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BibTeX records: Hei Wong
@inproceedings{DBLP:conf/icspcc/HongWCC23, author = {Jinfa Hong and Hei Wong and Oliver C. S. Choy and Ray C. C. Cheung}, title = {A Platform for Adaptive Interference Mitigation and Intent Analysis Using OpenLANE}, booktitle = {{IEEE} International Conference on Signal Processing, Communications and Computing, {ICSPCC} 2023, Zhengzhou, China, November 14-17, 2023}, pages = {1--6}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/ICSPCC59353.2023.10400251}, doi = {10.1109/ICSPCC59353.2023.10400251}, timestamp = {Sat, 24 Feb 2024 20:42:50 +0100}, biburl = {https://dblp.org/rec/conf/icspcc/HongWCC23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/chinaf/WongDC22, author = {Hei Wong and Shurong Dong and Zehua Chen}, title = {Effects of non-fatal electrostatic discharge on the threshold voltage degradation in nano {CMOS} devices}, journal = {Sci. China Inf. Sci.}, volume = {65}, number = {2}, year = {2022}, url = {https://doi.org/10.1007/s11432-020-3197-8}, doi = {10.1007/S11432-020-3197-8}, timestamp = {Thu, 23 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/chinaf/WongDC22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mj/LaiTKW20, author = {Shuk{-}Fun Lai and Wing{-}Shan Tam and Chi{-}Wah Kok and Hei Wong}, title = {{CMOS} low power split-drain {MAGFET} based magnetic field strength sensor}, journal = {Microelectron. J.}, volume = {100}, pages = {104759}, year = {2020}, url = {https://doi.org/10.1016/j.mejo.2020.104759}, doi = {10.1016/J.MEJO.2020.104759}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mj/LaiTKW20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HuDJWXLL18, author = {Tao Hu and Shurong Dong and Hao Jin and Hei Wong and Zekun Xu and Xiang Li and Juin J. Liou}, title = {A double snapback {SCR} {ESD} protection scheme for 28{\unicode{8239}}nm {CMOS} process}, journal = {Microelectron. Reliab.}, volume = {84}, pages = {20--25}, year = {2018}, url = {https://doi.org/10.1016/j.microrel.2018.03.010}, doi = {10.1016/J.MICROREL.2018.03.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HuDJWXLL18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FengRMDPW18, author = {Xuan Feng and Nagarajan Raghavan and Sen Mei and Shurong Dong and Kin Leong Pey and Hei Wong}, title = {Statistical nature of hard breakdown recovery in high-{\(\kappa\)} dielectric stacks studied using ramped voltage stress}, journal = {Microelectron. Reliab.}, volume = {88-90}, pages = {164--168}, year = {2018}, url = {https://doi.org/10.1016/j.microrel.2018.07.104}, doi = {10.1016/J.MICROREL.2018.07.104}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FengRMDPW18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tcas/LiuLCCW18, author = {Yao Liu and Xiao{-}Zhou Li and Ray C. C. Cheung and Sze{-}Chun Chan and Hei Wong}, title = {High-Speed Discrete Gaussian Sampler With Heterodyne Chaotic Laser Inputs}, journal = {{IEEE} Trans. Circuits Syst. {II} Express Briefs}, volume = {65-II}, number = {6}, pages = {794--798}, year = {2018}, url = {https://doi.org/10.1109/TCSII.2017.2749204}, doi = {10.1109/TCSII.2017.2749204}, timestamp = {Wed, 27 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tcas/LiuLCCW18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/fpl/0006CW18, author = {Yao Liu and Ray C. C. Cheung and Hei Wong}, title = {Lightweight Secure Processor Prototype on {FPGA}}, booktitle = {28th International Conference on Field Programmable Logic and Applications, {FPL} 2018, Dublin, Ireland, August 27-31, 2018}, pages = {443--444}, publisher = {{IEEE} Computer Society}, year = {2018}, url = {https://doi.org/10.1109/FPL.2018.00081}, doi = {10.1109/FPL.2018.00081}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/fpl/0006CW18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tcas/LiuCW17, author = {Yao Liu and Ray C. C. Cheung and Hei Wong}, title = {A Bias-Bounded Digital True Random Number Generator Architecture}, journal = {{IEEE} Trans. Circuits Syst. {I} Regul. Pap.}, volume = {64-I}, number = {1}, pages = {133--144}, year = {2017}, url = {https://doi.org/10.1109/TCSI.2016.2606353}, doi = {10.1109/TCSI.2016.2606353}, timestamp = {Fri, 22 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tcas/LiuCW17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AsenovSTWZ16, author = {Asen Asenov and Ulf Schlichtmann and Cher Ming Tan and Hei Wong and Xing Zhou}, title = {Editorial}, journal = {Microelectron. Reliab.}, volume = {61}, pages = {1--2}, year = {2016}, url = {https://doi.org/10.1016/j.microrel.2016.03.028}, doi = {10.1016/J.MICROREL.2016.03.028}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AsenovSTWZ16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FengDWYPSL16, author = {Xuan Feng and Shurong Dong and Hei Wong and Danqun Yu and Kin Leong Pey and Kalya Shubhakar and W. S. Lau}, title = {Effects of thermal annealing on the charge localization characteristics of HfO\({}_{\mbox{2}}\)/Au/HfO\({}_{\mbox{2}}\) stack}, journal = {Microelectron. Reliab.}, volume = {61}, pages = {78--81}, year = {2016}, url = {https://doi.org/10.1016/j.microrel.2016.02.012}, doi = {10.1016/J.MICROREL.2016.02.012}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/FengDWYPSL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YuLWFDP16, author = {Danqun Yu and W. S. Lau and Hei Wong and Xuan Feng and Shurong Dong and Kin Leong Pey}, title = {The variation of the leakage current characteristics of W/Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\)/W {MIM} capacitors with the thickness of the bottom {W} electrode}, journal = {Microelectron. Reliab.}, volume = {61}, pages = {95--98}, year = {2016}, url = {https://doi.org/10.1016/j.microrel.2016.02.013}, doi = {10.1016/J.MICROREL.2016.02.013}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YuLWFDP16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YuJDWZW16, author = {Zhihui Yu and Hao Jin and Shurong Dong and Hei Wong and Jie Zeng and Weihuai Wang}, title = {Comparative study of reliability degradation behaviors of {LDMOS} and {LDMOS-SCR} {ESD} protection devices}, journal = {Microelectron. Reliab.}, volume = {61}, pages = {111--114}, year = {2016}, url = {https://doi.org/10.1016/j.microrel.2015.12.024}, doi = {10.1016/J.MICROREL.2015.12.024}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YuJDWZW16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SunZW16, author = {Lixia Sun and Jianxin Zhu and Hei Wong}, title = {Simulation and evaluation of the peak temperature in {LED} light bulb heatsink}, journal = {Microelectron. Reliab.}, volume = {61}, pages = {140--144}, year = {2016}, url = {https://doi.org/10.1016/j.microrel.2015.12.023}, doi = {10.1016/J.MICROREL.2015.12.023}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SunZW16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ijcta/WongWTK15, author = {Oi{-}Ying Wong and Hei Wong and Wing{-}Shan Tam and Chi{-}Wah Kok}, title = {A dynamic-biasing 4{\texttimes} charge pump based on exponential topology}, journal = {Int. J. Circuit Theory Appl.}, volume = {43}, number = {3}, pages = {401--414}, year = {2015}, url = {https://doi.org/10.1002/cta.1949}, doi = {10.1002/CTA.1949}, timestamp = {Mon, 11 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/ijcta/WongWTK15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mj/TamKW15, author = {Wing{-}Shan Tam and Chi{-}Wah Kok and Hei Wong}, title = {Optimization of loss tangent and capacitor size of micro-vacuum dielectric capacitors}, journal = {Microelectron. J.}, volume = {46}, number = {12}, pages = {1382--1386}, year = {2015}, url = {https://doi.org/10.1016/j.mejo.2015.09.019}, doi = {10.1016/J.MEJO.2015.09.019}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mj/TamKW15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mj/WangWH15, author = {Weiyin Wang and Hei Wong and Yan Han}, title = {A high-efficiency full-wave {CMOS} rectifying charge pump for {RF} energy harvesting applications}, journal = {Microelectron. J.}, volume = {46}, number = {12}, pages = {1447--1452}, year = {2015}, url = {https://doi.org/10.1016/j.mejo.2015.08.001}, doi = {10.1016/J.MEJO.2015.08.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mj/WangWH15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/asicon/ChenWW15, author = {Zehua Chen and Weiyin Wang and Hei Wong}, title = {Low-voltage {CMOS} {DC-DC} converters for energy harvesting applications}, booktitle = {2015 {IEEE} 11th International Conference on ASIC, {ASICON} 2015, Chengdu, China, November 3-6, 2015}, pages = {1--4}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/ASICON.2015.7516985}, doi = {10.1109/ASICON.2015.7516985}, timestamp = {Wed, 16 Oct 2019 14:14:56 +0200}, biburl = {https://dblp.org/rec/conf/asicon/ChenWW15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AsenovSTWZ14, author = {Asen Asenov and Ulf Schlichtmann and Cher Ming Tan and Hei Wong and Xing Zhou}, title = {Special section reliability and variability of devices for circuits and systems}, journal = {Microelectron. Reliab.}, volume = {54}, number = {6-7}, pages = {1057}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2014.03.010}, doi = {10.1016/J.MICROREL.2014.03.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AsenovSTWZ14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenWHDY14, author = {Zehua Chen and Hei Wong and Yan Han and Shurong Dong and B. L. Yang}, title = {Temperature dependences of threshold voltage and drain-induced barrier lowering in 60 nm gate length {MOS} transistors}, journal = {Microelectron. Reliab.}, volume = {54}, number = {6-7}, pages = {1109--1114}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2013.12.005}, doi = {10.1016/J.MICROREL.2013.12.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChenWHDY14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TamKSTLW14, author = {Wing{-}Shan Tam and Chi{-}Wah Kok and Sik{-}Lam Siu and Wing{-}Man Tang and Chi{-}Wah Leung and Hei Wong}, title = {Thermal stability of sectorial split-drain magnetic field-effect transistors}, journal = {Microelectron. Reliab.}, volume = {54}, number = {6-7}, pages = {1115--1118}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2013.12.006}, doi = {10.1016/J.MICROREL.2013.12.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TamKSTLW14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FengWYDIK14, author = {Xuan Feng and Hei Wong and B. L. Yang and Shurong Dong and Hiroshi Iwai and Kuniyuki Kakushima}, title = {On the current conduction mechanisms of CeO\({}_{\mbox{2}}\)/La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) stacked gate dielectric}, journal = {Microelectron. Reliab.}, volume = {54}, number = {6-7}, pages = {1133--1136}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2013.12.014}, doi = {10.1016/J.MICROREL.2013.12.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FengWYDIK14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TamKSW14, author = {Wing{-}Shan Tam and Chi{-}Wah Kok and Sik{-}Lam Siu and Hei Wong}, title = {Snapback breakdown {ESD} device based on zener diodes on silicon-on-insulator technology}, journal = {Microelectron. Reliab.}, volume = {54}, number = {6-7}, pages = {1163--1168}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2014.01.014}, doi = {10.1016/J.MICROREL.2014.01.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TamKSW14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jcsc/LeelarasmeeW13, author = {Ekachai Leelarasmee and Hei Wong}, title = {Editorial}, journal = {J. Circuits Syst. Comput.}, volume = {22}, number = {9}, year = {2013}, url = {https://doi.org/10.1142/S0218126613020015}, doi = {10.1142/S0218126613020015}, timestamp = {Tue, 25 Aug 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jcsc/LeelarasmeeW13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongYD13, author = {Hei Wong and B. L. Yang and Shurong Dong}, title = {Thermal and voltage instabilities of hafnium oxide films prepared by sputtering technique}, journal = {Microelectron. Reliab.}, volume = {53}, number = {12}, pages = {1863--1867}, year = {2013}, url = {https://doi.org/10.1016/j.microrel.2013.06.006}, doi = {10.1016/J.MICROREL.2013.06.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongYD13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Wong12, author = {Hei Wong}, title = {Advances in non-volatile memory technology}, journal = {Microelectron. Reliab.}, volume = {52}, number = {4}, pages = {611--612}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2011.11.004}, doi = {10.1016/J.MICROREL.2011.11.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Wong12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongWTK12, author = {Oi{-}Ying Wong and Hei Wong and Wing{-}Shan Tam and Ted Chi{-}Wah Kok}, title = {A comparative study of charge pumping circuits for flash memory applications}, journal = {Microelectron. Reliab.}, volume = {52}, number = {4}, pages = {670--687}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2011.09.031}, doi = {10.1016/J.MICROREL.2011.09.031}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongWTK12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AsenovSTWZ12, author = {Asen Asenov and Ulf Schlichtmann and Cher Ming Tan and Hei Wong and Xing Zhou}, title = {{ICMAT} 2011 - Reliability and variability of semiconductor devices and ICs}, journal = {Microelectron. Reliab.}, volume = {52}, number = {8}, pages = {1531}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2012.05.003}, doi = {10.1016/J.MICROREL.2012.05.003}, timestamp = {Tue, 29 Dec 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AsenovSTWZ12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SiuTWKKI12, author = {S.{-}L. Siu and Wing{-}Shan Tam and Hei Wong and Chi{-}Wah Kok and K. Kakusima and Hiroshi Iwai}, title = {Influence of multi-finger layout on the subthreshold behavior of nanometer {MOS} transistors}, journal = {Microelectron. Reliab.}, volume = {52}, number = {8}, pages = {1606--1609}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2011.09.011}, doi = {10.1016/J.MICROREL.2011.09.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SiuTWKKI12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YangWKI12, author = {B. L. Yang and Hei Wong and Kuniyuki Kakushima and Hiroshi Iwai}, title = {Improving the electrical characteristics of {MOS} transistors with CeO\({}_{\mbox{2}}\)/La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) stacked gate dielectric}, journal = {Microelectron. Reliab.}, volume = {52}, number = {8}, pages = {1613--1616}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2011.10.009}, doi = {10.1016/J.MICROREL.2011.10.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YangWKI12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiuWSKF12, author = {J. Liu and Hei Wong and Sik{-}Lam Siu and Chi{-}Wah Kok and Valeriu Filip}, title = {Degradation behaviors of GaN light-emitting diodes under high-temperature and high-current stressing}, journal = {Microelectron. Reliab.}, volume = {52}, number = {8}, pages = {1636--1639}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2011.09.014}, doi = {10.1016/J.MICROREL.2011.09.014}, timestamp = {Sat, 11 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiuWSKF12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TamSWKWF12, author = {Wing{-}Shan Tam and Sik{-}Lam Siu and Oi{-}Ying Wong and Chi{-}Wah Kok and Hei Wong and Valeriu Filip}, title = {Modeling of terminal ring structures for high-voltage power MOSFETs}, journal = {Microelectron. Reliab.}, volume = {52}, number = {8}, pages = {1645--1650}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2011.10.015}, doi = {10.1016/J.MICROREL.2011.10.015}, timestamp = {Sat, 11 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TamSWKWF12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TamSYKW11, author = {Wing{-}Shan Tam and Sik{-}Lam Siu and Bing{-}Liang Yang and Chi{-}Wah Kok and Hei Wong}, title = {Off-state drain breakdown mechanisms of {VDMOS} with anti-JFET implantation}, journal = {Microelectron. Reliab.}, volume = {51}, number = {12}, pages = {2064--2068}, year = {2011}, url = {https://doi.org/10.1016/j.microrel.2011.07.060}, doi = {10.1016/J.MICROREL.2011.07.060}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TamSYKW11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/asicon/WongWTK11, author = {Oi{-}Ying Wong and Hei Wong and Wing{-}Shan Tam and Chi{-}Wah Kok}, title = {An overview of charge pumping circuits for flash memory applications}, booktitle = {2011 {IEEE} 9th International Conference on ASIC, {ASICON} 2011, Xiamen, China, October 25-28, 2011}, pages = {116--119}, publisher = {{IEEE}}, year = {2011}, url = {https://doi.org/10.1109/ASICON.2011.6157136}, doi = {10.1109/ASICON.2011.6157136}, timestamp = {Wed, 16 Oct 2019 14:14:56 +0200}, biburl = {https://dblp.org/rec/conf/asicon/WongWTK11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jcsc/TamWMKW10, author = {Wing{-}Shan Tam and Oi{-}Ying Wong and Ka{-}Yan Mok and Chi{-}Wah Kok and Hei Wong}, title = {An Energy Efficient Half-Static Clock-Gating d-Type flip-Flop}, journal = {J. Circuits Syst. Comput.}, volume = {19}, number = {3}, pages = {635--654}, year = {2010}, url = {https://doi.org/10.1142/S0218126610006335}, doi = {10.1142/S0218126610006335}, timestamp = {Tue, 25 Aug 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jcsc/TamWMKW10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NovikovVGNW10, author = {Yu. N. Novikov and A. V. Vishnyakov and V. A. Gritsenko and K. A. Nasyrov and Hei Wong}, title = {Modeling the charge transport mechanism in amorphous Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) with multiphonon trap ionization effect}, journal = {Microelectron. Reliab.}, volume = {50}, number = {2}, pages = {207--210}, year = {2010}, url = {https://doi.org/10.1016/j.microrel.2009.11.004}, doi = {10.1016/J.MICROREL.2009.11.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/NovikovVGNW10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TamWNKW10, author = {Wing{-}Shan Tam and Oi{-}Ying Wong and Tsz{-}Ching Ng and Chi{-}Wah Kok and Hei Wong}, title = {Analysis of {ESD} discharge current distribution and area optimization of {VDMOS} gate protection structure}, journal = {Microelectron. Reliab.}, volume = {50}, number = {5}, pages = {622--626}, year = {2010}, url = {https://doi.org/10.1016/j.microrel.2010.01.047}, doi = {10.1016/J.MICROREL.2010.01.047}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TamWNKW10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongTLSCKW10, author = {Oi{-}Ying Wong and Wing{-}Shan Tam and Jun Liu and Oi{-}Kan Shea and Shiu Hung Cheung and Chi{-}Wah Kok and Hei Wong}, title = {Modeling of high-frequency characteristics for epoxy-sealed micro vacuum capacitors}, journal = {Microelectron. Reliab.}, volume = {50}, number = {5}, pages = {627--630}, year = {2010}, url = {https://doi.org/10.1016/j.microrel.2010.01.013}, doi = {10.1016/J.MICROREL.2010.01.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongTLSCKW10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TamWKW10, author = {Wing{-}Shan Tam and Oi{-}Ying Wong and Chi{-}Wah Kok and Hei Wong}, title = {Generating sub-1V reference voltages from a resistorless {CMOS} bandgap reference circuit by using a piecewise curvature temperature compensation technique}, journal = {Microelectron. Reliab.}, volume = {50}, number = {8}, pages = {1054--1061}, year = {2010}, url = {https://doi.org/10.1016/j.microrel.2010.04.012}, doi = {10.1016/J.MICROREL.2010.04.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TamWKW10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongFLY09, author = {Hei Wong and Y. Fu and Juin J. Liou and Y. Yue}, title = {Hot-carrier reliability and breakdown characteristics of multi-finger {RF} {MOS} transistors}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {13--16}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.011}, doi = {10.1016/J.MICROREL.2008.10.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongFLY09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiuTWF09, author = {Jun Liu and Wing{-}Shan Tam and Hei Wong and Valeriu Filip}, title = {Temperature-dependent light-emitting characteristics of InGaN/GaN diodes}, journal = {Microelectron. Reliab.}, volume = {49}, number = {1}, pages = {38--41}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2008.10.002}, doi = {10.1016/J.MICROREL.2008.10.002}, timestamp = {Sat, 11 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiuTWF09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SiuWTKI09, author = {Sik{-}Lam Siu and Hei Wong and Wing{-}Shan Tam and Kuniyuki Kakushima and Hiroshi Iwai}, title = {Subthreshold parameters of radio-frequency multi-finger nanometer {MOS} transistors}, journal = {Microelectron. Reliab.}, volume = {49}, number = {4}, pages = {387--391}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.01.004}, doi = {10.1016/J.MICROREL.2009.01.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SiuWTKI09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongTSCLKW09, author = {Oi{-}Ying Wong and Wing{-}Shan Tam and Oi{-}Kan Shea and Shiu Hung Cheung and Jun Liu and Chi{-}Wah Kok and Hei Wong}, title = {Effects of periphery encapsulation material on the characteristics of micro vacuum dielectric capacitor}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {506--509}, year = {2009}, url = {https://doi.org/10.1016/j.microrel.2009.02.022}, doi = {10.1016/J.MICROREL.2009.02.022}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongTSCLKW09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iscas/WongTKW09, author = {Oi{-}Ying Wong and Wing{-}Shan Tam and Chi{-}Wah Kok and Hei Wong}, title = {Area Efficient 2\({}^{\mbox{n}}\){\texttimes} Switched Capacitor Charge Pump}, booktitle = {International Symposium on Circuits and Systems {(ISCAS} 2009), 24-17 May 2009, Taipei, Taiwan}, pages = {820--823}, publisher = {{IEEE}}, year = {2009}, url = {https://doi.org/10.1109/ISCAS.2009.5117882}, doi = {10.1109/ISCAS.2009.5117882}, timestamp = {Wed, 16 Oct 2019 14:14:49 +0200}, biburl = {https://dblp.org/rec/conf/iscas/WongTKW09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongWCCC08, author = {C. K. Wong and Hei Wong and Mansun Chan and Y. T. Chow and H. P. Chan}, title = {Silicon oxynitride integrated waveguide for on-chip optical interconnects applications}, journal = {Microelectron. Reliab.}, volume = {48}, number = {2}, pages = {212--218}, year = {2008}, url = {https://doi.org/10.1016/j.microrel.2007.04.014}, doi = {10.1016/J.MICROREL.2007.04.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongWCCC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SenYWKCH08, author = {Banani Sen and Bing{-}Liang Yang and Hei Wong and Chi{-}Wah Kok and P. K. Chu and A. Huang}, title = {Effects of aluminum incorporation on hafnium oxide film using plasma immersion ion implantation}, journal = {Microelectron. Reliab.}, volume = {48}, number = {11-12}, pages = {1765--1768}, year = {2008}, url = {https://doi.org/10.1016/j.microrel.2008.07.069}, doi = {10.1016/J.MICROREL.2008.07.069}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SenYWKCH08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/apccas/WongTKW08, author = {Oi{-}Ying Wong and Wing{-}Shan Tam and Chi{-}Wah Kok and Hei Wong}, title = {Current mode track and hold circuit with 50MS/sec speed and 8-bit resolution}, booktitle = {{IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2008, Macao, China, November 30 2008 - December 3, 2008}, pages = {1168--1171}, publisher = {{IEEE}}, year = {2008}, url = {https://doi.org/10.1109/APCCAS.2008.4746233}, doi = {10.1109/APCCAS.2008.4746233}, timestamp = {Wed, 16 Oct 2019 14:14:50 +0200}, biburl = {https://dblp.org/rec/conf/apccas/WongTKW08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/apccas/WongTKW08a, author = {Oi{-}Ying Wong and Wing{-}Shan Tam and Chi{-}Wah Kok and Hei Wong}, title = {Design strategy for 2-phase switched capacitor charge pump}, booktitle = {{IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2008, Macao, China, November 30 2008 - December 3, 2008}, pages = {1328--1331}, publisher = {{IEEE}}, year = {2008}, url = {https://doi.org/10.1109/APCCAS.2008.4746273}, doi = {10.1109/APCCAS.2008.4746273}, timestamp = {Fri, 02 Nov 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/apccas/WongTKW08a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/apccas/TamWKWW08, author = {Wing{-}Shan Tam and Oi{-}Ying Wong and Chi{-}Wah Kok and Hei Wong and Albert Z. H. Wang}, title = {A Wideband three-stage rail-to-rail power amplifier driving large capacitive load}, booktitle = {{IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2008, Macao, China, November 30 2008 - December 3, 2008}, pages = {1394--1397}, publisher = {{IEEE}}, year = {2008}, url = {https://doi.org/10.1109/APCCAS.2008.4746290}, doi = {10.1109/APCCAS.2008.4746290}, timestamp = {Fri, 02 Nov 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/apccas/TamWKWW08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongFWC07, author = {Hei Wong and Valeriu Filip and C. K. Wong and P. S. Chung}, title = {Silicon integrated photonics begins to revolutionize}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {1--10}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.01.002}, doi = {10.1016/J.MICROREL.2006.01.002}, timestamp = {Sat, 11 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongFWC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ShaimeevGKWLK07, author = {Sergey Shaimeev and Vladimir Gritsenko and Kaupo Kukli and Hei Wong and Eun{-}Hong Lee and Chungwoo Kim}, title = {Single band electronic conduction in hafnium oxide prepared by atomic layer deposition}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {36--40}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.03.002}, doi = {10.1016/J.MICROREL.2006.03.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ShaimeevGKWLK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FuWL07, author = {Y. Fu and Hei Wong and Juin J. Liou}, title = {Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {46--50}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.01.009}, doi = {10.1016/J.MICROREL.2006.01.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FuWL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FilipWN06, author = {Valeriu Filip and Hei Wong and D. Nicolaescu}, title = {Definition of curve fitting parameter to study tunneling and trapping of electrons in Si/ultra-thin SiO\({}_{\mbox{2}}\)/metal structures}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1027--1034}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.014}, doi = {10.1016/J.MICROREL.2005.10.014}, timestamp = {Sat, 11 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FilipWN06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongWCKC06, author = {C. K. Wong and Hei Wong and Mansun Chan and Chi{-}Wah Kok and H. P. Chan}, title = {Minimizing hydrogen content in silicon oxynitride by thermal oxidation of silicon-rich silicon nitride}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2056--2061}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.01.006}, doi = {10.1016/J.MICROREL.2006.01.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongWCKC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mj/ZhanPWNK05, author = {Nian Zhan and M. C. Poon and Hei Wong and K. L. Ng and Chi{-}Wah Kok}, title = {Dielectric breakdown characteristics and interface trapping of hafnium oxide films}, journal = {Microelectron. J.}, volume = {36}, number = {1}, pages = {29--33}, year = {2005}, url = {https://doi.org/10.1016/j.mejo.2004.10.006}, doi = {10.1016/J.MEJO.2004.10.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mj/ZhanPWNK05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YangLW04, author = {Bing{-}Liang Yang and P. T. Lai and Hei Wong}, title = {Conduction mechanisms in {MOS} gate dielectric films}, journal = {Microelectron. Reliab.}, volume = {44}, number = {5}, pages = {709--718}, year = {2004}, url = {https://doi.org/10.1016/j.microrel.2004.01.013}, doi = {10.1016/J.MICROREL.2004.01.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YangLW04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Wong03, author = {Hei Wong}, title = {Low-frequency noise study in electron devices: review and update}, journal = {Microelectron. Reliab.}, volume = {43}, number = {4}, pages = {585--599}, year = {2003}, url = {https://doi.org/10.1016/S0026-2714(02)00347-5}, doi = {10.1016/S0026-2714(02)00347-5}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Wong03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChanWPK03, author = {Jackie Chan and Hei Wong and M. C. Poon and Chi{-}Wah Kok}, title = {Oxynitride gate dielectric prepared by thermal oxidation of low-pressure chemical vapor deposition silicon-rich silicon nitride}, journal = {Microelectron. Reliab.}, volume = {43}, number = {4}, pages = {611--616}, year = {2003}, url = {https://doi.org/10.1016/S0026-2714(03)00031-3}, doi = {10.1016/S0026-2714(03)00031-3}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChanWPK03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GritsenkoSNBWZR03, author = {V. A. Gritsenko and A. V. Shaposhnikov and Yu. N. Novikov and A. P. Baraban and Hei Wong and G. M. Zhidomirov and M. Roger}, title = {Onefold coordinated oxygen atom: an electron trap in the silicon oxide}, journal = {Microelectron. Reliab.}, volume = {43}, number = {4}, pages = {665--669}, year = {2003}, url = {https://doi.org/10.1016/S0026-2714(03)00030-1}, doi = {10.1016/S0026-2714(03)00030-1}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GritsenkoSNBWZR03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NgZKPW03, author = {K. L. Ng and Nian Zhan and Chi{-}Wah Kok and M. C. Poon and Hei Wong}, title = {Electrical characterization of the hafnium oxide prepared by direct sputtering of Hf in oxygen with rapid thermal annealing}, journal = {Microelectron. Reliab.}, volume = {43}, number = {8}, pages = {1289--1293}, year = {2003}, url = {https://doi.org/10.1016/S0026-2714(03)00141-0}, doi = {10.1016/S0026-2714(03)00141-0}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/NgZKPW03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Wong02, author = {Hei Wong}, title = {Recent developments in silicon optoelectronic devices}, journal = {Microelectron. Reliab.}, volume = {42}, number = {3}, pages = {317--326}, year = {2002}, url = {https://doi.org/10.1016/S0026-2714(02)00008-2}, doi = {10.1016/S0026-2714(02)00008-2}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Wong02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongG02, author = {Hei Wong and V. A. Gritsenko}, title = {Defects in silicon oxynitride gate dielectric films}, journal = {Microelectron. Reliab.}, volume = {42}, number = {4-5}, pages = {597--605}, year = {2002}, url = {https://doi.org/10.1016/S0026-2714(02)00005-7}, doi = {10.1016/S0026-2714(02)00005-7}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongG02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HanWCP02, author = {P. G. Han and Hei Wong and Andy H. P. Chan and M. C. Poon}, title = {A novel approach for fabricating light-emitting porous polysilicon films}, journal = {Microelectron. Reliab.}, volume = {42}, number = {6}, pages = {929--933}, year = {2002}, url = {https://doi.org/10.1016/S0026-2714(02)00011-2}, doi = {10.1016/S0026-2714(02)00011-2}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HanWCP02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YangCDSWLC02, author = {Bing{-}Liang Yang and N. W. Cheung and S. Denholm and J. Shao and Hei Wong and P. T. Lai and Y. C. Cheng}, title = {Ultra-shallow n\({}^{\mbox{+}}\)p junction formed by PH\({}_{\mbox{3}}\) and AsH\({}_{\mbox{3}}\) plasma immersion ion implantation}, journal = {Microelectron. Reliab.}, volume = {42}, number = {12}, pages = {1985--1989}, year = {2002}, url = {https://doi.org/10.1016/S0026-2714(02)00099-9}, doi = {10.1016/S0026-2714(02)00099-9}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YangCDSWLC02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongHPG01, author = {Hei Wong and P. G. Han and M. C. Poon and Y. Gao}, title = {Investigation of the surface silica layer on porous poly-Si thin films}, journal = {Microelectron. Reliab.}, volume = {41}, number = {2}, pages = {179--184}, year = {2001}, url = {https://doi.org/10.1016/S0026-2714(00)00098-6}, doi = {10.1016/S0026-2714(00)00098-6}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongHPG01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PoonGKMW01, author = {M. C. Poon and Y. Gao and Ted Chi{-}Wah Kok and A. M. Myasnikov and Hei Wong}, title = {{SIMS} study of silicon oxynitride prepared by oxidation of silicon-rich silicon nitride layer}, journal = {Microelectron. Reliab.}, volume = {41}, number = {12}, pages = {2071--2074}, year = {2001}, url = {https://doi.org/10.1016/S0026-2714(01)00216-5}, doi = {10.1016/S0026-2714(01)00216-5}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PoonGKMW01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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