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Ivo S. M. de Jong

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2000 – 2009

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2009
[j5]
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R. Boumen, Ivo S. M. de Jong, J. M. G. Mestrom, Joanna M. van de Mortel-Fronczak, Jacobus E. Rooda:
Integration and Test Sequencing for Complex Systems. IEEE Trans. Syst. Man Cybern. Part A 39(1): 177-187 (2009)
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R. Boumen, Sui Ruan, Ivo S. M. de Jong, Joanna M. van de Mortel-Fronczak, Jacobus E. Rooda, Krishna R. Pattipati:
Hierarchical Test Sequencing for Complex Systems. IEEE Trans. Syst. Man Cybern. Part A 39(3): 640-649 (2009)
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Anne Rozinat, Ivo S. M. de Jong, Christian W. Günther, Wil M. P. van der Aalst:
Process Mining Applied to the Test Process of Wafer Scanners in ASML. IEEE Trans. Syst. Man Cybern. Part C 39(4): 474-479 (2009)
2008
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R. Boumen, Ivo S. M. de Jong, J. W. H. Vermunt, Joanna M. van de Mortel-Fronczak, Jacobus E. Rooda:
Test Sequencing in Complex Manufacturing Systems. IEEE Trans. Syst. Man Cybern. Part A 38(1): 25-37 (2008)
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R. Boumen, Ivo S. M. de Jong, J. W. H. Vermunt, Joanna M. van de Mortel-Fronczak, Jacobus E. Rooda:
Risk-Based Stopping Criteria for Test Sequencing. IEEE Trans. Syst. Man Cybern. Part A 38(6): 1 (2008)

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