Xiaobin Yuan
Xiaobin Yuan
Jingping Zhu
Hao Lei
Shengjun Peng
Weidong Wang
Xiaobin Li
Duplex-Hierarchy Representation Learning for Remote Sensing Image Classification.
1130
2024
February
24
Sensors
4
https://doi.org/10.3390/s24041130
db/journals/sensors/sensors24.html#YuanZLPWL24
Aida Varzaghani
Bardia Bozorgzadeh
Jack Lam
Ankush Goel
Xiaobin Yuan
Mohamed Elzeftawi
Mehran Izad
Sudipta Sarkar
Alberto Baldisserotto
Seong-Ryong Ryu
Steven Mikes
Jeffrey Hwang
Varun Joshi
Shahrzad Naraghi
Darshan Kadia
Mohammad Ranjbar
Paul Lee
Dimitri Loizos
Sotirios Zogopoulos
Shwetabh Verma
Stefanos Sidiropoulos
A 1-to-112Gb/s DSP-Based Wireline Transceiver with a Flexible Clocking Scheme in 5nm FinFET.
26-27
2022
VLSI Technology and Circuits
https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830304
conf/vlsit/2022
db/conf/vlsit/vlsit2022.html#VarzaghaniBLGYE22
Dongwen Wang
Bin Zhang
Xiaobin Yuan
Xuhui Zhang
Chen Liu
Preoperative planning and real-time assisted navigation by three-dimensional individual digital model in partial nephrectomy with three-dimensional laparoscopic system.
1461-1468
2015
10
Int. J. Comput. Assist. Radiol. Surg.
9
https://doi.org/10.1007/s11548-015-1148-7
https://www.wikidata.org/entity/Q40248850
db/journals/cars/cars10.html#WangZYZL15
Xiaobin Yuan
Pawel Owczarczyk
Alan J. Drake
Marshall D. Tiner
David T. Hui
John P. Pennings
Francesco A. Campisano
Richard L. Willaman
Leana M. Cropp
Rudolph D. Dussault
Design Considerations for Reconfigurable Delay Circuit to Emulate System Critical Paths.
2714-2718
2015
23
IEEE Trans. Very Large Scale Integr. Syst.
11
https://doi.org/10.1109/TVLSI.2014.2364785
db/journals/tvlsi/tvlsi23.html#YuanODTHPCWCD15
Xiaobin Yuan
Shesh N. Rai
Confidence Intervals for Survival Probabilities: A Comparison Study.
978-991
2011
40
Commun. Stat. Simul. Comput.
7
https://doi.org/10.1080/03610918.2011.560732
db/journals/cssc/cssc40.html#YuanR11
Han Liu 0001
Xiaobin Yuan
Qianying Tang
Rafal Kustra
An Efficient Method to Estimate Labelled Sample Size for Transductive LDA(QDA/MDA) Based on Bayes Risk.
274-285
https://doi.org/10.1007/978-3-540-30115-8_27
2004
conf/ecml/2004
ECML
db/conf/ecml/ecml2004.html#LiuYTK04
Han Liu 0001
Di Wu
Ji Zhang
Xiaolin Yang
Xiaobin Yuan
Rafal Kustra
Statistical Issues with Labeled Sample Size Analysis for Semi-Supervised Linear Discriminant Analysis.
1007-1012
2004
conf/icai/2004-2
IC-AI
db/conf/icai/icai2004-2.html#LiuWZYYK04
Alberto Baldisserotto
Bardia Bozorgzadeh
Francesco A. Campisano
Leana M. Cropp
Alan J. Drake
Rudolph D. Dussault
Mohamed Elzeftawi
Ankush Goel
David T. Hui
Jeffrey Hwang
Mehran Izad
Varun Joshi
Darshan Kadia
Rafal Kustra
Jack Lam
Paul Lee
Hao Lei
Xiaobin Li
Chen Liu
Han Liu 0001
Dimitri Loizos
Steven Mikes
Shahrzad Naraghi
Pawel Owczarczyk
Shengjun Peng
John P. Pennings
Shesh N. Rai
Mohammad Ranjbar
Seong-Ryong Ryu
Sudipta Sarkar
Stefanos Sidiropoulos
Qianying Tang
Marshall D. Tiner
Aida Varzaghani
Shwetabh Verma
Dongwen Wang
Weidong Wang
Richard L. Willaman
Di Wu
Xiaolin Yang
Bin Zhang
Ji Zhang
Xuhui Zhang
Jingping Zhu
Sotirios Zogopoulos