Keith Baker
Peggy Y. Kim
Jonathan P. Wanderer
David Allbritton
Matthias Eikermann
Keith Baker
Anesthesia Residents Preferentially Request Operating Room Case Assignments with Complex Cases.
64:1-64:11
2017
41
J. Medical Syst.
4
https://doi.org/10.1007/s10916-017-0718-3
https://www.wikidata.org/entity/Q38913744
db/journals/jms/jms41.html#KimWAEB17
Karsten Øster Lundqvist
Keith Baker
Shirley Williams
Ontology supported competency system.
197-219
2011
7
Int. J. Knowl. Learn.
3/4
https://doi.org/10.1504/IJKL.2011.044539
db/journals/ijkl/ijkl7.html#LundqvistBW11
Keith Baker
Torque Kills! Future Control of the Ambient Electromagnetic Spectrum.
4-8
2007
14
IEEE Multim.
1
https://doi.org/10.1109/MMUL.2007.21
http://doi.ieeecomputersociety.org/10.1109/MMUL.2007.21
db/journals/ieeemm/ieeemm14.html#Baker07
Keith Baker
Intrusive Interactivity Is Not an Ambient Experience.
4-7
2006
13
IEEE Multim.
2
https://doi.org/10.1109/MMUL.2006.33
http://doi.ieeecomputersociety.org/10.1109/MMUL.2006.33
db/journals/ieeemm/ieeemm13.html#Baker06
Ian T. Foster
Jerry Gieraltowski
Scott Gose
Natalia Maltsev
Edward N. May
Alex Rodriguez
Dinanath Sulakhe
A. Vaniachine
Jim Shank
Saul Youssef
David Adams
Richard Baker 0003
Wensheng Deng
Jason Smith
Dantong Yu
Iosif Legrand
Suresh Singh
Conrad Steenberg
Yang Xia
M. Anzar Afaq
Eileen Berman
James Annis
L. A. T. Bauerdick
Michael Ernst
Ian Fisk
Lisa Giacchetti
Gregory E. Graham
Anne Heavey
Joseph Kaiser
Nickolai Kuropatkin
Ruth Pordes
Vijay Sekhri
John Weigand
Yujun Wu
Keith Baker
Lawrence Sorrillo
John Huth
Matthew Allen
Leigh Grundhoefer
John Hicks
Fred Luehring
Steve Peck
Robert Quick
Stephen C. Simms
George Fekete
Jan vandenBerg
Kihyeon Cho
Kihwan Kwon
Dongchul Son
Hyoungwoo Park
Shane Canon
Keith R. Jackson
David E. Konerding
Jason Lee 0001
Doug Olson
Iwona Sakrejda
Brian Tierney
Mark Green 0001
Russ Miller
James Letts
Terrence Martin
David Bury
Catalin Dumitrescu
Daniel Engh
Robert W. Gardner
Marco Mambelli
Yuri Smirnov
Jens-S. Vöckler
Michael Wilde
Yong Zhao 0009
Xin Zhao
Paul Avery
Richard Cavanaugh
Bockjoo Kim
Craig Prescott
Jorge Luis Rodriguez
Andrew Zahn
Shawn McKee
Christopher T. Jordan
James E. Prewett
Timothy L. Thomas
Horst Severini
Ben Clifford
Ewa Deelman
Larry Flon
Carl Kesselman
Gaurang Mehta
Nosa Olomu
Karan Vahi
Kaushik De
Patrick McGuigan
Mark Sosebee
Dan Bradley
Peter Couvares
Alan DeSmet
Carey Kireyev
Erik Paulson 0001
Alain Roy
Scott Koranda
Brian Moe
Bobby Brown
Paul Sheldon
The Grid2003 Production Grid: Principles and Practice.
236-245
2004
conf/hpdc/2004
HPDC
https://doi.ieeecomputersociety.org/10.1109/HPDC.2004.36
db/conf/hpdc/hpdc2004.html#FosterGG04
Will R. Moore
Guido Gronthoud
Keith Baker
Maurice Lousberg
Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?
95-104
2000
conf/itc/2000
ITC
db/conf/itc/itc2000.html#MooreGBL00
https://doi.org/10.1109/TEST.2000.894196
https://doi.ieeecomputersociety.org/10.1109/TEST.2000.894196
Keith Baker
SIA Roadmaps: Sunset Boulevard for l_DDQ.
1121
1999
conf/itc/1999
ITC
db/conf/itc/itc1999.html#Baker99
https://doi.org/10.1109/TEST.1999.805854
https://doi.ieeecomputersociety.org/10.1109/TEST.1999.805854
Keith Baker
Spice up your life: simulate mixed-signal ICs!
1131
1998
conf/itc/1998
ITC
https://doi.org/10.1109/TEST.1998.743321
https://doi.ieeecomputersociety.org/10.1109/TEST.1998.743321
db/conf/itc/itc1998.html#Baker98
Keith Baker
Jos van Beers
Shmoo Plotting: The Black Art of IC Testing.
90-97
1997
14
IEEE Des. Test Comput.
3
https://doi.org/10.1109/54.606005
http://doi.ieeecomputersociety.org/10.1109/54.606005
db/journals/dt/dt14.html#BakerB97
Keith Baker
IDDQ: you heard the hype, but what's really coming?
116-119
1996
ED&TC
https://doi.org/10.1109/EDTC.1996.494135
https://doi.ieeecomputersociety.org/10.1109/EDTC.1996.494135
https://dl.acm.org/doi/10.5555/787259.787604
conf/date/1996
db/conf/date/edtc1996.html#Baker96
Keith Baker
Jos van Beers
Shmoo Plots - the Black Art of IC Test.
932-933
1996
conf/itc/1996
ITC
db/conf/itc/itc1996.html#BakerB96
https://doi.org/10.1109/TEST.1996.557162
https://doi.ieeecomputersociety.org/10.1109/TEST.1996.557162
https://www.wikidata.org/entity/Q30052695
Keith Baker
Alan Hales
Plug-and-Play IDDQ Testing for Test Fixtures.
53-61
1995
12
IEEE Des. Test Comput.
3
https://doi.org/10.1109/MDT.1995.466379
http://doi.ieeecomputersociety.org/10.1109/MDT.1995.466379
db/journals/dt/dt12.html#BakerH95
Keith Baker
Stuck-at Faults, PPMs Rejects or? What doe the SIA Roadmaps Say?
299
1995
conf/itc/1995
ITC
db/conf/itc/itc1995.html#Baker95
https://doi.org/10.1109/TEST.1995.529851
https://doi.ieeecomputersociety.org/10.1109/TEST.1995.529851
Keith Baker
T. F. Waayers
F. G. M. Bouwman
M. J. W. Verstraelen
Plug & Play IDDQ Monitoring with QTAG.
739-749
1995
conf/itc/1995
ITC
db/conf/itc/itc1995.html#BakerWBV95
https://doi.org/10.1109/TEST.1995.529905
https://doi.ieeecomputersociety.org/10.1109/TEST.1995.529905
Keith Baker
QTAG: A Standard for Test Fixture Based IDDQ/ISSQ Monitors.
194-202
1994
conf/itc/1994
ITC
db/conf/itc/itc1994.html#Baker94
https://doi.org/10.1109/TEST.1994.527950
https://doi.ieeecomputersociety.org/10.1109/TEST.1994.527950
Keith Baker
A. H. Bratt
Andrew Richardson 0001
A. Welbers
Development of a CLASS 1 QTAG Monitor.
213-222
1994
conf/itc/1994
ITC
db/conf/itc/itc1994.html#BakerBRW94
https://doi.org/10.1109/TEST.1994.527952
https://doi.ieeecomputersociety.org/10.1109/TEST.1994.527952
R. J. A. Harvey
Andrew Mark David Richardson
Eric Bruls
Keith Baker
Analogue Fault Simulation Based on Layout-Dependent Fault Models.
641-649
1994
conf/itc/1994
ITC
db/conf/itc/itc1994.html#HarveyRBB94
https://doi.org/10.1109/TEST.1994.528009
https://doi.ieeecomputersociety.org/10.1109/TEST.1994.528009
Frank Bouwman
Taco Zwemstra
Sonny Hartanto
Keith Baker
Jan Koopmans
Application of Joint Time-Frequency Analysis in Mixed-Signal Testing.
747-756
1994
conf/itc/1994
ITC
db/conf/itc/itc1994.html#BouwmanZHBK94
https://doi.org/10.1109/TEST.1994.528021
https://doi.ieeecomputersociety.org/10.1109/TEST.1994.528021
M. M. A. van Rosmalen
Keith Baker
Eric Bruls
Jochen A. G. Jess
Parameter Monitoring: Advantages and Pitfalls.
115-124
1993
conf/itc/1993
ITC
db/conf/itc/itc1993.html#RosmalenBBJ93
https://doi.org/10.1109/TEST.1993.470711
https://doi.ieeecomputersociety.org/10.1109/TEST.1993.470711
Keith Baker
Time-to-Market: An Issue in Mixed-signal vs. Analogue.
254
1992
conf/itc/1992
ITC
db/conf/itc/itc1992.html#Baker92
https://doi.org/10.1109/TEST.1992.527828
https://doi.ieeecomputersociety.org/10.1109/TEST.1992.527828
Bas Verhelst
Richard Morren
Keith Baker
Using EDIF for Transfer of Test Data: Practical Experience.
459-465
1992
conf/itc/1992
ITC
db/conf/itc/itc1992.html#VerhelstMB92
https://doi.org/10.1109/TEST.1992.527857
https://doi.ieeecomputersociety.org/10.1109/TEST.1992.527857
R. Mehtani
M. De Jonghe
Richard Morren
Keith Baker
Improving Total IC Design Quality Using Application Mode Testing.
866-872
1992
conf/itc/1992
ITC
db/conf/itc/itc1992.html#MehtaniJMB92
https://doi.org/10.1109/TEST.1992.527912
https://doi.ieeecomputersociety.org/10.1109/TEST.1992.527912
Kate Crennell
Keith Baker
5th Alvey vision Conference.
2-3
1990
8
Image Vis. Comput.
1
https://doi.org/10.1016/0262-8856(90)90048-A
db/journals/ivc/ivc8.html#CrennellB90
Keith Baker
Bas Verhelst
IDDQ testing because 'zero defects isn't enough': a Philips perspective.
253-254
1990
ITC
https://doi.org/10.1109/TEST.1990.114025
https://doi.ieeecomputersociety.org/10.1109/TEST.1990.114025
conf/itc/1990
db/conf/itc/itc1990.html#BakerV90
R. Mehtani
Keith Baker
C. M. Huizer
P. J. Hynes
Jos van Beers
Macro-testability and the VSP.
739-748
1990
ITC
https://doi.org/10.1109/TEST.1990.114090
https://doi.ieeecomputersociety.org/10.1109/TEST.1990.114090
conf/itc/1990
db/conf/itc/itc1990.html#MehtaniBHHB90
N. A. Jones
Keith Baker
Knowledge-based system tool for high-level BIST design.
35-40
1987
11
Microprocess. Microsystems
1
https://doi.org/10.1016/0141-9331(87)90327-9
db/journals/mam/mam11.html#JonesB87
S. B. Tan
K. Totton
Keith Baker
Prab Varma
R. Porter
A Fast Signature Simulation Tool for Built-In Self-Testing Circuits.
17-25
1987
conf/dac/1987
DAC
https://doi.org/10.1145/37888.37891
db/conf/dac/dac87.html#TanTBVP87
N. A. Jones
Keith Baker
An Intelligent Knowledge-Based System Tool for High-Level BIST Design.
743-749
1986
conf/itc/1986
ITC
db/conf/itc/itc1986.html#JonesB86
Prab Varma
Anthony P. Ambler
Keith Baker
An Analysis of the Economics of Self Test.
20-30
1984
conf/itc/1984
ITC
db/conf/itc/itc1984.html#VarmaAB84
Keith Baker
Specifying the system.
259-261
1980
4
Microprocess. Microsystems
7
https://doi.org/10.1016/0141-9331(80)90323-3
db/journals/mam/mam4.html#Baker80
Keith Baker
Microprocessor impact on commerce.
59-63
1979
3
Microprocess. Microsystems
2
https://doi.org/10.1016/0141-9331(79)90061-9
db/journals/mam/mam3.html#Baker79
Keith Baker
Microprocessors and software design tools.
87-93
1979
3
Microprocess. Microsystems
2
https://doi.org/10.1016/0141-9331(79)90067-X
db/journals/mam/mam3.html#Baker79a
Keith Baker
Improve complex software by using multiple microprocessors.
165-168
1977
1
Microprocess.
3
https://doi.org/10.1016/0308-5953(77)90118-0
https://www.wikidata.org/entity/Q111900741
db/journals/mam/mam1.html#Baker77
David Adams
M. Anzar Afaq
David Allbritton
Matthew Allen
Anthony P. Ambler
James Annis
Paul Avery
Richard Baker 0003
L. A. T. Bauerdick
Jos van Beers
Eileen Berman
F. G. M. Bouwman
Frank Bouwman
Dan Bradley
A. H. Bratt
Bobby Brown
Eric Bruls
David Bury
Shane Canon
Richard Cavanaugh
Kihyeon Cho
Ben Clifford
Peter Couvares
Kate Crennell
Kaushik De
Ewa Deelman
Wensheng Deng
Alan DeSmet
Catalin Dumitrescu
Matthias Eikermann
Daniel Engh
Michael Ernst
George Fekete
Ian Fisk
Larry Flon
Ian T. Foster
Robert W. Gardner
Lisa Giacchetti
Jerry Gieraltowski
Scott Gose
Gregory E. Graham
Mark Green 0001
Guido Gronthoud
Leigh Grundhoefer
Alan Hales
Sonny Hartanto
R. J. A. Harvey
Anne Heavey
John Hicks
C. M. Huizer
John Huth
P. J. Hynes
Keith R. Jackson
Jochen A. G. Jess
N. A. Jones
M. De Jonghe
Christopher T. Jordan
Joseph Kaiser
Carl Kesselman
Bockjoo Kim
Peggy Y. Kim
Carey Kireyev
David E. Konerding
Jan Koopmans
Scott Koranda
Nickolai Kuropatkin
Kihwan Kwon
Jason Lee 0001
Iosif Legrand
James Letts
Maurice Lousberg
Fred Luehring
Karsten LundqvistKarsten Øster Lundqvist
Natalia Maltsev
Marco Mambelli
Terrence Martin
Edward N. May
Patrick McGuigan
Shawn McKee
Gaurang Mehta
R. Mehtani
Russ Miller
Brian Moe
Will R. Moore
Richard Morren
Nosa Olomu
Doug Olson
Hyoungwoo Park
Erik Paulson 0001
Steve Peck
Ruth Pordes
R. Porter
Craig Prescott
James E. Prewett
Robert Quick
Andrew Richardson 0001Andrew Mark David Richardson
Alex Rodriguez
Jorge Rodríguez 0002Jorge Luis Rodriguez
M. M. A. van Rosmalen
Alain J. RoyAlain Roy
Iwona Sakrejda
Vijay Sekhri
Horst Severini
Jim Shank
Paul Sheldon
Stephen C. Simms
Suresh Singh
Yuri Smirnov
Jason Smith
Dongchul Son
Lawrence Sorrillo
Mark Sosebee
Conrad Steenberg
Dinanath Sulakhe
S. B. Tan
Timothy L. Thomas
Brian Tierney
K. Totton
Karan Vahi
Jan vandenBerg
A. Vaniachine
Prab Varma
Bas Verhelst
M. J. W. Verstraelen
Jens-S. Vöckler
T. F. Waayers
Jonathan P. Wanderer
John Weigand
A. Welbers
Michael Wilde
Shirley Williams
Yujun Wu
Yang Xia
Saul Youssef
Dantong Yu
Andrew Zahn
Xin Zhao
Yong Zhao 0009
Taco Zwemstra