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Yi-Chin Chu

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1990 – 1999

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1998
[c2]
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Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey:
Experimental Results for IDDQ and VLV Testing. VTS 1998: 118-125
1996
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Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell:
Analysis and Detection of Timing Failures in an Experimental Test Chip. ITC 1996: 691-700

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