Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDPeter C. Maxwell
Person information
- affiliation: ON Semiconductor, USA
- affiliation: Aptina Imaging, San Jose, CA, USA
- affiliation: Micron Technology Inc., USA
- affiliation: Agilent Technologies, Santa Clara, CA, USA
- affiliation: Hewlett-Packard Company, Santa Clara, CA, USA
- affiliation: University of New South Wales, Sydney, NSW, Australia
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2021
[j12]Friedrich Hapke
, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski:
Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(3): 584-597 (2021)
2010 – 2019
- 2018
- [c33]Friedrich Hapke, Peter C. Maxwell:
Total Critical Area Based Testing. ITC 2018: 1-10 - 2017
- [c32]Peter C. Maxwell, Friedrich Hapke, Maija Ryynaenen, Peter Weseloh:
Bridge over troubled waters: Critical area based pattern generation. ETS 2017: 1-6 - 2016
- [c31]Peter C. Maxwell, Friedrich Hapke, Huaxing Tang:
Cell-aware diagnosis: Defective inmates exposed in their cells. ETS 2016: 1-6 - [c30]Hans-Joachim Wunderlich, Peter C. Maxwell:
ETS 2015 best paper. ETS 2016: 1 - 2012
- [c29]Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell:
Adaptive testing: Conquering process variations. ETS 2012: 1-6 - 2011
- [j11]Peter C. Maxwell:
Adaptive Testing: Dealing with Process Variability. IEEE Des. Test Comput. 28(6): 41-49 (2011) - [c28]Ilia Polian, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, Peter C. Maxwell:
Towards Variation-Aware Test Methods. ETS 2011: 219-225 - 2010
- [c27]Peter C. Maxwell:
Adaptive test directions. ETS 2010: 12-16
2000 – 2009
- 2007
- [c26]Peter C. Maxwell:
Wafer Level Reliability Screens. ETS 2007: 201 - [c25]Peter C. Maxwell:
Principles and results of some test cost reduction methods for ASICs. ITC 2007: 1-5 - 2006
- [c24]Peter C. Maxwell:
The Design, Implementation and Analysis of Test Experiments. ITC 2006: 1-9 - 2003
- [j10]Peter C. Maxwell:
Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings. IEEE Des. Test Comput. 20(5): 84-89 (2003) - 2002
- [j9]Jaume Segura, Peter C. Maxwell:
Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron Era. IEEE Des. Test Comput. 19(5): 5-7 (2002) - [c23]Peter C. Maxwell:
The Heisenberg Uncertainty of Test. ITC 2002: 13 - [c22]Peter C. Maxwell:
Wafer/Package Test Mix for Optimal Defect Detection. ITC 2002: 1050-1055 - [c21]Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers:
Debating the Future of Burn-In. VTS 2002: 311-314 - 2000
- [c20]Peter C. Maxwell, Ismed Hartanto, Lee Bentz:
Comparing functional and structural tests. ITC 2000: 400-407 - [c19]Peter C. Maxwell, Jeff Rearick:
Deception by design: fooling ourselves with gate-level models. ITC 2000: 921-929 - [c18]Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman:
Current ratios: a self-scaling technique for production IDDQ testing. ITC 2000: 1148-1156
1990 – 1999
- 1999
- [c17]Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman:
Current ratios: a self-scaling technique for production I_DDQ testing. ITC 1999: 738-746 - 1998
- [c16]Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell:
CMOS IC reliability indicators and burn-in economics. ITC 1998: 194-203 - [c15]Peter C. Maxwell, Jeff Rearick:
Estimation of defect-free IDDQ in submicron circuits using switch level simulation. ITC 1998: 882-889 - [c14]Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh:
Best Methods for At-Speed Testing? VTS 1998: 460-461 - 1997
- [c13]Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly:
So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC 1997: 1037-1038 - [c12]Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken:
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS 1997: 459 - 1996
- [c11]Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown:
IDDQ and AC Scan: The War Against Unmodelled Defects. ITC 1996: 250-258 - 1995
- [j8]Peter C. Maxwell:
Reductions in quality caused by uneven fault coverage of different areas of an integrated circuit. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(5): 603-607 (1995) - [c10]Peter C. Maxwell:
The Many Faces of Test Synthesis. ITC 1995: 295 - [c9]Peter C. Maxwell:
The use of IDDQ testing in low stuck-at coverage situations. VTS 1995: 84-88 - 1994
- [c8]Peter C. Maxwell, Robert C. Aitken, Leendert M. Huisman:
The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. ITC 1994: 739-746 - [c7]Peter C. Maxwell:
Quality impacts of non-uniform fault coverage. VTS 1994: 197-200 - 1993
- [j7]Peter C. Maxwell, Robert C. Aitken:
Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. IEEE Des. Test Comput. 10(1): 42-51 (1993) - [c6]Peter C. Maxwell, Robert C. Aitken:
Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. ITC 1993: 63-72 - [c5]Peter C. Maxwell:
Let's Grade ALL the Faults. ITC 1993: 595 - 1992
- [j6]Peter C. Maxwell, Robert C. Aitken:
IDDQ testing as a component of a test suite: The need for several fault coverage metrics. J. Electron. Test. 3(4): 305-316 (1992) - [c4]Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang:
The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need? ITC 1992: 168-177 - 1991
- [c3]Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang:
The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%? ITC 1991: 358-364 - [c2]Peter C. Maxwell:
The Interaction of Test and Quality. ITC 1991: 1120 - 1990
- [c1]Peter C. Maxwell, Hans-Joachim Wunderlich:
The effectiveness of different test sets for PLAs. EURO-DAC 1990: 628-632
1980 – 1989
- 1988
- [j5]Peter C. Maxwell:
Comparative Analysis of Different Implementations of Multiple-Input Signature Analyzers. IEEE Trans. Computers 37(11): 1411-1414 (1988)
1970 – 1979
- 1978
- [j4]Philip G. McCrea, Peter C. Maxwell, Paul W. Baker:
Comments on "A Floating Point Multiplexed DDA System". IEEE Trans. Computers 27(12): 1226 (1978) - 1977
- [j3]Peter C. Maxwell:
Correct DDA Register Transfers for Trapezoidal Integration When Solving Nonlinear Equations of the Form y = A yn. IEEE Trans. Computers 26(11): 1151-1153 (1977) - 1976
- [j2]Peter C. Maxwell, Paul W. Baker, Philip G. McCrea:
Incremental Computer Systems. Aust. Comput. J. 8(3): 97-102 (1976) - 1974
- [j1]Peter C. Maxwell:
Alternative Descriptions in Line Drawing Analysis. Artif. Intell. 5(4): 325-348 (1974)
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-25 05:51 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
