BibTeX records: Hei Wong

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@inproceedings{DBLP:conf/icspcc/HongWCC23,
  author       = {Jinfa Hong and
                  Hei Wong and
                  Oliver C. S. Choy and
                  Ray C. C. Cheung},
  title        = {A Platform for Adaptive Interference Mitigation and Intent Analysis
                  Using OpenLANE},
  booktitle    = {{IEEE} International Conference on Signal Processing, Communications
                  and Computing, {ICSPCC} 2023, Zhengzhou, China, November 14-17, 2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ICSPCC59353.2023.10400251},
  doi          = {10.1109/ICSPCC59353.2023.10400251},
  timestamp    = {Sat, 24 Feb 2024 20:42:50 +0100},
  biburl       = {https://dblp.org/rec/conf/icspcc/HongWCC23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/chinaf/WongDC22,
  author       = {Hei Wong and
                  Shurong Dong and
                  Zehua Chen},
  title        = {Effects of non-fatal electrostatic discharge on the threshold voltage
                  degradation in nano {CMOS} devices},
  journal      = {Sci. China Inf. Sci.},
  volume       = {65},
  number       = {2},
  year         = {2022},
  url          = {https://doi.org/10.1007/s11432-020-3197-8},
  doi          = {10.1007/S11432-020-3197-8},
  timestamp    = {Thu, 23 Jun 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/chinaf/WongDC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/LaiTKW20,
  author       = {Shuk{-}Fun Lai and
                  Wing{-}Shan Tam and
                  Chi{-}Wah Kok and
                  Hei Wong},
  title        = {{CMOS} low power split-drain {MAGFET} based magnetic field strength
                  sensor},
  journal      = {Microelectron. J.},
  volume       = {100},
  pages        = {104759},
  year         = {2020},
  url          = {https://doi.org/10.1016/j.mejo.2020.104759},
  doi          = {10.1016/J.MEJO.2020.104759},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mj/LaiTKW20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuDJWXLL18,
  author       = {Tao Hu and
                  Shurong Dong and
                  Hao Jin and
                  Hei Wong and
                  Zekun Xu and
                  Xiang Li and
                  Juin J. Liou},
  title        = {A double snapback {SCR} {ESD} protection scheme for 28{\unicode{8239}}nm
                  {CMOS} process},
  journal      = {Microelectron. Reliab.},
  volume       = {84},
  pages        = {20--25},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.03.010},
  doi          = {10.1016/J.MICROREL.2018.03.010},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HuDJWXLL18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FengRMDPW18,
  author       = {Xuan Feng and
                  Nagarajan Raghavan and
                  Sen Mei and
                  Shurong Dong and
                  Kin Leong Pey and
                  Hei Wong},
  title        = {Statistical nature of hard breakdown recovery in high-{\(\kappa\)}
                  dielectric stacks studied using ramped voltage stress},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {164--168},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.07.104},
  doi          = {10.1016/J.MICROREL.2018.07.104},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/FengRMDPW18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcas/LiuLCCW18,
  author       = {Yao Liu and
                  Xiao{-}Zhou Li and
                  Ray C. C. Cheung and
                  Sze{-}Chun Chan and
                  Hei Wong},
  title        = {High-Speed Discrete Gaussian Sampler With Heterodyne Chaotic Laser
                  Inputs},
  journal      = {{IEEE} Trans. Circuits Syst. {II} Express Briefs},
  volume       = {65-II},
  number       = {6},
  pages        = {794--798},
  year         = {2018},
  url          = {https://doi.org/10.1109/TCSII.2017.2749204},
  doi          = {10.1109/TCSII.2017.2749204},
  timestamp    = {Wed, 27 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcas/LiuLCCW18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fpl/0006CW18,
  author       = {Yao Liu and
                  Ray C. C. Cheung and
                  Hei Wong},
  title        = {Lightweight Secure Processor Prototype on {FPGA}},
  booktitle    = {28th International Conference on Field Programmable Logic and Applications,
                  {FPL} 2018, Dublin, Ireland, August 27-31, 2018},
  pages        = {443--444},
  publisher    = {{IEEE} Computer Society},
  year         = {2018},
  url          = {https://doi.org/10.1109/FPL.2018.00081},
  doi          = {10.1109/FPL.2018.00081},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/fpl/0006CW18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcas/LiuCW17,
  author       = {Yao Liu and
                  Ray C. C. Cheung and
                  Hei Wong},
  title        = {A Bias-Bounded Digital True Random Number Generator Architecture},
  journal      = {{IEEE} Trans. Circuits Syst. {I} Regul. Pap.},
  volume       = {64-I},
  number       = {1},
  pages        = {133--144},
  year         = {2017},
  url          = {https://doi.org/10.1109/TCSI.2016.2606353},
  doi          = {10.1109/TCSI.2016.2606353},
  timestamp    = {Fri, 22 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcas/LiuCW17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AsenovSTWZ16,
  author       = {Asen Asenov and
                  Ulf Schlichtmann and
                  Cher Ming Tan and
                  Hei Wong and
                  Xing Zhou},
  title        = {Editorial},
  journal      = {Microelectron. Reliab.},
  volume       = {61},
  pages        = {1--2},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.028},
  doi          = {10.1016/J.MICROREL.2016.03.028},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AsenovSTWZ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FengDWYPSL16,
  author       = {Xuan Feng and
                  Shurong Dong and
                  Hei Wong and
                  Danqun Yu and
                  Kin Leong Pey and
                  Kalya Shubhakar and
                  W. S. Lau},
  title        = {Effects of thermal annealing on the charge localization characteristics
                  of HfO\({}_{\mbox{2}}\)/Au/HfO\({}_{\mbox{2}}\) stack},
  journal      = {Microelectron. Reliab.},
  volume       = {61},
  pages        = {78--81},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.02.012},
  doi          = {10.1016/J.MICROREL.2016.02.012},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/FengDWYPSL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuLWFDP16,
  author       = {Danqun Yu and
                  W. S. Lau and
                  Hei Wong and
                  Xuan Feng and
                  Shurong Dong and
                  Kin Leong Pey},
  title        = {The variation of the leakage current characteristics of W/Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\)/W
                  {MIM} capacitors with the thickness of the bottom {W} electrode},
  journal      = {Microelectron. Reliab.},
  volume       = {61},
  pages        = {95--98},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.02.013},
  doi          = {10.1016/J.MICROREL.2016.02.013},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/YuLWFDP16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuJDWZW16,
  author       = {Zhihui Yu and
                  Hao Jin and
                  Shurong Dong and
                  Hei Wong and
                  Jie Zeng and
                  Weihuai Wang},
  title        = {Comparative study of reliability degradation behaviors of {LDMOS}
                  and {LDMOS-SCR} {ESD} protection devices},
  journal      = {Microelectron. Reliab.},
  volume       = {61},
  pages        = {111--114},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.024},
  doi          = {10.1016/J.MICROREL.2015.12.024},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YuJDWZW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SunZW16,
  author       = {Lixia Sun and
                  Jianxin Zhu and
                  Hei Wong},
  title        = {Simulation and evaluation of the peak temperature in {LED} light bulb
                  heatsink},
  journal      = {Microelectron. Reliab.},
  volume       = {61},
  pages        = {140--144},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.023},
  doi          = {10.1016/J.MICROREL.2015.12.023},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SunZW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ijcta/WongWTK15,
  author       = {Oi{-}Ying Wong and
                  Hei Wong and
                  Wing{-}Shan Tam and
                  Chi{-}Wah Kok},
  title        = {A dynamic-biasing 4{\texttimes} charge pump based on exponential topology},
  journal      = {Int. J. Circuit Theory Appl.},
  volume       = {43},
  number       = {3},
  pages        = {401--414},
  year         = {2015},
  url          = {https://doi.org/10.1002/cta.1949},
  doi          = {10.1002/CTA.1949},
  timestamp    = {Mon, 11 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ijcta/WongWTK15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/TamKW15,
  author       = {Wing{-}Shan Tam and
                  Chi{-}Wah Kok and
                  Hei Wong},
  title        = {Optimization of loss tangent and capacitor size of micro-vacuum dielectric
                  capacitors},
  journal      = {Microelectron. J.},
  volume       = {46},
  number       = {12},
  pages        = {1382--1386},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.mejo.2015.09.019},
  doi          = {10.1016/J.MEJO.2015.09.019},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mj/TamKW15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/WangWH15,
  author       = {Weiyin Wang and
                  Hei Wong and
                  Yan Han},
  title        = {A high-efficiency full-wave {CMOS} rectifying charge pump for {RF}
                  energy harvesting applications},
  journal      = {Microelectron. J.},
  volume       = {46},
  number       = {12},
  pages        = {1447--1452},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.mejo.2015.08.001},
  doi          = {10.1016/J.MEJO.2015.08.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mj/WangWH15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/asicon/ChenWW15,
  author       = {Zehua Chen and
                  Weiyin Wang and
                  Hei Wong},
  title        = {Low-voltage {CMOS} {DC-DC} converters for energy harvesting applications},
  booktitle    = {2015 {IEEE} 11th International Conference on ASIC, {ASICON} 2015,
                  Chengdu, China, November 3-6, 2015},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ASICON.2015.7516985},
  doi          = {10.1109/ASICON.2015.7516985},
  timestamp    = {Wed, 16 Oct 2019 14:14:56 +0200},
  biburl       = {https://dblp.org/rec/conf/asicon/ChenWW15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AsenovSTWZ14,
  author       = {Asen Asenov and
                  Ulf Schlichtmann and
                  Cher Ming Tan and
                  Hei Wong and
                  Xing Zhou},
  title        = {Special section reliability and variability of devices for circuits
                  and systems},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {6-7},
  pages        = {1057},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.03.010},
  doi          = {10.1016/J.MICROREL.2014.03.010},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AsenovSTWZ14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenWHDY14,
  author       = {Zehua Chen and
                  Hei Wong and
                  Yan Han and
                  Shurong Dong and
                  B. L. Yang},
  title        = {Temperature dependences of threshold voltage and drain-induced barrier
                  lowering in 60 nm gate length {MOS} transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {6-7},
  pages        = {1109--1114},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2013.12.005},
  doi          = {10.1016/J.MICROREL.2013.12.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChenWHDY14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TamKSTLW14,
  author       = {Wing{-}Shan Tam and
                  Chi{-}Wah Kok and
                  Sik{-}Lam Siu and
                  Wing{-}Man Tang and
                  Chi{-}Wah Leung and
                  Hei Wong},
  title        = {Thermal stability of sectorial split-drain magnetic field-effect transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {6-7},
  pages        = {1115--1118},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2013.12.006},
  doi          = {10.1016/J.MICROREL.2013.12.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TamKSTLW14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FengWYDIK14,
  author       = {Xuan Feng and
                  Hei Wong and
                  B. L. Yang and
                  Shurong Dong and
                  Hiroshi Iwai and
                  Kuniyuki Kakushima},
  title        = {On the current conduction mechanisms of CeO\({}_{\mbox{2}}\)/La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
                  stacked gate dielectric},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {6-7},
  pages        = {1133--1136},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2013.12.014},
  doi          = {10.1016/J.MICROREL.2013.12.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/FengWYDIK14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TamKSW14,
  author       = {Wing{-}Shan Tam and
                  Chi{-}Wah Kok and
                  Sik{-}Lam Siu and
                  Hei Wong},
  title        = {Snapback breakdown {ESD} device based on zener diodes on silicon-on-insulator
                  technology},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {6-7},
  pages        = {1163--1168},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.01.014},
  doi          = {10.1016/J.MICROREL.2014.01.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TamKSW14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jcsc/LeelarasmeeW13,
  author       = {Ekachai Leelarasmee and
                  Hei Wong},
  title        = {Editorial},
  journal      = {J. Circuits Syst. Comput.},
  volume       = {22},
  number       = {9},
  year         = {2013},
  url          = {https://doi.org/10.1142/S0218126613020015},
  doi          = {10.1142/S0218126613020015},
  timestamp    = {Tue, 25 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jcsc/LeelarasmeeW13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongYD13,
  author       = {Hei Wong and
                  B. L. Yang and
                  Shurong Dong},
  title        = {Thermal and voltage instabilities of hafnium oxide films prepared
                  by sputtering technique},
  journal      = {Microelectron. Reliab.},
  volume       = {53},
  number       = {12},
  pages        = {1863--1867},
  year         = {2013},
  url          = {https://doi.org/10.1016/j.microrel.2013.06.006},
  doi          = {10.1016/J.MICROREL.2013.06.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WongYD13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wong12,
  author       = {Hei Wong},
  title        = {Advances in non-volatile memory technology},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {4},
  pages        = {611--612},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.11.004},
  doi          = {10.1016/J.MICROREL.2011.11.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Wong12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongWTK12,
  author       = {Oi{-}Ying Wong and
                  Hei Wong and
                  Wing{-}Shan Tam and
                  Ted Chi{-}Wah Kok},
  title        = {A comparative study of charge pumping circuits for flash memory applications},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {4},
  pages        = {670--687},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.09.031},
  doi          = {10.1016/J.MICROREL.2011.09.031},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WongWTK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AsenovSTWZ12,
  author       = {Asen Asenov and
                  Ulf Schlichtmann and
                  Cher Ming Tan and
                  Hei Wong and
                  Xing Zhou},
  title        = {{ICMAT} 2011 - Reliability and variability of semiconductor devices
                  and ICs},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {8},
  pages        = {1531},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.05.003},
  doi          = {10.1016/J.MICROREL.2012.05.003},
  timestamp    = {Tue, 29 Dec 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AsenovSTWZ12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SiuTWKKI12,
  author       = {S.{-}L. Siu and
                  Wing{-}Shan Tam and
                  Hei Wong and
                  Chi{-}Wah Kok and
                  K. Kakusima and
                  Hiroshi Iwai},
  title        = {Influence of multi-finger layout on the subthreshold behavior of nanometer
                  {MOS} transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {8},
  pages        = {1606--1609},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.09.011},
  doi          = {10.1016/J.MICROREL.2011.09.011},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SiuTWKKI12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangWKI12,
  author       = {B. L. Yang and
                  Hei Wong and
                  Kuniyuki Kakushima and
                  Hiroshi Iwai},
  title        = {Improving the electrical characteristics of {MOS} transistors with
                  CeO\({}_{\mbox{2}}\)/La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) stacked
                  gate dielectric},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {8},
  pages        = {1613--1616},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.10.009},
  doi          = {10.1016/J.MICROREL.2011.10.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YangWKI12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuWSKF12,
  author       = {J. Liu and
                  Hei Wong and
                  Sik{-}Lam Siu and
                  Chi{-}Wah Kok and
                  Valeriu Filip},
  title        = {Degradation behaviors of GaN light-emitting diodes under high-temperature
                  and high-current stressing},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {8},
  pages        = {1636--1639},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.09.014},
  doi          = {10.1016/J.MICROREL.2011.09.014},
  timestamp    = {Sat, 11 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiuWSKF12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TamSWKWF12,
  author       = {Wing{-}Shan Tam and
                  Sik{-}Lam Siu and
                  Oi{-}Ying Wong and
                  Chi{-}Wah Kok and
                  Hei Wong and
                  Valeriu Filip},
  title        = {Modeling of terminal ring structures for high-voltage power MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {8},
  pages        = {1645--1650},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.10.015},
  doi          = {10.1016/J.MICROREL.2011.10.015},
  timestamp    = {Sat, 11 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TamSWKWF12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TamSYKW11,
  author       = {Wing{-}Shan Tam and
                  Sik{-}Lam Siu and
                  Bing{-}Liang Yang and
                  Chi{-}Wah Kok and
                  Hei Wong},
  title        = {Off-state drain breakdown mechanisms of {VDMOS} with anti-JFET implantation},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {12},
  pages        = {2064--2068},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2011.07.060},
  doi          = {10.1016/J.MICROREL.2011.07.060},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TamSYKW11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/asicon/WongWTK11,
  author       = {Oi{-}Ying Wong and
                  Hei Wong and
                  Wing{-}Shan Tam and
                  Chi{-}Wah Kok},
  title        = {An overview of charge pumping circuits for flash memory applications},
  booktitle    = {2011 {IEEE} 9th International Conference on ASIC, {ASICON} 2011, Xiamen,
                  China, October 25-28, 2011},
  pages        = {116--119},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/ASICON.2011.6157136},
  doi          = {10.1109/ASICON.2011.6157136},
  timestamp    = {Wed, 16 Oct 2019 14:14:56 +0200},
  biburl       = {https://dblp.org/rec/conf/asicon/WongWTK11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jcsc/TamWMKW10,
  author       = {Wing{-}Shan Tam and
                  Oi{-}Ying Wong and
                  Ka{-}Yan Mok and
                  Chi{-}Wah Kok and
                  Hei Wong},
  title        = {An Energy Efficient Half-Static Clock-Gating d-Type flip-Flop},
  journal      = {J. Circuits Syst. Comput.},
  volume       = {19},
  number       = {3},
  pages        = {635--654},
  year         = {2010},
  url          = {https://doi.org/10.1142/S0218126610006335},
  doi          = {10.1142/S0218126610006335},
  timestamp    = {Tue, 25 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jcsc/TamWMKW10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NovikovVGNW10,
  author       = {Yu. N. Novikov and
                  A. V. Vishnyakov and
                  V. A. Gritsenko and
                  K. A. Nasyrov and
                  Hei Wong},
  title        = {Modeling the charge transport mechanism in amorphous Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
                  with multiphonon trap ionization effect},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {2},
  pages        = {207--210},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2009.11.004},
  doi          = {10.1016/J.MICROREL.2009.11.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/NovikovVGNW10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TamWNKW10,
  author       = {Wing{-}Shan Tam and
                  Oi{-}Ying Wong and
                  Tsz{-}Ching Ng and
                  Chi{-}Wah Kok and
                  Hei Wong},
  title        = {Analysis of {ESD} discharge current distribution and area optimization
                  of {VDMOS} gate protection structure},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {5},
  pages        = {622--626},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.01.047},
  doi          = {10.1016/J.MICROREL.2010.01.047},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TamWNKW10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongTLSCKW10,
  author       = {Oi{-}Ying Wong and
                  Wing{-}Shan Tam and
                  Jun Liu and
                  Oi{-}Kan Shea and
                  Shiu Hung Cheung and
                  Chi{-}Wah Kok and
                  Hei Wong},
  title        = {Modeling of high-frequency characteristics for epoxy-sealed micro
                  vacuum capacitors},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {5},
  pages        = {627--630},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.01.013},
  doi          = {10.1016/J.MICROREL.2010.01.013},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WongTLSCKW10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TamWKW10,
  author       = {Wing{-}Shan Tam and
                  Oi{-}Ying Wong and
                  Chi{-}Wah Kok and
                  Hei Wong},
  title        = {Generating sub-1V reference voltages from a resistorless {CMOS} bandgap
                  reference circuit by using a piecewise curvature temperature compensation
                  technique},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {8},
  pages        = {1054--1061},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.04.012},
  doi          = {10.1016/J.MICROREL.2010.04.012},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TamWKW10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongFLY09,
  author       = {Hei Wong and
                  Y. Fu and
                  Juin J. Liou and
                  Y. Yue},
  title        = {Hot-carrier reliability and breakdown characteristics of multi-finger
                  {RF} {MOS} transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {1},
  pages        = {13--16},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2008.10.011},
  doi          = {10.1016/J.MICROREL.2008.10.011},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WongFLY09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuTWF09,
  author       = {Jun Liu and
                  Wing{-}Shan Tam and
                  Hei Wong and
                  Valeriu Filip},
  title        = {Temperature-dependent light-emitting characteristics of InGaN/GaN
                  diodes},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {1},
  pages        = {38--41},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2008.10.002},
  doi          = {10.1016/J.MICROREL.2008.10.002},
  timestamp    = {Sat, 11 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiuTWF09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SiuWTKI09,
  author       = {Sik{-}Lam Siu and
                  Hei Wong and
                  Wing{-}Shan Tam and
                  Kuniyuki Kakushima and
                  Hiroshi Iwai},
  title        = {Subthreshold parameters of radio-frequency multi-finger nanometer
                  {MOS} transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {4},
  pages        = {387--391},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.01.004},
  doi          = {10.1016/J.MICROREL.2009.01.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SiuWTKI09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongTSCLKW09,
  author       = {Oi{-}Ying Wong and
                  Wing{-}Shan Tam and
                  Oi{-}Kan Shea and
                  Shiu Hung Cheung and
                  Jun Liu and
                  Chi{-}Wah Kok and
                  Hei Wong},
  title        = {Effects of periphery encapsulation material on the characteristics
                  of micro vacuum dielectric capacitor},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {5},
  pages        = {506--509},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.02.022},
  doi          = {10.1016/J.MICROREL.2009.02.022},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WongTSCLKW09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/WongTKW09,
  author       = {Oi{-}Ying Wong and
                  Wing{-}Shan Tam and
                  Chi{-}Wah Kok and
                  Hei Wong},
  title        = {Area Efficient 2\({}^{\mbox{n}}\){\texttimes} Switched Capacitor Charge
                  Pump},
  booktitle    = {International Symposium on Circuits and Systems {(ISCAS} 2009), 24-17
                  May 2009, Taipei, Taiwan},
  pages        = {820--823},
  publisher    = {{IEEE}},
  year         = {2009},
  url          = {https://doi.org/10.1109/ISCAS.2009.5117882},
  doi          = {10.1109/ISCAS.2009.5117882},
  timestamp    = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl       = {https://dblp.org/rec/conf/iscas/WongTKW09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongWCCC08,
  author       = {C. K. Wong and
                  Hei Wong and
                  Mansun Chan and
                  Y. T. Chow and
                  H. P. Chan},
  title        = {Silicon oxynitride integrated waveguide for on-chip optical interconnects
                  applications},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {2},
  pages        = {212--218},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2007.04.014},
  doi          = {10.1016/J.MICROREL.2007.04.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WongWCCC08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SenYWKCH08,
  author       = {Banani Sen and
                  Bing{-}Liang Yang and
                  Hei Wong and
                  Chi{-}Wah Kok and
                  P. K. Chu and
                  A. Huang},
  title        = {Effects of aluminum incorporation on hafnium oxide film using plasma
                  immersion ion implantation},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {11-12},
  pages        = {1765--1768},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2008.07.069},
  doi          = {10.1016/J.MICROREL.2008.07.069},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SenYWKCH08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/apccas/WongTKW08,
  author       = {Oi{-}Ying Wong and
                  Wing{-}Shan Tam and
                  Chi{-}Wah Kok and
                  Hei Wong},
  title        = {Current mode track and hold circuit with 50MS/sec speed and 8-bit
                  resolution},
  booktitle    = {{IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2008,
                  Macao, China, November 30 2008 - December 3, 2008},
  pages        = {1168--1171},
  publisher    = {{IEEE}},
  year         = {2008},
  url          = {https://doi.org/10.1109/APCCAS.2008.4746233},
  doi          = {10.1109/APCCAS.2008.4746233},
  timestamp    = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl       = {https://dblp.org/rec/conf/apccas/WongTKW08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/apccas/WongTKW08a,
  author       = {Oi{-}Ying Wong and
                  Wing{-}Shan Tam and
                  Chi{-}Wah Kok and
                  Hei Wong},
  title        = {Design strategy for 2-phase switched capacitor charge pump},
  booktitle    = {{IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2008,
                  Macao, China, November 30 2008 - December 3, 2008},
  pages        = {1328--1331},
  publisher    = {{IEEE}},
  year         = {2008},
  url          = {https://doi.org/10.1109/APCCAS.2008.4746273},
  doi          = {10.1109/APCCAS.2008.4746273},
  timestamp    = {Fri, 02 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/apccas/WongTKW08a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/apccas/TamWKWW08,
  author       = {Wing{-}Shan Tam and
                  Oi{-}Ying Wong and
                  Chi{-}Wah Kok and
                  Hei Wong and
                  Albert Z. H. Wang},
  title        = {A Wideband three-stage rail-to-rail power amplifier driving large
                  capacitive load},
  booktitle    = {{IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2008,
                  Macao, China, November 30 2008 - December 3, 2008},
  pages        = {1394--1397},
  publisher    = {{IEEE}},
  year         = {2008},
  url          = {https://doi.org/10.1109/APCCAS.2008.4746290},
  doi          = {10.1109/APCCAS.2008.4746290},
  timestamp    = {Fri, 02 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/apccas/TamWKWW08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongFWC07,
  author       = {Hei Wong and
                  Valeriu Filip and
                  C. K. Wong and
                  P. S. Chung},
  title        = {Silicon integrated photonics begins to revolutionize},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {1},
  pages        = {1--10},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2006.01.002},
  doi          = {10.1016/J.MICROREL.2006.01.002},
  timestamp    = {Sat, 11 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WongFWC07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShaimeevGKWLK07,
  author       = {Sergey Shaimeev and
                  Vladimir Gritsenko and
                  Kaupo Kukli and
                  Hei Wong and
                  Eun{-}Hong Lee and
                  Chungwoo Kim},
  title        = {Single band electronic conduction in hafnium oxide prepared by atomic
                  layer deposition},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {1},
  pages        = {36--40},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2006.03.002},
  doi          = {10.1016/J.MICROREL.2006.03.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ShaimeevGKWLK07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FuWL07,
  author       = {Y. Fu and
                  Hei Wong and
                  Juin J. Liou},
  title        = {Characterization and modeling of flicker noise in junction field-effect
                  transistor with source and drain trench isolation},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {1},
  pages        = {46--50},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2006.01.009},
  doi          = {10.1016/J.MICROREL.2006.01.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/FuWL07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FilipWN06,
  author       = {Valeriu Filip and
                  Hei Wong and
                  D. Nicolaescu},
  title        = {Definition of curve fitting parameter to study tunneling and trapping
                  of electrons in Si/ultra-thin SiO\({}_{\mbox{2}}\)/metal structures},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1027--1034},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.014},
  doi          = {10.1016/J.MICROREL.2005.10.014},
  timestamp    = {Sat, 11 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/FilipWN06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongWCKC06,
  author       = {C. K. Wong and
                  Hei Wong and
                  Mansun Chan and
                  Chi{-}Wah Kok and
                  H. P. Chan},
  title        = {Minimizing hydrogen content in silicon oxynitride by thermal oxidation
                  of silicon-rich silicon nitride},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2056--2061},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.01.006},
  doi          = {10.1016/J.MICROREL.2006.01.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WongWCKC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/ZhanPWNK05,
  author       = {Nian Zhan and
                  M. C. Poon and
                  Hei Wong and
                  K. L. Ng and
                  Chi{-}Wah Kok},
  title        = {Dielectric breakdown characteristics and interface trapping of hafnium
                  oxide films},
  journal      = {Microelectron. J.},
  volume       = {36},
  number       = {1},
  pages        = {29--33},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.mejo.2004.10.006},
  doi          = {10.1016/J.MEJO.2004.10.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mj/ZhanPWNK05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangLW04,
  author       = {Bing{-}Liang Yang and
                  P. T. Lai and
                  Hei Wong},
  title        = {Conduction mechanisms in {MOS} gate dielectric films},
  journal      = {Microelectron. Reliab.},
  volume       = {44},
  number       = {5},
  pages        = {709--718},
  year         = {2004},
  url          = {https://doi.org/10.1016/j.microrel.2004.01.013},
  doi          = {10.1016/J.MICROREL.2004.01.013},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YangLW04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wong03,
  author       = {Hei Wong},
  title        = {Low-frequency noise study in electron devices: review and update},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {4},
  pages        = {585--599},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(02)00347-5},
  doi          = {10.1016/S0026-2714(02)00347-5},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Wong03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChanWPK03,
  author       = {Jackie Chan and
                  Hei Wong and
                  M. C. Poon and
                  Chi{-}Wah Kok},
  title        = {Oxynitride gate dielectric prepared by thermal oxidation of low-pressure
                  chemical vapor deposition silicon-rich silicon nitride},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {4},
  pages        = {611--616},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00031-3},
  doi          = {10.1016/S0026-2714(03)00031-3},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChanWPK03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GritsenkoSNBWZR03,
  author       = {V. A. Gritsenko and
                  A. V. Shaposhnikov and
                  Yu. N. Novikov and
                  A. P. Baraban and
                  Hei Wong and
                  G. M. Zhidomirov and
                  M. Roger},
  title        = {Onefold coordinated oxygen atom: an electron trap in the silicon oxide},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {4},
  pages        = {665--669},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00030-1},
  doi          = {10.1016/S0026-2714(03)00030-1},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GritsenkoSNBWZR03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NgZKPW03,
  author       = {K. L. Ng and
                  Nian Zhan and
                  Chi{-}Wah Kok and
                  M. C. Poon and
                  Hei Wong},
  title        = {Electrical characterization of the hafnium oxide prepared by direct
                  sputtering of Hf in oxygen with rapid thermal annealing},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {8},
  pages        = {1289--1293},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00141-0},
  doi          = {10.1016/S0026-2714(03)00141-0},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/NgZKPW03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wong02,
  author       = {Hei Wong},
  title        = {Recent developments in silicon optoelectronic devices},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {3},
  pages        = {317--326},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00008-2},
  doi          = {10.1016/S0026-2714(02)00008-2},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Wong02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongG02,
  author       = {Hei Wong and
                  V. A. Gritsenko},
  title        = {Defects in silicon oxynitride gate dielectric films},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {4-5},
  pages        = {597--605},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00005-7},
  doi          = {10.1016/S0026-2714(02)00005-7},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WongG02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HanWCP02,
  author       = {P. G. Han and
                  Hei Wong and
                  Andy H. P. Chan and
                  M. C. Poon},
  title        = {A novel approach for fabricating light-emitting porous polysilicon
                  films},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {6},
  pages        = {929--933},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00011-2},
  doi          = {10.1016/S0026-2714(02)00011-2},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HanWCP02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangCDSWLC02,
  author       = {Bing{-}Liang Yang and
                  N. W. Cheung and
                  S. Denholm and
                  J. Shao and
                  Hei Wong and
                  P. T. Lai and
                  Y. C. Cheng},
  title        = {Ultra-shallow n\({}^{\mbox{+}}\)p junction formed by PH\({}_{\mbox{3}}\)
                  and AsH\({}_{\mbox{3}}\) plasma immersion ion implantation},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {12},
  pages        = {1985--1989},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00099-9},
  doi          = {10.1016/S0026-2714(02)00099-9},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YangCDSWLC02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongHPG01,
  author       = {Hei Wong and
                  P. G. Han and
                  M. C. Poon and
                  Y. Gao},
  title        = {Investigation of the surface silica layer on porous poly-Si thin films},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {2},
  pages        = {179--184},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(00)00098-6},
  doi          = {10.1016/S0026-2714(00)00098-6},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WongHPG01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PoonGKMW01,
  author       = {M. C. Poon and
                  Y. Gao and
                  Ted Chi{-}Wah Kok and
                  A. M. Myasnikov and
                  Hei Wong},
  title        = {{SIMS} study of silicon oxynitride prepared by oxidation of silicon-rich
                  silicon nitride layer},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {12},
  pages        = {2071--2074},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00216-5},
  doi          = {10.1016/S0026-2714(01)00216-5},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PoonGKMW01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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