Mingxu Huo
Xiaoyang Du
Shurong Dong
Yan Han
Juin J. Liou
Mingxu Huo
You Li
Qiang Cui
Dahai Huang
Demiao Wang
Evaluation of RF electrostatic discharge (ESD) protection in 0.18-µm CMOS technology.
995-999
2008
48
Microelectron. Reliab.
7
https://doi.org/10.1016/j.microrel.2008.04.005
db/journals/mr/mr48.html#DuDHLHLCHW08
Mingxu Huo
Koubao Ding
An Improved Algorithm for Sequence Pair Generation.
482-489
2006
conf/iccS/2006-1
International Conference on Computational Science (1)
https://doi.org/10.1007/11758501_66
db/conf/iccS/iccS2006-1.html#HuoD06
Mingxu Huo
Koubao Ding
A Quick Generation Method of Sequence Pair for Block Placement.
954-957
2005
conf/iccS/2005-3
International Conference on Computational Science (3)
https://doi.org/10.1007/11428862_146
db/conf/iccS/iccS2005-3.html#HuoD05
Qiang Cui
Koubao Ding
Shurong Dong
Xiaoyang Du
Yan Han
Dahai Huang
You Li
Juin J. Liou
Demiao Wang