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ORCIDBibTeX records: Yuzo Takamatsu
@article{DBLP:journals/ieicet/HigamiSTKT09,
author = {Yoshinobu Higami and
Kewal K. Saluja and
Hiroshi Takahashi and
Shin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {Addressing Defect Coverage through Generating Test Vectors for Transistor
Defects},
journal = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
volume = {92-A},
number = {12},
pages = {3128--3135},
year = {2009},
url = {https://doi.org/10.1587/transfun.E92.A.3128},
doi = {10.1587/TRANSFUN.E92.A.3128},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/HigamiSTKT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ipsj/HigamiSTKT09,
author = {Yoshinobu Higami and
Kewal K. Saluja and
Hiroshi Takahashi and
Shin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {An Algorithm for Diagnosing Transistor Shorts Using Gate-level Simulation},
journal = {{IPSJ} Trans. Syst. {LSI} Des. Methodol.},
volume = {2},
pages = {250--262},
year = {2009},
url = {https://doi.org/10.2197/ipsjtsldm.2.250},
doi = {10.2197/IPSJTSLDM.2.250},
timestamp = {Tue, 29 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ipsj/HigamiSTKT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakahashiHTYTYH09,
author = {Hiroshi Takahashi and
Yoshinobu Higami and
Yuzo Takamatsu and
Koji Yamazaki and
Toshiyuki Tsutsumi and
Hiroyuki Yotsuyanagi and
Masaki Hashizume},
title = {New Class of Tests for Open Faults with Considering Adjacent Lines},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {301--306},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.39},
doi = {10.1109/ATS.2009.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TakahashiHTYTYH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HigamiKOYTSAT09,
author = {Yoshinobu Higami and
Yosuke Kurose and
Satoshi Ohno and
Hironori Yamaoka and
Hiroshi Takahashi and
Yoshihiro Shimizu and
Takashi Aikyo and
Yuzo Takamatsu},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Diagnostic test generation for transition faults using a stuck-at
{ATPG} tool},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355681},
doi = {10.1109/TEST.2009.5355681},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HigamiKOYTSAT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/YamazakiTTHATYH09,
author = {Koji Yamazaki and
Toshiyuki Tsutsumi and
Hiroshi Takahashi and
Yoshinobu Higami and
Takashi Aikyo and
Yuzo Takamatsu and
Hiroyuki Yotsuyanagi and
Masaki Hashizume},
title = {A Novel Approach for Improving the Quality of Open Fault Diagnosis},
booktitle = {{VLSI} Design 2009: Improving Productivity through Higher Abstraction,
The 22nd International Conference on {VLSI} Design, New Delhi, India,
5-9 January 2009},
pages = {85--90},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VLSI.Design.2009.53},
doi = {10.1109/VLSI.DESIGN.2009.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/YamazakiTTHATYH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/YotsuyanagiHTYAHTT09,
author = {Hiroyuki Yotsuyanagi and
Masaki Hashizume and
Toshiyuki Tsutsumi and
Koji Yamazaki and
Takashi Aikyo and
Yoshinobu Higami and
Hiroshi Takahashi and
Yuzo Takamatsu},
title = {Fault Effect of Open Faults Considering Adjacent Signal Lines in a
90 nm {IC}},
booktitle = {{VLSI} Design 2009: Improving Productivity through Higher Abstraction,
The 22nd International Conference on {VLSI} Design, New Delhi, India,
5-9 January 2009},
pages = {91--96},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VLSI.Design.2009.60},
doi = {10.1109/VLSI.DESIGN.2009.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/YotsuyanagiHTYAHTT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/YamazakiT08,
author = {Koji Yamazaki and
Yuzo Takamatsu},
title = {A Method of Locating Open Faults on Incompletely Identified Pass/Fail
Information},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {91-D},
number = {3},
pages = {661--666},
year = {2008},
url = {https://doi.org/10.1093/ietisy/e91-d.3.661},
doi = {10.1093/IETISY/E91-D.3.661},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/YamazakiT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/TakamatsuTHAY08,
author = {Yuzo Takamatsu and
Hiroshi Takahashi and
Yoshinobu Higami and
Takashi Aikyo and
Koji Yamazaki},
title = {Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {91-D},
number = {3},
pages = {675--682},
year = {2008},
url = {https://doi.org/10.1093/ietisy/e91-d.3.675},
doi = {10.1093/IETISY/E91-D.3.675},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/TakamatsuTHAY08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/HigamiSTKT08,
author = {Yoshinobu Higami and
Kewal K. Saluja and
Hiroshi Takahashi and
Shin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at
Test Tools},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {91-D},
number = {3},
pages = {690--699},
year = {2008},
url = {https://doi.org/10.1093/ietisy/e91-d.3.690},
doi = {10.1093/IETISY/E91-D.3.690},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/HigamiSTKT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/TakahashiHKTYAS08,
author = {Hiroshi Takahashi and
Yoshinobu Higami and
Shuhei Kadoyama and
Yuzo Takamatsu and
Koji Yamazaki and
Takashi Aikyo and
Yasuo Sato},
title = {Post-BIST Fault Diagnosis for Multiple Faults},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {91-D},
number = {3},
pages = {771--775},
year = {2008},
url = {https://doi.org/10.1093/ietisy/e91-d.3.771},
doi = {10.1093/IETISY/E91-D.3.771},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/TakahashiHKTYAS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/HigamiSTKT08a,
author = {Yoshinobu Higami and
Kewal K. Saluja and
Hiroshi Takahashi and
Shin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors},
journal = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
volume = {91-A},
number = {12},
pages = {3506--3513},
year = {2008},
url = {https://doi.org/10.1093/ietfec/e91-a.12.3506},
doi = {10.1093/IETFEC/E91-A.12.3506},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/HigamiSTKT08a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiSTKT08,
author = {Yoshinobu Higami and
Kewal K. Saluja and
Hiroshi Takahashi and
Shin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {Increasing Defect Coverage by Generating Test Vectors for Stuck-Open
Faults},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {97--102},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.39},
doi = {10.1109/ATS.2008.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiSTKT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakahashiHKATYT07,
author = {Hiroshi Takahashi and
Yoshinobu Higami and
Shuhei Kadoyama and
Takashi Aikyo and
Yuzo Takamatsu and
Koji Yamazaki and
Toshiyuki Tsutsumi and
Hiroyuki Yotsuyanagi and
Masaki Hashizume},
title = {Clues for Modeling and Diagnosing Open Faults with Considering Adjacent
Lines},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {39--44},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.34},
doi = {10.1109/ATS.2007.34},
timestamp = {Wed, 09 Nov 2022 21:30:34 +0100},
biburl = {https://dblp.org/rec/conf/ats/TakahashiHKATYT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiSTKT07,
author = {Yoshinobu Higami and
Kewal K. Saluja and
Hiroshi Takahashi and
Shin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {Test Generation for Transistor Shorts using Stuck-at Fault Simulator
and Test Generator},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {271--274},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.64},
doi = {10.1109/ATS.2007.64},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiSTKT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/AikyoTHOOT07,
author = {Takashi Aikyo and
Hiroshi Takahashi and
Yoshinobu Higami and
Junichi Ootsu and
Kyohei Ono and
Yuzo Takamatsu},
editor = {Cristiana Bolchini and
Yong{-}Bin Kim and
Adelio Salsano and
Nur A. Touba},
title = {Timing-Aware Diagnosis for Small Delay Defects},
booktitle = {22nd {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2007), 26-28 September 2007, Rome, Italy},
pages = {223--234},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DFT.2007.30},
doi = {10.1109/DFT.2007.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/AikyoTHOOT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/TakahashiHKATYH07,
author = {Hiroshi Takahashi and
Yoshinobu Higami and
Toru Kikkawa and
Takashi Aikyo and
Yuzo Takamatsu and
Hiroyuki Yotsuyanagi and
Masaki Hashizume},
editor = {Cristiana Bolchini and
Yong{-}Bin Kim and
Adelio Salsano and
Nur A. Touba},
title = {Test Generation and Diagnostic Test Generation for Open Faults with
Considering Adjacent Lines},
booktitle = {22nd {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2007), 26-28 September 2007, Rome, Italy},
pages = {243--251},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DFT.2007.11},
doi = {10.1109/DFT.2007.11},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/TakahashiHKATYH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/HigamiSTT07,
author = {Yoshinobu Higami and
Kewal K. Saluja and
Hiroshi Takahashi and
Yuzo Takamatsu},
title = {Fault Coverage and Fault Efficiency of Transistor Shorts using Gate-Level
Simulation and Test Generation},
booktitle = {20th International Conference on {VLSI} Design {(VLSI} Design 2007),
Sixth International Conference on Embedded Systems {(ICES} 2007),
6-10 January 2007, Bangalore, India},
pages = {781--786},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/VLSID.2007.83},
doi = {10.1109/VLSID.2007.83},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/HigamiSTT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/HigamiKPKT06,
author = {Yoshinobu Higami and
Seiji Kajihara and
Irith Pomeranz and
Shin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {On Finding Don't Cares in Test Sequences for Sequential Circuits},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {89-D},
number = {11},
pages = {2748--2755},
year = {2006},
url = {https://doi.org/10.1093/ietisy/e89-d.11.2748},
doi = {10.1093/IETISY/E89-D.11.2748},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/HigamiKPKT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/HigamiSTKT06,
author = {Yoshinobu Higami and
Kewal K. Saluja and
Hiroshi Takahashi and
Shin{-}ya Kobayashi and
Yuzo Takamatsu},
editor = {Fumiyasu Hirose},
title = {Compaction of pass/fail-based diagnostic test vectors for combinational
and sequential circuits},
booktitle = {Proceedings of the 2006 Conference on Asia South Pacific Design Automation:
{ASP-DAC} 2006, Yokohama, Japan, January 24-27, 2006},
pages = {659--664},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ASPDAC.2006.1594761},
doi = {10.1109/ASPDAC.2006.1594761},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/aspdac/HigamiSTKT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YamazakiT06,
author = {Koji Yamazaki and
Yuzo Takamatsu},
title = {Fanout-based fault diagnosis for open faults on pass/fail information},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {349--353},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260954},
doi = {10.1109/ATS.2006.260954},
timestamp = {Mon, 07 Nov 2022 17:39:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YamazakiT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiSTKT06,
author = {Yoshinobu Higami and
Kewal K. Saluja and
Hiroshi Takahashi and
Sin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {Diagnosis of Transistor Shorts in Logic Test Environment},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {354--359},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260955},
doi = {10.1109/ATS.2006.260955},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiSTKT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/TakahashiKHTYAS06,
author = {Hiroshi Takahashi and
Shuhei Kadoyama and
Yoshinobu Higami and
Yuzo Takamatsu and
Koji Yamazaki and
Takashi Aikyo and
Yasuo Sato},
title = {Effective Post-BIST Fault Diagnosis for Multiple Faults},
booktitle = {21th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2006), 4-6 October 2006, Arlington, Virginia,
{USA}},
pages = {401--109},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/DFT.2006.24},
doi = {10.1109/DFT.2006.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/TakahashiKHTYAS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/scjapan/HigamiKIT05,
author = {Yoshinobu Higami and
Seiji Kajihara and
Hideyuki Ichihara and
Yuzo Takamatsu},
title = {Test cost reduction for logic circuits: Reduction of test data volume
and test application time},
journal = {Syst. Comput. Jpn.},
volume = {36},
number = {6},
pages = {69--83},
year = {2005},
url = {https://doi.org/10.1002/scj.20240},
doi = {10.1002/SCJ.20240},
timestamp = {Wed, 13 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/scjapan/HigamiKIT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/TakahashiKLST05,
author = {Hiroshi Takahashi and
Keith J. Keller and
Kim T. Le and
Kewal K. Saluja and
Yuzo Takamatsu},
title = {A method for reducing the target fault list of crosstalk faults in
synchronous sequential circuits},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {24},
number = {2},
pages = {252--263},
year = {2005},
url = {https://doi.org/10.1109/TCAD.2004.837733},
doi = {10.1109/TCAD.2004.837733},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/TakahashiKLST05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/SeiyamaTHYT05,
author = {T. Seiyama and
Hiroshi Takahashi and
Yoshinobu Higami and
Kazuo Yamazaki and
Yuzo Takamatsu},
title = {On the fault diagnosis in the presence of unknown fault models using
pass/fail information},
booktitle = {International Symposium on Circuits and Systems {(ISCAS} 2005), 23-26
May 2005, Kobe, Japan},
pages = {2987--2990},
publisher = {{IEEE}},
year = {2005},
url = {https://doi.org/10.1109/ISCAS.2005.1465255},
doi = {10.1109/ISCAS.2005.1465255},
timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
biburl = {https://dblp.org/rec/conf/iscas/SeiyamaTHYT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/HigamiKT04,
author = {Yoshinobu Higami and
Shin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {Generation of Test Sequences with Low Power Dissipation for Sequential
Circuits},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {87-D},
number = {3},
pages = {530--536},
year = {2004},
url = {http://search.ieice.org/bin/summary.php?id=e87-d\_3\_530},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/HigamiKT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiKKT04,
author = {Yoshinobu Higami and
Seiji Kajihara and
Shin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {Techniques for Finding Xs in Test Sequences for Sequential Circuits
and Applications to Test Length/Power Reduction},
booktitle = {13th Asian Test Symposium {(ATS} 2004), 15-17 November 2004, Kenting,
Taiwan},
pages = {46--49},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ATS.2004.80},
doi = {10.1109/ATS.2004.80},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiKKT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakahashiYHT04,
author = {Hiroshi Takahashi and
Yukihiro Yamamoto and
Yoshinobu Higami and
Yuzo Takamatsu},
title = {Enhancing {BIST} Based Single/Multiple Stuck-at Fault Diagnosis by
Ambiguous Test Set},
booktitle = {13th Asian Test Symposium {(ATS} 2004), 15-17 November 2004, Kenting,
Taiwan},
pages = {216--221},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ATS.2004.41},
doi = {10.1109/ATS.2004.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TakahashiYHT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatoTHT04,
author = {Yuichi Sato and
Hiroshi Takahashi and
Yoshinobu Higami and
Yuzo Takamatsu},
title = {Failure Analysis of Open Faults by Using Detecting/Un-detecting Information
on Tests},
booktitle = {13th Asian Test Symposium {(ATS} 2004), 15-17 November 2004, Kenting,
Taiwan},
pages = {222--227},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ATS.2004.44},
doi = {10.1109/ATS.2004.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatoTHT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/TakahashiTAT03,
author = {Hiroshi Takahashi and
Yasunori Tsugaoka and
Hidekazu Ayano and
Yuzo Takamatsu},
title = {{BIST} Based Fault Diagnosis Using Ambiguous Test Set},
booktitle = {18th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2003), 3-5 November 2003, Boston, MA, USA,
Proceedings},
pages = {89--96},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/DFTVS.2003.1250099},
doi = {10.1109/DFTVS.2003.1250099},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/TakahashiTAT03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/HigamiKTKP03,
author = {Yoshinobu Higami and
Shin{-}ya Kobayashi and
Yuzo Takamatsu and
Seiji Kajihara and
Irith Pomeranz},
title = {A Method to Find Don't Care Values in Test Sequences for Sequential
Circuits},
booktitle = {21st International Conference on Computer Design {(ICCD} 2003),VLSI
in Computers and Processors, 13-15 October 2003, San Jose, CA, USA,
Proceedings},
pages = {397},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/ICCD.2003.1240927},
doi = {10.1109/ICCD.2003.1240927},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/HigamiKTKP03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/TakahashiBST02,
author = {Hiroshi Takahashi and
Kwame Osei Boateng and
Kewal K. Saluja and
Yuzo Takamatsu},
title = {On diagnosing multiple stuck-at faults using multiple and singlefault
simulation in combinational circuits},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {21},
number = {3},
pages = {362--368},
year = {2002},
url = {https://doi.org/10.1109/43.986429},
doi = {10.1109/43.986429},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/TakahashiBST02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KellerTLST02,
author = {Keith J. Keller and
Hiroshi Takahashi and
Kim T. Le and
Kewal K. Saluja and
Yuzo Takamatsu},
title = {Reduction of Target Fault List for Crosstalk-Induced Delay Faults
by using Layout Constraints},
booktitle = {11th Asian Test Symposium {(ATS} 2002), 18-20 November 2002, Guam,
{USA}},
pages = {242--247},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/ATS.2002.1181718},
doi = {10.1109/ATS.2002.1181718},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KellerTLST02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiKT02,
author = {Yoshinobu Higami and
Shin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {A Method to Reduce Power Dissipation during Test for Sequential Circuits},
booktitle = {11th Asian Test Symposium {(ATS} 2002), 18-20 November 2002, Guam,
{USA}},
pages = {326--331},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/ATS.2002.1181732},
doi = {10.1109/ATS.2002.1181732},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiKT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/HigamiKT02,
author = {Yoshinobu Higami and
Shin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {Modifying Test Vectors for Reducing Power Dissipation in {CMOS} Circuits},
booktitle = {1st {IEEE} International Workshop on Electronic Design, Test and Applications
{(DELTA} 2002), 29-31 January 2002, Christchurch, New Zealand},
pages = {431--433},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/DELTA.2002.994665},
doi = {10.1109/DELTA.2002.994665},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/HigamiKT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/prdc/TakahashiST02,
author = {Hiroshi Takahashi and
Kewal K. Saluja and
Yuzo Takamatsu},
title = {An Alternative Method of Generating Tests for Path Delay Faults Using
{N} -Detection Test Sets},
booktitle = {9th Pacific Rim International Symposium on Dependable Computing {(PRDC}
2002), 16-18 December 2002, Tsukuba-City, Ibarski, Japan},
pages = {275--282},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/PRDC.2002.1185647},
doi = {10.1109/PRDC.2002.1185647},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/prdc/TakahashiST02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakahashiPHST01,
author = {Hiroshi Takahashi and
Marong Phadoongsidhi and
Yoshinobu Higami and
Kewal K. Saluja and
Yuzo Takamatsu},
title = {Simulation-Based Diagnosis for Crosstalk Faults in Sequential Circuits},
booktitle = {10th Asian Test Symposium {(ATS} 2001), 19-21 November 2001, Kyoto,
Japan},
pages = {63},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/ATS.2001.990260},
doi = {10.1109/ATS.2001.990260},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TakahashiPHST01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiTT01,
author = {Yoshinobu Higami and
Naoko Takahashi and
Yuzo Takamatsu},
title = {Test Generation for Double Stuck-at Faults},
booktitle = {10th Asian Test Symposium {(ATS} 2001), 19-21 November 2001, Kyoto,
Japan},
pages = {71--75},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/ATS.2001.990261},
doi = {10.1109/ATS.2001.990261},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiTT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KellerTST01,
author = {Keith J. Keller and
Hiroshi Takahashi and
Kewal K. Saluja and
Yuzo Takamatsu},
title = {On reducing the target fault list of crosstalk-induced delay faults
in synchronous sequential circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {568--577},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966675},
doi = {10.1109/TEST.2001.966675},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KellerTST01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HigamiTSK00,
author = {Yoshinobu Higami and
Yuzo Takamatsu and
Kewal K. Saluja and
Kozo Kinoshita},
title = {Algorithms to Select {IDDQ} Measurement Vectors for Bridging Faults
in Sequential Circuits},
journal = {J. Electron. Test.},
volume = {16},
number = {5},
pages = {443--451},
year = {2000},
url = {https://doi.org/10.1023/A:1008360430959},
doi = {10.1023/A:1008360430959},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HigamiTSK00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/scjapan/MinamiyamaT00,
author = {Tetsuro Minamiyama and
Yuzo Takamatsu},
title = {Identification of redundant faults in combinational circuits},
journal = {Syst. Comput. Jpn.},
volume = {31},
number = {6},
pages = {65--73},
year = {2000},
url = {https://doi.org/10.1002/(SICI)1520-684X(200006)31:6\&\#60;65::AID-SCJ7\&\#62;3.0.CO;2-\%23},
doi = {10.1002/(SICI)1520-684X(200006)31:6\&\#60;65::AID-SCJ7\&\#62;3.0.CO;2-\%23},
timestamp = {Mon, 30 Oct 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/scjapan/MinamiyamaT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/scjapan/HigamiSTK00,
author = {Yoshinobu Higami and
Kewal K. Saluja and
Yuzo Takamatsu and
Kozo Kinoshita},
title = {Static test compaction for {IDDQ} testing of bridging faults in sequential
circuits},
journal = {Syst. Comput. Jpn.},
volume = {31},
number = {11},
pages = {41--50},
year = {2000},
url = {https://doi.org/10.1002/1520-684X(200010)31:11\&\#60;41::AID-SCJ5\&\#62;3.0.CO;2-F},
doi = {10.1002/1520-684X(200010)31:11\&\#60;41::AID-SCJ5\&\#62;3.0.CO;2-F},
timestamp = {Wed, 13 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/scjapan/HigamiSTK00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/HigamiTSK00,
author = {Yoshinobu Higami and
Yuzo Takamatsu and
Kewal K. Saluja and
Kozo Kinoshita},
title = {Fault models and test generation for {IDDQ} testing: embedded tutorial},
booktitle = {Proceedings of {ASP-DAC} 2000, Asia and South Pacific Design Automation
Conference 2000, Yokohama, Japan},
pages = {509--514},
publisher = {{ACM}},
year = {2000},
url = {https://doi.org/10.1145/368434.368773},
doi = {10.1145/368434.368773},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/HigamiTSK00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiTK00,
author = {Yoshinobu Higami and
Yuzo Takamatsu and
Kozo Kinoshita},
title = {Test sequence compaction for sequential circuits with reset states},
booktitle = {9th Asian Test Symposium {(ATS} 2000), 4-6 December 2000, Taipei,
Taiwan},
pages = {165--170},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/ATS.2000.893620},
doi = {10.1109/ATS.2000.893620},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiTK00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BoatengTT00,
author = {Kwame Osei Boateng and
Hiroshi Takahashi and
Yuzo Takamatsu},
title = {General BIST-Amenable Method of Test Generation for Iterative Logic
Arrays},
booktitle = {18th {IEEE} {VLSI} Test Symposium {(VTS} 2000), 30 April - 4 May 2000,
Montreal, Canada},
pages = {171--178},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/VTEST.2000.843842},
doi = {10.1109/VTEST.2000.843842},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BoatengTT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiTSK99,
author = {Yoshinobu Higami and
Yuzo Takamatsu and
Kewal K. Saluja and
Kozo Kinoshita},
title = {Fault Simulation Techniques to Reduce {IDDQ} Measurement Vectors for
Sequential Circuits},
booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
China},
pages = {141--146},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/ATS.1999.810742},
doi = {10.1109/ATS.1999.810742},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiTSK99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakahashiBTY99,
author = {Hiroshi Takahashi and
Kwame Osei Boateng and
Yuzo Takamatsu and
Nobuhiro Yanagida},
title = {Multiple Fault Diagnosis in Logic Circuits Using {EB} Tester and Multiple/Single
Fault Simulators},
booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
China},
pages = {341--346},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/ATS.1999.810773},
doi = {10.1109/ATS.1999.810773},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TakahashiBTY99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TakahashiBT99,
author = {Hiroshi Takahashi and
Kwame Osei Boateng and
Yuzo Takamatsu},
title = {A New Method for Diagnosing Multiple Stuck-at Faults using Multiple
and Single Fault Simulations},
booktitle = {17th {IEEE} {VLSI} Test Symposium {(VTS} '99), 25-30 April 1999, San
Diego, CA, {USA}},
pages = {64--69},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/VTEST.1999.766648},
doi = {10.1109/VTEST.1999.766648},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TakahashiBT99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakahashiBT98,
author = {Hiroshi Takahashi and
Kwame Osei Boateng and
Yuzo Takamatsu},
title = {Diagnosis of Single Gate Delay Faults in Combinational Circuits using
Delay Fault Simulation},
booktitle = {7th Asian Test Symposium {(ATS} '98), 2-4 December 1998, Singapore},
pages = {108--112},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/ATS.1998.741599},
doi = {10.1109/ATS.1998.741599},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TakahashiBT98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YanagidaTT98,
author = {Nobuhiro Yanagida and
Hiroshi Takahashi and
Yuzo Takamatsu},
title = {Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based
on Sensitized Paths},
booktitle = {7th Asian Test Symposium {(ATS} '98), 2-4 December 1998, Singapore},
pages = {237},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/ATS.1998.741619},
doi = {10.1109/ATS.1998.741619},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YanagidaTT98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/scjapan/TakahashiWMT97,
author = {Hiroshi Takahashi and
Takashi Watanabe and
Toshiyuki Matsunaga and
Yuzo Takamatsu},
title = {Tests for small gate delay faults in combinational circuits and a
test generation method},
journal = {Syst. Comput. Jpn.},
volume = {28},
number = {6},
pages = {68--76},
year = {1997},
url = {https://doi.org/10.1002/(SICI)1520-684X(19970615)28:6\&\#60;68::AID-SCJ8\&\#62;3.0.CO;2-K},
doi = {10.1002/(SICI)1520-684X(19970615)28:6\&\#60;68::AID-SCJ8\&\#62;3.0.CO;2-K},
timestamp = {Wed, 13 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/scjapan/TakahashiWMT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BoatengTT97,
author = {Kwame Osei Boateng and
Hiroshi Takahashi and
Yuzo Takamatsu},
title = {Design of C-Testable Multipliers Based on the Modified Booth Algorithm},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {42--47},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643914},
doi = {10.1109/ATS.1997.643914},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BoatengTT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakahashiBTM97,
author = {Hiroshi Takahashi and
Kwame Osei Boateng and
Yuzo Takamatsu and
Toshiyuki Matsunaga},
title = {A Method of Generating Tests for Marginal Delays an Delay Faults in
Combinational Circuits},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {320--325},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643977},
doi = {10.1109/ATS.1997.643977},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TakahashiBTM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ftcs/YanagidaTT96,
author = {Nobuhiro Yanagida and
Hiroshi Takahashi and
Yuzo Takamatsu},
title = {Multiple Fault Diagnosis in Sequential Circuits Using Sensitizing
Sequence Pairs},
booktitle = {Digest of Papers: FTCS-26, The Twenty-Sixth Annual International Symposium
on Fault-Tolerant Computing, Sendai, Japan, June 25-27, 1996},
pages = {86--95},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/FTCS.1996.534597},
doi = {10.1109/FTCS.1996.534597},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ftcs/YanagidaTT96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/YanagidaTT95,
author = {Nobuhiro Yanagida and
Hiroshi Takahashi and
Yuzo Takamatsu},
title = {Multiple Fault Diagnosis by Sensitizing Input Pairs},
journal = {{IEEE} Des. Test Comput.},
volume = {12},
number = {3},
pages = {44--52},
year = {1995},
url = {https://doi.org/10.1109/MDT.1995.466375},
doi = {10.1109/MDT.1995.466375},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/YanagidaTT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/YuTT95,
author = {Xiangqiu Yu and
Hiroshi Takahashi and
Yuzo Takamatsu},
title = {A Study for Testability of Redundant Faults in Combinational Circuits
Using Delay Effects},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {78-D},
number = {7},
pages = {822--829},
year = {1995},
url = {http://search.ieice.org/bin/summary.php?id=e78-d\_7\_822},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/YuTT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/scjapan/YanagidaTT95,
author = {Nobuhiro Yanagida and
Hiroshi Takahashi and
Yuzo Takamatsu},
title = {Multiple fault diagnosis in combinational circuits using sensitizing
input-pairs},
journal = {Syst. Comput. Jpn.},
volume = {26},
number = {3},
pages = {17--29},
year = {1995},
url = {https://doi.org/10.1002/scj.4690260302},
doi = {10.1002/SCJ.4690260302},
timestamp = {Wed, 13 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/scjapan/YanagidaTT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/scjapan/TakamatsuHK95,
author = {Yuzo Takamatsu and
Isao Higashi and
Tsuyoshi Kodama},
title = {Test generation for sequential circuits using parallel fault simulation
with random inputs},
journal = {Syst. Comput. Jpn.},
volume = {26},
number = {10},
pages = {24--34},
year = {1995},
url = {https://doi.org/10.1002/scj.4690261003},
doi = {10.1002/SCJ.4690261003},
timestamp = {Wed, 13 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/scjapan/TakamatsuHK95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakahashiYT95,
author = {Hiroshi Takahashi and
Nobuhiro Yanagida and
Yuzo Takamatsu},
title = {Enhancing multiple fault diagnosis in combinational circuits based
on sensitized paths and {EB} testing},
booktitle = {4th Asian Test Symposium {(ATS} '95), November 23-24, 1995. Bangalore,
India},
pages = {58--64},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/ATS.1995.485317},
doi = {10.1109/ATS.1995.485317},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TakahashiYT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakahashiWT95,
author = {Hiroshi Takahashi and
Takashi Watanabe and
Yuzo Takamatsu},
title = {Generation of tenacious tests for small gate delay faults in combinational
circuits},
booktitle = {4th Asian Test Symposium {(ATS} '95), November 23-24, 1995. Bangalore,
India},
pages = {332--338},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/ATS.1995.485357},
doi = {10.1109/ATS.1995.485357},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TakahashiWT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TakamatsuK90,
author = {Yuzo Takamatsu and
Kozo Kinoshita},
title = {Extended selection of switching target faults in {CONT} algorithm
for test generation},
journal = {J. Electron. Test.},
volume = {1},
number = {3},
pages = {183--189},
year = {1990},
url = {https://doi.org/10.1007/BF00153855},
doi = {10.1007/BF00153855},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/TakamatsuK90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aaecc/MoriiT90,
author = {Masakatu Morii and
Yuzo Takamatsu},
editor = {Shojiro Sakata},
title = {Exponetiation in Finite Fields Using Dual Basis Multiplier},
booktitle = {Applied Algebra, Algebraic Algorithms and Error-Correcting Codes,
8th International Symposium, AAECC-8, Tokyo, Japan, August 20-24,
1990, Proceedings},
series = {Lecture Notes in Computer Science},
volume = {508},
pages = {354--366},
publisher = {Springer},
year = {1990},
url = {https://doi.org/10.1007/3-540-54195-0\_64},
doi = {10.1007/3-540-54195-0\_64},
timestamp = {Fri, 17 Jul 2020 16:12:48 +0200},
biburl = {https://dblp.org/rec/conf/aaecc/MoriiT90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/TakamatsuK89,
author = {Yuzo Takamatsu and
Kozo Kinoshita},
title = {{CONT:} a concurrent test generation system},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {8},
number = {9},
pages = {966--972},
year = {1989},
url = {https://doi.org/10.1109/43.35548},
doi = {10.1109/43.35548},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/TakamatsuK89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/FujiwaraTNYTF88,
author = {Hideo Fujiwara and
Yuzo Takamatsu and
Takashi Nanya and
Teruhiko Yamada and
Hideo Tamamoto and
Kiyoshi Furuya},
title = {Test research in Japan},
journal = {{IEEE} Des. Test},
volume = {5},
number = {5},
pages = {60--79},
year = {1988},
url = {https://doi.org/10.1109/54.7982},
doi = {10.1109/54.7982},
timestamp = {Tue, 02 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/FujiwaraTNYTF88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/OgiharaMTKF83,
author = {Takuji Ogihara and
Shinichi Murai and
Yuzo Takamatsu and
Kozo Kinoshita and
Hideo Fujiwara},
editor = {Charles E. Radke},
title = {Test generation for scan design circuits with tri-state modules and
bidirectional terminals},
booktitle = {Proceedings of the 20th Design Automation Conference, {DAC} '83, Miami
Beach, Florida, USA, June 27-29, 1983},
pages = {71--78},
publisher = {{ACM/IEEE}},
year = {1983},
url = {http://dl.acm.org/citation.cfm?id=800643},
timestamp = {Wed, 29 Mar 2017 16:45:25 +0200},
biburl = {https://dblp.org/rec/conf/dac/OgiharaMTKF83.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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