BibTeX records: Lubomyr M. Zobniw

• > Home > Persons > Lubomyr M. Zobniw

@inproceedings{DBLP:conf/itc/Zobniw83,
  author       = {Lubomyr M. Zobniw},
  title        = {Designing the {VLSI} Device-to-Board Test Ukraine Translator},
  booktitle    = {Proceedings International Test Conference 1983, Philadelphia, PA,
                  USA, October 1983},
  pages        = {489--496},
  publisher    = {{IEEE} Computer Society},
  year         = {1983},
  timestamp    = {Fri, 10 Feb 2012 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Zobniw83.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dac/HsuSZ78,
  author       = {Frank C. Hsu and
                  Peter Solecky and
                  Lubomyr M. Zobniw},
  editor       = {Stephen A. Szygenda},
  title        = {Selective controllability: {A} proposal for testing and diagnosis},
  booktitle    = {Proceedings of the 15th Design Automation Conference, {DAC} '78, Las
                  Vegas, Nevada, USA, June 19-21, 1978},
  pages        = {110--116},
  publisher    = {{ACM}},
  year         = {1978},
  url          = {http://dl.acm.org/citation.cfm?id=803074},
  timestamp    = {Thu, 01 Mar 2012 19:05:48 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/HsuSZ78.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dac/Zobniw76,
  author       = {Lubomyr M. Zobniw},
  editor       = {Donald J. Humcke and
                  J. Michael Galey and
                  Stephen A. Szygenda and
                  Pat O. Pistilli and
                  Nitta P. Dooner and
                  Judith G. Brinsfield and
                  J. S. Olila},
  title        = {Multi-defect real time diagnosis using a single pin probe},
  booktitle    = {Proceedings of the 13th Design Automation Conference, {DAC} '76, San
                  Francisco, California, USA, June 28-30, 1976},
  pages        = {179--185},
  publisher    = {{ACM}},
  year         = {1976},
  url          = {https://doi.org/10.1145/800146.804812},
  doi          = {10.1145/800146.804812},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/Zobniw76.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dac/Zobniw75,
  author       = {Lubomyr M. Zobniw},
  editor       = {Robert B. Hitchcock Sr. and
                  Donald J. Humcke and
                  Stephen A. Szygenda},
  title        = {Real time diagnosis using single pin probe},
  booktitle    = {Proceedings of the 12th Design Automation Conference, {DAC} '75, Boston,
                  Massachusetts, USA, June 23-25, 1975},
  pages        = {268--285},
  publisher    = {{ACM}},
  year         = {1975},
  url          = {http://dl.acm.org/citation.cfm?id=809077},
  timestamp    = {Thu, 01 Mar 2012 19:09:34 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/Zobniw75.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dac/PatchZ70,
  author       = {F. David Patch and
                  Lubomyr M. Zobniw},
  editor       = {Ralph J. Preiss},
  title        = {Real time diagnosis of logic assemblies},
  booktitle    = {Proceedings of the 7th Design Automation Workshop, {DAC} '70, San
                  Francisco, California, USA, June 22-25, 1970},
  pages        = {108--115},
  publisher    = {{ACM}},
  year         = {1970},
  url          = {https://doi.org/10.1145/800160.805118},
  doi          = {10.1145/800160.805118},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/PatchZ70.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}