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Mustapha Slamani
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2020 – today
- 2024
- [c24]Xiaozhe Fan, Swathi Manamohan, Mustapha Slamani, John Ferrario, Murugan Muthukaruppan:
Signal Integrity Analysis and Optimization of DDR Interconnect Design. ICCE 2024: 1-5
2010 – 2019
- 2016
- [j13]Nicholai L'Esperance, Timothy Platt, Mustapha Slamani, Tian Xia:
OFDM Multitone Signal Generation Technique for Analog Circuitry Test Characterization. IEEE Trans. Circuits Syst. II Express Briefs 63-II(6): 583-587 (2016) - 2015
- [j12]Afsaneh Nassery, Srinath Byregowda, Sule Ozev, Marian Verhelst, Mustapha Slamani:
Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector. IEEE Trans. Very Large Scale Integr. Syst. 23(2): 331-341 (2015) - 2014
- [c23]Jae Woong Jeong, Sule Ozev, Shreyas Sen, Vishwanath Natarajan, Mustapha Slamani:
Built-in self-test and characterization of polar transmitter parameters in the loop-back mode. DATE 2014: 1-6 - [c22]Mohamed Metwally, Nicholai L'Esperance, Tian Xia, Mustapha Slamani:
Continuous wave radar circuitry testing using OFDM technique. VTS 2014: 1-6 - 2013
- [j11]Tian Xia, Rohit Shetty, Timothy Platt, Mustapha Slamani:
Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique. J. Electron. Test. 29(6): 893-901 (2013) - [c21]Afsaneh Nassery, Sule Ozev, Mustapha Slamani:
Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion. ETS 2013: 1-6 - 2012
- [c20]Nourredine Akkouche, Salvador Mir, Emmanuel Simeu, Mustapha Slamani:
Analog/RF test ordering in the early stages of production testing. VTS 2012: 25-30 - [c19]Afsaneh Nassery, Srinath Byregowda, Sule Ozev, Marian Verhelst, Mustapha Slamani:
Built-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector. VTS 2012: 56-61 - 2011
- [c18]Nathan Kupp, Mustapha Slamani, Yiorgos Makris:
Correlating inline data with final test outcomes in analog/RF devices. DATE 2011: 812-817 - [c17]Afsaneh Nassery, Sule Ozev, Marian Verhelst, Mustapha Slamani:
Extraction of EVM from Transmitter System Parameters. ETS 2011: 75-80 - 2010
- [j10]Haralampos-G. D. Stratigopoulos, Petros Drineas, Mustapha Slamani, Yiorgos Makris:
RF Specification Test Compaction Using Learning Machines. IEEE Trans. Very Large Scale Integr. Syst. 18(6): 998-1002 (2010) - [c16]Devin Morris, William R. Eisenstadt, Andrea Paganini, Mustapha Slamani, Timothy Platt, John Ferrario:
Synthetic DSP approach for novel FPGA-based measurement of error vector magnitude. ITC 2010: 237-244
2000 – 2009
- 2009
- [j9]Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris:
On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction. J. Electron. Test. 25(6): 309-321 (2009) - 2008
- [c15]Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris:
Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction. ETS 2008: 35-40 - 2007
- [j8]Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat, Mustapha Slamani:
RF Testing on a Mixed Signal Tester. J. Electron. Test. 23(1): 85-94 (2007) - [c14]Haralampos-G. D. Stratigopoulos, Petros Drineas, Mustapha Slamani, Yiorgos Makris:
Non-RF to RF Test Correlation Using Learning Machines: A Case Study. VTS 2007: 9-14 - 2006
- [j7]André Boyoguéno, Mohamad Sawan, Mustapha Slamani:
A BICMOS 120 MW 11 GHZ transimpedance amplifier Dedicated for High-Speed Photoreceivers. J. Circuits Syst. Comput. 15(4): 467-490 (2006) - 2005
- [c13]Mustapha Slamani:
Reducing high-speed/RF test cost - guaranteed by design or guaranteed to fail? ITC 2005: 1 - 2004
- [j6]Carol Stolicny, Mustapha Slamani, Fidel Muradali, Geir Eide, Mike Li:
ITC 2003 panels: Part 2. IEEE Des. Test Comput. 21(3): 175-176, 261-262 (2004) - 2003
- [j5]John Ferrario, Randy Wolf, Steve Moss, Mustapha Slamani:
A low-cost test solution for wireless phone RFICs. IEEE Commun. Mag. 41(9): 82-88 (2003) - [c12]Mustapha Slamani:
RF Test 101: Defining the Problem, Finding Solutions. ITC 2003: 1286 - 2002
- [c11]Mustapha Slamani:
Testing Highly Integrated Wireless Circuits and Systems with Low Cost Tester: How to Overcome the Challenge? ITC 2002: 1225 - [c10]Robert C. Aitken, Mustapha Slamani, H. Ding, William R. Eisenstadt, Sanghoon Choi, John McLaughlin:
Wireless Test. VTS 2002: 173-174 - 2001
- [j4]Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska:
A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface. J. Electron. Test. 17(1): 53-61 (2001) - [j3]Mustapha Slamani, Karim Arabi:
Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques. J. Electron. Test. 17(5): 417-425 (2001) - 2000
- [c9]Abdelohahab Djemouai, Mohamad Sawan, Mustapha Slamani:
New CMOS integrated pulse width modulator for voltage conversion applications. ICECS 2000: 116-119 - [c8]André Boyoguéno, Bozena Kaminska, Mustapha Slamani:
A preamplifier IC design for photonic links. ISCAS 2000: 285-288
1990 – 1999
- 1999
- [c7]Abdelohahab Djemouai, Mohamad Sawan, Mustapha Slamani:
New circuit techniques based on a high performance frequency-to-voltage converter. ICECS 1999: 13-16 - [c6]Abdelohahab Djemouai, Mohamad Sawan, Mustapha Slamani:
A 200 MHz frequency-locked loop based on new frequency-to-voltage converters approach. ISCAS (2) 1999: 89-92 - [c5]Abdelohahab Djemouai, Mohamad Sawan, Mustapha Slamani:
An efficient RF power transfer and bidirectional data transmission to implantable electronic devices. ISCAS (2) 1999: 259-262 - 1998
- [c4]Mustapha Slamani, Maddi Zineb, Mounir Boukadoum:
A DSP testing approach by modeling the circuit response as a Markov chain. ICECS 1998: 241-247 - [c3]Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska, Fartoumi M. Hossein, Patrick Vincent:
Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing. VTS 1998: 239-244 - 1995
- [j2]Mustapha Slamani, Bozena Kaminska:
Multifrequency Analysis of Faults in Analog Circuits. IEEE Des. Test Comput. 12(2): 70-80 (1995) - 1994
- [c2]Mustapha Slamani, Bozena Kaminska, Guy Quesnel:
An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters. ITC 1994: 631-640 - [c1]Mustapha Slamani, Bozena Kaminska:
Multifrequency testability analysis for analog circuits. VTS 1994: 54-59 - 1992
- [j1]Mustapha Slamani, Bozena Kaminska:
Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing. IEEE Des. Test Comput. 9(1): 30-39 (1992)
Coauthor Index
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