi = {10.1109/DCIS201949030.2019.8959910},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dcis/LeitaoCS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dcis/CapeleiroLCS18,
author = {Rodrigo B. Capeleiro and
Jos{\'{e}} M. Leit{\~{a}}o and
Ricardo Chaves and
Marcelino B. Santos},
title = {Low-power frequency monitoring circuit for clock failure detection},
booktitle = {Conference on Design of Circuits and Integrated Systems, {DCIS} 2018,
Lyon, France, November 14-16, 2018},
pages = {1--6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/DCIS.2018.8681489},
doi = {10.1109/DCIS.2018.8681489},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dcis/CapeleiroLCS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dcis/CapeleiroS18,
author = {Rodrigo B. Capeleiro and
Marcelino B. Santos},
title = {Low noise, high efficiency, segmented {LCD} drivers for ultra-low
power applications in 22 nm {FD-SOI}},
booktitle = {Conference on Design of Circuits and Integrated Systems, {DCIS} 2018,
Lyon, France, November 14-16, 2018},
pages = {1--6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/DCIS.2018.8681488},
doi = {10.1109/DCIS.2018.8681488},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dcis/CapeleiroS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/hci/SemiaoCSTT18,
author = {Jorge Semi{\~{a}}o and
Ruben Cabral and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Margherita Antona and
Constantine Stephanidis},
title = {Performance Sensor for Reliable Operation},
booktitle = {Universal Access in Human-Computer Interaction. Virtual, Augmented,
and Intelligent Environments - 12th International Conference, {UAHCI}
2018, Held as Part of {HCI} International 2018, Las Vegas, NV, USA,
July 15-20, 2018, Proceedings, Part {II}},
series = {Lecture Notes in Computer Science},
volume = {10908},
pages = {347--365},
publisher = {Springer},
year = {2018},
url = {https://doi.org/10.1007/978-3-319-92052-8\_28},
doi = {10.1007/978-3-319-92052-8\_28},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/hci/SemiaoCSTT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/LeongSSTT15,
author = {Carlos Leong and
Jorge Semi{\~{a}}o and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Fault-Tolerance in Field Programmable Gate Array with Dynamic Voltage
and Frequency Scaling},
journal = {J. Low Power Electron.},
volume = {11},
number = {4},
pages = {517--527},
year = {2015},
url = {https://doi.org/10.1166/jolpe.2015.1406},
doi = {10.1166/JOLPE.2015.1406},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/LeongSSTT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/LeongSSTT15,
author = {Carlos Leong and
Jorge Semi{\~{a}}o and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Fault-tolerance in {FPGA} focusing power reduction or performance
enhancement},
booktitle = {16th Latin-American Test Symposium, {LATS} 2015, Puerto Vallarta,
Mexico, March 25-27, 2015},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/LATW.2015.7102523},
doi = {10.1109/LATW.2015.7102523},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/LeongSSTT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/ParreiraLS14,
author = {Abilio Parreira and
Floriberto A. Lima and
Marcelino B. Santos},
title = {Digital modular control of high frequency {DC-DC} converters},
journal = {Microelectron. J.},
volume = {45},
number = {10},
pages = {1254--1260},
year = {2014},
url = {https://doi.org/10.1016/j.mejo.2013.12.002},
doi = {10.1016/J.MEJO.2013.12.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mj/ParreiraLS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SemiaoSLRSTT14,
author = {Jorge Semi{\~{a}}o and
David Saraiva and
Carlos Leong and
Andr{\'{e}} Rom{\~{a}}o and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Performance sensor for tolerance and predictive detection of delay-faults},
booktitle = {2014 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2014, Amsterdam, The Netherlands,
October 1-3, 2014},
pages = {110--115},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/DFT.2014.6962092},
doi = {10.1109/DFT.2014.6962092},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SemiaoSLRSTT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isie/MoreiraS14,
author = {Carlos Moreira and
Marcelino B. Santos},
title = {Implicit current {DC-DC} Digital Voltage-Mode Control},
booktitle = {23rd {IEEE} International Symposium on Industrial Electronics, {ISIE}
2014, Istanbul, Turkey, June 1-4, 2014},
pages = {1378--1383},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ISIE.2014.6864815},
doi = {10.1109/ISIE.2014.6864815},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/isie/MoreiraS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/VazquezCSTST13,
author = {Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Jorge Semi{\~{a}}o and
Isabel C. Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {Process Variations-Aware Statistical Analysis Framework for Aging
Sensors Insertion},
journal = {J. Electron. Test.},
volume = {29},
number = {3},
pages = {289--299},
year = {2013},
url = {https://doi.org/10.1007/s10836-013-5358-z},
doi = {10.1007/S10836-013-5358-Z},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/VazquezCSTST13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/MoitaAS13,
author = {Tiago H. Moita and
Carlos B. Almeida and
Marcelino Bicho Dos Santos},
title = {ActivIC: Design-Based Automatic Characterization of Mixed-Signal Integrated
Circuits},
journal = {J. Low Power Electron.},
volume = {9},
number = {1},
pages = {73--88},
year = {2013},
url = {https://doi.org/10.1166/jolpe.2013.1242},
doi = {10.1166/JOLPE.2013.1242},
timestamp = {Fri, 22 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/MoitaAS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/EstevesPPS13,
author = {Jorge O. M. Esteves and
Jo{\~{a}}o Pereira and
J{\'{u}}lio Paisana and
Marcelino B. Santos},
title = {Ultra low power capless {LDO} with dynamic biasing of derivative feedback},
journal = {Microelectron. J.},
volume = {44},
number = {2},
pages = {94--102},
year = {2013},
url = {https://doi.org/10.1016/j.mejo.2012.10.010},
doi = {10.1016/J.MEJO.2012.10.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mj/EstevesPPS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fpl/LeongSTSTVFRV13,
author = {Carlos Leong and
Jorge Semi{\~{a}}o and
Isabel C. Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira and
Mar{\'{\i}}a Dolores Vald{\'{e}}s and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas},
title = {Aging monitoring with local sensors in FPGA-based designs},
booktitle = {23rd International Conference on Field programmable Logic and Applications,
{FPL} 2013, Porto, Portugal, September 2-4, 2013},
pages = {1--4},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/FPL.2013.6645596},
doi = {10.1109/FPL.2013.6645596},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/fpl/LeongSTSTVFRV13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/RabuskeFRRS13,
author = {Taimur Gibran Rabuske and
Jorge R. Fernandes and
Fabio Gibran Rabuske and
Cesar Ramos Rodrigues and
Marcelino Bicho Dos Santos},
title = {A self-calibrated 10-bit 1 MSps {SAR} {ADC} with reduced-voltage charge-sharing
{DAC}},
booktitle = {2013 {IEEE} International Symposium on Circuits and Systems (ISCAS2013),
Beijing, China, May 19-23, 2013},
pages = {2452--2455},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/ISCAS.2013.6572375},
doi = {10.1109/ISCAS.2013.6572375},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iscas/RabuskeFRRS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/PachitoMJSVCSTT12,
author = {Jackson Pachito and
Celestino V. Martins and
Bruno Jacinto and
Jorge Semi{\~{a}}o and
Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Aging-Aware Power or Frequency Tuning With Predictive Fault Detection},
journal = {{IEEE} Des. Test Comput.},
volume = {29},
number = {5},
pages = {27--36},
year = {2012},
url = {https://doi.org/10.1109/MDT.2012.2206009},
doi = {10.1109/MDT.2012.2206009},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/PachitoMJSVCSTT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/SadioRMS12,
author = {Valter S{\'{a}}dio and
Fabian Rein and
Christian M{\"{u}}nker and
Marcelino B. Santos},
title = {Modeling of Inherent Losses of Fully Integrated Switched Capacitor
{DC-DC} Converters},
journal = {J. Low Power Electron.},
volume = {8},
number = {5},
pages = {667--673},
year = {2012},
url = {https://doi.org/10.1166/jolpe.2012.1224},
doi = {10.1166/JOLPE.2012.1224},
timestamp = {Fri, 22 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/SadioRMS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/biocas/CostaPS12,
author = {Tiago L. Costa and
Mois{\'{e}}s Sim{\~{o}}es Piedade and
Marcelino B. Santos},
title = {An ultra-low noise current source for magnetoresistive biosensors
biasing},
booktitle = {2012 {IEEE} Biomedical Circuits and Systems Conference, BioCAS 2012,
Hsinchu, Taiwan, November 28-30, 2012},
pages = {73--76},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/BioCAS.2012.6418507},
doi = {10.1109/BIOCAS.2012.6418507},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/biocas/CostaPS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/PachitoMSSTT12,
author = {Jackson Pachito and
Celestino V. Martins and
Jorge Semi{\~{a}}o and
Marcelino Bicho Dos Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {The influence of clock-gating on NBTI-induced delay degradation},
booktitle = {18th {IEEE} International On-Line Testing Symposium, {IOLTS} 2012,
Sitges, Spain, June 27-29, 2012},
pages = {61--66},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/IOLTS.2012.6313842},
doi = {10.1109/IOLTS.2012.6313842},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/PachitoMSSTT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/JacintoMS11,
author = {Bruno Jacinto and
Carlos Moreira and
Marcelino B. Santos},
title = {Digital Sliding Mode Control of {DC-DC} Buck Converters},
journal = {J. Low Power Electron.},
volume = {7},
number = {2},
pages = {218--233},
year = {2011},
url = {https://doi.org/10.1166/jolpe.2011.1130},
doi = {10.1166/JOLPE.2011.1130},
timestamp = {Fri, 22 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/JacintoMS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/RochaSC11,
author = {Jos{\'{e}} F. da Rocha and
Marcelino Bicho Dos Santos and
Jos{\'{e}} M. Dores Costa},
title = {Smart Control of Internal Supply Voltage Spikes in a Low Voltage {DC-DC}
Buck Converter},
journal = {J. Low Power Electron.},
volume = {7},
number = {3},
pages = {426--443},
year = {2011},
url = {https://doi.org/10.1166/jolpe.2011.1146},
doi = {10.1166/JOLPE.2011.1146},
timestamp = {Fri, 22 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/RochaSC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/OliveiraSTST11,
author = {R. S. Oliveira and
Jorge Semi{\~{a}}o and
Isabel C. Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {On-Line {BIST} for Performance Failure Prediction Under NBTI-Induced
Aging in Safety-Critical Applications},
journal = {J. Low Power Electron.},
volume = {7},
number = {4},
pages = {562--572},
year = {2011},
url = {https://doi.org/10.1166/jolpe.2011.1155},
doi = {10.1166/JOLPE.2011.1155},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/OliveiraSTST11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GuerreiroS11,
author = {Nuno Guerreiro and
Marcelino B. Santos},
title = {Mixed-Signal Fault Equivalence: Search and Evaluation},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {377--382},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.19},
doi = {10.1109/ATS.2011.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GuerreiroS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurocon/MoreiraSPS11,
author = {Carlos O. Moreira and
J. Fernando A. da Silva and
S{\'{o}}nia Ferreira Pinto and
Marcelino B. Santos},
title = {Digital {LQR} control with Kalman Estimator for {DC-DC} Buck converter},
booktitle = {Proceedings of {EUROCON} 2011, International Conference on Computer
as a Tool, 27-29 April 2011, Lisbon, Portugal},
pages = {1--4},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/EUROCON.2011.5929326},
doi = {10.1109/EUROCON.2011.5929326},
timestamp = {Wed, 14 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/eurocon/MoreiraSPS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurocon/RochaSC11,
author = {Jos{\'{e}} F. da Rocha and
Marcelino Bicho Dos Santos and
Jos{\'{e}} M. Dores Costa},
title = {Analysis of a monolithic buck converter's pMOS switch during turn
off},
booktitle = {Proceedings of {EUROCON} 2011, International Conference on Computer
as a Tool, 27-29 April 2011, Lisbon, Portugal},
pages = {1--4},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/EUROCON.2011.5929347},
doi = {10.1109/EUROCON.2011.5929347},
timestamp = {Fri, 02 Jun 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/eurocon/RochaSC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/EstevesMAS11,
author = {Jorge O. M. Esteves and
Tiago H. Moita and
Carlos B. Almeida and
Marcelino B. Santos},
title = {{ICT:} Interface software for the characterization and test of mixed-signal
power cores},
booktitle = {17th {IEEE} International On-Line Testing Symposium {(IOLTS} 2011),
13-15 July, 2011, Athens, Greece},
pages = {202--205},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/IOLTS.2011.5993843},
doi = {10.1109/IOLTS.2011.5993843},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/EstevesMAS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/OliveiraSTS011,
author = {R. S. Oliveira and
Jorge Semi{\~{a}}o and
Isabel C. Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {On-line {BIST} for performance failure prediction under aging effects
in automotive safety-critical applications},
booktitle = {12th Latin American Test Workshop, {LATW} 2011, Beach of Porto de
Galinhas, Brazil, March 27-30, 2011},
pages = {1--6},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/LATW.2011.5985919},
doi = {10.1109/LATW.2011.5985919},
timestamp = {Sun, 06 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/OliveiraSTS011.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MartinsSVCSTT11,
author = {Celestino V. Martins and
Jorge Semi{\~{a}}o and
Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Adaptive Error-Prediction Flip-flop for performance failure prediction
with aging sensors},
booktitle = {29th {IEEE} {VLSI} Test Symposium, {VTS} 2011, May 1-5, 2011, Dana
Point, California, {USA}},
pages = {203--208},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/VTS.2011.5783784},
doi = {10.1109/VTS.2011.5783784},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/MartinsSVCSTT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/VazquezCTST10,
author = {Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Isabel C. Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
editor = {Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller and
Enrico Macii},
title = {Programmable aging sensor for automotive safety-critical applications},
booktitle = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany,
March 8-12, 2010},
pages = {618--621},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DATE.2010.5457131},
doi = {10.1109/DATE.2010.5457131},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/VazquezCTST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/VazquezCZRSTST10,
author = {Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Adriel Ziesemer and
Ricardo Reis and
Jorge Semi{\~{a}}o and
Isabel C. Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {Predictive error detection by on-line aging monitoring},
booktitle = {16th {IEEE} International On-Line Testing Symposium {(IOLTS} 2010),
5-7 July, 2010, Corfu, Greece},
pages = {9--14},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/IOLTS.2010.5560241},
doi = {10.1109/IOLTS.2010.5560241},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/VazquezCZRSTST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/VazquezCZRTST10,
author = {Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Adriel Ziesemer and
Ricardo Reis and
Isabel Maria Cacho Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {Low-sensitivity to process variations aging sensor for automotive
safety-critical applications},
booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
Santa Cruz, California, {USA}},
pages = {238--243},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/VTS.2010.5469568},
doi = {10.1109/VTS.2010.5469568},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/VazquezCZRTST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/MonteiroSND09,
author = {Angelo Monteiro and
Marcelino B. Santos and
Alexandre Neves and
Nuno Dias},
title = {Noise Minimization for Low Power Bandgap Reference and Low Dropout
Regulator Cores},
journal = {J. Low Power Electron.},
volume = {5},
number = {2},
pages = {206--222},
year = {2009},
url = {https://doi.org/10.1166/jolpe.2009.1021},
doi = {10.1166/JOLPE.2009.1021},
timestamp = {Fri, 22 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/MonteiroSND09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/DiasSMBN09,
author = {Nuno Dias and
Marcelino B. Santos and
Angelo Monteiro and
Pedro Braga and
Alexandre Neves},
title = {Gate Driver Voltage Optimization for Multi-Mode Low Power {DC-DC}
Conversion},
journal = {J. Low Power Electron.},
volume = {5},
number = {2},
pages = {241--254},
year = {2009},
url = {https://doi.org/10.1166/jolpe.2009.1024},
doi = {10.1166/JOLPE.2009.1024},
timestamp = {Fri, 22 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/DiasSMBN09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/VazquezCZRTST09,
author = {Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Adriel Ziesemer and
Ricardo Reis and
Isabel C. Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {Built-in aging monitoring for safety-critical applications},
booktitle = {15th {IEEE} International On-Line Testing Symposium {(IOLTS} 2009),
24-26 June 2009, Sesimbra-Lisbon, Portugal},
pages = {9--14},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/IOLTS.2009.5195976},
doi = {10.1109/IOLTS.2009.5195976},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/VazquezCZRTST09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/RochaDMNSST09,
author = {Jos{\'{e}} F. da Rocha and
Nuno Dias and
Angelo Monteiro and
Alexandre Neves and
Gabriel Santos and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {Controllability and observability in mixed signal cores},
booktitle = {15th {IEEE} International On-Line Testing Symposium {(IOLTS} 2009),
24-26 June 2009, Sesimbra-Lisbon, Portugal},
pages = {198--200},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/IOLTS.2009.5196012},
doi = {10.1109/IOLTS.2009.5196012},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/RochaDMNSST09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SemiaoFRVSTT09,
author = {Jorge Semi{\~{a}}o and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Delay-fault tolerance to power supply Voltage disturbances analysis
in nanometer technologies},
booktitle = {15th {IEEE} International On-Line Testing Symposium {(IOLTS} 2009),
24-26 June 2009, Sesimbra-Lisbon, Portugal},
pages = {223--228},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/IOLTS.2009.5196020},
doi = {10.1109/IOLTS.2009.5196020},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/SemiaoFRVSTT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/SemiaoFMMAB0STR09,
author = {Jorge Semi{\~{a}}o and
Judit Freijedo and
Marlon Moraes and
M. Mallmann and
C. Antunes and
Juliano Benfica and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Jo{\~{a}}o Paulo Teixeira and
Daniel Lupi and
Edmundo Gatti and
Luis Garcia and
Fernando Hernandez},
title = {Measuring clock-signal modulation efficiency for Systems-on-Chip in
electromagnetic interference environment},
booktitle = {10th Latin American Test Workshop, {LATW} 2009, Rio de Janeiro, Brazil,
March 2-5, 2009},
pages = {1--6},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/LATW.2009.4813817},
doi = {10.1109/LATW.2009.4813817},
timestamp = {Fri, 08 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/SemiaoFMMAB0STR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/SemiaoRRPVSTT08,
author = {Jorge Semi{\~{a}}o and
Marcial Jes{\'{u}}s Rodr{\'{\i}}guez{-}Irago and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Leonardo Bisch Piccoli and
Fabian Vargas and
Marcelino Bicho Dos Santos and
Isabel Maria Cacho Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Signal Integrity Enhancement in Digital Circuits},
journal = {{IEEE} Des. Test Comput.},
volume = {25},
number = {5},
pages = {452--461},
year = {2008},
url = {https://doi.org/10.1109/MDT.2008.146},
doi = {10.1109/MDT.2008.146},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/SemiaoRRPVSTT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/SemiaoFRVSTT08,
author = {Jorge Semi{\~{a}}o and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Time Management for Low-Power Design of Digital Systems},
journal = {J. Low Power Electron.},
volume = {4},
number = {3},
pages = {410--419},
year = {2008},
url = {https://doi.org/10.1166/jolpe.2008.194},
doi = {10.1166/JOLPE.2008.194},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/SemiaoFRVSTT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tie/RochaSCL08,
author = {Jos{\'{e}} F. da Rocha and
Marcelino Bicho Dos Santos and
Jos{\'{e}} M. Dores Costa and
Floriberto A. Lima},
title = {Level Shifters and {DCVSL} for a Low-Voltage {CMOS} 4.2-V Buck Converter},
journal = {{IEEE} Trans. Ind. Electron.},
volume = {55},
number = {9},
pages = {3315--3323},
year = {2008},
url = {https://doi.org/10.1109/TIE.2008.927974},
doi = {10.1109/TIE.2008.927974},
timestamp = {Fri, 22 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tie/RochaSCL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/apccas/DuartePSL08,
author = {Rodrigo Duarte and
J{\'{u}}lio Paisana and
Marcelino B. Santos and
Floriberto A. Lima},
title = {Adjustable low consumption circuit for monitorization of power source
voltages in a SoC},
booktitle = {{IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2008,
Macao, China, November 30 2008 - December 3, 2008},
pages = {376--379},
publisher = {{IEEE}},
year = {2008},
url = {https://doi.org/10.1109/APCCAS.2008.4746038},
doi = {10.1109/APCCAS.2008.4746038},
timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
biburl = {https://dblp.org/rec/conf/apccas/DuartePSL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/SemiaoRVSTT08,
author = {Jorge Semi{\~{a}}o and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Bernd Straube and
Milos Drutarovsk{\'{y}} and
Michel Renovell and
Peter Gramata and
M{\'{a}}ria Fischerov{\'{a}}},
title = {Process Tolerant Design Using Thermal and Power-Supply Tolerance in
Pipeline Based Circuits},
booktitle = {Proceedings of the 11th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2008), Bratislava,
Slovakia, April 16-18, 2008},
pages = {34--37},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/DDECS.2008.4538752},
doi = {10.1109/DDECS.2008.4538752},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/SemiaoRVSTT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SemiaoFRVSTT08,
author = {Jorge Semi{\~{a}}o and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Exploiting Parametric Power Supply and/or Temperature Variations to
Improve Fault Tolerance in Digital Circuits},
booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008),
7-9 July 2008, Rhodes, Greece},
pages = {227--232},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/IOLTS.2008.51},
doi = {10.1109/IOLTS.2008.51},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/SemiaoFRVSTT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/patmos/DiasSLBP08,
author = {Nuno Dias and
Marcelino B. Santos and
Floriberto A. Lima and
Beatriz Vieira Borges and
J{\'{u}}lio Paisana},
editor = {Lars Svensson and
Jos{\'{e}} Monteiro},
title = {Monolithic Multi-mode {DC-DC} Converter with Gate Voltage Optimization},
booktitle = {Integrated Circuit and System Design. Power and Timing Modeling, Optimization
and Simulation, 18th International Workshop, {PATMOS} 2008, Lisbon,
Portugal, September 10-12, 2008. Revised Selected Papers},
series = {Lecture Notes in Computer Science},
volume = {5349},
pages = {258--267},
publisher = {Springer},
year = {2008},
url = {https://doi.org/10.1007/978-3-540-95948-9\_26},
doi = {10.1007/978-3-540-95948-9\_26},
timestamp = {Tue, 08 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/patmos/DiasSLBP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iet-cdt/SantosT07,
author = {Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {Functional-oriented mask-based built-in self-test},
journal = {{IET} Comput. Digit. Tech.},
volume = {1},
number = {5},
pages = {491--498},
year = {2007},
url = {https://doi.org/10.1049/iet-cdt:20060073},
doi = {10.1049/IET-CDT:20060073},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/iet-cdt/SantosT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/SemiaoFRVSTT07,
author = {Jorge Semi{\~{a}}o and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Patrick Girard and
Andrzej Krasniewski and
Elena Gramatov{\'{a}} and
Adam Pawlak and
Tomasz Garbolino},
title = {Improving Tolerance to Power-Supply and Temperature Variations in
Synchronous Circuits},
booktitle = {Proceedings of the 10th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2007), Krak{\'{o}}w,
Poland, April 11-13, 2007},
pages = {295--300},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DDECS.2007.4295299},
doi = {10.1109/DDECS.2007.4295299},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/SemiaoFRVSTT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SemiaoRVSTT07,
author = {Jorge Semi{\~{a}}o and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino Bicho Dos Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Cristiana Bolchini and
Yong{-}Bin Kim and
Adelio Salsano and
Nur A. Touba},
title = {Improving the Tolerance of Pipeline Based Circuits to Power Supply
or Temperature Variations},
booktitle = {22nd {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2007), 26-28 September 2007, Rome, Italy},
pages = {303--311},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DFT.2007.60},
doi = {10.1109/DFT.2007.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SemiaoRVSTT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SemiaoFRVSTT07,
author = {Jorge Semi{\~{a}}o and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous
Circuits},
booktitle = {13th {IEEE} International On-Line Testing Symposium {(IOLTS} 2007),
8-11 July 2007, Heraklion, Crete, Greece},
pages = {167--172},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/IOLTS.2007.49},
doi = {10.1109/IOLTS.2007.49},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/SemiaoFRVSTT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isvlsi/SemiaoFRVSTT07,
author = {Jorge Semi{\~{a}}o and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Enhancing the Tolerance to Power-Supply Instability in Digital Circuits},
booktitle = {2007 {IEEE} Computer Society Annual Symposium on {VLSI} {(ISVLSI}
2007), May 9-11, 2007, Porto Alegre, Brazil},
pages = {207--212},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/ISVLSI.2007.44},
doi = {10.1109/ISVLSI.2007.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isvlsi/SemiaoFRVSTT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/FernandesSOT06,
author = {Jos{\'{e}} M. Fernandes and
Marcelino B. Santos and
Arlindo L. Oliveira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Matteo Sonza Reorda and
Ondrej Nov{\'{a}}k and
Bernd Straube and
Hana Kub{\'{a}}tov{\'{a}} and
Zdenek Kot{\'{a}}sek and
Pavel Kubal{\'{\i}}k and
Raimund Ubar and
Jir{\'{\i}} Bucek},
title = {Probabilistic Testability Analysis and {DFT} Methods at {RTL}},
booktitle = {Proceedings of the 9th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2006), Prague, Czech
Republic, April 18-21, 2006},
pages = {216--217},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/DDECS.2006.1649614},
doi = {10.1109/DDECS.2006.1649614},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/FernandesSOT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/GuerreiroSPSTT06,
author = {F. Guerreiro and
Jorge Semi{\~{a}}o and
A. Pierce and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Matteo Sonza Reorda and
Ondrej Nov{\'{a}}k and
Bernd Straube and
Hana Kub{\'{a}}tov{\'{a}} and
Zdenek Kot{\'{a}}sek and
Pavel Kubal{\'{\i}}k and
Raimund Ubar and
Jir{\'{\i}} Bucek},
title = {Functional-Oriented {BIST} of Sequential Circuits Aiming at Dynamic
Faults Coverage},
booktitle = {Proceedings of the 9th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2006), Prague, Czech
Republic, April 18-21, 2006},
pages = {279--284},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/DDECS.2006.1649635},
doi = {10.1109/DDECS.2006.1649635},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/GuerreiroSPSTT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/hldvt/FernandesSOT06,
author = {Jos{\'{e}} M. Fernandes and
Marcelino B. Santos and
Arlindo L. Oliveira and
Jo{\~{a}}o Paulo Cacho Teixeira},
title = {{DFT} and Probabilistic Testability Analysis at {RTL}},
booktitle = {Eleventh Annual {IEEE} International High-Level Design Validation
and Test Workshop 2006, Monterey, CA, USA, Nov 9-10, 2006},
pages = {41--47},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/HLDVT.2006.320002},
doi = {10.1109/HLDVT.2006.320002},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/hldvt/FernandesSOT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/ParreiraS006,
author = {Abilio Parreira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {{BIST} Architectures and Fault Emulation},
booktitle = {7th Latin American Test Workshop, {LATW} 2006, Buenos Aires, Argentina,
March 26-29, 2006},
pages = {55--60},
publisher = {{IEEE}},
year = {2006},
timestamp = {Thu, 27 Jul 2023 13:45:38 +0200},
biburl = {https://dblp.org/rec/conf/latw/ParreiraS006.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/JuniorRSTVT05,
author = {D. Barros J{\'{u}}nior and
Marcial Jes{\'{u}}s Rodr{\'{\i}}guez{-}Irago and
Marcelino B. Santos and
Isabel C. Teixeira and
Fabian Vargas and
Jo{\~{a}}o Paulo Teixeira},
title = {Fault Modeling and Simulation of Power Supply Voltage Transients in
Digital Systems on a Chip},
journal = {J. Electron. Test.},
volume = {21},
number = {4},
pages = {349--363},
year = {2005},
url = {https://doi.org/10.1007/s10836-005-0972-z},
doi = {10.1007/S10836-005-0972-Z},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/JuniorRSTVT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/Rodriguez-IragoAVSTT05,
author = {Marcial Jes{\'{u}}s Rodr{\'{\i}}guez{-}Irago and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple
Clock Schemes and Multi-VDD Test},
booktitle = {11th {IEEE} International On-Line Testing Symposium {(IOLTS} 2005),
6-8 July 2005, Saint Raphael, France},
pages = {281--286},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/IOLTS.2005.25},
doi = {10.1109/IOLTS.2005.25},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/Rodriguez-IragoAVSTT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/cai/ParreiraTS04,
author = {Abilio Parreira and
Jo{\~{a}}o Paulo Teixeira and
Marcelino B. Santos},
title = {Built-In Self-Test Quality Assessment Using Hardware Fault Emulation
In FPGAs},
journal = {Comput. Artif. Intell.},
volume = {23},
number = {5},
pages = {537--556},
year = {2004},
url = {http://www.cai.sk/ojs/index.php/cai/article/view/444},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/cai/ParreiraTS04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SantosTTMBF04,
author = {Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira and
Salvador Manich and
Luz Balado and
Joan Figueras},
title = {On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level},
journal = {J. Electron. Test.},
volume = {20},
number = {4},
pages = {345--355},
year = {2004},
url = {https://doi.org/10.1023/B:JETT.0000039603.89172.2e},
doi = {10.1023/B:JETT.0000039603.89172.2E},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SantosTTMBF04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/FernandesSOT04,
author = {Jos{\'{e}} M. Fernandes and
Marcelino B. Santos and
Arlindo L. Oliveira and
Jo{\~{a}}o Paulo Teixeira},
title = {A Probabilistic Method for the Computation of Testability of {RTL}
Constructs},
booktitle = {2004 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2004), 16-20 February 2004, Paris, France},
pages = {176--181},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/DATE.2004.1268845},
doi = {10.1109/DATE.2004.1268845},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/FernandesSOT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fpl/ParreiraTS04,
author = {Abilio Parreira and
Jo{\~{a}}o Paulo Teixeira and
Marcelino B. Santos},
editor = {J{\"{u}}rgen Becker and
Marco Platzner and
Serge Vernalde},
title = {FPGAs {BIST} Evaluation},
booktitle = {Field Programmable Logic and Application, 14th International Conference
, {FPL} 2004, Leuven, Belgium, August 30-September 1, 2004, Proceedings},
series = {Lecture Notes in Computer Science},
volume = {3203},
pages = {333--343},
publisher = {Springer},
year = {2004},
url = {https://doi.org/10.1007/978-3-540-30117-2\_35},
doi = {10.1007/978-3-540-30117-2\_35},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/fpl/ParreiraTS04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/BarrosVSTT04,
author = {Daniel Barros Jr. and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Modeling and Simulation of Time Domain Faults in Digital Systems},
booktitle = {10th {IEEE} International On-Line Testing Symposium {(IOLTS} 2004),
12-14 July 2004, Funchal, Madeira Island, Portugal},
pages = {5--10},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.ieeecomputersociety.org/10.1109/IOLTS.2004.29},
doi = {10.1109/IOLTS.2004.29},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/BarrosVSTT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/SantosFTT03,
author = {Marcelino B. Santos and
Jos{\'{e}} M. Fernandes and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {{RTL} Test Pattern Generation for High Quality Loosely Deterministic
{BIST}},
booktitle = {2003 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2003), 3-7 March 2003, Munich, Germany},
pages = {10994--10999},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.ieeecomputersociety.org/10.1109/DATE.2003.10010},
doi = {10.1109/DATE.2003.10010},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/SantosFTT03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fpl/ParreiraTPSS03,
author = {Abilio Parreira and
Jo{\~{a}}o Paulo Teixeira and
A. Pantelimon and
Marcelino B. Santos and
Jos{\'{e}} T. de Sousa},
editor = {Peter Y. K. Cheung and
George A. Constantinides and
Jos{\'{e}} T. de Sousa},
title = {Fault Simulation Using Partially Reconfigurable Hardware},
booktitle = {Field Programmable Logic and Application, 13th International Conference,
{FPL} 2003, Lisbon, Portugal, September 1-3, 2003, Proceedings},
series = {Lecture Notes in Computer Science},
volume = {2778},
pages = {839--848},
publisher = {Springer},
year = {2003},
url = {https://doi.org/10.1007/978-3-540-45234-8\_81},
doi = {10.1007/978-3-540-45234-8\_81},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/fpl/ParreiraTPSS03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/GoncalvesSTT03,
author = {Fernando M. Gon{\c{c}}alves and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Property Coverage for Quality Assessment of Fault Tolerant or Fail
Safe Systems},
booktitle = {9th {IEEE} International On-Line Testing Symposium {(IOLTS} 2003),
7-9 July 2003, Kos Island, Greece},
pages = {164--165},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/OLT.2003.1214390},
doi = {10.1109/OLT.2003.1214390},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/GoncalvesSTT03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SantosGTT02,
author = {Marcelino B. Santos and
Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {{RTL} Design Validation, {DFT} and Test Pattern Generation for High
Defects Coverage},
journal = {J. Electron. Test.},
volume = {18},
number = {2},
pages = {179--187},
year = {2002},
url = {https://doi.org/10.1023/A:1014997610714},
doi = {10.1023/A:1014997610714},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SantosGTT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GoncalvesSTT02,
author = {Fernando M. Gon{\c{c}}alves and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Design and Test of a Certifiable {ASIC} for a Safety-Critical Gas
Burner Control System},
journal = {J. Electron. Test.},
volume = {18},
number = {3},
pages = {285--294},
year = {2002},
url = {https://doi.org/10.1023/A:1015083105421},
doi = {10.1023/A:1015083105421},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GoncalvesSTT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GoncalvesSTT02,
author = {Fernando M. Gon{\c{c}}alves and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling},
booktitle = {17th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2002), 6-8 November 2002, Vancouver, BC,
Canada, Proceedings},
pages = {216--224},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/DFTVS.2002.1173518},
doi = {10.1109/DFTVS.2002.1173518},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/GoncalvesSTT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SantosTTMRF02,
author = {Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira and
Salvador Manich and
Rosa Rodr{\'{\i}}guez{-}Monta{\~{n}}{\'{e}}s and
Joan Figueras},
title = {{RTL} Level Preparation of High-Quality/Low-Energy/Low-Power {BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {814--823},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041835},
doi = {10.1109/TEST.2002.1041835},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SantosTTMRF02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/SantosT0MBF02,
author = {Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira and
Salvador Manich and
Luz Balado and
Joan Figueras},
title = {On High-Quality, Low Energy {BIST} Preparation at RT-Level},
booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay,
February 10-13, 2002},
pages = {52--57},
publisher = {{IEEE}},
year = {2002},
timestamp = {Wed, 26 Jul 2023 15:57:25 +0200},
biburl = {https://dblp.org/rec/conf/latw/SantosT0MBF02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SantosGTT01,
author = {Marcelino B. Santos and
Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {RTL-Based Functional Test Generation for High Defects Coverage in
Digital Systems},
journal = {J. Electron. Test.},
volume = {17},
number = {3-4},
pages = {311--319},
year = {2001},
url = {https://doi.org/10.1023/A:1012223614418},
doi = {10.1023/A:1012223614418},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SantosGTT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SantosGTT01,
author = {Marcelino B. Santos and
Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {{RTL} design validation, {DFT} and test pattern generation for high
defects coverage},
booktitle = {6th European Test Workshop, {ETW} 2001, Stockholm, Sweden, May 29
- June 1, 2001},
pages = {99--105},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/ETW.2001.946672},
doi = {10.1109/ETW.2001.946672},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/SantosGTT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/GoncalvesSTT01,
author = {Fernando M. Gon{\c{c}}alves and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Design and Test of Certifiable ASICs for Safety-Critical Gas Burners
Contro},
booktitle = {7th {IEEE} International On-Line Testing Workshop {(IOLTW} 2001),
9-11 July 2001, Taormina, Italy},
pages = {197--201},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/OLT.2001.937842},
doi = {10.1109/OLT.2001.937842},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/GoncalvesSTT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GoncalvesSTT01,
author = {Fernando M. Gon{\c{c}}alves and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Implicit functionality and multiple branch coverage {(IFMB):} a testability
metric for RT-level},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {377--385},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966654},
doi = {10.1109/TEST.2001.966654},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GoncalvesSTT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ManichGLFGGLPTS00,
author = {Salvador Manich and
A. Gabarr{\'{o}} and
M. Lopez and
Joan Figueras and
Patrick Girard and
Lo{\"{\i}}s Guiller and
Christian Landrault and
Serge Pravossoudovitch and
Jo{\~{a}}o Paulo Teixeira and
Marcelino B. Santos},
title = {Low Power {BIST} by Filtering Non-Detecting Vectors},
journal = {J. Electron. Test.},
volume = {16},
number = {3},
pages = {193--202},
year = {2000},
url = {https://doi.org/10.1023/A:1008331029249},
doi = {10.1023/A:1008331029249},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ManichGLFGGLPTS00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SantosGTT00,
author = {Marcelino B. Santos and
Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {RTL-based functional test generation for high defects coverage in
digital SOCs},
booktitle = {5th European Test Workshop, {ETW} 2000, Cascais, Portugal, May 23-26,
2000},
pages = {99--104},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/ETW.2000.873785},
doi = {10.1109/ETW.2000.873785},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/SantosGTT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/DiasSSTT00,
author = {Oct{\'{a}}vio P{\'{a}}scoa Dias and
Jorge Semi{\~{a}}o and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Quality of Electronic Design: From Architectural Level to Test Coverage},
booktitle = {1st International Symposium on Quality of Electronic Design {(ISQED}
2000), 20-22 March 2000, San Jose, CA, {USA}},
pages = {197},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/ISQED.2000.838874},
doi = {10.1109/ISQED.2000.838874},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/DiasSSTT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/Santos000,
author = {Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {Experiments on {RTL} {ATPG} and Fault Simulation for High Defect Coverage
in Digital Systems-on-a-Chip},
booktitle = {1st Latin American Test Workshop, {LATW} 2000, Rio de Janeiro, RJ,
Brazil, March 13-15, 2000},
pages = {66--71},
publisher = {{IEEE}},
year = {2000},
timestamp = {Tue, 25 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/Santos000.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/SantosT99,
author = {Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {Defect-Oriented Mixed-Level Fault Simulation of Digital Systems-on-a-Chip
Using {HDL}},
booktitle = {1999 Design, Automation and Test in Europe {(DATE} '99), 9-12 March
1999, Munich, Germany},
pages = {549},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1999},
url = {https://doi.org/10.1109/DATE.1999.761181},
doi = {10.1109/DATE.1999.761181},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/SantosT99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/DiasSSTT99,
author = {Oct{\'{a}}vio P{\'{a}}scoa Dias and
Jorge Semi{\~{a}}o and
Marcelino B. Santos and
Isabel Maria Cacho Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {From system level to defect-oriented test: a case study},
booktitle = {4th European Test Workshop, {ETW} 1999, Constance, Germany, May 25-28,
1999},
pages = {136--141},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/ETW.1999.804509},
doi = {10.1109/ETW.1999.804509},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/DiasSSTT99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/ManichGLFGGLPTS99,
author = {Salvador Manich and
A. Gabarr{\'{o}} and
M. Lopez and
Joan Figueras and
Patrick Girard and
Lo{\"{\i}}s Guiller and
Christian Landrault and
Serge Pravossoudovitch and
Jo{\~{a}}o Paulo Teixeira and
Marcelino B. Santos},
title = {Low power {BIST} by filtering non-detecting vectors},
booktitle = {4th European Test Workshop, {ETW} 1999, Constance, Germany, May 25-28,
1999},
pages = {165--170},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/ETW.1999.804524},
doi = {10.1109/ETW.1999.804524},
timestamp = {Thu, 26 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/ManichGLFGGLPTS99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/GirardGLPFMTS99,
author = {Patrick Girard and
Lo{\"{\i}}s Guiller and
Christian Landrault and
Serge Pravossoudovitch and
Joan Figueras and
Salvador Manich and
Jo{\~{a}}o Paulo Teixeira and
Marcelino B. Santos},
title = {Low-energy {BIST} design: impact of the {LFSR} {TPG} parameters on
the weighted switching activity},
booktitle = {Proceedings of the 1999 International Symposium on Circuits and Systems,
{ISCAS} 1999, Orlando, Florida, USA, May 30 - June 2, 1999},
pages = {110--113},
publisher = {{IEEE}},
year = {1999},
url = {https://doi.org/10.1109/ISCAS.1999.777817},
doi = {10.1109/ISCAS.1999.777817},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iscas/GirardGLPFMTS99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SantosGTT99,
author = {Marcelino B. Santos and
Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified
Fault Sampling Technique},
booktitle = {17th {IEEE} {VLSI} Test Symposium {(VTS} '99), 25-30 April 1999, San
Diego, CA, {USA}},
pages = {326--332},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/VTEST.1999.766683},
doi = {10.1109/VTEST.1999.766683},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SantosGTT99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icecsys/SantosGOT98,
author = {Marcelino B. Santos and
Fernando M. Gon{\c{c}}alves and
Michael J. Ohletz and
Jo{\~{a}}o Paulo Teixeira},
title = {Defect-oriented testing of analogue and mixed signal ICs},
booktitle = {5th {IEEE} International Conference on Electronics, Circuits and Systems,
{ICECS} 1998, Surfing the Waves of Science and Technology, Lisbon,
Portugal, September 7-10, 1998},
pages = {419--424},
publisher = {{IEEE}},
year = {1998},
url = {https://doi.org/10.1109/ICECS.1998.814913},
doi = {10.1109/ICECS.1998.814913},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/icecsys/SantosGOT98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GoncalvesSTT98,
author = {Fernando M. Gon{\c{c}}alves and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Defect-oriented test quality assessment using fault sampling and simulation},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {35--42},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743134},
doi = {10.1109/TEST.1998.743134},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GoncalvesSTT98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurodac/TeixeiraCDFS96,
author = {Jo{\~{a}}o Paulo Teixeira and
F. Celeiro and
L. Dias and
J. Ferreira and
Marcelino B. Santos},
editor = {Graham Symonds and
Wolfgang Nebel},
title = {{VHDL} fault simulation for defect-oriented test and diagnosis of
digital ICs},
booktitle = {Proceedings of the conference on European design automation, {EURO-DAC}
'96/EURO-VHDL '96, Geneva, Switzerland, September 16-20, 1996},
pages = {450--455},
publisher = {{IEEE} Computer Society Press},
year = {1996},
url = {https://doi.org/10.1109/EURDAC.1996.558242},
doi = {10.1109/EURDAC.1996.558242},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/eurodac/TeixeiraCDFS96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CeleiroDFST96,
author = {F. Celeiro and
L. Dias and
J. Ferreira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {Defect-Oriented {IC} Test and Diagnosis Using {VHDL} Fault Simulation},
booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
Validity, Washington, DC, USA, October 20-25, 1996},
pages = {620--628},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/TEST.1996.557119},
doi = {10.1109/TEST.1996.557119},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CeleiroDFST96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/SantosSTT95,
author = {Marcelino B. Santos and
M. Sim{\~{o}}es and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Test preparation methodology for high coverage of physical defects
in {CMOS} digital ICs},
booktitle = {1995 European Design and Test Conference, ED{\&}TC 1995, Paris,
France, March 6-9, 1995},
pages = {604},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/EDTC.1995.470325},
doi = {10.1109/EDTC.1995.470325},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/SantosSTT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SantosSTT95,
author = {Marcelino B. Santos and
M. Sim{\~{o}}es and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Test preparation for high coverage of physical defects in {CMOS} digital
ICs},
booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
Princeton, New Jersey, {USA}},
pages = {330--337},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/VTEST.1995.512657},
doi = {10.1109/VTEST.1995.512657},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SantosSTT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/CasimiroCTS94,
author = {A. P. Casimiro and
Fernando M. Gon{\c{c}}alves and
Jo{\~{a}}o Paulo Teixeira and
Marcelino B. Santos},
title = {On the Analysis of Routing Cells and Adjacency Faults in {CMOS} Digital
Circuits},
booktitle = {The {IEEE} International Workshop on Defect and Fault Tolerance in
{VLSI} Systems, October 17-19, 1994, Montr{\'{e}}al, Quebec,
Canada, Proceedings},
pages = {263--270},
publisher = {{IEEE} Computer Society},
year = {1994},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/CasimiroCTS94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CalhaSGTT94,
author = {Mario Calha and
Marcelino B. Santos and
Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Back Annotation of Physical Defects into Gate-Level, Realistic Faults
in Digital ICs},
booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
Next 25 Years, Washington, DC, USA, October 2-6, 1994},
pages = {720--728},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/TEST.1994.528018},
doi = {10.1109/TEST.1994.528018},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CalhaSGTT94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/CasimiroSSTT93,
author = {A. P. Casimiro and
M. Sim{\~{o}}es and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Fabrizio Lombardi and
Mariagiovanna Sami and
Yvon Savaria and
Renato Stefanelli},
title = {Experiments on Bridging Fault Analysis and Layout-Level {DFT} for
{CMOS} Designs},
booktitle = {The {IEEE} International Workshop on Defect and Fault Tolerance in
{VLSI} Systems, October 27-29, 1993, Venice, Italy, Proceedings},
pages = {109--116},
publisher = {{IEEE} Computer Society},
year = {1993},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/CasimiroSSTT93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/NicolauBSSTT93,
author = {P. Nicolau and
J. Barbosa and
M. Saraiva and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Fabrizio Lombardi and
Mariagiovanna Sami and
Yvon Savaria and
Renato Stefanelli},
title = {Realistic Fault Analysis of {CMOS} Analog Building Blocks},
booktitle = {The {IEEE} International Workshop on Defect and Fault Tolerance in
{VLSI} Systems, October 27-29, 1993, Venice, Italy, Proceedings},
pages = {311--318},
publisher = {{IEEE} Computer Society},
year = {1993},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/NicolauBSSTT93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jsa/SaraivaSCTT92,
author = {M. Saraiva and
Marcelino B. Santos and
A. P. Casimiro and
Isabel Maria Cacho Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {On the design of a highly testable cell library},
journal = {Microprocess. Microprogramming},
volume = {35},
number = {1-5},
pages = {383--389},
year = {1992},
url = {https://doi.org/10.1016/0165-6074(92)90343-6},
doi = {10.1016/0165-6074(92)90343-6},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jsa/SaraivaSCTT92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SaraivaCSSGTT92,
author = {M. Saraiva and
P. Casimiro and
Marcelino B. Santos and
Jos{\'{e}} T. de Sousa and
Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Physical {DFT} for High Coverage of Realistic Faults},
booktitle = {Proceedings {IEEE} International Test Conference 1992, Discover the
New World of Test and Design, Baltimore, Maryland, USA, September
20-24, 1992},
pages = {642--651},
publisher = {{IEEE} Computer Society},
year = {1992},
url = {https://doi.org/10.1109/TEST.1992.527885},
doi = {10.1109/TEST.1992.527885},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SaraivaCSSGTT92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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