BibTeX records: Nobuyuki Sugii

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@inproceedings{DBLP:conf/icicdt/IshibashiKS17,
  author       = {Koichiro Ishibashi and
                  Junya Kikuchi and
                  Nobuyuki Sugii},
  title        = {A 910nW delta sigma modulator using 65nm {SOTB} technology for mixed
                  signal {IC} of IoT applications},
  booktitle    = {2017 {IEEE} International Conference on {IC} Design and Technology,
                  {ICICDT} 2017, Austin, TX, USA, May 23-25, 2017},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ICICDT.2017.7993514},
  doi          = {10.1109/ICICDT.2017.7993514},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/icicdt/IshibashiKS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HadiSWTIK16,
  author       = {M. S. Hadi and
                  Nobuyuki Sugii and
                  Hitoshi Wakabayashi and
                  Kazuo Tsutsui and
                  Hiroshi Iwai and
                  Kuniyuki Kakushima},
  title        = {Resistive switching properties of a thin SiO\({}_{\mbox{2}}\) layer
                  with CeO\({}_{\mbox{x}}\) buffer layer on n\({}^{\mbox{+}}\) and p\({}^{\mbox{+}}\)
                  Si bottom electrodes},
  journal      = {Microelectron. Reliab.},
  volume       = {63},
  pages        = {42--45},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.06.013},
  doi          = {10.1016/J.MICROREL.2016.06.013},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/HadiSWTIK16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieiceee/HoangSI15,
  author       = {Minh{-}Thien Hoang and
                  Nobuyuki Sugii and
                  Koichiro Ishibashi},
  title        = {A 27.6 {\(\mathrm{\mu}\)}W 315 MHz low-complexity {OOK} receiver with
                  on-off {RF} front-end},
  journal      = {{IEICE} Electron. Express},
  volume       = {12},
  number       = {7},
  pages        = {20150206},
  year         = {2015},
  url          = {https://doi.org/10.1587/elex.12.20150206},
  doi          = {10.1587/ELEX.12.20150206},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ieiceee/HoangSI15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/IshibashiSKUAKP15,
  author       = {Koichiro Ishibashi and
                  Nobuyuki Sugii and
                  Shiro Kamohara and
                  Kimiyoshi Usami and
                  Hideharu Amano and
                  Kazutoshi Kobayashi and
                  Cong{-}Kha Pham},
  title        = {A Perpetuum Mobile 32bit {CPU} on 65nm {SOTB} {CMOS} Technology with
                  Reverse-Body-Bias Assisted Sleep Mode},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {98-C},
  number       = {7},
  pages        = {536--543},
  year         = {2015},
  url          = {https://doi.org/10.1587/transele.E98.C.536},
  doi          = {10.1587/TRANSELE.E98.C.536},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ieicet/IshibashiSKUAKP15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/micro/SakamotoTTMHYOM15,
  author       = {Toshitsugu Sakamoto and
                  Yukihide Tsuji and
                  Munehiro Tada and
                  Hideki Makiyama and
                  Takumi Hasegawa and
                  Yoshiki Yamamoto and
                  Shinobu Okanishi and
                  Keiichi Maekawa and
                  Naoki Banno and
                  Makoto Miyamura and
                  Koichiro Okamoto and
                  Noriyuki Iguchi and
                  Hidekazu Oda and
                  Shiro Kamohara and
                  Yasushi Yamagata and
                  Nobuyuki Sugii and
                  Hiromitsu Hada and
                  Yasuhiro Ogasahara},
  title        = {A Silicon-on-Thin-Buried-Oxide {CMOS} Microcontroller with Embedded
                  Atom-Switch {ROM}},
  journal      = {{IEEE} Micro},
  volume       = {35},
  number       = {6},
  pages        = {13--23},
  year         = {2015},
  url          = {https://doi.org/10.1109/MM.2015.142},
  doi          = {10.1109/MM.2015.142},
  timestamp    = {Sun, 12 Nov 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/micro/SakamotoTTMHYOM15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiSOAKKNSWTNI15,
  author       = {Wei Li and
                  Akito Sasaki and
                  Hideyuki Oozu and
                  Katsuaki Aoki and
                  Kuniyuki Kakushima and
                  Yoshinori Kataoka and
                  Akira Nishiyama and
                  Nobuyuki Sugii and
                  Hitoshi Wakabayashi and
                  Kazuo Tsutsui and
                  Kenji Natori and
                  Hiroshi Iwai},
  title        = {Improvement of charge/discharge performance for lithium ion batteries
                  with tungsten trioxide electrodes},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {2},
  pages        = {402--406},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2014.11.002},
  doi          = {10.1016/J.MICROREL.2014.11.002},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LiSOAKKNSWTNI15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiSOAKKNSWTNI15a,
  author       = {Wei Li and
                  Akito Sasaki and
                  Hideyuki Oozu and
                  Katsuaki Aoki and
                  Kuniyuki Kakushima and
                  Yoshinori Kataoka and
                  Akira Nishiyama and
                  Nobuyuki Sugii and
                  Hitoshi Wakabayashi and
                  Kazuo Tsutsui and
                  Kenji Natori and
                  Hiroshi Iwai},
  title        = {Electron transport mechanism of tungsten trioxide powder thin film
                  studied by investigating effect of annealing on resistivity},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {2},
  pages        = {407--410},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2014.10.012},
  doi          = {10.1016/J.MICROREL.2014.10.012},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LiSOAKKNSWTNI15a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/coolchips/SakamotoTTMHYOM15,
  author       = {Toshitsugu Sakamoto and
                  Yukihide Tsuji and
                  Munehiro Tada and
                  Hideki Makiyama and
                  Takumi Hasegawa and
                  Yoshiki Yamamoto and
                  Shinobu Okanishi and
                  Keiichi Maekawa and
                  Naoki Banno and
                  Makoto Miyamura and
                  Koichiro Okamoto and
                  Noriyuki Iguchi and
                  Yasuhiro Ogasahara and
                  Hidekazu Oda and
                  Shiro Kamohara and
                  Yasushi Yamagata and
                  Nobuyuki Sugii and
                  Hiromitsu Hada},
  title        = {0.39-V, 18.26-{\(\mathrm{\mu}\)}W/MHz {SOTB} {CMOS} Microcontroller
                  with embedded atom switch {ROM}},
  booktitle    = {2015 {IEEE} Symposium in Low-Power and High-Speed Chips, {COOL} {CHIPS}
                  XVIII, Yokohama, Japan, April 13-15, 2015},
  pages        = {1--3},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/CoolChips.2015.7158658},
  doi          = {10.1109/COOLCHIPS.2015.7158658},
  timestamp    = {Sun, 12 Nov 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/coolchips/SakamotoTTMHYOM15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icicdt/LeSKNIP15,
  author       = {Duc{-}Hung Le and
                  Nobuyuki Sugii and
                  Shiro Kamohara and
                  Xuan{-}Thuan Nguyen and
                  Koichiro Ishibashi and
                  Cong{-}Kha Pham},
  title        = {Design of a low-power fixed-point 16-bit digital signal processor
                  using 65nm {SOTB} process},
  booktitle    = {2015 International Conference on {IC} Design {\&} Technology,
                  {ICICDT} 2015, Leuven, Belgium, June 1-3, 2015},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ICICDT.2015.7165918},
  doi          = {10.1109/ICICDT.2015.7165918},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/icicdt/LeSKNIP15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsic/TsujiBMSTBOISH15,
  author       = {Yukihide Tsuji and
                  Xu Bai and
                  Makoto Miyamura and
                  Toshitsugu Sakamoto and
                  Munehiro Tada and
                  Naoki Banno and
                  Koichiro Okamoto and
                  Noriyuki Iguchi and
                  Nobuyuki Sugii and
                  Hiromitsu Hada},
  title        = {Sub-{\(\mu\)}W standby power, {\textless}18 {\(\mu\)}W/DMIPS@25MHz
                  {MCU} with embedded atom-switch programmable logic and {ROM}},
  booktitle    = {Symposium on {VLSI} Circuits, {VLSIC} 2015, Kyoto, Japan, June 17-19,
                  2015},
  pages        = {86},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/VLSIC.2015.7231363},
  doi          = {10.1109/VLSIC.2015.7231363},
  timestamp    = {Sun, 12 Nov 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsic/TsujiBMSTBOISH15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DouSNKAKNSWTNI14,
  author       = {Chunmeng Dou and
                  Tomoya Shoji and
                  Kazuhiro Nakajima and
                  Kuniyuki Kakushima and
                  Parhat Ahmet and
                  Yoshinori Kataoka and
                  Akira Nishiyama and
                  Nobuyuki Sugii and
                  Hitoshi Wakabayashi and
                  Kazuo Tsutsui and
                  Kenji Natori and
                  Hiroshi Iwai},
  title        = {Characterization of interface state density of three-dimensional Si
                  nanostructure by charge pumping measurement},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {4},
  pages        = {725--729},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2013.11.016},
  doi          = {10.1016/J.MICROREL.2013.11.016},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DouSNKAKNSWTNI14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuHKOWNSWTKNYI14,
  author       = {Yan Wu and
                  Hiroyuki Hasegawa and
                  Kuniyuki Kakushima and
                  Kenji Ohmori and
                  Takanobu Watanabe and
                  Akira Nishiyama and
                  Nobuyuki Sugii and
                  Hitoshi Wakabayashi and
                  Kazuo Tsutsui and
                  Yoshinori Kataoka and
                  Kenji Natori and
                  Keisaku Yamada and
                  Hiroshi Iwai},
  title        = {A novel hetero-junction Tunnel-FET using Semiconducting silicide-Silicon
                  contact and its scalability},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {5},
  pages        = {899--904},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.01.023},
  doi          = {10.1016/J.MICROREL.2014.01.023},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/WuHKOWNSWTKNYI14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/coolchips/IshibashiSUAKPM14,
  author       = {Koichiro Ishibashi and
                  Nobuyuki Sugii and
                  Kimiyoshi Usami and
                  Hideharu Amano and
                  Kazutoshi Kobayashi and
                  Cong{-}Kha Pham and
                  Hideki Makiyama and
                  Yoshiki Yamamoto and
                  Hirofumi Shinohara and
                  Toshiaki Iwamatsu and
                  Yasuo Yamaguchi and
                  Hidekazu Oda and
                  Takumi Hasegawa and
                  Shinobu Okanishi and
                  Hiroshi Yanagita and
                  Shiro Kamohara and
                  Masaru Kadoshima and
                  Keiichi Maekawa and
                  Tomohiro Yamashita and
                  Duc{-}Hung Le and
                  Takumu Yomogita and
                  Masaru Kudo and
                  Kuniaki Kitamori and
                  Shuya Kondo and
                  Yuuki Manzawa},
  title        = {A Perpetuum Mobile 32bit {CPU} with 13.4pJ/cycle, 0.14{\(\mathrm{\mu}\)}A
                  sleep current using Reverse Body Bias Assisted 65nm {SOTB} {CMOS}
                  technology},
  booktitle    = {2014 {IEEE} Symposium on Low-Power and High-Speed Chips, {COOL} Chips
                  XVII, Yokohama, Japan, April 14-16, 2014},
  pages        = {1--3},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/CoolChips.2014.6842954},
  doi          = {10.1109/COOLCHIPS.2014.6842954},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/coolchips/IshibashiSUAKPM14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/hotchips/KamoharaSIUAKP14,
  author       = {Shiro Kamohara and
                  Nobuyuki Sugii and
                  Koichiro Ishibashi and
                  Kimiyoshi Usami and
                  Hideharu Amano and
                  Kazutoshi Kobayashi and
                  Cong{-}Kha Pham},
  title        = {A perpetuum mobile 32bit {CPU} on 65nm {SOTB} {CMOS} technology with
                  reverse-body-bias assisted sleep mode},
  booktitle    = {2014 {IEEE} Hot Chips 26 Symposium (HCS), Cupertino, CA, USA, August
                  10-12, 2014},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/HOTCHIPS.2014.7478838},
  doi          = {10.1109/HOTCHIPS.2014.7478838},
  timestamp    = {Wed, 07 Dec 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/hotchips/KamoharaSIUAKP14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/KawanagoKKNSWTNI13,
  author       = {Takamasa Kawanago and
                  Kuniyuki Kakushima and
                  Yoshinori Kataoka and
                  Akira Nishiyama and
                  Nobuyuki Sugii and
                  Hitoshi Wakabayashi and
                  Kazuo Tsutsui and
                  Kenji Natori and
                  Hiroshi Iwai},
  title        = {Advantage of TiN Schottky gate over conventional Ni for improved electrical
                  characteristics in AlGaN/GaN {HEMT}},
  booktitle    = {Proceedings of the European Solid-State Device Research Conference,
                  {ESSDERC} 2013, Bucharest, Romania, September 16-20, 2013},
  pages        = {107--110},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/ESSDERC.2013.6818830},
  doi          = {10.1109/ESSDERC.2013.6818830},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/KawanagoKKNSWTNI13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DouKATNSNHI12,
  author       = {Chunmeng Dou and
                  Kuniyuki Kakushima and
                  Parhat Ahmet and
                  Kazuo Tsutsui and
                  Akira Nishiyama and
                  Nobuyuki Sugii and
                  Kenji Natori and
                  Takeo Hattori and
                  Hiroshi Iwai},
  title        = {Resistive switching behavior of a CeO\({}_{\mbox{2}}\) based ReRAM
                  cell incorporated with Si buffer layer},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {4},
  pages        = {688--691},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.10.019},
  doi          = {10.1016/J.MICROREL.2011.10.019},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DouKATNSNHI12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MamatrishatKSKATKNSNHI12,
  author       = {M. Mamatrishat and
                  T. Kubota and
                  T. Seki and
                  Kuniyuki Kakushima and
                  Parhat Ahmet and
                  Kazuo Tsutsui and
                  Yoshinori Kataoka and
                  Akira Nishiyama and
                  Nobuyuki Sugii and
                  Kenji Natori and
                  Takeo Hattori and
                  Hiroshi Iwai},
  title        = {Oxide and interface trap densities estimation in ultrathin W/La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)/Si
                  {MOS} capacitors},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {6},
  pages        = {1039--1042},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.12.025},
  doi          = {10.1016/J.MICROREL.2011.12.025},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/MamatrishatKSKATKNSNHI12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/KawanagoKAKNSTNHI12,
  author       = {Takamasa Kawanago and
                  Kuniyuki Kakushima and
                  Parhat Ahmet and
                  Yoshinori Kataoka and
                  Akira Nishiyama and
                  Nobuyuki Sugii and
                  Kazuo Tsutsui and
                  Kenji Natori and
                  Takeo Hattori and
                  Hiroshi Iwai},
  title        = {{(100)-} and (110)-oriented nMOSFETs with highly scaled {EOT} in La-silicate/Si
                  interface for multi-gate architecture},
  booktitle    = {Proceedings of the 2012 European Solid-State Device Research Conference,
                  {ESSDERC} 2012, Bordeaux, France, September 17-21, 2012},
  pages        = {89--92},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/ESSDERC.2012.6343340},
  doi          = {10.1109/ESSDERC.2012.6343340},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/KawanagoKAKNSTNHI12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZadeSKSATNSNHSI11,
  author       = {D. Zade and
                  Soshi Sato and
                  Kuniyuki Kakushima and
                  A. Srivastava and
                  Parhat Ahmet and
                  Kazuo Tsutsui and
                  Akira Nishiyama and
                  Nobuyuki Sugii and
                  Kenji Natori and
                  Takeo Hattori and
                  Chandan Kumar Sarkar and
                  Hiroshi Iwai},
  title        = {Effects of La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) incorporation in
                  HfO\({}_{\mbox{2}}\) gated nMOSFETs on low-frequency noise},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {4},
  pages        = {746--750},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2010.11.004},
  doi          = {10.1016/J.MICROREL.2010.11.004},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ZadeSKSATNSNHSI11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KakushimaOKKTKSANTSHI10,
  author       = {Kuniyuki Kakushima and
                  K. Okamoto and
                  T. Koyanagi and
                  M. Kouda and
                  Kiichi Tachi and
                  Takamasa Kawanago and
                  J. Song and
                  Parhat Ahmet and
                  Hiroshi Nohira and
                  Kazuo Tsutsui and
                  Nobuyuki Sugii and
                  Takeo Hattori and
                  Hiroshi Iwai},
  title        = {SrO capping effect for La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)/Ce-silicate
                  gate dielectrics},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {3},
  pages        = {356--359},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2009.12.004},
  doi          = {10.1016/J.MICROREL.2009.12.004},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/KakushimaOKKTKSANTSHI10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KakushimaTATSHI10,
  author       = {Kuniyuki Kakushima and
                  Kiichi Tachi and
                  Parhat Ahmet and
                  Kazuo Tsutsui and
                  Nobuyuki Sugii and
                  Takeo Hattori and
                  Hiroshi Iwai},
  title        = {Advantage of further scaling in gate dielectrics below 0.5 nm of equivalent
                  oxide thickness with La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) gate dielectrics},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {6},
  pages        = {790--793},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.02.001},
  doi          = {10.1016/J.MICROREL.2010.02.001},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/KakushimaTATSHI10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AhmetNKNTSHI08,
  author       = {Parhat Ahmet and
                  Kentaro Nakagawa and
                  Kuniyuki Kakushima and
                  Hiroshi Nohira and
                  Kazuo Tsutsui and
                  Nobuyuki Sugii and
                  Takeo Hattori and
                  Hiroshi Iwai},
  title        = {Electrical characteristics of MOSFETs with La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)/Y\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
                  gate stack},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {11-12},
  pages        = {1769--1771},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2008.09.004},
  doi          = {10.1016/J.MICROREL.2008.09.004},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/AhmetNKNTSHI08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieiceee/ReyesKATSHI07,
  author       = {Joel Molina Reyes and
                  Kuniyuki Kakushima and
                  Parhat Ahmet and
                  Kazuo Tsutsui and
                  Nobuyuki Sugii and
                  Takeo Hattori and
                  Hiroshi Iwai},
  title        = {Carrier separation and Vth measurements of W-La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
                  gated {MOSFET} structures after electrical stress},
  journal      = {{IEICE} Electron. Express},
  volume       = {4},
  number       = {6},
  pages        = {185--191},
  year         = {2007},
  url          = {https://doi.org/10.1587/elex.4.185},
  doi          = {10.1587/ELEX.4.185},
  timestamp    = {Fri, 12 Feb 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ieiceee/ReyesKATSHI07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieiceee/NgSKATHI06,
  author       = {Jin{-}Aun Ng and
                  Nobuyuki Sugii and
                  Kuniyuki Kakushima and
                  Parhat Ahmet and
                  Kazuo Tsutsui and
                  Takeo Hattori and
                  Hiroshi Iwai},
  title        = {Effective mobility and interface-state density of La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
                  nMISFETs after post deposition annealing},
  journal      = {{IEICE} Electron. Express},
  volume       = {3},
  number       = {13},
  pages        = {316--321},
  year         = {2006},
  url          = {https://doi.org/10.1587/elex.3.316},
  doi          = {10.1587/ELEX.3.316},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ieiceee/NgSKATHI06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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